IEEE Organizations related to Mixed Analog-digital Integrated Circuits

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No organizations are currently tagged "Mixed Analog-digital Integrated Circuits"



Conferences related to Mixed Analog-digital Integrated Circuits

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2020 IEEE International Symposium on Circuits and Systems (ISCAS)

The International Symposium on Circuits and Systems (ISCAS) is the flagship conference of the IEEE Circuits and Systems (CAS) Society and the world’s premier networking and exchange forum for researchers in the highly active fields of theory, design and implementation of circuits and systems. ISCAS2020 focuses on the deployment of CASS knowledge towards Society Grand Challenges and highlights the strong foundation in methodology and the integration of multidisciplinary approaches which are the distinctive features of CAS contributions. The worldwide CAS community is exploiting such CASS knowledge to change the way in which devices and circuits are understood, optimized, and leveraged in a variety of systems and applications.


2020 IEEE Radio and Wireless Symposium (RWS)

RWW2020 will be an international conference covering all aspects of radio and wireless. RWW2020's multidisciplinary events will bring together innovations that are happening across the broad wireless spectrum. RWS2020, this conference application, acts as the main conference for the entire RWW of events that includes the following conferences: PAWR2020, SiRF2020, WiSNet2020, and TWiOS2020 (IEEE Topical Conference on RF/microwave Power Amplifiers, IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, IEEE Topical Conference on Wireless Sensors and Sensor Networks, and IEEE Topical Workshop on the Internet of Space IoS, respectively). In addition to traditional podium presentations and poster sessions, tracks for IEEE Distinguished Lectures, Sunday half-day workshops, Monday panels, and a demo session are planned. A RWW2020 plenary talk are a parallel IoT Summit are planned. A student competition is also planned.

  • 2019 IEEE Radio and Wireless Symposium (RWS)

    This is a conference with a focus on wireless components, applications, and systems that impact both our current and future life style. The conference's main niche is to bring together technologists, circuit designers, system designers, and entrepreneurs at a single event. It was and is the place where these worlds meet, where new processes and systems can be benchmarked against the needs of circuit designers at the bleeding edge of RF systems, where today's design compromises can trigger tomorrow's advanced technologies. Where dreams can become a reality. RWS is the cornerstone conference for Radio Wireless Week.

  • 2018 IEEE Radio and Wireless Symposium (RWS)

    This is a set of five conferences with a focus on wireless components, applications, and systems that effect both now and our future life style. These conferences main niche is to bring together technologists, circuit designers, system designers, and entrepreneurs at a single event. It was and is the place where these worlds meet, where new processes and systems can be benchmarked against the needs of circuit designers at the bleeding edge of RF systems, where today’s design compromises can trigger tomorrow’s advanced technologies. Where dreams can become a reality.

  • 2017 IEEE Radio and Wireless Symposium (RWS)

    This is a set of five conferences with a focus on wireless components, applications, and systems that effect both now and our future life style. These conferences main niche is to bring together technologists, circuit designers, system designers, and entrepreneurs at a single event. It was and is the place where these worlds meet, where new processes and systems can be benchmarked against the needs of circuit designers at the bleeding edge of RF systems, where today’s design compromises can trigger tomorrow’s advanced technologies. Where dreams can become a reality.

  • 2016 IEEE Radio and Wireless Symposium (RWS)

    This is a set of five conferences with a focus on wireless components, applications, and systems that effect both now and our future life style. These conferences main niche is to bring together technologists, circuit designers, system designers, and entrepreneurs at a single event. It was and is the place where these worlds meet, where new processes and systems can be bench-marked against the needs of circuit designers at the bleeding edge of RF systems, where today

  • 2015 IEEE Radio and Wireless Symposium (RWS)

    This is a set of five conferences with a focus on wireless components, applications, and systems that effect both now and our future life style. These conferences main niche is to bring together technologists, circuit designers, system designers, and entrepreneurs at a single event. It was and is the place where these worlds meet, where new processes and systems can be benchmarked against the needs of circuit designers at the bleeding edge of RF systems, where today

  • 2014 IEEE Radio and Wireless Symposium (RWS)

    RWS focuses on the intersection between radio systems and wireless technology, which creates a unique forum for engineers to discuss hardware design and system performance of the state -of-the-art wireless systems. Includes an expanded program on the latest information on wireless communications and networking, and associated enabling technologies as new services and applications emerge.

  • 2013 IEEE Radio and Wireless Symposium (RWS)

    RWS focuses on the intersection between radio systems and wireless technology, which creates a unique forum for engineers to discuss hardware design and system performance of the state-of-the-art wireless systems. Includes an expanded program on the latest information on wireless communications and networking, and associated enabling technologies as new services and applications emerge.

