IEEE Organizations related to Electrostatic Discharges

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No organizations are currently tagged "Electrostatic Discharges"



Conferences related to Electrostatic Discharges

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2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)

Technical presentations will range from the fundamental physics of electron emission and modulated electron beams to the design and operation of devices at UHF to THz frequencies, theory and computational tool development, active and passive components, systems, and supporting technologies.System developers will find that IVEC provides a unique snapshot of the current state-of-the-art in vacuum electron devices. These devices continue to provide unmatched power and performance for advanced electromagnetic systems, particularly in the challenging frequency regimes of millimeter-wave and THz electronics.Plenary talks will provide insights into the history, the broad spectrum of fundamental physics, the scientific issues, and the technological applications driving the current directions in vacuum electronics research.


2020 IEEE Industry Applications Society Annual Meeting

The Annual Meeting is a gathering of experts who work and conduct research in the industrial applications of electrical systems.


2020 IEEE International Conference on Plasma Science (ICOPS)

IEEE International Conference on Plasma Science (ICOPS) is an annual conference coordinated by the Plasma Science and Application Committee (PSAC) of the IEEE Nuclear & Plasma Sciences Society.


2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)

This symposium pertains to the field of electromagnetic compatibility.


2019 IEEE 9th International Nanoelectronics Conferences (INEC)

Topics of Interests (but not limited to)• Application of nanoelectronic• Low-dimensional materials• Microfluidics/Nanofluidics• Nanomagnetic materials• Carbon materials• Nanomaterials• Nanophotonics• MEMS/NEMS• Nanoelectronic• Nanomedicine• Nano Robotics• Spintronic devices• Sensor and actuators• Quality and Reliability of Nanotechnology


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Periodicals related to Electrostatic Discharges

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No periodicals are currently tagged "Electrostatic Discharges"


Most published Xplore authors for Electrostatic Discharges

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Xplore Articles related to Electrostatic Discharges

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A Generalized ESD Testing Regimen for Digital Electronic Systems

1982 IEEE International Symposium on Electromagnetic Compatibility, 1982

None


IEE Colloquium 'Electrostatic Problems During Material Handling' (Digest No.1994/041)

IEE Colloquium on Electrostatic Problems During Material Handling, 1994

None


AMS verification in advanced technologies

Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013

Verification of Analog and Mixed-Signal(AMS) circuits and systems is increasingly challenging. This session explores novel AMS simulation and emulation techniques, and advanced reliability and performance issues with technology scaling.


SEAES-GEO: A spacecraft environmental anomalies expert system for geosynchronous orbit

Space Weather, 2009

Indications of the space environment hazard at any point in space and time along geosynchronous orbit (GEO) can be obtained using the set of rules described in this paper. These rules are implemented using real-time Geostationary Operational Environmental Satellite particle sensor data and the magnetic index Kp. These rules should be useful for both real-time and posthoc analysis of GEO ...


IEE Colloquium on 'Electromagnetic Hazards to Active Electronic Components' (Digest No.1994/008)

IEE Colloquium on Electromagnetic Hazards to Active Electronic Components, 1994

None


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Educational Resources on Electrostatic Discharges

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IEEE-USA E-Books

  • A Generalized ESD Testing Regimen for Digital Electronic Systems

    None

  • IEE Colloquium 'Electrostatic Problems During Material Handling' (Digest No.1994/041)

    None

  • AMS verification in advanced technologies

    Verification of Analog and Mixed-Signal(AMS) circuits and systems is increasingly challenging. This session explores novel AMS simulation and emulation techniques, and advanced reliability and performance issues with technology scaling.

  • SEAES-GEO: A spacecraft environmental anomalies expert system for geosynchronous orbit

    Indications of the space environment hazard at any point in space and time along geosynchronous orbit (GEO) can be obtained using the set of rules described in this paper. These rules are implemented using real-time Geostationary Operational Environmental Satellite particle sensor data and the magnetic index Kp. These rules should be useful for both real-time and posthoc analysis of GEO spacecraft anomalies. The hazards covered are surface charging, internal charging, single-event effects due to solar particle events, and total dose (solar arrays). The system provides a “hazard quotient,” the ratio of the instantaneous to mission-averaged likelihood of an anomaly due to each hazard, based on environmental measurements. With the exception of total dose, the hazard quotients are derived from lists of on- orbit anomalies or their proxies, and it is assumed that the probability of future anomalies will share the same functional dependence on the environment exhibited by the anomalies in the lists. Hazard quotients are potentially more valuable to satellite operators than are raw measurements, as hazard quotients directly convey the statistical relationship between the radiation environment and the likelihood of an anomaly.

  • IEE Colloquium on 'Electromagnetic Hazards to Active Electronic Components' (Digest No.1994/008)

    None

  • New voltage controlled diode for power rail and regulator ESD protection

    A novel diode structure is successfully designed for the first time to protect the power line against the ESD stress condition in the high voltage (HV) CMOS technology nodes. Controlled by the voltage difference between VDD and signal, the depletion regions of two HV-NW's can shut off or turn on the current path to the ground (GND) of the diode depending on whether it is under normal operation mode or ESD event.

  • HMM single site testing: Can we reproduce component failure level with the HMM document?

    The ESDA working group 5.6 has conducted single site testing to evaluate the repeatability of passfail results when using the setups in the standard practice 5.6 document. A ten times lower standard deviation is obtained in comparison to the 2011 round robin.

  • RC triggered active ESD clamps; How should they behave under powered conditions?

    Problems with standard RC clamp circuits during powered system level ESD events are reviewed. A new clamp design is presented which employs a proportional triggering scheme that regulates the pad voltage during transient events, rather than simply switching the clamps fully on or off.

  • Behavioral ESD protection modeling to perform system level ESD efficient design

    For both Equipment Manufacturers (EM) and semiconductor suppliers, the prediction of ElectroStatic Discharge (ESD) events into design phase is becoming a challenging issue to insure rehability into system level considerations. This is mainly due to the shrinking of Integrated Circuits (IC) technology, which decreases the robustness level and increase the probability of failures. In this paper, we will present how to build IC's models taking into account behavioral description of ESD protections, to perform system level ESD simulations. The IBIS (Input/output Buffer Information Specification) models are mixed with information extracted from Transmission Line Pulsing (TLP) measurement's techniques to build system simulations. The methodology is detailed and proved in some case studies addressing the current propagation path and the susceptibility of the ICs. The main goal of the proposed model is that it could be shared by IC suppliers and EMs to ensure that ICs can handle system level ESD events.

  • An investigation of ESD protection for magnetoresistive heads

    Many precautions are taken to avoid damaging electrostatic discharge (ESD) through disk drive magnetic recording heads featuring readback via a magnetoresistive (MR) sensor. By optimizing protective spark-gaps (PSG) in the recording head, the extent of ESD damage can be reduced. Human Body Model (HBM), Machine Model (MM) and Charged Device Model (CDM) transients are applied to simulated soft-adjacent-layer (SAL)-biased MR heads with and without protective spark-gaps. Design principles for ESD-damage-suppressing spark-gaps in MR heads are developed and several implementations compared.



Standards related to Electrostatic Discharges

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Jobs related to Electrostatic Discharges

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