IEEE Organizations related to Scanning Microwave Microscopy

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Conferences related to Scanning Microwave Microscopy

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Periodicals related to Scanning Microwave Microscopy

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Most published Xplore authors for Scanning Microwave Microscopy

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Xplore Articles related to Scanning Microwave Microscopy

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Nanodot-Molecule Junctions: Assessing Intermolecular Interactions and Electron Transport at Microwave Frequencies

2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 2018

Here, we present the properties of molecular junctions fabricated on a large array of sub-10 nm single crystal Au nanodot electrodes, each junction being made of less than one hundred molecules. Thanks to this approach, we discuss some pending issues in molecular electronic: (i) the determination of inter- molecular interactions from the conductance histograms of molecular junctions, (ii) the demonstration ...


Near field scanning microwave microscope based on a coaxial cavity resonator for the characterization of semiconductor structures

2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 2018

In this work, we have designed, simulated and fabricated a near-field scanning microwave microscope based on a coaxial cavity resonator. The coaxial cavity resonator is fed by a Keysight N5242A PNA-X Network Analyzer. The inner conductor of the coaxial resonator is connected to a sharpened tungsten tip home-made in our Lab following an electrochemical process. The transmission coefficient S21, the ...


Electromagnetic Modeling in Near-Field Scanning Microwave Microscopy Highlighting Limitations in Spatial and Electrical Resolutions

2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), 2018

Near-field scanning microwave microscopy (NSMM) is a scanning probe microscopy (SPM) technique that measures the local interaction of evanescent microwaves with a sample using a sharp tip probe. The traceability in NSMM is still challenging as the distribution of the electrical fields is affected by several parameters. In this effort, finite element method (FEM) based electromagnetic modeling methods are used ...


Quantitative Error Analysis in Near-Field Scanning Microwave Microscopy

2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), 2018

Near-field scanning microwave microscopy (NSMM) has to face several issues for the establishment of traceable and quantitative data. In particular, at the nanoscale, the wavelength of operation in the microwave regime appears disproportionate compared to the size of the nano-object under investigation. Incidentally, the microwave characterization results in poor electrical sensitivity as the volume of the wave/material interaction is limited ...


Scanning Microwave Microscopy of Vital Mitochondria in Respiration Buffer

2018 IEEE/MTT-S International Microwave Symposium - IMS, 2018

We demonstrate imaging using scanning microwave microscopy (SMM) of vital mitochondria in respiration buffer. The mitochondria are isolated from cultured HeLa cells and tethered to a solid graphene support. The mitochondria are kept vital (alive) using a respiration buffer, which provides nutrients to sustain the Krebs cycle. We verify that the mitochondria are “alive” by measuring the membrane potential using ...



Educational Resources on Scanning Microwave Microscopy

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IEEE.tv Videos

Nanoscale Magnetism with Picosecond Time Resolution and High Sensitivity - Hendrik Ohldag - IEEE Magnetics Distinguished Lecture
Ultrafast Lasers for Multi-photon Microscopy - Plenary Speaker: Jim Kafka - IPC 2018
IMS 2011 Microapps - Improved Microwave Device Characterization and Qualification Using Affordable Microwave Microprobing Techniques for High-Yield Production of Microwave Components
Real-time Spectrogram Analysis of Continuous Optical Wavefields - José Azaña - Closing Ceremony, IPC 2018
3D Body-Mapping for Severely Burned Patients - Julia Loegering - IEEE EMBS at NIH, 2019
IMS 2012 Microapps - Bonding Materials used in Multilayer Microwave PCB Applications
IMS 2012 Special Sessions: A Retrospective of Field Theory in Microwave Engineering - Magdalena Salazar Palma
MicroApps: How Digital Markets are Driving Microwave Technology (Agilent Technologies)
IMS Organizer: Richard Snyder, President Elect for MTT-S
IMS 2010 - International Microwave Symposium
IMS 2012 Microapps - Panel Session: Device Characterization Methods and Advanced RF/ Microwave Design
IMS 2011 Microapps - Techniques for Validating a Vector Network Analyzer Calibration When Using Microwave Probes
IMS 2012 Special Sessions: A Retrospective of Field Theory in Microwave Engineering - Constantine A. Balanis
IMS Organizers: Samir El-Ghazaly, President of MTT-S on Society Mission and Structure
IMS 2012 Special Sessions: The Evolution of Some Key Active and Passive Microwave Components - Richard True
IMS 2012 Special Sessions: A Retrospective of Field Theory in Microwave Engineering - David M. Pozar
IMS 2012 Microapps - Improve Microwave Circuit Design Flow Through Passive Model Yield and Sensitivity Analysis
IMS 2011 Closing Ceremony
IMS 2010 Special Features: Recognizing Chuck Swift's 52 Years of Service
IMS Special Sessions - Memorial Session for Theodore Saad

IEEE-USA E-Books

  • Nanodot-Molecule Junctions: Assessing Intermolecular Interactions and Electron Transport at Microwave Frequencies

    Here, we present the properties of molecular junctions fabricated on a large array of sub-10 nm single crystal Au nanodot electrodes, each junction being made of less than one hundred molecules. Thanks to this approach, we discuss some pending issues in molecular electronic: (i) the determination of inter- molecular interactions from the conductance histograms of molecular junctions, (ii) the demonstration of molecular electronic devices for high-frequency operation with a molecular diode working in the microwave regime up to 18 GHz.

