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Spectroscopy is the study of the interaction between matter and radiated energy. (Wikipedia.org)

Conferences related to Spectroscopy

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2020 IEEE International Conference on Plasma Science (ICOPS)

IEEE International Conference on Plasma Science (ICOPS) is an annual conference coordinated by the Plasma Science and Application Committee (PSAC) of the IEEE Nuclear & Plasma Sciences Society.

2019 20th International Conference on Solid-State Sensors, Actuators and Microsystems & Eurosensors XXXIII (TRANSDUCERS & EUROSENSORS XXXIII)

The world's premiere conference in MEMS sensors, actuators and integrated micro and nano systems welcomes you to attend this four-day event showcasing major technological, scientific and commercial breakthroughs in mechanical, optical, chemical and biological devices and systems using micro and nanotechnology.The major areas of activity in the development of Transducers solicited and expected at this conference include but are not limited to: Bio, Medical, Chemical, and Micro Total Analysis Systems Fabrication and Packaging Mechanical and Physical Sensors Materials and Characterization Design, Simulation and Theory Actuators Optical MEMS RF MEMS Nanotechnology Energy and Power

2019 41st Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)

The conference program will consist of plenary lectures, symposia, workshops andinvitedsessions of the latest significant findings and developments in all the major fields ofbiomedical engineering.Submitted papers will be peer reviewed. Accepted high quality paperswill be presented in oral and postersessions, will appear in the Conference Proceedings and willbe indexed in PubMed/MEDLINE & IEEE Xplore

2019 44th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)

Science, technology and applications spanning the millimeter-waves, terahertz and infrared spectral regions

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)

Photovoltaic materials, devices, systems and related science and technology

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Periodicals related to Spectroscopy

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Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission

Biomedical Circuits and Systems, IEEE Transactions on

The Transactions on Biomedical Circuits and Systems addresses areas at the crossroads of Circuits and Systems and Life Sciences. The main emphasis is on microelectronic issues in a wide range of applications found in life sciences, physical sciences and engineering. The primary goal of the journal is to bridge the unique scientific and technical activities of the Circuits and Systems ...

Computing in Science & Engineering

Physics, medicine, astronomy—these and other hard sciences share a common need for efficient algorithms, system software, and computer architecture to address large computational problems. And yet, useful advances in computational techniques that could benefit many researchers are rarely shared. To meet that need, Computing in Science & Engineering (CiSE) presents scientific and computational contributions in a clear and accessible format. ...

Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...

Dielectrics and Electrical Insulation, IEEE Transactions on

Electrical insulation common to the design and construction of components and equipment for use in electric and electronic circuits and distribution systems at all frequencies.

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Most published Xplore authors for Spectroscopy

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Xplore Articles related to Spectroscopy

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Properties of bulk polycrystalline CVD diamond

[{u'author_order': 1, u'affiliation': u'De Beers Ind. Diamond Div., Ascot, UK', u'authorUrl': u'https://ieeexplore.ieee.org/author/37320653700', u'full_name': u'R.S. Sussmann', u'id': 37320653700}, {u'author_order': 2, u'affiliation': u'De Beers Ind. Diamond Div., Ascot, UK', u'authorUrl': u'https://ieeexplore.ieee.org/author/37390205000', u'full_name': u'C.J.H. Wort', u'id': 37390205000}, {u'author_order': 3, u'affiliation': u'De Beers Ind. Diamond Div., Ascot, UK', u'authorUrl': u'https://ieeexplore.ieee.org/author/37390204400', u'full_name': u'C.G. Sweeney', u'id': 37390204400}, {u'author_order': 4, u'affiliation': u'De Beers Ind. Diamond Div., Ascot, UK', u'authorUrl': u'https://ieeexplore.ieee.org/author/37390205600', u'full_name': u'G.A. Scarsbrook', u'id': 37390205600}, {u'author_order': 5, u'affiliation': u'De Beers Ind. Diamond Div., Ascot, UK', u'authorUrl': u'https://ieeexplore.ieee.org/author/37385466400', u'full_name': u'T.J. Valentine', u'id': 37385466400}, {u'author_order': 6, u'affiliation': u'De Beers Ind. Diamond Div., Ascot, UK', u'authorUrl': u'https://ieeexplore.ieee.org/author/37281571000', u'full_name': u'A.J. Whitehead', u'id': 37281571000}] IEE Colloquium on Diamond in Electronics and Optics, 1993

Considerable progress has been made in recent years on the synthesis of diamond by chemical vapour deposition (CVD) leading to substantial improvements in material quality and rate of synthesis. As a result it has been possible to manufacture relatively thick plates of free-standing bulk polycrystalline CVD diamond removing many of the limitations of thin-film coatings. This exploit has promoted CVD ...