  • 2012 IEEE Radio and Wireless Symposium (RWS)

    RWS focuses on the intersection between radio systems and wireless technology, which creates a unique forum for engineers to discuss hardware design and system performance of the state-of-the-art wireless systems. Includes an expanded program on the latest information on wireless communications and networking, and associated enabling technologies as new services and applications emerge.

  • 2011 IEEE Radio and Wireless Symposium (RWS)

    All aspects of components and systems related to radio and wireless networks.

  • 2010 IEEE Radio and Wireless Symposium (RWS)

    RWS focuses on the intersection between radio systems and wireless technology, which creates a unique forum for engineers to discuss various aspects of wireless communication systems and the state-of-the-art in both fields by exploring the connections between hardware design and system performance.

  • 2009 IEEE Radio and Wireless Symposium (RWS)

    This symposium highlights the state of the art of hardware and systems of radio and wireless

  • 2008 IEEE Radio and Wireless Symposium (RWS)

  • 2007 IEEE Radio and Wireless Symposium (RWS)

  • 2006 IEEE Radio and Wireless Symposium (RWS)

  • 2004 IEEE Radio and Wireless Conference - (RAWCON 2004)

  • 2003 IEEE Radio and Wireless Conference - (RAWCON 2003)

  • 2002 IEEE Radio and Wireless Conference - (RAWCON 2002)

  • 2001 IEEE Radio and Wireless Conference - (RAWCON 2001)

  • 2000 IEEE Radio and Wireless Conference - (RAWCON 2000)

  • 1999 IEEE Radio and Wireless Conference - (RAWCON '99)

  • 1998 IEEE Radio and Wireless Conference - (RAWCON '98)


2019 IEEE 19th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)

This is a set of five conferences with a focus on wireless components, applications and systems that affect both now and our future lifestyle. The main niche of these conferences is to bring together technologists, circuit designers, system designers and entrepreneurs at a single event. It was and is the place where these worlds meet, where new processes and systems can be benchmarked against the needs of circuit designers at the bleeding edge of RF systems. This is also an area where today's design compromises can trigger tomorrow's advanced technologies, where dreams can become a reality.


2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)

The IEEE International Midwest Symposium on Circuits and Systems is the oldest IEEE sponsored or co-sponsored conference in the area of analog and digital circuits and systems. Traditional lecture and interactive lecture/poster sessions cover virtually every area of electronic circuits and systems in all fields of interest to IEEE.


2019 IEEE Custom Integrated Circuits Conference (CICC)

Conference with technical sessions, educational sessions, panel discussions and forums.


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Periodicals related to Mixed Analog-digital Integrated Circuits

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No periodicals are currently tagged "Mixed Analog-digital Integrated Circuits"


Most published Xplore authors for Mixed Analog-digital Integrated Circuits

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Xplore Articles related to Mixed Analog-digital Integrated Circuits

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IEE Colloquium on 'Linear Analogue Circuits and Systems' (Digest No.158)

IEE Colloquium on Linear Analogue Circuits and Systems, 1992

None


IEE Colloquium on 'SPICE: Surviving Problems in Circuit Evaluation' (Digest No.1993/154)

IEE Colloquium on SPICE: Surviving Problems in Circuit Evaluation, 1993

None


Substrate noise measurement by using noise-selective voltage comparators in analog and digital mixed-signal integrated circuits

IEEE Transactions on Instrumentation and Measurement, 1999

In mixed-signal integrated circuits (IC's), substrate noise produced by high- speed digital circuits passes to the on-chip analog circuits through the substrate and seriously degrades their performance. We have developed a method for measuring the substrate noise by using noise-selective chopper-type voltage comparators as noise detectors. This method can detect the wide-band substrate noise so we can analyze and further ...


Current sensor IC provides 9 bit+sign result without external sense resister

Proceedings of the IEEE 1998 Custom Integrated Circuits Conference (Cat. No.98CH36143), 1998

This paper describes a mixed signal integrated circuit for current measurement. Fabricated on a 1 /spl mu/m CMOS process, the IC employs a delta sigma analog to digital converter to generate a pulse-width modulated (PWM) output proportional to current. A metal loop stamped into the lead frame acts as a current sense resistor, providing a 5 mV full scale signal ...


Design-for-Test of Mixed-Signal Integrated Circuits

2006 49th IEEE International Midwest Symposium on Circuits and Systems, 2006

What to test and what does test need for a complex mixed-signal ASIC are the two main issues this tutorial will try to focus. It will account for several factors: Stimuli generation. An efficient test procedure would use a single signal especially a signal that is easily supplied to a selected input or generated on-chip. Sufficient access. It is preferable ...