  • Near field scanning microwave microscope based on a coaxial cavity resonator for the characterization of semiconductor structures

    In this work, we have designed, simulated and fabricated a near-field scanning microwave microscope based on a coaxial cavity resonator. The coaxial cavity resonator is fed by a Keysight N5242A PNA-X Network Analyzer. The inner conductor of the coaxial resonator is connected to a sharpened tungsten tip home-made in our Lab following an electrochemical process. The transmission coefficient S21, the resonance frequency fr and the quality factor Q are measured as the sharp tip is scanned over the device under test at a fixed sample-tip distance in the near field region. The variations of these parameters are related to the topographical and dielectric properties of a very small region of the material under the tip.

  • Electromagnetic Modeling in Near-Field Scanning Microwave Microscopy Highlighting Limitations in Spatial and Electrical Resolutions

    Near-field scanning microwave microscopy (NSMM) is a scanning probe microscopy (SPM) technique that measures the local interaction of evanescent microwaves with a sample using a sharp tip probe. The traceability in NSMM is still challenging as the distribution of the electrical fields is affected by several parameters. In this effort, finite element method (FEM) based electromagnetic modeling methods are used to study the effects of the wavelength of operation and the humidity on the spatial and electrical resolutions respectively. From the simulated data, it is demonstrated that the lateral resolution is improved with increasing the frequency of operation. Furthermore, the existence and influence of a water meniscus is highlighted by fine comparison between simulated and measured data. To face these issues, an alternative near-field scanning millimeter-wave microscopy working in a controlled environment is proposed.

  • Quantitative Error Analysis in Near-Field Scanning Microwave Microscopy

    Near-field scanning microwave microscopy (NSMM) has to face several issues for the establishment of traceable and quantitative data. In particular, at the nanoscale, the wavelength of operation in the microwave regime appears disproportionate compared to the size of the nano-object under investigation. Incidentally, the microwave characterization results in poor electrical sensitivity as the volume of the wave/material interaction is limited to a fraction of the wavelength. In addition, the definition of nanoscale microwave impedance standards requires accurate knowledge of the material and dimensional properties at such scale. In this effort, a quantitative error analysis performed on micrometric metal oxide semiconductor (MOS) structures is proposed. In particular, atomic force microscopy (AFM) image together with the magnitude and phase-shift images of the complex microwave reflection coefficient using a Keysight™'s LS5600 AFM interfaced directly with a vector network analyzer, without electrical matching strategy, are performed around 9.5GHz. From a detailed analysis of the raw data, completed with a FEM-based electromagnetic modeling, quantitative capacitances extraction and system limitations are exemplary shown.

  • Scanning Microwave Microscopy of Vital Mitochondria in Respiration Buffer

    We demonstrate imaging using scanning microwave microscopy (SMM) of vital mitochondria in respiration buffer. The mitochondria are isolated from cultured HeLa cells and tethered to a solid graphene support. The mitochondria are kept vital (alive) using a respiration buffer, which provides nutrients to sustain the Krebs cycle. We verify that the mitochondria are “alive” by measuring the membrane potential using a voltage sensitive fluorescent dye (TMRE). The organelles are measured capacitively at 7 GHz. Several technical advances are demonstrated which enable this work: 1) The SMM operates in an electrophysiologically relevant liquid (hence conducting) environment; 2) The SMM operates in tapping mode, averaging the microwave reflection measurement over many tapping periods; 3) A tuned reflectometer enables increased sensitivity; 4) Variable frequencies up to 18 GHz are used; 5) In contrast with traditional matching/resonant methods that exhibit high quality factor that fail in the presence of liquids, interferometric/tuned reflectometer gives the possibility to adjust the quality factor or sensitivity even in the presence of the liquid.

  • Interferometer Scanning Microwave Microscopy: Performance Evaluation

    A systematic and quantitative comparison of electrical detection systems in scanning microwave microscopy is reported. Scanning microwave microscopy (SMM) is capable of investigating nanoscale electrical properties with high accuracy over a broad frequency range of 1-20 GHz. However, due to the passive matching network only discrete frequencies can be used every 1 GHz with varying signal- to-noise ratio (SNR). Here we study in detail the impedance matching mechanism using an interferometric network where a two-port measurement is implemented with a reduction of the trace noise due to signal subtraction. The interferometer setup shows superior performance resulting in a 2-8 fold increased SNR with respect to the standard shunt solution, in addition to stable broadband performance over the full frequency range. We perform a comparison of the electrical sensitivity obtained using a direct connection from the network analyser to probe, the typically implemented shunt-resonator impedance matching network, and the proposed interferometer setup. The interferometer SMM allows us also for calibrated impedance measurements, which we demonstrate on Tobacco mosaic viruses with 18-nm diameter, with a capacitance resolution of 0.67 attoFarads at 10 ms acquisition time per pixel.



Standards related to Scanning Microwave Microscopy

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No standards are currently tagged "Scanning Microwave Microscopy"