2,565 resources related to

Bias Temperature Instability

Top Conferences on Bias Temperature Instability

2023 IEEE International Symposium on Circuits and Systems (ISCAS)

2023 International Electron Devices Meeting (IEDM)

2022 IEEE International Reliability Physics Symposium (IRPS)

ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)

2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)

2022 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)

2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

2021 IEEE International Integrated Reliability Workshop (IIRW)

2021 Symposium on VLSI Technology

2021 18th International SoC Design Conference (ISOCC)

2021 IEEE Symposium on Industrial Electronics & Applications (ISIEA)

2021 International Conference on IC Design and Technology (ICICDT)

2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

2021 IEEE 32nd International Conference on Microelectronics (MIEL)

2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)

2018 IEEE Custom Integrated Circuits Conference (CICC)

2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)

2018 19th International Symposium on Quality Electronic Design (ISQED)

2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC)

2018 31st IEEE International System-on-Chip Conference (SOCC)

2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)

2018 IEEE International Students' Conference on Electrical, Electronics and Computer Science (SCEECS)

2017 13th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS)

2017 15th IEEE International New Circuits and Systems Conference (NEWCAS)

2017 75th Device Research Conference (DRC)

2017 NASA/ESA Conference on Adaptive Hardware and Systems (AHS)

ESSCIRC 2017 - 43rd IEEE European Solid State Circuits Conference (ESSCIRC)

2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)

2017 International Mixed Signals Testing Workshop (IMSTW)

2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC)

2017 IEEE 35th International Conference on Computer Design (ICCD)

2017 29th International Conference on Microelectronics (ICM)

2016 IEEE International Conference on Semiconductor Electronics (ICSE)

2014 20th Biennial University/Government/Industry Micro/Nano Symposium (UGIM)

2012 IEEE 30th VLSI Test Symposium (VTS)

2012 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

2012 23rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2012

2012 International Conference on Devices, Circuits and Systems (ICDCS)

2011 IEEE 6th International Design and Test Workshop (IDT)

2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011)

2011 International Semiconductor Device Research Symposium (ISDRS)

2009 International Workshop on Junction Technology (IWJT)

2008 21st International Conference on VLSI Design: concurrently with the 7th International Conference on Embedded Systems Design

2007 IEEE International Behavioral Modeling and Simulation Workshop (BMAS 2007)

2007 44th ACM/IEEE Design Automation Conference (DAC)

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Xplore Articles related to Bias Temperature Instability

Characteristics and Fluctuation of Negative **Bias Temperature Instability** in Si Nanowire Field-Effect Transistors

Anomalous Negative **Bias Temperature Instability** Degradation Induced by Source/Drain Bias in Nanoscale PMOS Devices

Correlations between plasma induced damage and negative **bias temperature instability** in 65 nm bulk and thin-BOX FDSOI processes

Acceptor-like trap effect on negative-**bias temperature instability** (NBTI) of SiGe pMOSFETs on SRB

A Compact Model of Negative **Bias Temperature Instability** Suitable for Gate-Level Circuit Simulation

Effect of gate length on Negative **Bias Temperature Instability** of 32nm advanced technology HKMG PMOSFET

SiGe Channel CMOS: Understanding Dielectric Breakdown and **Bias Temperature Instability** Tradeoffs

Defects for random telegraph noise and negative **bias temperature instability**

Degradation caused by Negative **Bias temperature instability** depending on Body Bias on NMOS or PMOS in 65 nm bulk and thin-BOX FDSOI processes

Impact of Fin Height on **Bias Temperature Instability** of Memory Periphery FinFETs

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Periodicals related to Bias Temperature Instability

Aerospace and Electronic Systems Magazine, IEEE

Applied Superconductivity, IEEE Transactions on

Circuits and Systems II: Express Briefs, IEEE Transactions on

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Dependable and Secure Computing, IEEE Transactions on

Design & Test of Computers, IEEE

Device and Materials Reliability, IEEE Transactions on

Display Technology, Journal of

Electron Device Letters, IEEE

Electron Devices, IEEE Transactions on

Geoscience and Remote Sensing, IEEE Transactions on

Magnetics, IEEE Transactions on

Microelectromechanical Systems, Journal of

Nanotechnology, IEEE Transactions on

Nuclear Science, IEEE Transactions on

Parallel and Distributed Systems, IEEE Transactions on

Power Electronics, IEEE Transactions on

Reliability, IEEE Transactions on

Semiconductor Manufacturing, IEEE Transactions on

Sensors Journal, IEEE

Solid-State Circuits, IEEE Journal of

Ultrasonics, Ferroelectrics and Frequency Control, IEEE Transactions on

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

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E-books related to Bias Temperature Instability

Why Are Low‐Voltage and Low‐Energy Devices Desired?

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Courses related to Bias Temperature Instability

Introduction to Statistical Variation and Techniques for Design Optimization

Effects of Reliability Mech. On VLSI Circuit Functionality (Archived)

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Standards related to Bias Temperature Instability

IEEE Standard for Inertial Sensor Terminology

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Top Organizations on Bias Temperature Instability

Aerospace & Electronics Systems

Circuits & Systems

Communications

Components, Packaging & Manufacturing Tech

Computer

Electron Devices

Electronic Design Automation, Council on

Geoscience & Remote Sensing

Industrial Electronics

Magnetics

Member and Geographic Activities

Nanotechnology Council

Nuclear & Plasma Science

Power Electronics

Reliability

Robotics & Automation

Sensors Council

Solid State Circuits

Ultrasonics, Ferroelectrics & Frequency Control

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Most published Xplore authors for Bias Temperature Instability

Yi Liu

Jian-Min Cao

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Bias Temperature Instability

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Top Conferences on Bias Temperature Instability

Xplore Articles related to Bias Temperature Instability

Periodicals related to Bias Temperature Instability

E-books related to Bias Temperature Instability

Courses related to Bias Temperature Instability

Standards related to Bias Temperature Instability

Top Organizations on Bias Temperature Instability

Most published Xplore authors for Bias Temperature Instability