SPICE

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SPICE (Simulation Program with Integrated Circuit Emphasis) is a general-purpose open source analog electronic circuit simulator. (Wikipedia.org)






Conferences related to SPICE

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2021 IEEE Photovoltaic Specialists Conference (PVSC)

Photovoltaic materials, devices, systems and related science and technology


2021 IEEE Pulsed Power Conference (PPC)

The Pulsed Power Conference is held on a biannual basis and serves as the principal forum forthe exchange of information on pulsed power technology and engineering.


2020 IEEE 70th Electronic Components and Technology Conference (ECTC)

ECTC is the premier international conference sponsored by the IEEE Components, Packaging and Manufacturing Society. ECTC paper comprise a wide spectrum of topics, including 3D packaging, electronic components, materials, assembly, interconnections, device and system packaging, optoelectronics, reliability, and simulation.


2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)

This symposium pertains to the field of electromagnetic compatibility.


2020 IEEE/MTT-S International Microwave Symposium (IMS)

The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2036 IEEE/MTT-S International Microwave Symposium - IMS 2036

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2031 IEEE/MTT-S International Microwave Symposium - IMS 2031

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2029 IEEE/MTT-S International Microwave Symposium - IMS 2029

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2026 IEEE/MTT-S International Microwave Symposium - IMS 2026

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2025 IEEE/MTT-S International Microwave Symposium - IMS 2025

    The IEEE International Microwave Symposium (IMS) is the world s foremost conferencecovering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies;encompassing everything from basic technologies to components to systems including thelatest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulationand more. The IMS includes technical and interactive sessions, exhibits, student competitions,panels, workshops, tutorials, and networking events.

  • 2024 IEEE/MTT-S International Microwave Symposium - IMS 2024

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2021 IEEE/MTT-S International Microwave Symposium - IMS 2021

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2019 IEEE/MTT-S International Microwave Symposium - IMS 2019

    Comprehensive symposium on microwave theory and techniques including active and passive circuit components, theory and microwave systems.

  • 2018 IEEE/MTT-S International Microwave Symposium - IMS 2018

    Microwave theory and techniques, RF/microwave/millimeter-wave/terahertz circuit design and fabrication technology, radio/wireless communication.

  • 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2016 IEEE/MTT-S International Microwave Symposium - IMS 2016

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2015 IEEE/MTT-S International Microwave Symposium - MTT 2015

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics. The IMS includes technical sessions, both oral and interactive, worksh

  • 2014 IEEE/MTT-S International Microwave Symposium - MTT 2014

    IMS2014 will cover developments in microwave technology from nano devices to system applications. Technical paper sessions, interactive forums, plenary and panel sessions, workshops, short courses, industrial exhibits, and a wide array of other technical activities will be offered.

  • 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter -wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2011 IEEE/MTT-S International Microwave Symposium - MTT 2011

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010

    Reports of research and development at the state-of-the-art of the theory and techniques related to the technology and applications of devices, components, circuits, modules and systems in the RF, microwave, millimeter-wave, submillimeter-wave and Terahertz ranges of the electromagnetic spectrum.

  • 2009 IEEE/MTT-S International Microwave Symposium - MTT 2009

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2008 IEEE/MTT-S International Microwave Symposium - MTT 2008

  • 2007 IEEE/MTT-S International Microwave Symposium - MTT 2007

  • 2006 IEEE/MTT-S International Microwave Symposium - MTT 2006

  • 2005 IEEE/MTT-S International Microwave Symposium - MTT 2005

  • 2004 IEEE/MTT-S International Microwave Symposium - MTT 2004

  • 2003 IEEE/MTT-S International Microwave Symposium - MTT 2003

  • 2002 IEEE/MTT-S International Microwave Symposium - MTT 2002

  • 2001 IEEE/MTT-S International Microwave Symposium - MTT 2001

  • 2000 IEEE/MTT-S International Microwave Symposium - MTT 2000

  • 1999 IEEE/MTT-S International Microwave Symposium - MTT '99

  • 1998 IEEE/MTT-S International Microwave Symposium - MTT '98

  • 1997 IEEE/MTT-S International Microwave Symposium - MTT '97

  • 1996 IEEE/MTT-S International Microwave Symposium - MTT '96


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Periodicals related to SPICE

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Advanced Packaging, IEEE Transactions on

The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.


Circuits and Systems I: Regular Papers, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Circuits and Systems II: Express Briefs, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Circuits and Systems Magazine, IEEE


Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Methods, algorithms, and human-machine interfaces for physical and logical design, including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, and documentation of integrated-circuit and systems designs of all complexities. Practical applications of aids resulting in producible analog, digital, optical, or microwave integrated circuits are emphasized.


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Most published Xplore authors for SPICE

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No authors for "SPICE"


Xplore Articles related to SPICE

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Dual Port Sram - Data In Buffer

Dual Port Sram - Data In Buffer, 12/15/2011

Course content reaffirmed: 06/2015--There are several important timings that must be considered when designing the Data In Buffer that go beyond amplifying the input signal to drive the data to be written into the bit cell. The control timing must be such that the hold time for data in from the customer can be zero and not cause a change ...


Superposition and the Extra Element Theorem

Linear Circuit Transfer Functions: An Introduction to Fast Analytical Techniques, None

When dealing with more than one input, the superposition theorem occupies the top of the list as its extension naturally leads to the Extra Element Theorem (EET). By first introducing superposition theorem in a simple and graphical way, this chapter paves the way towards the EET understanding in a hopefully simple and intelligible manner. In a linear circuit involving more ...


