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IEEE Circuits and Devices

Top Conferences on IEEE Circuits and Devices

2022 IEEE International Solid- State Circuits Conference (ISSCC)

2022 IEEE International Electron Devices Meeting (IEDM)

2022 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)

2022 IEEE Applied Power Electronics Conference and Exposition (APEC)

2021 IEEE International Conference on Plasma Science (ICOPS)

2021 International Topical Meeting on Microwave Photonics (MWP)

2021 IEEE 48th Photovoltaic Specialists Conference (PVSC)

2021 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

2020 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)

2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting

2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)

2019 IEEE International Conference on Industrial Technology (ICIT)

2019 IEEE International Reliability Physics Symposium (IRPS)

2019 IEEE Radio and Wireless Symposium (RWS)

2019 IEEE SENSORS

2019 Joint Conference of the IEEE International Frequency Control Symposium anEuropean Frequency and Time Forum (EFTF/IFC)

2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)

2018 IEEE Custom Integrated Circuits Conference (CICC)

2018 IEEE Aerospace Conference

2018 IEEE 18th International Conference on Nanotechnology (IEEE-NANO)

2018 IEEE International Symposium on Circuits and Systems (ISCAS)

2018 IEEE 26th Annual International Symposium on Field-Programmable Custom Computing Machines (FCCM)

2018 IEEE 19th Workshop on Control and Modeling for Power Electronics (COMPEL)

2018 IEEE Power and Energy Conference at Illinois (PECI)

2018 IEEE International Vacuum Electronics Conference (IVEC)

2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

2018 International Conference on IC Design & Technology (ICICDT)

2017 IEEE International Conference on Mechatronics and Automation (ICMA)

2017 IEEE 12th International Conference on Power Electronics and Drive Systems (PEDS)

2017 IEEE International Conference on Information and Automation (ICIA)

2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

2017 IEEE 19th International Conference on High Performance Computing and Communications; IEEE 15th International Conference on Smart City; IEEE 3rd International Conference on Data Science and Systems (HPCC/SmartCity/DSS)

2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM

2017 IEEE 12th International Conference on ASIC (ASICON)

2017 International Conference on ReConFigurable Computing and FPGAs (ReConFig)

2016 18th Mediterranean Electrotechnical Conference (MELECON)

2016 IEEE International Conference on Semiconductor Electronics (ICSE)

2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS)]

2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)

2011 IEEE International Conference on Intelligent Computing and Intelligent Systems (ICIS 2011)

2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis (ICTD)

2007 IEEE Workshop on Automatic Identification Advanced Technologies (Auto ID)

2006 IEEE Workshop on Microelectronics and Electron Devices (WMED)

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Xplore Articles related to IEEE Circuits and Devices

Linear switching of the differential pair tail current

BiCMOS Device Improves Voltage Reference [Designer's Casebook]

Customizing commercialized technology

Coupling effects on wire delay. Challenges in deep submicron VLSI design

Photonic time-division switching systems

Broadband building blocks [optical networks]

VLSI - Designer's interface

Student essay winners - How my career in electrical engineering will contribute to a better life for my family

Integrating research and promotion

Innovator Insights - Milton Chang: been there, done that - showing others the way

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Periodicals related to IEEE Circuits and Devices

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Electron Devices, IEEE Transactions on

Energy Conversion, IEEE Transaction on

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Industry Applications, IEEE Transactions on

Instrumentation and Measurement, IEEE Transactions on

Latin America Transactions, IEEE (Revista IEEE America Latina)

Lightwave Technology, Journal of

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Micro, IEEE

Microelectromechanical Systems, Journal of

Microwave and Wireless Components Letters, IEEE

Microwave Magazine, IEEE

Microwave Theory and Techniques, IEEE Transactions on

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Photonics Technology Letters, IEEE

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Power Delivery, IEEE Transactions on

Power Electronics, IEEE Transactions on

Power Systems, IEEE Transactions on

Proceedings of the IEEE

Quantum Electronics, IEEE Journal of

Reliability, IEEE Transactions on

Robotics, IEEE Transactions on

Security & Privacy, IEEE

Semiconductor Manufacturing, IEEE Transactions on

Sensors Journal, IEEE

Solid-State Circuits, IEEE Journal of

Spectrum, IEEE

Systems Journal, IEEE

Ultrasonics, Ferroelectrics and Frequency Control, IEEE Transactions on

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

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E-books related to IEEE Circuits and Devices

2014 IEEE-USA Circuits & Devices Industry Salary Report

2015 Circuits and Devices Industry Salary Report

2013 Circuits & Devices Industry Salary Report

SHORT‐CIRCUIT CALCULATIONS ACCORDING TO ANSI/IEEE STANDARDS FOR ARC FLASH ANALYSIS

TLU Dependency on PowerPin Damping Frequency and Damping Factor in CMOS Integrated Circuits1 2007 IEEE. 4.14.3 and part of 4.4 reprinted, with permission, from ShengFu Hsu and MingDou Ker, Transientinduced latchup dependence on powerpin damping frequency and damping factor in CMOS integrated circuits (abstractsection IV and figures 2, 3, 711, and 1416), in IEEE Transactions on Electron Devices, Vol. 54, no. 8, pp. 20022010, Aug. 2007. IEEE, Piscataway, NJ.

ACCOUNTING FOR DECAYING SHORT‐CIRCUIT CURRENTS IN ARC FLASH CALCULATIONS

4 History of Electronic Devices

Main‐Circuit Design

ARC FLASH HAZARD CALCULATIONS IN DC SYSTEMS

ARC‐RESISTANT EQUIPMENT

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Standards related to IEEE Circuits and Devices

IEEE Application Guide for Low-Voltage AC Power Circuit Breakers Applied with Separately-Mounted Current-Limiting Fuses

IEEE Guide for the Application of Faulted Circuit Indicators for 200 / 600 A, Three-phase Underground Distribution

IEEE Standard for Low-Voltage AC Power Circuit Breakers Used in Enclosures

IEEE Standard for Low-Voltage AC Power Circuit Protectors Used in Enclosures

Standard for 4.76 kV to 38 kV Rated Ground and Test Devices Used in Enclosures

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Top Organizations on IEEE Circuits and Devices

Aerospace & Electronics Systems

Broadcast Technology

Circuits & Systems

Communications

Components, Packaging & Manufacturing Tech

Computer

Consumer Technology Society

Dielectrics & Electrical Insulation

Electron Devices

Electronic Design Automation, Council on

Engineering in Medicine & Biology

Industrial Electronics

Industry Applications

Instrumentation & Measurement

Magnetics

Member and Geographic Activities

Microwave Theory & Techniques

Nanotechnology Council

Nuclear & Plasma Science

Photonics

Power & Energy

Power Electronics

Reliability

Robotics & Automation

Sensors Council

Solid State Circuits

Standards Board

Systems Council

Technical Activities Board

Ultrasonics, Ferroelectrics & Frequency Control

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Periodicals related to IEEE Circuits and Devices

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Standards related to IEEE Circuits and Devices

Top Organizations on IEEE Circuits and Devices