Deep Level Transient Spectroscopy
14 resources related to Deep Level Transient Spectroscopy
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No organizations are currently tagged "Deep Level Transient Spectroscopy"
2020 IEEE Photovoltaic Specialists Conference (PVSC)
Promote science and engineering of photovoltaic materials, devices, systems and applications
CSW2019 covers all aspects of compound semiconductors – including growth, processing, devices, physics, spintronics, quantum information, MEMS/NEMS, sensors, solar cells, and novel applications. The conference deals with III-V compounds such as GaAs, InP, and GaN; II-VI compounds such as ZnSe and ZnS; carbon related materials; oxide semiconductors; organic semiconductors etc.
Industrial Electronics, Computational Intelligence, Information Engineering, Network & Communication Technologies,Signal & Image Processing, Trusted Computing & Secure Systems, Software Engineering, Internet of Things
Materials and technologies- semiconductor and dielectric materials- quantum heterostructures- MS and MIS structures- nanostructures and nanotubes, low-dimensional structures- organic electronicsStructures and devices- Si-based heterostructure devices- III-V and III-N heterostructure devices- quantum and resonance devices, microwave devices, nanodevices- lasers and photodetectors- power electronicsCharacterization, modelling and simulation- 2-D and 3-D process, structure and device simulation- heterostructure device modelling- structural, optical and electrical characterization of materials, structures and devices- reliability evaluation and modellingSensors and microsystems- advanced concepts in lithography, plasma etching and deposition techniques- design and fabrication- surface and bulk micromachining- micro(nano)mechanical structures, micro(nano)electro-mechanical systems (MEMS, NEMS)- SMART Sensors- sensor characterization, modelling and simulation
To cope with the rapidly progressing technology which, today, reaches the nanometer scale. The areas of interest include the design, test and technology of electronic products, ranging from integrated circuit modules and printed circuit boards to full systems and microsystems, as well as the methodologies and tools used in the design, veri¿cation and validation of such products.
No periodicals are currently tagged "Deep Level Transient Spectroscopy"
2019 IEEE International Reliability Physics Symposium (IRPS), 2019
High resolution observation of density of interface states (Dit) at SiO2/4H- SiC interfaces was performed by local deep level transient spectroscopy based on time-resolved scanning nonlinear dielectric microscopy (tr-SNDM). The sizes of the non-uniform contrasts observed in the map of Dit were in the order of several tens of nanometers, which are smaller than the value reported in the previous ...
Neural Processor Design Enabled by Memristor Technology - Hai Li: 2016 International Conference on Rebooting Computing
Enter Deep Learning
2019 ICRA Plenary- Challenges for Deep learning towards AI
Local Activity, Memristor, and 137 - Leon Chua: 2016 International Conference on Rebooting Computing
2D Nanodevices - Paul Hurley at INC 2019
Planning for Complex High-Level Missions
IMS 2012 Microapps - Strengths and Limitations of the SOLR Wafer Level S-Parameter Calibration Technique
Improved Deep Neural Network Hardware Accelerators Based on Non-Volatile-Memory: the Local Gains Technique: IEEE Rebooting Computing 2017
Scientific Discovery & Deep Brain Stimulation: Jerrold Vitek, MD, PhD
Life Sciences: Surface Enhanced Raman Spectroscopy, and more
Deep Learning and the Representation of Natural Data
Designing Reconfigurable Large-Scale Deep Learning Systems Using Stochastic Computing - Ao Ren: 2016 International Conference on Rebooting Computing
Deep Learning & Machine Learning Inference - Ashish Sirasao - LPIRC 2019
Multi-Level Optical Weights in Integrated Circuits - IEEE Rebooting Computing 2017
IMS 2012 Microapps - Performing Accurate Wafer-Level TRL Calibration with Custom Calibration Sets using WinCal
ASC-2014 SQUIDs 50th Anniversary: 5 of 6 - Ronny Stolz - SQUIDs in Geophysics
Multi-Level Optimization for Large Fan-In Optical Logic Circuits - Takumi Egawa - ICRC 2018
Power: A Fundamental Ingredient of Advanced Science and Applied Technology - Adam Hamilton, APEC 2018
Volunteering with IEEE: As Deep and Engaging as You Make It - Anthony Lobo (Webinar)
High resolution observation of density of interface states (Dit) at SiO2/4H- SiC interfaces was performed by local deep level transient spectroscopy based on time-resolved scanning nonlinear dielectric microscopy (tr-SNDM). The sizes of the non-uniform contrasts observed in the map of Dit were in the order of several tens of nanometers, which are smaller than the value reported in the previous study (>100 nm). The simulation of the tr-SNDM measurement suggested that the spatial resolution of tr-SNDM is down to the tip radius of the cantilever used for the measurement and can be smaller than the lateral spread of the depletion layer width.
No standards are currently tagged "Deep Level Transient Spectroscopy"