The Bifurcation Diagram Calculation Using the Capabilities of SPICE Simulation

NDES 2012; Nonlinear Dynamics of Electronic Systems, 2012

In this paper the approach to the calculation of bifurcation diagrams for nonautonomous electronic systems, based on the use of SPICE-simulation without using the external software, is proposed. The example of the SPICE code for ID-bifurcation diagram calculation for well-known nonautonomous RL-Diode Circuit is described.


The DPF turbulence investigation

IEEE Conference Record - Abstracts. 1992 IEEE International Conference on Plasma, 1993

None


Dual Port SRAM- Sensing Scheme

Dual Port SRAM- Sensing Scheme, 09/15/2011

Course content reaffirmed: 06/2015--This dual port SRAM utilizes a 2-sided differential sensing scheme by taking advantage of the fact that both bit true and bit complement bit lines are available due to the nature of the 6T SRAM bit cell. The sense amp is clocked by a 1 of 4 decoded Sense Amp Clock utilizing a regenerative feedback latch that ...


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Educational Resources on SPICE

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IEEE-USA E-Books

  • Dual Port Sram - Data In Buffer

    Course content reaffirmed: 06/2015--There are several important timings that must be considered when designing the Data In Buffer that go beyond amplifying the input signal to drive the data to be written into the bit cell. The control timing must be such that the hold time for data in from the customer can be zero and not cause a change on the pin to propagate all the way to the bit cell and disturb what was just written. This tutorial makes a deeper evaluation of the timing paths that must be considered between clock and data in.

  • Superposition and the Extra Element Theorem

    When dealing with more than one input, the superposition theorem occupies the top of the list as its extension naturally leads to the Extra Element Theorem (EET). By first introducing superposition theorem in a simple and graphical way, this chapter paves the way towards the EET understanding in a hopefully simple and intelligible manner. In a linear circuit involving more than one individual source, superposition theorem states that the response, a current or a voltage, in a branch is the algebraic sum of the responses obtained from each of the individual sources while the other sources are turned off. SPICE is an excellent resource to verify calculations either obtained by hand or from a mathematical solver. The chapter also summarizes the different forms of EET and how people can combine time constants to form the numerator (zero) and the denominator (pole) of the transfer function under study.

  • The Bifurcation Diagram Calculation Using the Capabilities of SPICE Simulation

    In this paper the approach to the calculation of bifurcation diagrams for nonautonomous electronic systems, based on the use of SPICE-simulation without using the external software, is proposed. The example of the SPICE code for ID-bifurcation diagram calculation for well-known nonautonomous RL-Diode Circuit is described.

  • The DPF turbulence investigation

    None

  • Dual Port SRAM- Sensing Scheme

    Course content reaffirmed: 06/2015--This dual port SRAM utilizes a 2-sided differential sensing scheme by taking advantage of the fact that both bit true and bit complement bit lines are available due to the nature of the 6T SRAM bit cell. The sense amp is clocked by a 1 of 4 decoded Sense Amp Clock utilizing a regenerative feedback latch that can generate a logic output that is rail to rail. The read path from the bit line through the read select circuitry to the amplification of the signal at the sense amp output is presented in this tutorial.

  • Dual Port SRAM - Writing Bit Cell During Word Line Collision

    Course content reaffirmed: 06/2015--The interaction in the array between the two ports can have some adverse effects that must be evaluated when designing a Dual Port SRAM, especially when one of the ports is doing a write. This tutorial takes a close look at a Word Line collision" that occurs when one port is writing while the other port is reading the same row. SPICE simulation waveforms will be evaluated showing the interaction that can occur through the bit cell and affect what happens on the bit lines between the two ports. The situation where both ports access the same bit cell while one port is reading and the other port is writing is also evaluated."

  • Dual Port SRAM Bit Line Coupling Between Ports

    Course content reaffirmed: 06/2015--The influence that one port can have on the other port bit line can be a subtle, yet costly problem if not fully evaluated, and can in fact result in the design not working. Capacitive coupling between neighboring bit lines must be properly modeled and evaluated to determine their impact based on the different conditions that can occur in a dual port. This tutorial evaluates the worst case circumstances that can cause the differential during a read to be degraded - such as writing from one port while reading from the other, data dependency and bit cell location.

  • A wideband two-quadrant analog multiplier

    A multiplier design technique affording &#177; 0.25% accuracy with 100MHz signal bandwidth will be discussed. Although the circuit operates in current mode, the virtual-ground inputs permit operation from low-level voltages. Laser trimming is used to eliminate nonlinearities due to V<inf>BE</inf>mismatch.

  • Parametric Studies Of Electrode Configurations For The Dense Plasma Focus

    None

  • Dual Port Sram - Write Path

    Course content reaffirmed: 06/2015--The circuits in the write path from the bit cell through the write drivers and down to the write select circuitry are discussed. Specific analysis is done with one port writing while the other port is reading from the same row. The decoding approach for determining which bit line is driven low for a write is compared to the decoding required for reading the selected bit line and passing it out to the data out pin. Timing relationships between the key signals for doing a write will be evaluated from SPICE simulations.



Standards related to SPICE

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IEEE Standard Interface for Hardware Description Models of Electronic Components

Development of a standard simulation and related tool interface for component models written in VHDL, Verilog, C and other description languages.