Conferences related to Statistical Analysis

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2020 57th ACM/ESDA/IEEE Design Automation Conference (DAC)

The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2022 59th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2021 58th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC Description for TMRF The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading

  • 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 session on design methodologies and EDA tool developments, keynotes, panels, plus User Track presentations. A diverse worldwide community representing more than 1,000 organization attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers

  • 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference is the world s leading technical conference and tradeshow on electronic design and design automation. DAC is where the IC Design and EDA ecosystem learns, networks, and does business.

  • 2010 47th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers.

  • 2009 46th ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC is the premier event for the electronic design community. DAC offers the industry s most prestigious technical conference in combination with the biggest exhibition, bringing together design, design automation and manufacturing market influencers.

  • 2008 45th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 250 of the leading electronics design suppliers.

  • 2007 44th ACM/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier Electronic Design Automation (EDA) and silicon solution event. DAC features over 50 technical sessions covering the latest in design methodologies and EDA tool developments and an Exhibition and Demo Suite area with over 250 of the leading EDA, silicon and IP Providers.


Oceans 2020 MTS/IEEE GULF COAST

To promote awareness, understanding, advancement and application of ocean engineering and marine technology. This includes all aspects of science, engineering, and technology that address research, development, and operations pertaining to all bodies of water. This includes the creation of new capabilities and technologies from concept design through prototypes, testing, and operational systems to sense, explore, understand, develop, use, and responsibly manage natural resources.

  • OCEANS 2018 MTS/IEEE Charleston

    Ocean, coastal, and atmospheric science and technology advances and applications

  • OCEANS 2017 - Anchorage

    Papers on ocean technology, exhibits from ocean equipment and service suppliers, student posters and student poster competition, tutorials on ocean technology, workshops and town meetings on policy and governmental process.

  • OCEANS 2016

    The Marine Technology Scociety and the Oceanic Engineering Society of the IEEE cosponor a joint annual conference and exposition on ocean science, engineering, and policy. The OCEANS conference covers four days. One day for tutorials and three for approx. 500 technical papers and 150 -200 exhibits.

  • OCEANS 2015

    The Marine Technology Scociety and the Oceanic Engineering Society of the IEEE cosponor a joint annual conference and exposition on ocean science, engineering, and policy. The OCEANS conference covers four days. One day for tutorials and three for approx. 450 technical papers and 150-200 exhibits.

  • OCEANS 2014

    The OCEANS conference covers four days. One day for tutorials and three for approx. 450 technical papers and 150-200 exhibits.

  • OCEANS 2013

    Three days of 8-10 tracks of technical sessions (400-450 papers) and concurent exhibition (150-250 exhibitors)

  • OCEANS 2012

    Ocean related technology. Tutorials and three days of technical sessions and exhibits. 8-12 parallel technical tracks.

  • OCEANS 2011

    The Marine Technology Society and the Oceanic Engineering Scociety of the IEEE cosponsor a joint annual conference and exposition on ocean science engineering, and policy.

  • OCEANS 2010

    The Marine Technology Society and the Oceanic Engineering Scociety of the IEEE cosponsor a joint annual conference and exposition on ocean science engineering, and policy.

  • OCEANS 2009

  • OCEANS 2008

    The Marine Technology Society (MTS) and the Oceanic Engineering Society (OES) of the Institute of Electrical and Electronic Engineers (IEEE) cosponsor a joint conference and exposition on ocean science, engineering, education, and policy. Held annually in the fall, it has become a focal point for the ocean and marine community to meet, learn, and exhibit products and services. The conference includes technical sessions, workshops, student poster sessions, job fairs, tutorials and a large exhibit.

  • OCEANS 2007

  • OCEANS 2006

  • OCEANS 2005

  • OCEANS 2004

  • OCEANS 2003

  • OCEANS 2002

  • OCEANS 2001

  • OCEANS 2000

  • OCEANS '99

  • OCEANS '98

  • OCEANS '97

  • OCEANS '96


2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe)

Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for smarter grid, energy efficiency,technologies for sustainable energy systems, converters and power supplies


2019 41st Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)

The conference program will consist of plenary lectures, symposia, workshops andinvitedsessions of the latest significant findings and developments in all the major fields ofbiomedical engineering.Submitted papers will be peer reviewed. Accepted high quality paperswill be presented in oral and postersessions, will appear in the Conference Proceedings and willbe indexed in PubMed/MEDLINE & IEEE Xplore


2019 IEEE 16th International Symposium on Biomedical Imaging (ISBI)

The IEEE International Symposium on Biomedical Imaging (ISBI) is the premier forum for the presentation of technological advances in theoretical and applied biomedical imaging.ISBI 2019 will be the 16th meeting in this series. The previous meetings have played a leading role in facilitating interaction between researchers in medical and biological imaging. The 2019 meeting will continue this tradition of fostering cross fertilization among different imaging communities and contributing to an integrative approach to biomedical imaging across all scales of observation.


