64 resources related to UHF devices
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The EMC 2015 provides an excellent forum for presentation, discussion and exchange of the latest EMC problems and solutions from universities, research laboratories and industry.
2015 IEEE International Ultrasonics Symposium (IUS)
Annual meeting of the UFFC Society that is being held regularly. It is focusing on ultrasonics.
2014 IEEE Electrical Insulation Conference (EIC)
The Electrical Insulation Conference is focused on the practical applications of electrical insulating sytsems and materials (including nanodielectrics), the associated diagnostics and field use as applied to all types of electrical and electronic equipment.
2014 IEEE International Symposium on Circuits and Systems (ISCAS)
The IEEE International Symposium on Circuits and Systems (ISCAS) is the flagship conference of the IEEE Circuits and Systems Society and the world’s premier networking forum in the highly active fields of theory, design and implementation of circuits and systems.ISCAS 2014 will have a special focus on nano/bio circuits and systems applied to enhancing living and lifestyles, and seeks to address multidisciplinary challenges in healthcare and well-being, the environment and climate change.
2012 47th International Universities Power Engineering Conference (UPEC)
A major international forum for the presentation, discussion and exchange of information concerning new trends in electrical power engineering. To become better informed about the latest developments in the field of power engineering.
Electrical insulation common to the design and construction of components and equipment for use in electric and electronic circuits and distribution systems at all frequencies.
Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.
Drobakhin, O.O.; Doronin, A.V.; Grigoriev, V.V. Electronic Instrument Engineering, 2008. APEIE 2008. 9th International Conference on Actual Problems of, 2008
To obtain accurate displacement data for the objects with non-flat surface by UHF interference method using 3 probes the neural network technologies were used. The real experiments were made. To provide quadratic characteristic of the detectors the calibration using the developed mathematical model of neural network was performed. Combining UHF interference method with neural network technologies increased accuracy of displacement ...
Pustovalova, N.V. Electronic Instrument Engineering, 2008. APEIE 2008. 9th International Conference on Actual Problems of, 2008
This paper discusses TRIZ (The theory of inventor's problem solving) adaptation problems for requirements consistency verification process. How TRIZ methodology can be used for technical contradictions solving are discussed. Common proprieties of technical contradiction are determined. Conclusions about prospects of TRIZ adaptation are presented.
Caverly, R.; Breed, G.; Cantrell, W.; Eron, M.; Garcia, J.; Kondrath, N.; Myer, D.; Ruiz, M.; Walker, J. Microwave Magazine, IEEE, 2015
In the March 2002 issue of IEEE Transactions on Microwave Theory and Techniques (T-MTT), Frederick Raab, chair and founder of the highfrequency (HF), very high frequency (VHF), ultrahigh frequency (UHF) technology technical committee of the IEEE Microwave Theory and Techniques Society (Technical Committee 17), organized an extensive overview paper "HF, VHF, and UHF Systems and Technology" . The paper started ...
Batskikh, G.I.; Gurejev, K.G.; Karbushev, N.I.; Lisitsyn, A.I. High-Power Particle Beams, 1990 8th International Conference on, 1990
Hybrid plasma slowing structures are offered for utilization in electron UHF devices. Advantages of such devices in comparison with vacuum and purely plasma those are discussed and the estimation of conditions providing the achievement of hybrid properties in them is carried out.
Gruzman, I.S.; Karpushin, V.B. Electronic Instrument Engineering, 2008. APEIE 2008. 9th International Conference on Actual Problems of, 2008
Algorithms and program for automatic comparing trace images are considered. Usually trace images have two types of structure: traces left by identified instruments (anisotropic structure) and isotropic background. To compare anisotropic images the topography of the cutting edge of the instrument is used.
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