Sensitivity analysis

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Sensitivity analysis (SA) is the study of how the variation (uncertainty) in the output of a statistical model can be attributed to different variations in the inputs of the model. (Wikipedia.org)






Conferences related to Sensitivity analysis

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2019 20th International Conference on Solid-State Sensors, Actuators and Microsystems & Eurosensors XXXIII (TRANSDUCERS & EUROSENSORS XXXIII)

The world's premiere conference in MEMS sensors, actuators and integrated micro and nano systems welcomes you to attend this four-day event showcasing major technological, scientific and commercial breakthroughs in mechanical, optical, chemical and biological devices and systems using micro and nanotechnology.The major areas of activity in the development of Transducers solicited and expected at this conference include but are not limited to: Bio, Medical, Chemical, and Micro Total Analysis Systems Fabrication and Packaging Mechanical and Physical Sensors Materials and Characterization Design, Simulation and Theory Actuators Optical MEMS RF MEMS Nanotechnology Energy and Power


2019 IEEE International Electric Machines & Drives Conference (IEMDC)

The IEEE International Electric Machines and Drives Conference (IEMDC) has been established to be one of the major events in the field of electrical machines and drives. IEMDC is a refernce forum to disseminate and exchange state of art in the filed of the Electrical Machines and Drives. The 2018 edition started in 1997 and the 2019 edition will be 11th one.


2018 25th IEEE International Conference on Image Processing (ICIP)

The International Conference on Image Processing (ICIP), sponsored by the IEEE Signal Processing Society, is the premier forum for the presentation of technological advances and research results in the fields of theoretical, experimental, and applied image and video processing. ICIP 2018, the 25th in the series that has been held annually since 1994, brings together leading engineers and scientists in image and video processing from around the world.


2018 40th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)

The conference program will consist of plenary lectures, symposia, workshops and invitedsessions of the latest significant findings and developments in all the major fields of biomedical engineering.Submitted papers will be peer reviewed. Accepted high quality papers will be presented in oral and postersessions, will appear in the Conference Proceedings and will be indexed in PubMed/MEDLINE


2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz2018)

Covering terahertz, far infrared and millimeter wave science, technology and applications


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Periodicals related to Sensitivity analysis

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Advanced Packaging, IEEE Transactions on

The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Broadcasting, IEEE Transactions on

Broadcast technology, including devices, equipment, techniques, and systems related to broadcast technology, including the production, distribution, transmission, and propagation aspects.


Circuits and Systems I: Regular Papers, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


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Most published Xplore authors for Sensitivity analysis

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Xplore Articles related to Sensitivity analysis

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Sensitivity analysis of similarity metrices for image matching

[{u'author_order': 1, u'affiliation': u'Dept. of Electr. Eng., Texas Univ., Arlington, TX, USA', u'full_name': u'R. Malla'}, {u'author_order': 2, u'affiliation': u'Dept. of Electr. Eng., Texas Univ., Arlington, TX, USA', u'full_name': u'V. Devarajan'}] Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation, 1994

This paper presents simulation results on the performance of similarity metrices for image matching. Specifically, matching and determining the transformation between slightly rotated images are addressed. The use of a correlation function and an error function as similarity metrices is reexamined when there is a coupling between translation and rotation. Sensitivity of these two metrices in the above context is ...


A sensitivity-driven parametric electromagnetic design environment

[{u'author_order': 1, u'affiliation': u'Electr. & Comput. Eng. Dept., McGill Univ., Montreal, Que., Canada', u'full_name': u'P.J. Weicker'}, {u'author_order': 2, u'affiliation': u'Electr. & Comput. Eng. Dept., McGill Univ., Montreal, Que., Canada', u'full_name': u'D.A. Lowther'}] IEEE Transactions on Magnetics, 2006

The paper describes a design environment for electromagnetic devices and systems which links the concepts of variational geometry with sensitivity analysis. The goal is to allow a designer to explore a potential set of solutions to a design problem which has been posed through a rough, parameterized geometric sketch of the desired device


