IEEE Organizations related to Microwave Measurement

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Conferences related to Microwave Measurement

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2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)

The conference program will consist of plenary lectures, symposia, workshops and invitedsessions of the latest significant findings and developments in all the major fields of biomedical engineering.Submitted papers will be peer reviewed. Accepted high quality papers will be presented in oral and postersessions, will appear in the Conference Proceedings and will be indexed in PubMed/MEDLINE


2020 IEEE International Conference on Plasma Science (ICOPS)

IEEE International Conference on Plasma Science (ICOPS) is an annual conference coordinated by the Plasma Science and Application Committee (PSAC) of the IEEE Nuclear & Plasma Sciences Society.


2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

The Conference focuses on all aspects of instrumentation and measurement science andtechnology research development and applications. The list of program topics includes but isnot limited to: Measurement Science & Education, Measurement Systems, Measurement DataAcquisition, Measurements of Physical Quantities, and Measurement Applications.


2020 IEEE/MTT-S International Microwave Symposium (IMS)

The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2036 IEEE/MTT-S International Microwave Symposium - IMS 2036

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2031 IEEE/MTT-S International Microwave Symposium - IMS 2031

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2029 IEEE/MTT-S International Microwave Symposium - IMS 2029

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2026 IEEE/MTT-S International Microwave Symposium - IMS 2026

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2025 IEEE/MTT-S International Microwave Symposium - IMS 2025

    The IEEE International Microwave Symposium (IMS) is the world s foremost conferencecovering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies;encompassing everything from basic technologies to components to systems including thelatest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulationand more. The IMS includes technical and interactive sessions, exhibits, student competitions,panels, workshops, tutorials, and networking events.

  • 2024 IEEE/MTT-S International Microwave Symposium - IMS 2024

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2021 IEEE/MTT-S International Microwave Symposium - IMS 2021

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2019 IEEE/MTT-S International Microwave Symposium - IMS 2019

    Comprehensive symposium on microwave theory and techniques including active and passive circuit components, theory and microwave systems.

  • 2018 IEEE/MTT-S International Microwave Symposium - IMS 2018

    Microwave theory and techniques, RF/microwave/millimeter-wave/terahertz circuit design and fabrication technology, radio/wireless communication.

  • 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2016 IEEE/MTT-S International Microwave Symposium - IMS 2016

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2015 IEEE/MTT-S International Microwave Symposium - MTT 2015

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics. The IMS includes technical sessions, both oral and interactive, worksh

  • 2014 IEEE/MTT-S International Microwave Symposium - MTT 2014

    IMS2014 will cover developments in microwave technology from nano devices to system applications. Technical paper sessions, interactive forums, plenary and panel sessions, workshops, short courses, industrial exhibits, and a wide array of other technical activities will be offered.

  • 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter -wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2011 IEEE/MTT-S International Microwave Symposium - MTT 2011

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010

    Reports of research and development at the state-of-the-art of the theory and techniques related to the technology and applications of devices, components, circuits, modules and systems in the RF, microwave, millimeter-wave, submillimeter-wave and Terahertz ranges of the electromagnetic spectrum.

  • 2009 IEEE/MTT-S International Microwave Symposium - MTT 2009

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2008 IEEE/MTT-S International Microwave Symposium - MTT 2008

  • 2007 IEEE/MTT-S International Microwave Symposium - MTT 2007

  • 2006 IEEE/MTT-S International Microwave Symposium - MTT 2006

  • 2005 IEEE/MTT-S International Microwave Symposium - MTT 2005

  • 2004 IEEE/MTT-S International Microwave Symposium - MTT 2004

  • 2003 IEEE/MTT-S International Microwave Symposium - MTT 2003

  • 2002 IEEE/MTT-S International Microwave Symposium - MTT 2002

  • 2001 IEEE/MTT-S International Microwave Symposium - MTT 2001

  • 2000 IEEE/MTT-S International Microwave Symposium - MTT 2000

  • 1999 IEEE/MTT-S International Microwave Symposium - MTT '99

  • 1998 IEEE/MTT-S International Microwave Symposium - MTT '98

  • 1997 IEEE/MTT-S International Microwave Symposium - MTT '97

  • 1996 IEEE/MTT-S International Microwave Symposium - MTT '96


2019 92nd ARFTG Microwave Measurement Symposium (ARFTG)

This symposium is one of the top gatherings that focuses on microwave measurement science. New technology, instrumentation, techniques and their application ro existing and merging measurements are explored through a short course, a workshop and a conference. The meeting is co-located this time with the Radio and Wireless Symposium for more attendee benefit.


