IEEE Organizations related to Single Event Latchup

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No organizations are currently tagged "Single Event Latchup"



Conferences related to Single Event Latchup

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Periodicals related to Single Event Latchup

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Most published Xplore authors for Single Event Latchup

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Xplore Articles related to Single Event Latchup

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Heavy-Ion Testing Results for Several Commercial and Military Grade Parts

2016 IEEE Radiation Effects Data Workshop (REDW), 2016

We report the results of testing seven components for single event effects at the 88-inch Cyclotron at Lawrence Berkeley National Laboratory.


Single event latchup in ICs with integrated latchup protection technology

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS), 2017

Test method is described and obtained results presented for ADC 7809ALP with internal latchup protection system.


Analysis of SEL on Commercial SRAM Memories and Mixed-Field Characterization of a Latchup Detection Circuit for LEO Space Applications

IEEE Transactions on Nuclear Science, 2017

A single event latchup (SEL) experiment based on commercial static random access memory (SRAM) memories has recently been proposed in the framework of the European Organization for Nuclear Research (CERN) Latchup Experiment and Student Satellite nanosatellite low Earth orbit (LEO) space mission. SEL characterization of three commercial SRAM memories has been carried out at the Paul Scherrer Institut (PSI) facility, ...



Educational Resources on Single Event Latchup

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IEEE.tv Videos

POC AAT-based Diagnostic Technology - Paul Yager - IEEE EMBS at NIH, 2019
An IEEE IPC Special Session with X. Chen from Nokia Bell Labs
Energy Efficient Single Flux Quantum Based Neuromorphic Computing - IEEE Rebooting Computing 2017
Single Frame Super Resolution: Fuzzy Rule-Based and Gaussian Mixture Regression Approaches
A Comparison Between Single Purpose and Flexible Neuromorphic Processor Designs: IEEE Rebooting Computing 2017
Neuromorphic computing with integrated photonics and superconductors - Jeffrey Shainline: 2016 International Conference on Rebooting Computing
Broadband IQ, Image Reject, and Single Sideband Mixers: MicroApps 2015 - Marki Microwave
IMS MicroApps: Single Chip LNA on 0.25um SOS for SKA Midband Receiver
Single Die Broadband CMOS Power Amplifier and Tracker with 37% Overall Efficiency for TDD/FDD LTE Applications: RFIC Industry Forum
Maker Faire 2008: Spectrum's Digital Clock Contest Winner
Nanophotonic Devices for Quantum Information Processing: Optical Computing - Carsten Schuck at INC 2019
Multiobjective Quantum-inspired Evolutionary Algorithm and Preference-based Solution Selection Algorithm
A Wideband Single-PLL RF Receiver for Simultaneous Multi-Band and Multi-Channel Digital Car Radio Reception: RFIC Industry Showcase
Approximate Dynamic Programming Methods A Unified Framework
Handling of a Single Object by Multiple Mobile Robots based on Caster-Like Dynamics
Single Crystal AlGaN Bulk Acoustic Wave Resonators on Silicon Substrates with High Electromechanical Coupling: RFIC Industry Showcase
IEEE IPC Special Session with Domanic Lavery of UCL
SIMD Programming in VOLK, the Vector-Optimized Library of Kernels
Ciena Corp - IEEE Spectrum Emerging Technology Award, 2019 IEEE Honors Ceremony
Stochastic Single Flux Quantum Neuromorphic Computing using Magnetically Tunable Josephson Junctions - Stephen Russek: 2016 International Conference on Rebooting Computing

IEEE-USA E-Books

  • Heavy-Ion Testing Results for Several Commercial and Military Grade Parts

    We report the results of testing seven components for single event effects at the 88-inch Cyclotron at Lawrence Berkeley National Laboratory.

  • Single event latchup in ICs with integrated latchup protection technology

    Test method is described and obtained results presented for ADC 7809ALP with internal latchup protection system.

  • Analysis of SEL on Commercial SRAM Memories and Mixed-Field Characterization of a Latchup Detection Circuit for LEO Space Applications

    A single event latchup (SEL) experiment based on commercial static random access memory (SRAM) memories has recently been proposed in the framework of the European Organization for Nuclear Research (CERN) Latchup Experiment and Student Satellite nanosatellite low Earth orbit (LEO) space mission. SEL characterization of three commercial SRAM memories has been carried out at the Paul Scherrer Institut (PSI) facility, using monoenergetic focused proton beams and different acquisition setups. The best target candidate was selected and a circuit for SEL detection has been proposed and tested at CERN, in the CERN High Energy AcceleRator Mixed-field facility (CHARM). Experimental results were carried out at test locations representative of the LEO environment, thus providing a full characterization of the SRAM cross sections, together with the analysis of the single-event effect and total ionizing dose of the latchup detection circuit in relation to the particle spectra expected during mission. The setups used for SEL monitoring are described, and details of the proposed circuit components and topology are presented. Experimental results obtained both at PSI and at CHARM facilities are discussed.



Standards related to Single Event Latchup

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Jobs related to Single Event Latchup

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