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Scanning electron microscopy
Top Conferences on Scanning electron microscopy
2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
2022 IEEE Sensors
2022 IEEE International Symposium on Applications of Ferroelectrics (ISAF)
2022 IEEE 19th International Symposium on Biomedical Imaging (ISBI)
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)
2021 IEEE 21st International Conference on Nanotechnology (NANO)
2021 IEEE 71st Electronic Components and Technology Conference (ECTC)
2021 IEEE International Reliability Physics Symposium (IRPS)
2021 IEEE International Ultrasonics Symposium (IUS)
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC)
2021 IEEE 16th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)
2020 Opto-Electronics and Communications Conference (OECC)
2019 IEEE 9th International Nanoelectronics Conferences (INEC)
2019 IEEE Photonics Conference (IPC)
2018 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
2018 15th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON)
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
2018 31st International Vacuum Nanoelectronics Conference (IVNC)
2018 IEEE International Semiconductor Laser Conference (ISLC)
2018 17th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)
2018 IEEE International Interconnect Technology Conference (IITC)
2017 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)
2017 IEEE Regional Symposium on Micro and Nanoelectronics (RSM)
2017 International Symposium on Electrical Insulating Materials (ISEIM)
2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC)
2017 IEEE 30th International Conference on Micro Electro Mechanical Systems (MEMS)
2017 Symposium on Piezoelectricity, Acoustic Waves, and Device Applications (SPAWDA)
2016 IEEE International Conference on Semiconductor Electronics (ICSE)
2015 2nd International Symposium on Physics and Technology of Sensors (ISPTS)
2014 International Conference on Nanoscience and Nanotechnology (ICONN)
2013 IEEE International Conference on Solid Dielectrics (ICSD)
2012 International Conference on Biomedical Engineering and Biotechnology (iCBEB)
2011 International Conference on Nanoscience, Technology and Societal Implications (NSTSI)
2009 EMC Europe Workshop Materials in Applications (EMC EUROPE WORKSHOP)
2007 IEEE Region 5 Technical, Professional and Student Development Workshop (TPS)
2007 26th International Conference on Thermoelectrics (ICT 2007)
2006 Nanotechnology Materials and Devices Conference (NMDC)
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Most published Xplore authors for Scanning electron microscopy
P. Polovodov
D. Théron
S. Eliet
V. Avramovic
C. Boyaval
D. Deresmes
G. Dambrine
K. Haddadi
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