The studies of thin film coatings on the surface of porous silicon

[{u'author_order': 1, u'affiliation': u'Phys. Dept., Lviv State Univ., Ukraine', u'authorUrl': u'https://ieeexplore.ieee.org/author/37372776500', u'full_name': u'P.V. Galiy', u'id': 37372776500}, {u'author_order': 2, u'authorUrl': u'https://ieeexplore.ieee.org/author/37372776300', u'full_name': u'L.S. Monastyrskii', u'id': 37372776300}, {u'author_order': 3, u'authorUrl': u'https://ieeexplore.ieee.org/author/37372776600', u'full_name': u'T.M. Nenchuk', u'id': 37372776600}, {u'author_order': 4, u'authorUrl': u'https://ieeexplore.ieee.org/author/37372775900', u'full_name': u'J.V. Boyko', u'id': 37372775900}, {u'author_order': 5, u'authorUrl': u'https://ieeexplore.ieee.org/author/37372775700', u'full_name': u'I.O. Rudyi', u'id': 37372775700}] Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382), 1998

Summary form only given. The complex of surface and subsurface sensitive methods: Auger electron spectroscopy (AES), thermostimulated exoelectron emission (TSEE), mass-spectrometry (MS), ellipsometry and low-frequency dielectric spectroscopy (LFDS) have been applied to investigation of the thin films' coatings, which play a significant role in photo- (PL) and electroluminescence (EL) of por-Si/Si heterostructures.

Improvement of charge-to-breakdown distribution by fluorine incorporation into thin gate oxides

[{u'author_order': 1, u'affiliation': u'Adv. LSI Technol. Lab., Toshiba Corp., Yokohama, Japan', u'authorUrl': u'https://ieeexplore.ieee.org/author/37279797900', u'full_name': u'Y. Mitani', u'id': 37279797900}, {u'author_order': 2, u'affiliation': u'Adv. LSI Technol. Lab., Toshiba Corp., Yokohama, Japan', u'authorUrl': u'https://ieeexplore.ieee.org/author/37268324100', u'full_name': u'H. Satake', u'id': 37268324100}, {u'author_order': 3, u'affiliation': u'Adv. LSI Technol. Lab., Toshiba Corp., Yokohama, Japan', u'authorUrl': u'https://ieeexplore.ieee.org/author/37264977200', u'full_name': u'Y. Nakasaki', u'id': 37264977200}, {u'author_order': 4, u'authorUrl': u'https://ieeexplore.ieee.org/author/37282577000', u'full_name': u'A. Toriumi', u'id': 37282577000}] IEEE Transactions on Electron Devices, 2003

This paper reports on the effect of fluorine incorporation on gate-oxide reliability, especially the spatial distribution of charge-to-breakdown (Q/sub BD/). Fluorine atoms were implanted into gate electrodes and introduced into gate-oxide films by annealing. Excess fluorine incorporation increased the oxide thickness and degraded not only the reliability of Si/SiO/sub 2/ interfaces but also dielectric-breakdown immunity. However, it was found, for ...

Corrections to “High Performance Quantum Cascade Lasers Grown by Metal-Organic Vapor Phase Epitaxy and Their Applications to Trace Gas Sensing” [Nov 08 3534-3555]

[{u'author_order': 1, u'full_name': u'M. Troccoli'}, {u'author_order': 2, u'full_name': u'L. Diehl'}, {u'author_order': 3, u'full_name': u'D. P. Bour'}, {u'author_order': 4, u'full_name': u'S. W. Corzine'}, {u'author_order': 5, u'full_name': u'N. Yu'}, {u'author_order': 6, u'full_name': u'C. Y. Wang'}, {u'author_order': 7, u'full_name': u'M. A. Belkin'}, {u'author_order': 8, u'full_name': u'G. Hofler'}, {u'author_order': 9, u'full_name': u'R. Lewicki'}, {u'author_order': 10, u'full_name': u'G. Wysocki'}, {u'author_order': 11, u'full_name': u'F. K. Tittel'}, {u'author_order': 12, u'full_name': u'F. Capasso'}] Journal of Lightwave Technology, 2010

For the above titled paper (ibid., vol. 26, no. 21, pp. 3534-3555, Nov. 08), there are some additional comments that are presented here.