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Periodicals related to Statistical Analysis

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Antennas and Wireless Propagation Letters, IEEE

IEEE Antennas and Wireless Propagation Letters (AWP Letters) will be devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation.


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Broadcasting, IEEE Transactions on

Broadcast technology, including devices, equipment, techniques, and systems related to broadcast technology, including the production, distribution, transmission, and propagation aspects.


Circuits and Systems for Video Technology, IEEE Transactions on

Video A/D and D/A, display technology, image analysis and processing, video signal characterization and representation, video compression techniques and signal processing, multidimensional filters and transforms, analog video signal processing, neural networks for video applications, nonlinear video signal processing, video storage and retrieval, computer vision, packet video, high-speed real-time circuits, VLSI architecture and implementation for video technology, multiprocessor systems--hardware and software-- ...


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Most published Xplore authors for Statistical Analysis

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Xplore Articles related to Statistical Analysis

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Using statistical analysis methods to predict switching stability

2014 IEEE AUTOTEST, 2014

Switching reliability, repeatability and stability are crucial in Automated Test Equipment (ATE). There is an inherent variability in a mechanical switch and after an extended number of cycles, will cause an out tolerance condition. This could present itself as an intermittent test failure that will require isolation to the Unit Under Test (UUT) or the ATE. A method that could ...


A malicious code detection method based on statistical analysis

2012 9th International Conference on Fuzzy Systems and Knowledge Discovery, 2012

The malicious code detection based on behaviors has proved effective. But there are high false positives and high false negatives when using this method. Because the behaviors are always out-of-order and redundant. To solve these problems, this paper proposes a detection method based on statistical analysis. Firstly, this method uses association rules to sort out the behaviors, and then we ...


A Novel Looseness Detection Method for Hydraulic Pipeline Clamp Based on Statistical Analysis

2018 9th International Conference on Mechanical and Aerospace Engineering (ICMAE), 2018

The pipeline is widely used in various kinds of mechanical equipment, usually fixed by the clamps. It is great important to detect the fixed clamps for the operation of equipment by signal processing. The time domain signal is quite popular in the field of signal processing. There are generally two major types of methods for analyzing time-domain signals. The one ...


Statistical analysis of large amount of power cables diagnostic data

2008 International Conference on Condition Monitoring and Diagnosis, 2008

In this contribution statistical analysis were applied to evaluate condition of serviced aged MV power cables systems. Analysis were based on large number of diagnostic data as obtained from the on-site inspections of 89 mass insulated power cables, 26 XLPE insulated power cables and 126 mixed-insulated power cable. Statistical analysis input data was represented with several diagnostic parameters regarding to ...


Anatomically adapted wavelets for integrated statistical analysis of fMRI data

2011 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, 2011

Wavelets have been successfully used in statistical analysis of fMRI data as a spatial transform providing a compact representation of brain activation maps. However, conventional (tensor-product) wavelet transforms assume a rectangular domain, while the essential brain activity takes place in the convoluted gray- matter layer. We use the lifting scheme to design wavelet bases for more arbitrary domains which do ...


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Educational Resources on Statistical Analysis

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IEEE.tv Videos

The eXtensible Event Stream (XES) standard
26th Annual MTT-AP Symposium and Mini Show - Dr. Ajay Poddar
Vladimir Cherkassky - Predictive Learning, Knowledge Discovery and Philosophy of Science
A Bayesian Approach for Spatial Clustering - IEEE CIS Webinar
Challenging the stigma surrounding the role of women in technology, a journey from combinatorial optimization to IBM
IMS 2011 Microapps - A Practical Approach to Verifying RFICs with Fast Mismatch Analysis
IMS MicroApps: Multi-Rate Harmonic Balance Analysis
IMS 2012 Microapps - Improve Microwave Circuit Design Flow Through Passive Model Yield and Sensitivity Analysis
IMS 2011 Microapps - Yield Analysis During EM Simulation
Dictionary Learning: Principles, Algorithms, Guarantees
Spectrum Analysis: RF Boot Camp
IMS 2011 Microapps - Tools for Creating FET and MMIC Thermal Profiles
Zohara Cohen AMA EMBS Individualized Health
Surgical Robotics: Analysis and Control Architecture for Semiautonomous Robotic Surgery
IMS 2012 Microapps - Generation and Analysis Techniques for Cost-efficient SATCOM Measurements Richard Overdorf, Agilent
Vladimir Vapnik accepts the IEEE John Von Neumann Medal - Honors Ceremony 2017
New Approach of Vehicle Electrification: Analysis of Performance and Implementation Issue
A Flexible Testbed for 5G Waveform Generation and Analysis: MicroApps 2015 - Keysight Technologies
IMS 2011 Microapps - Remcom's XFdtd and Wireless InSite: Advanced Tools for Advanced Communication Systems Analysis
Louis Scharf - Honors Ceremony 2016 Red Carpet Interview