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Periodicals related to Microwave Measurement

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No periodicals are currently tagged "Microwave Measurement"


Most published Xplore authors for Microwave Measurement

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Xplore Articles related to Microwave Measurement

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Two-dimensional synthetic aperture millimeter-wave radiometric interferometer for measuring full-component Stokes vector of emission from hydrometeors

Radio Science, 2003

Calculations of attainable values for space resolution and radiometric sensibility of a spaceborne two-dimensional synthetic aperture microwave polarimetric interferometer are carried out. It is shown that for the most preferable Y-shaped interferometer configuration, it is possible to achieve (within the transparency windows of waveband 3–22.5 mm) a space resolution of 0.5–1 km and a radiometric resolution close to 1 K ...


Comparison of two image reconstruction algorithms for microwave tomography

Radio Science, 2005

Two image reconstruction algorithms for microwave tomography are compared and contrasted. One is a general, gradient-based minimization algorithm. The other is the chirp pulse microwave computed tomography (CP-MCT) method, which is a highly computationally efficient reconstruction method but also a method best suited for low contrasts. The results of the simulations show that when imaging high-contrast objects, such as a ...


Microwave/Millimeter Wave Holography Based on the Concepts of Optical Holography

Real-Time Three-Dimensional Imaging of Dielectric Bodies Using Microwave/Millimeter Wave Holography, None

In optical holography, the hologram is essentially a planar record of the intensity of an interference pattern obtained in a single‐frequency measurement with two coherent waves. For shorter millimeter waves the production of an optical hologram requires less scaling. This chapter reviews the expressions for the intensity pattern over the hologram plane obtained in indirect microwave holography. It describes what ...


Imaging Microwave and DC Magnetic Fields in a Vapor-Cell Rb Atomic Clock

IEEE Transactions on Instrumentation and Measurement, 2015

We report on the experimental measurement of the dc and microwave magnetic field distributions inside a recently developed compact magnetron-type microwave cavity mounted inside the physics package of a high-performance vapor-cell atomic frequency standard. Images of the microwave field distribution with sub-100-μm lateral spatial resolution are obtained by pulsed optical-microwave Rabi measurements, using the Rb atoms inside the cell as ...


Measurements and Tolerances

Phased Array Antennas, None

This chapter contains sections titled:Measurement of Low‐Sidelobe PatternsArray DiagnosticsWaveguide SimulatorsArray TolerancesAcknowledgmentReferences


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Educational Resources on Microwave Measurement

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IEEE.tv Videos

IMS 2011 Microapps - A Comparison of Noise Parameter Measurement Techniques
IMS 2011 Microapps - Vector-Receiver Load Pull - Measurement Accuracy at its Best
IMS 2011 Microapps - Ultra Low Phase Noise Measurement Technique Using Innovative Optical Delay Lines
IMS 2011 Microapps - Waveguide Characteristics and Measurement Errors
MicroApps: Recent Improvement on Y-Factor Noise Figure Measurement Uncertainty (Agilent Technologies)
MicroApps: Measurement Advances for Differential and I/Q Devices (Agilent Technologies)
Testing 5G: OTA and the Connectorless World - IMS 2017
Micro-Apps 2013: Precision RF/MW Cable and Antenna Test in the Field
ASC-2014 SQUIDs 50th Anniversary: 6 of 6 - Kent Irwin - SQUIDs as detectors for cosmology
Electronic Systems for Quantum Computation - David DiVincenzo: 2016 International Conference on Rebooting Computing
IMS 2011 Microapps - Improved Microwave Device Characterization and Qualification Using Affordable Microwave Microprobing Techniques for High-Yield Production of Microwave Components
The Josephson Effect: The Josephson Volt
IMS 2012 Microapps - Passive Intermodulation (PIM) measurement using vector network analyzer Osamu Kusano, Agilent CTD-Kobe
I2MTC 2014 Conference Preview
APEC 2012 - Thomas S. Buzak Plenary
5G Wireless A Measurement and Metrology Perspective: MicroApps 2015 - Keysight Technologies
IMS 2012 Special Sessions: A Retrospective of Field Theory in Microwave Engineering - Magdalena Salazar Palma
IMS 2012 Microapps - Panel Session: Device Characterization Methods and Advanced RF/ Microwave Design
IMS 2011 Microapps - Techniques for Validating a Vector Network Analyzer Calibration When Using Microwave Probes
IMS 2012 Microapps - Bonding Materials used in Multilayer Microwave PCB Applications

IEEE-USA E-Books

  • Two-dimensional synthetic aperture millimeter-wave radiometric interferometer for measuring full-component Stokes vector of emission from hydrometeors

    Calculations of attainable values for space resolution and radiometric sensibility of a spaceborne two-dimensional synthetic aperture microwave polarimetric interferometer are carried out. It is shown that for the most preferable Y-shaped interferometer configuration, it is possible to achieve (within the transparency windows of waveband 3–22.5 mm) a space resolution of 0.5–1 km and a radiometric resolution close to 1 K at the receiver bandwidth of 100 MHz. For cross- and T-shaped resolutions, values close to the above can be reached.