Destruction of isotopically labeled nitric oxide (/sup 15/N/sup 18/O) in air by corona discharge: kinetics and products of destruction

[{u'author_order': 1, u'affiliation': u'Dept. of Chem. Eng., Chem. & Environ. Sci., New Jersey Inst. of Technol., Newark, NJ, USA', u'authorUrl': u'https://ieeexplore.ieee.org/author/37442753900', u'full_name': u'L.G. Krishtopa', u'id': 37442753900}, {u'author_order': 2, u'authorUrl': u'https://ieeexplore.ieee.org/author/37442753500', u'full_name': u'L.N. Krasnoperov', u'id': 37442753500}] IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th IEEE International Conference (Cat. No.99CH36297), 1999

Summary form only given, as follows. Destruction of isotopically labeled nitric oxide (/sup 15/N/sup 18/O) in air by corona discharge was studied using tubular-flow, coaxial wire, AC-powered dielectric barrier corona discharge reactor coupled with on-line quadrupole mass spectrometer. The kinetics and products of the destruction were determined as functions of specific discharge energy. There has been no direct confirmation of ...

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Educational Resources on Spectroscopy

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No eLearning Articles are currently tagged "Spectroscopy"


  • Surface and Interface Analysis

    This chapter contains sections titled: * Surface and Interface Techniques * Excited Electron Spectroscopies * Principles of Surface Sensitivity * Surface Analytic and Processing Chambers * Summary

  • Electron Energy Loss Spectroscopy

    This chapter contains sections titled: * Overview * Dielectric Response Theory * Surface Phonon Scattering * Bulk and Surface Plasmon Scattering * Interface Electronic Transitions * Atomic-Scale Electron Energy Loss Spectroscopy * Summary

  • Rutherford Backscattering Spectrometry

    This chapter contains sections titled: * Overview * Theory of Rutherford Backscattering * Depth Profiling * Channeling and Blocking * Interface Studies * Summary

  • Technologies for Discovering Protein Interactions

    This chapter contains sections titled: * Introduction * Techniques Investigating Physical Interactions * Technologies Investigating Kinetic Dynamics * Summary

  • Ultrafast Time‐Resolved Spectroscopy

    This chapter contains sections titled:Introduction to Ultrafast SpectroscopyDegenerate Pump–Probe Transmission MeasurementsNondegenerate and Spectrally Resolved Pump–Probe: Case StudiesBasic Quantum Mechanics for Coherent Short‐Pulse SpectroscopiesWave PacketsDephasing PhenomenaImpulsive Stimulated Raman ScatteringProblems

  • Optical Spectroscopies

    This chapter contains sections titled: * Overview * Optical Absorption * Modulation Techniques * Multiple Surface Interaction Techniques * Spectroscopic Ellipsometry * Surface-Enhanced Raman Spectroscopy * Surface Photoconductivity * Surface Photovoltage Spectroscopy * Summary

  • Photoemission with Soft X-Rays

    This chapter contains sections titled: * Soft X-Ray Spectroscopy Techniques * Synchrotron Radiation Sources * Soft X-Ray Photoemission Spectroscopy * Related Soft X-Ray Techniques * Summary

  • Particle-Solid Scattering

    This chapter contains sections titled: * Overview * Scattering Cross Section * Electron Beam Spectroscopies * Auger Electron Spectroscopy * Auger Depth Profiling * Summary

  • Secondary Ion Mass Spectrometry

    This chapter contains sections titled: * Overview * Principles * SIMS Equipment * Secondary Ion Yields * Imaging * Dynamic SIMS * Organic and Biological Species * Summary

  • Photoemission Spectroscopy

    This chapter contains sections titled: * The Photoelectric Effect * The Optical Excitation Process * Photoionization Cross Section * Density of States * Experimental Spectrum * Experimental Energy Distribution Curves * Measured Photoionization Cross Sections * Principles of X-Ray Photoelectron Spectroscopy * Excitation Sources * Electron Energy Analyzers * Summary