Ball grid arrays

What Are Ball Grid Arrays?

Ball grid arrays are surface mount integrated circuit packages whose external connections are a two-dimensional array of solder spheres distributed across the underside of the package body, rather than leads projecting from its perimeter. Each sphere reflows during board assembly to form a solder joint between a pad on the package substrate and a matching pad on the printed circuit board. The arrangement was introduced commercially in the late 1980s and became dominant through the 1990s as processor and application-specific integrated circuit designs outgrew the input and output counts that peripheral leaded packages could support.

The advantage is geometric. A perimeter package such as a quad flat pack adds pins only along its edges, so pin count grows linearly with package size and lead pitch must shrink to keep pace. An area array populates the entire footprint, so pin count grows with the square of the edge dimension, which lets a 1.0 mm or 0.8 mm ball pitch carry hundreds or thousands of connections without the fine-pitch coplanarity problems that plague bent leads. Short, thick solder connections also reduce parasitic inductance, which matters for high-speed signaling and for power delivery to a modern processor.

Package Construction and Variants

A ball grid array consists of a die attached to an organic laminate or ceramic substrate, an interconnect layer of wire bonds or flip chip bumps, an encapsulant or lid, and the solder ball array on the substrate's lower face. Plastic ball grid arrays use a laminate substrate with molded encapsulation and are the volume workhorse. Ceramic versions provide higher thermal conductivity and hermetic sealing for aerospace and military parts. Chip scale packages and die-size ball grid arrays shrink the body to little more than the die footprint with pitches down to 0.5 mm and below, and NASA's electronic parts program maintains guidelines covering both conventional BGA and die-size BGA assemblies for high-reliability use. Ball composition ranges from eutectic tin-lead alloys, still used in some space and defense hardware, to the tin-silver-copper alloys that dominate commercial lead-free assembly.

Assembly and Inspection

Placement relies on the self-alignment that occurs when molten solder pulls the package toward the pad pattern under surface tension, which tolerates modest placement offsets. The trade-off is inspection: the joints sit under the package body, so direct visual inspection is not possible and individual joints cannot be reworked without removing the whole component. Manufacturers therefore rely on transmission X-ray imaging to detect voids, bridges, and head-in-pillow defects, on boundary scan testing to confirm electrical continuity, and on cross-sectioning of sample boards. Reflow profiles must be controlled tightly, since warpage of the substrate during heating is a common root cause of open joints at the package corners.

Solder Joint Reliability

The dominant wear-out mechanism is thermomechanical fatigue. Silicon, laminate substrate, and printed circuit board expand at different rates, so every power cycle strains the solder joints, and cracks initiate at the intermetallic interface and propagate until a connection opens. Corner joints fail first because their distance from the neutral point is greatest. Qualification typically applies accelerated thermal cycling under JEDEC test conditions, for example cycling from -40 to 125 degrees Celsius with fifteen minute dwell and ramp times, with results fitted to a Coffin-Manson style life model. Underfill epoxy dispensed beneath the package couples it mechanically to the board and can raise cycles to failure substantially. Corner staking, via-in-pad design rules, and pad geometry choices between solder mask defined and non-solder mask defined pads all shift the failure distribution.

Applications

Ball grid arrays are used wherever high connection counts meet surface mount assembly, including:

  • Microprocessors, graphics processors, and system-on-chip devices
  • Memory modules and stacked package-on-package assemblies
  • Networking and telecommunications line cards
  • Automotive electronic control units and driver assistance modules
  • Spacecraft avionics and other high-reliability electronics
  • Mobile handsets and other space-constrained consumer products
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