  • Comparison of two image reconstruction algorithms for microwave tomography

    Two image reconstruction algorithms for microwave tomography are compared and contrasted. One is a general, gradient-based minimization algorithm. The other is the chirp pulse microwave computed tomography (CP-MCT) method, which is a highly computationally efficient reconstruction method but also a method best suited for low contrasts. The results of the simulations show that when imaging high-contrast objects, such as a breast cancer tumor, reconstructions made are comparable to results from the minimization algorithm below a contrast of about 10%. The simulations, however, show that the reconstructions made by the CP-MCT method are very robust to noise. The reconstruction of the conductivity using the minimization algorithm, on the other hand, is very sensitive to the level of noise. In spite of a strong degradation in the conductivity reconstructions, the corresponding permittivity reconstructions do not show the same sensitivity to the noise level.

  • Microwave/Millimeter Wave Holography Based on the Concepts of Optical Holography

    In optical holography, the hologram is essentially a planar record of the intensity of an interference pattern obtained in a single‐frequency measurement with two coherent waves. For shorter millimeter waves the production of an optical hologram requires less scaling. This chapter reviews the expressions for the intensity pattern over the hologram plane obtained in indirect microwave holography. It describes what is known in some literature sources as true microwave holography rather than quasi‐microwave holography. Detectors that have been used for intensity measurements at microwave frequencies can be categorized in two classes: antennas that can be employed along with the receiver circuits and continuous materials that change under microwave illumination. Intensity hologram measurements require a reference wave coherent with the scattered wave due to the object. Because a hologram contains information derived from the Fraunhofer or Fresnel wavefields diffracted by the object, wave front reconstruction and image retrieval can be described by Fourier transform operations.

  • Imaging Microwave and DC Magnetic Fields in a Vapor-Cell Rb Atomic Clock

    We report on the experimental measurement of the dc and microwave magnetic field distributions inside a recently developed compact magnetron-type microwave cavity mounted inside the physics package of a high-performance vapor-cell atomic frequency standard. Images of the microwave field distribution with sub-100-μm lateral spatial resolution are obtained by pulsed optical-microwave Rabi measurements, using the Rb atoms inside the cell as field probes and detecting with a CCD camera. Asymmetries observed in the microwave field images can be attributed to the precise practical realization of the cavity and the Rb vapor cell. Similar spatially resolved images of the dc magnetic field distribution are obtained by Ramsey-type measurements. The T2relaxation time in the Rb vapor cell is found to be position dependent and correlates with the gradient of the dc magnetic field. The presented method is highly useful for experimental in situ characterization of dc magnetic fields and resonant microwave structures, for atomic clocks or other atom-based sensors and instrumentation.

  • Measurements and Tolerances

    This chapter contains sections titled:Measurement of Low‐Sidelobe PatternsArray DiagnosticsWaveguide SimulatorsArray TolerancesAcknowledgmentReferences

  • Measurement Techniques for RF Nanoelectronic Devices: New Equipment to Overcome the Problems of Impedance and Scale Mismatch

    The emergence of new materials (nanowires, nanotubes, graphene tapes, and thin films) and devices with nanoscale dimensions give rise to the necessity for developing dedicated techniques that will allow their electrical characterization at high-frequency range. In this article, two possible views have been highlighted to tackle the issue of the measurement of high-impedance nanoscale devices. The first solution is based on the integration of a high- impedance reflectometer and a nanoscale device on the same chip. The microwave impedance of a single CNT has been successfully measured up to 6 GHz using this technique. The second solution consists of inserting an adjustable microwave interferometer between a traditional VNA and the high-impedance device. The interferometer allows adjustment of the impedance to be measured to the highest measurement sensitivity of the measurement system. In particular, capacitances down to 0.35 fF have been measured with an error estimated to be less than 10% using the interferometric technique combined with a scanning microwave microscope. These proofs of concept on one-port nanodevices open the route towards the case of two-port active devices with high impedance. Advances in the manufacturing of next-generation nanodevices will depend on our ability to measure electrical properties and performance characteristics accurately and reproducibly at the nanoscale regime over a broad frequency range.

  • Correction to “Water vapor microwave continuum absorption: A comparison of measurements and models”

    No abstract is available.

  • Corrections to "Complex Permittivity Measurements of Common Plastics Over Variable Temperatures"

    Despite our best efforts to present error-free measurements to the IEEE Microwave Theory and Techniques Society (IEEE MTT-S), one of the figures in the above paper [1] contains an incorrect scaling factor. In [1, Fig. 11], the loss tangent data for polycarbonate is low by a factor of ten. The correct data is shown in Fig. 1 in this paper. We apologize for any confusion this error may have caused.

  • A look to your future IEEE can help you stay current technically through groups and societies

    None

  • Electromagnetic Characterization of Absorbers

    Electromagnetic Characterization of Absorbers Agenda.



Standards related to Microwave Measurement

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Jobs related to Microwave Measurement

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