More Xplore Articles

Educational Resources on Mixed Analog-digital Integrated Circuits

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IEEE-USA E-Books

  • IEE Colloquium on 'Linear Analogue Circuits and Systems' (Digest No.158)

    None

  • IEE Colloquium on 'SPICE: Surviving Problems in Circuit Evaluation' (Digest No.1993/154)

    None

  • Substrate noise measurement by using noise-selective voltage comparators in analog and digital mixed-signal integrated circuits

    In mixed-signal integrated circuits (IC's), substrate noise produced by high- speed digital circuits passes to the on-chip analog circuits through the substrate and seriously degrades their performance. We have developed a method for measuring the substrate noise by using noise-selective chopper-type voltage comparators as noise detectors. This method can detect the wide-band substrate noise so we can analyze and further reduce its effect. A switched capacitance is selectively loaded on the output of the inverter amplifier of the comparator during the comparison period in order to reduce the noise detected at the transition from compare to auto-zero. In contrast, the noise at the transition from auto-zero to compare can be selectively detected. Waveforms of high-frequency substrate noise were reconstructed by using this on-chip-noise detector incorporating the noise-selective comparators implemented using a 0.5-/spl mu/m CMOS bulk process.

  • Current sensor IC provides 9 bit+sign result without external sense resister

    This paper describes a mixed signal integrated circuit for current measurement. Fabricated on a 1 /spl mu/m CMOS process, the IC employs a delta sigma analog to digital converter to generate a pulse-width modulated (PWM) output proportional to current. A metal loop stamped into the lead frame acts as a current sense resistor, providing a 5 mV full scale signal at 1 amp sense current. The IC measures the sense voltage, corrects for the temperature coefficient in the metal loop, and creates a 9 bit accurate PWM output. This circuit consumes less than 120 /spl mu/A in operating mode and less than 3 /spl mu/A in sleep mode.

  • Design-for-Test of Mixed-Signal Integrated Circuits

    What to test and what does test need for a complex mixed-signal ASIC are the two main issues this tutorial will try to focus. It will account for several factors: Stimuli generation. An efficient test procedure would use a single signal especially a signal that is easily supplied to a selected input or generated on-chip. Sufficient access. It is preferable to have access to several internal nodes that the tester can read either sequentially or in parallel. Such access permits selection of convenient test points. Single test output. The output should contain all the information required to interpret test signals. Having the information digitally encoded would also reduce tester requirements. Simple measurement set. This set must contain sufficient information about the circuit under test's operational status. System-level decomposition. An efficient test procedure will employ a system-level strategy for decomposing the ASIC into meaningful parts. This decomposition permits testing of each part using a common procedure. These issues are worth attention for specific circuit classes, since there is no universal method valid for any kind of analog and/or mixed-signal function. These factors and their application for solving testing problems in general or for specific circuits will be presented and discussed. In particular, during the presentations making part of this tutorial, more attention will be paid to integrated filters (Switched-Capacitor and continuous-time), integrated A/D and D/A converters, and PLLs.

  • Design-for-Test of Mixed-Signal Integrated Circuits

    What to test and what does test need for a complex mixed-signal ASIC are the two main issues this tutorial will try to focus. It will account for several factors: Stimuli generation. An efficient test procedure would use a single signal especially a signal that is easily supplied to a selected input or generated on-chip. Sufficient access. It is preferable to have access to several internal nodes that the tester can read either sequentially or in parallel. Such access permits selection of convenient test points. Single test output. The output should contain all the information required to interpret test signals. Having the information digitally encoded would also reduce tester requirements. Simple measurement set. This set must contain sufficient information about the circuit under test's operational status. System-level decomposition. An efficient test procedure will employ a system-level strategy for decomposing the ASIC into meaningful parts. This decomposition permits testing of each part using a common procedure. These issues are worth attention for specific circuit classes, since there is no universal method valid for any kind of analog and/or mixed-signal function. These factors and their application for solving testing problems in general or for specific circuits will be presented and discussed. In particular, during the presentations making part of this tutorial, more attention will be paid to integrated filters (Switched-Capacitor and continuous-time), integrated A/D and D/A converters, and PLLs.

  • IEE Colloquium on Mixed-Signal AHDL/VHDL Modelling and Synthesis (Ref. No.1997/331)

    None

  • IEE Colloquium on 'Mixed Mode Modelling and Simulation' (Digest No.1994/205)

    None

  • IEE Colloquium on 'Mixed Signal VLSI Test' (Digest No.1993/240)

    None

  • IEE Colloquium on 'Circuits and Systems' (Digest No.1993/045)

    None



Standards related to Mixed Analog-digital Integrated Circuits

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Jobs related to Mixed Analog-digital Integrated Circuits

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