IEEE-USA E-Books

  • Using statistical analysis methods to predict switching stability

    Switching reliability, repeatability and stability are crucial in Automated Test Equipment (ATE). There is an inherent variability in a mechanical switch and after an extended number of cycles, will cause an out tolerance condition. This could present itself as an intermittent test failure that will require isolation to the Unit Under Test (UUT) or the ATE. A method that could detect anomalous switching behavior and predict potential switching issues would be very beneficial. It could potentially preclude failures due to deviations in ATE paths caused by switching variability. This paper will discuss a method to test switches within the ATE system and identify suspect switches. The testing methodology is based on an existing system self-test. It can be implemented as an enhancement to the existing code or as a standalone test. Each group of tests within the switching self-test is repeated multiple times and data is captured for all iterations. Statistical analysis is then applied to the acquired data. The test data is assessed for two parametric characteristics; the average value and standard deviation of the repetitive measurements taken for each switch path. The data can be exported to a spreadsheet or calculated within the self-test code. Maximum limits are determined based on the resistive path and number of switches. These limits are then compared to the statistical results. The results can be displayed numerically and also be displayed graphically. Charts can be generated if the results are exported to a spreadsheet. This expanded testing can be performed on a periodic basis but less frequently than the existing self-test. The testing can be expanded to include an adapter built for the specific application. It would include wrap- around wiring and connectors to mate to the front panels of the switch modules. This would isolate the switches from the system and permit testing of just the switches without the system wiring. The approach and method of utilizing statistical analysis of self-test data provides a means to identify early signs of variability and initiate a proactive repair of degrading switches.

  • A malicious code detection method based on statistical analysis

    The malicious code detection based on behaviors has proved effective. But there are high false positives and high false negatives when using this method. Because the behaviors are always out-of-order and redundant. To solve these problems, this paper proposes a detection method based on statistical analysis. Firstly, this method uses association rules to sort out the behaviors, and then we can get the integrated and accurate behavior sequences. Secondly, by using the association algorithm we can pick up the signatures of behavior sequences. In addition, this method can detect the signatures to judge the threat based on statistical analysis. Experimental results indicate that it can reduce both the false positives and the false negatives effectively.

  • A Novel Looseness Detection Method for Hydraulic Pipeline Clamp Based on Statistical Analysis

    The pipeline is widely used in various kinds of mechanical equipment, usually fixed by the clamps. It is great important to detect the fixed clamps for the operation of equipment by signal processing. The time domain signal is quite popular in the field of signal processing. There are generally two major types of methods for analyzing time-domain signals. The one is that the time domain signal is converted into other domains such as frequency domain and time frequency domain; the other is using statistical analysis methods to analyze signals. This paper presents a new feature extraction method based on statistical analysis, which is called the number of conformation patterns (CPN). The phase space reconstruction of time series is carried out, and the numbers of conformation patterns with different embedding dimensions are counted to be features for the signal. Through the simulation analysis, the characteristic values are sensitive to the frequency of the signal. This method is used to analyze the experimental data of the looseness of the pipeline clamp, and the results show that CPN can effectively detect the different degrees of clamp looseness.

  • Statistical analysis of large amount of power cables diagnostic data

    In this contribution statistical analysis were applied to evaluate condition of serviced aged MV power cables systems. Analysis were based on large number of diagnostic data as obtained from the on-site inspections of 89 mass insulated power cables, 26 XLPE insulated power cables and 126 mixed-insulated power cable. Statistical analysis input data was represented with several diagnostic parameters regarding to partial discharges phenomenon (PD). Investigated parameters were obtained with application of damped AC (DAC) diagnostic system during on-site tests. After a survey of all relevant parameters describing condition of the particular cable system components, sub-groups of different cable accessories were created (e.g. joints, termination, insulation types) For proper interpretation of collected data related to cable insulation condition as well as different accessories condition, categorization based on such diagnostic parameters e.g. PDIV (partial discharge inception voltage), PD occurrence, and PD mappings was assumed. Moreover investigated statistically PD parameters were employed to estimate experience norms and measuring criteria. Based on knowledge rules and estimated statistically norms example of so called ldquoexperimental condition indexrdquo was used to indicate overall condition of discussed MV power cables systems.