Advanced fault analysis techniques on AES

[{u'author_order': 1, u'affiliation': u'Department of Informatics, The Univ. of Electro-Communications, Tokyo 182-8585, Japan', u'full_name': u'Kazuo Sakiyama'}, {u'author_order': 2, u'affiliation': u'Department of Informatics, The Univ. of Electro-Communications, Tokyo 182-8585, Japan', u'full_name': u'Takanori Machida'}, {u'author_order': 3, u'affiliation': u'Department of Informatics, The Univ. of Electro-Communications, Tokyo 182-8585, Japan', u'full_name': u'Arisa Matsubara'}] 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC), 2015

Fault analysis research on symmetric-key cipher has been intensively discussed since differential fault analysis (DFA) was proposed in 1997. Output masking for wrong ciphertexts was believed to be the most effective countermeasure of the DFA attacks. However, fault sensitive analysis (FSA), proposed in 2010, can bypass the output-masking countermeasure. Both DFA and FSA require a strict fault injection control with ...


Comparison of effectiveness of Current Ratio and Delta-I/sub DDQ/ tests

[{u'author_order': 1, u'affiliation': u'Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA', u'full_name': u'S.S. Sabade'}, {u'author_order': 2, u'affiliation': u'Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA', u'full_name': u'D.M.H. Walker'}] 17th International Conference on VLSI Design. Proceedings., 2004

I/sub DDQ/ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. Current two test methods that promise to extend the life of I/sub DDQ/ test are Current Ratio and Delta-I/sub DDQ/. Although several studies have been reported on these methods, their effectiveness in detecting defects ...


Sensitivity analysis of region landslide vegetation factor based on the remote sensing and geography information system

[{u'author_order': 1, u'affiliation': u'Department of Prospecting Techniques, Shijiazhuang University of Economics, China', u'full_name': u'Hongyang Cao'}, {u'author_order': 2, u'affiliation': u'Department of Prospecting Techniques, Shijiazhuang University of Economics, China', u'full_name': u'Yingjiao Xu'}, {u'author_order': 3, u'affiliation': u'Department of Civil Engineering and Architecture, Zhongyuan University of Technology, Zhengzhou, China', u'full_name': u'Yadong Bian'}] 2011 International Conference on Remote Sensing, Environment and Transportation Engineering, 2011

Influence factors sensitivity analysis is a key problem for region landslide field, vegetation coverage is an important one of all factors. The type of vegetation coverage was classified by remote sensing supervised classification technology, and landslides were interpreted by the three dimension image of remote sensing. The internal relation between landslides and the type of vegetation coverage was revealed by ...


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Educational Resources on Sensitivity analysis

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No eLearning Articles are currently tagged "Sensitivity analysis"

IEEE.tv Videos

IMS 2012 Microapps - Improve Microwave Circuit Design Flow Through Passive Model Yield and Sensitivity Analysis
95uW 802.11g/n compliant fully-integrated wake-up receiver with -72dBm sensitivity in 14nm FinFET CMOS: RFIC Industry Showcase 2017
IMS 2011 Microapps - A Practical Approach to Verifying RFICs with Fast Mismatch Analysis
IMS MicroApps: Multi-Rate Harmonic Balance Analysis
Robotics History: Narratives and Networks Oral Histories: Petar Kokotovic
IMS 2011 Microapps - Yield Analysis During EM Simulation
IMS 2011 Microapps - Tools for Creating FET and MMIC Thermal Profiles
Zohara Cohen AMA EMBS Individualized Health
A Flexible Testbed for 5G Waveform Generation and Analysis: MicroApps 2015 - Keysight Technologies
Spectrum Analysis: RF Boot Camp
Surgical Robotics: Analysis and Control Architecture for Semiautonomous Robotic Surgery
IMS 2012 Microapps - Generation and Analysis Techniques for Cost-efficient SATCOM Measurements Richard Overdorf, Agilent
IMS 2011 Microapps - Remcom's XFdtd and Wireless InSite: Advanced Tools for Advanced Communication Systems Analysis
IMS 2011 Microapps - STAN Tool: A New Method for Linear and Nonlinear Stability Analysis of Microwave Circuits
Network Analysis: RF Boot Camp
Micro-Apps 2013: Power Added Efficiency (PAE) Analysis with 8990B Peak Power Analyzer
Brooklyn 5G Summit 2014: Dr. Robert Heath on Coverage and Capacity Analysis of Dense Millimeter Wave Cellular System
MicroApps: New Technologies and Techniques for Wideband Analysis (Agilent Technologies)
Receiver Design and Analysis: RF Boot Camp
Nanoscale Magnetism with Picosecond Time Resolution and High Sensitivity - Hendrik Ohldag - IEEE Magnetics Distinguished Lecture

