Weibull distribution

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In probability theory and statistics, the Weibull distribution is a continuous probability distribution. (Wikipedia.org)






Conferences related to Weibull distribution

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2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

The Conference focuses on all aspects of instrumentation and measurement science andtechnology research development and applications. The list of program topics includes but isnot limited to: Measurement Science & Education, Measurement Systems, Measurement DataAcquisition, Measurements of Physical Quantities, and Measurement Applications.


2019 IEEE International Reliability Physics Symposium (IRPS)

Meeting of academia and research professionals to discuss reliability challenges.


2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting

The conference is intended to provide an international forum for the exchange of information on state-of-the-art research in antennas, propagation, electromagnetics, and radio science.


2019 IEEE Power & Energy Society General Meeting (PESGM)

The Annual IEEE PES General Meeting will bring together over 2900 attendees for technical sessions, administrative sessions, super sessions, poster sessions, student programs, awards ceremonies, committee meetings, tutorials and more


2019 IFIP/IEEE Symposium on Integrated Network and Service Management (IM)

Management of information and communication technology focusing on research, development, integration, standards, service provisioning, and user communities.


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Periodicals related to Weibull distribution

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Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Communications Letters, IEEE

Covers topics in the scope of IEEE Transactions on Communications but in the form of very brief publication (maximum of 6column lengths, including all diagrams and tables.)


Communications, IEEE Transactions on

Telephone, telegraphy, facsimile, and point-to-point television, by electromagnetic propagation, including radio; wire; aerial, underground, coaxial, and submarine cables; waveguides, communication satellites, and lasers; in marine, aeronautical, space and fixed station services; repeaters, radio relaying, signal storage, and regeneration; telecommunication error detection and correction; multiplexing and carrier techniques; communication switching systems; data communications; and communication theory. In addition to the above, ...


Components and Packaging Technologies, IEEE Transactions on

Component parts, hybrid microelectronics, materials, packaging techniques, and manufacturing technology.


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Most published Xplore authors for Weibull distribution

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Xplore Articles related to Weibull distribution

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CFAR Detection of Extended Targets in SAR Images based on goodness-of-fit test

[{u'author_order': 1, u'affiliation': u'University of electronic Science and Technology of China, China', u'full_name': u'Xiaobo Deng'}, {u'author_order': 2, u'affiliation': u'University of electronic Science and Technology of China, China', u'full_name': u'Zhuoan Han'}, {u'author_order': 3, u'affiliation': u'University of electronic Science and Technology of China, China', u'full_name': u'Xiaobo Yang'}, {u'author_order': 4, u'affiliation': u'University of electronic Science and Technology of China, China', u'full_name': u'Yiming Pi'}, {u'author_order': 5, u'affiliation': u'Radar and Avionics Institute of China Aviation Industry Corporation I, China', u'full_name': u'Zhenglin Cao'}] 7th European Conference on Synthetic Aperture Radar, 2008

A novel CFAR scheme based on goodness-of-fit (GoF) test is proposed in this paper. This scheme begins with a logarithmic amplifier, which transforms the clutter PDF, whether Weibull or Lognormal into a location-scale one, some relevant properties of which are exploited to ensure CFAR. A Goodness-of-fit test is adopted at last to decide whether the samples from target window belong ...


The failure of MTTF in availability evaluation

[{u'author_order': 1, u'affiliation': u'Motorola, Chicago, IL, USA', u'authorUrl': u'https://ieeexplore.ieee.org/author/37335116100', u'full_name': u'Hairong Sun', u'id': 37335116100}, {u'author_order': 2, u'authorUrl': u'https://ieeexplore.ieee.org/author/38004638500', u'full_name': u'J.J. Han', u'id': 38004638500}] Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318), 2002

In this paper, a truncated bathtub is proposed to model the failure rate of a product with perfect burn-in. We expose some counter-intuition observations, e.g., increasing the MTTF does not necessarily increase the average and instantaneous availability during the product's lifetime, and the average and instantaneous availability could be improved without changing the MTTF. The MTTF and the steady-state availability ...


Analysis of failure prediction methods

[{u'author_order': 1, u'affiliation': u'Group of High Voltage Technology and Equipment, Budapest University of Technology and Economics, Hungary', u'authorUrl': u'https://ieeexplore.ieee.org/author/37086172579', u'full_name': u'Dori\xe1n Irinyi', u'id': 37086172579}, {u'author_order': 2, u'affiliation': u'Group of High Voltage Technology and Equipment, Budapest University of Technology and Economics, Hungary', u'authorUrl': u'https://ieeexplore.ieee.org/author/37542939200', u'full_name': u'Rich\xe1rd Cselk\xf3', u'id': 37542939200}] 2017 6th International Youth Conference on Energy (IYCE), 2017

This paper describes the effects of constant and varied maintenance strategies through an example of artificially generated failure data. During the constant maintenance strategy two main cases are distinguished. In the first example constant number of failures while in the second example specified percentage of failures are prevented with maintenance every year. Through the case study of the varied maintenance ...


Reliability Prediction of the Series System with Spares Subject to Weibull Failures

[{u'author_order': 1, u'affiliation': u'Leach Corporation; Relay Division; 5915 Avalon Boulevard; Los Angeles, California 90003 USA', u'authorUrl': u'https://ieeexplore.ieee.org/author/37896695800', u'full_name': u'J. N. Pan', u'id': 37896695800}, {u'author_order': 2, u'affiliation': u'Industrial Engineering Department POBox 4130; Texas Tech University; Lubbock, Texas 79409 USA.', u'authorUrl': u'https://ieeexplore.ieee.org/author/37327102400', u'full_name': u'W. J. Kolarik', u'id': 37327102400}] IEEE Transactions on Reliability, 1985

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Selection of Weibull Shape Parameter, Based on Adaptive Estimation

[{u'author_order': 1, u'affiliation': u'Department of Mathematics & Statistics; Banaras Hindu University; Varanasi - 221 005 INDIA.', u'authorUrl': u'https://ieeexplore.ieee.org/author/37385325800', u'full_name': u'M. Pandey', u'id': 37385325800}, {u'author_order': 2, u'affiliation': u'Department of Mathematics & Statistics; Banaras Hindu University; Varanasi - 221 005 INDIA.', u'authorUrl': u'https://ieeexplore.ieee.org/author/37314105400', u'full_name': u'S.K. Upadhyay', u'id': 37314105400}] IEEE Transactions on Reliability, 1983

The paper provides a modified likelihood ratio criterion for deciding whether or not the Weibull shape parameter is unity. The analysis is based on a Monte Carlo study of 1000 samples of simulated life-test data. The method has been used as a preliminary test for estimating unknown parameters. Thus two sets of adaptive estimators of the scale and the shape ...


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IEEE-USA E-Books

  • System and Component Reliability

    The reliability of a grid depends on the reliabilities of the underlying parts and the way these are interconnected. This chapter discusses system dependencies on system configurations and unit performances. Concepts and techniques are discussed to evaluate the reliabilities in systems like connections, circuits and substation bays. The chapter discusses the basics of system reliability and introduces block diagrams as a method to represent system components and/or failure mechanisms in a total configuration. It discusses special basic system configurations, namely series system and parallel system. The chapter explains that in some cases a system seems redundant, but in reality suffers from a common cause that cancels the redundancy. The systems that require a minimal redundancy, the so‐called _k_‐out‐of‐_n_ systems are discussed. The chapter also analyses complex systems by conditional method, up‐table method, and minimal paths and minimum blockades method.



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