  • Anatomically adapted wavelets for integrated statistical analysis of fMRI data

    Wavelets have been successfully used in statistical analysis of fMRI data as a spatial transform providing a compact representation of brain activation maps. However, conventional (tensor-product) wavelet transforms assume a rectangular domain, while the essential brain activity takes place in the convoluted gray- matter layer. We use the lifting scheme to design wavelet bases for more arbitrary domains which do not have a group structure. In particular, we have considered the grey-matter cortical layer as the domain. We then applied the new transform to fMRI data using the wavelet-based SPM (WSPM) framework. Preliminary results show that the adapted wavelets have superior performance in terms of sensitivity than the standard tensor-product wavelets, while having the same control over type-I error rate (specificity).

  • Statistical Analysis of a Linear Algebra Asymmetricwatermarking Scheme

    We introduce a novel asymmetric watermarking scheme, involving a private key for embedding and a public key for detection, and we detail its statistical analysis, relying on Neyman-Pearson criterion. The proposed scheme solves part of the problems connected to previous watermarking approaches based on linear algebra. In particular, special attention is paid at reducing the side information required at the detector, as well as at achieving higher robustness by enphasizing the contribution of the watermark in the detection phase.

  • Information Extraction from Semi-structured WEB Page Based on DOM Tree and its Application in Scientific Literature Statistical Analysis System

    To extract information automatically from semi-structured Web pages, this paper puts forward a method named IESS for discovering the record model based on DOM and maximal similar sub tree, to identify records automatically and correctly when there are some differences in expression models of records that belong to the same type. To test the performance of the method, a scientific literature statistical analysis system is designed. The practice shows that users can quickly understand the distribution of papers in their retrieving field and grasp the importance with the help of the system.

  • Measurement and statistical analysis of Partial Discharges at DC voltage

    Partial Discharge (PD) detection and diagnostics is an established tool to test the condition of the insulation in HV-facilities. One basic question while performing PD measurements is the one concerning the type and location of the defect. Under AC stress there are several instruments to interpret the measured PD, most important the phase angle histogram. At DC voltages this approach is inapplicable and therefore new parameters to analyze PD under DC stress have to be identified. In this paper it is shown, that a statistical analysis of pulse shape parameters can give information about the type of defect and thus could be used for DC-PD diagnostics.

  • Statistical analysis of SHVC encoded video

    Scalable extension (SHVC) of the High Efficiency Video Coding HEVC was developed to ameliorate the coding efficiency for different types of scalability. In this paper, a survey for SHVC extensions is investigated. We describe its scalability types and explain the different additional coding features that further improve the Enhancement Layer (EL) coding efficiency. Furthermore, we evaluate and prove the effectiveness of the SHVC through experimental results for different coding configurations reduction of about. Based on statistical analysis, depth 0 (64×64) can reach more than 75% of use in B1 frame. This statistics helped us explore deeply on the prediction mode percentages.

  • Generalized anisotropic polynomial chaos approach for expedited statistical analysis of nonlinear radio-frequency (RF) circuits

    In this paper, a generalized anisotropic polynomial chaos approach for the fast statistical analysis of nonlinear radio-frequency (RF) circuits is proposed. This approach relies on a high dimensional model representation (HDMR) formulation in order to determine the maximum degree of the PC expansion along each random dimension separately. The resultant anisotropic multidimensional PC expansion of the circuit response is significantly sparse compared to the conventional isotropic expansion, thereby requiring substantially smaller time and memory cost for construction without significant loss of accuracy. The validity of the proposed methodology is demonstrated using a RF low noise amplifier example.



Standards related to Statistical Analysis

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Guide for Developing and Assessing Reliability Predictions Based on IEEE Standard 1413

The scope of this document is to provide guidance for conducting and assessing reliability predictions (techniques and methods) for electronic products and systems.


Guide for the statistical analysis of electrical insulation breakdown data


IEEE Guide for Selecting and Using Reliability Predictions Based on IEEE 1413

Processes and methodologies for conducting reliability predictions for electronic systems and equipment.


IEEE Guide for the Statistical Analysis of Electrical Insulation Breakdown Data

To prepare a guide describing statistical methods to analyze breakdown test data (at constant or increasing voltage) for purposes including characterization of an insulation system, comparison with other systems and prediction of the probability of breakdown at given times or voltages. The statistical methods included in the guide are based on Weibull, lognormal and Gumbel distributions.


IEEE Guide for the Statistical Analysis of Thermal Life Test Data


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