IEEE-USA E-Books

  • Advanced Circuit Simulation using Multisim Workbench

    Multisim is now the de facto standard for circuit simulation. It is a SPICE- based circuit simulator which combines analog, discrete-time, and mixed-mode circuits. In addition, it is the only simulator which incorporates microcontroller simulation in the same environment. It also includes a tool for printed circuit board design. Advanced Circuit Simulation Using Multisim Workbench is a companion book to Circuit Analysis Using Multisim, published by Morgan & Claypool in 2011. This new book covers advanced analyses and the creation of models and subcircuits. It also includes coverage of transmission lines, the special elements which are used to connect components in PCBs and integrated circuits. Finally, it includes a description of Ultiboard, the tool for PCB creation from a circuit description in Multisim. Both books completely cover most of the important features available for a successful circuit simulation with Multisim. Table of Contents: Models and Subcircuits / Transmission Lines / Other Types of Analyses / Simulating Microcontrollers / PCB Design With Ultiboard

  • Stochastic Partial Differential Equations for Computer Vision with Uncertain Data

    <p>In image processing and computer vision applications such as medical or scientific image data analysis, as well as in industrial scenarios, images are used as input measurement data. It is good scientific practice that proper measurements must be equipped with error and uncertainty estimates. For many applications, not only the measured values but also their errors and uncertainties, should be—and more and more frequently are—taken into account for further processing. This error and uncertainty propagation must be done for every processing step such that the final result comes with a reliable precision estimate.</p> <p>The goal of this book is to introduce the reader to the recent advances from the field of uncertainty quantification and error propagation for computer vision, image processing, and image analysis that are based on partial differential equations (PDEs). It presents a concept with which error propagation and sensitivity analysis can be formulated with a set of basic operations. The approach discussed in this book has the potential for application in all areas of quantitative computer vision, image processing, and image analysis. In particular, it might help medical imaging finally become a scientific discipline that is characterized by the classical paradigms of observation, measurement, and error awareness.</p> <p>This book is comprised of eight chapters. After an introduction to the goals of the book (Chapter 1), we present a brief review of PDEs and their numerical treatment (Chapter 2), PDE-based image processing (Chapter 3), and the numerics of stochastic PDEs (Chapter 4). We then proceed to define the concept of stochastic images (Chapter 5), describe how to accomplish image processing and computer vision with stochastic images (Chapter 6), and demonstrate the use of these principles for accomplishing sensitivity analysis (Chapter 7). Chapter 8 concludes the book and highlights new research topics for the future.</p>

  • LSP METHOD

    The evaluation process can be denoted as professional if the evaluated systems have substantial complexity and require professional domain expertise to specify the structure and parameters of Logic Scoring of Preference (LSP) evaluation criteria. Elementary attribute criteria generate attribute suitability scores for all attributes of an evaluated object. The chapter focuses on strategic decision, techniques, and tools that are necessary in the process of professional development of complex LSP criteria and their aggregation structures. Two basic processes that are used for tuning and justification of complex criteria are sensitivity analysis and tradeoff analysis. The chapter presents basic design rules for logic aggregation structures used in LSP criteria. It also presents the optimum pricing problem where the cost/suitability analysis is performed from both the buyer's and seller's standpoint. The chapter provides a short summary of existing software, and an outline of the LSP method. The LSP software technology is designed to support different categories of users.

  • Fundamentals of Engineering Economics and Decision Analysis

    The authors cover two general topics: basic engineering economics and risk analysis in this text. Within the topic of engineering economics are discussions on the time value of money and interest relationships. These interest relationships are used to define certain project criteria that are used by engineers and project managers to select the best economic choice among several alternatives. Projects examined will include both income- and service-producing investments. The effects of escalation, inflation, and taxes on the economic analysis of alternatives are discussed. Risk analysis incorporates the concepts of probability and statistics in the evaluation of alternatives. This allows management to determine the probability of success or failure of the project. Two types of sensitivity analyses are presented. The first is referred to as the range approach while the second uses probabilistic concepts to determine a measure of the risk involved. The authors have designed the text to assist individuals to prepare to successfully complete the economics portions of the Fundamentals of Engineering Exam. Table of Contents: Introduction / Interest and the Time Value of Money / Project Evaluation Methods / Service Producing Investments / Income Producing Investments / Determination of Project Cash Flow / Financial Leverage / Basic Statistics and Probability / Sensitivity Analysis

  • Strategic Cost Fundamentals: for Designers, Engineers, Technologists, Estimators, Project Managers, and Financial Analysts

    This book is designed to introduce designers, engineers, technologists, estimators, project managers, and financial analysts as well as students in engineering and business to strategic cost tools for project cost evaluations. The three main sections are as follows. (1) Cost Relationships, Financial Statements, and Performance Measures—This section describes the relationships between cash flows and profits; the relationships between financial statements and the Purcell Diagram; and the issues of cost estimating, time-based breakeven analysis and time-based earned schedule. (2) Tools for Economic Evaluations—This section considers the basic mathematical relations used behind the economic equations and factors; discrete and continuous interest; depreciation terms and methods; and the Present Value of Principal Approach for evaluating loans. (3) Methods for Project Evaluation and Risk Analysis—This section considers payback periods, present worth analysis, return on investment, internal rate of return, benefit/cost ratios and positive-negative project balances; risk techniques of sensitivity analysis, optimistic-pessimistic analysis, discrete probability examples, and continuous probability models using the normal and triangular distributions.

  • Critical considerations and improvements to the short-time gaussian plume models

    This chapter contains sections titled: A sensitivity analysis of the multiple- source gaussian plume urban diffusion model, Amendments relating to the basic gaussian short-time models, The gaussian plume model combined with street- canyon or highway submodules, References

  • Practical Considerations and Design Examples

    This chapter aims to bridge the gap between theory and practical realization of microwave filters and multiplexing networks. It provides examples that cover system considerations and tradeoffs in the development of specifications for filter networks. The chapter addresses the constraints imposed by the operating environment, technology limitations, and manufacturing tolerances. These constraints are captured by invoking the concept of equivalent linear frequency drift (ELFD). The chapter also provides examples that deal with filter design and synthesis techniques. It describes simple examples to help understand the design methodology of the two most widely used multiplexers, the circulator‐coupled configuration and the manifold coupled design. The chapter explains examples related to high‐power requirements for filters and multiplexers in space and terrestrial environment. It concludes with an overview of electromagnetic (EM)‐based tolerance and sensitivity analysis in filter design.

  • Internet Telephony in the Corporation

    This chapter contains section titled: Corporate Internet Telephony, Results, Sensitivity Analysis, Economic and Policy Implications, Conclusions, Notes

  • Computers and Modeling

    This chapter contains sections titled: The Art of Modeling, Types of Models, Analogue Simulations and Scale Models, Computer Simulation, Techniques of Modeling, Sensitivity Analysis, Models, Computers, and Planning, Systems, Modeling and Process, Postscript, Editors' Postscript

  • Phase 3: Evaluating and Choosing Flexible Designs

    This chapter contains sections titled: Evaluation of Individual Projects, Choosing Between Target Curves, Multidimensional Comparison of Projects, Validation by Sensitivity Analysis, Example Application: Development of a Deep-Water Oil Field, Take Away



Standards related to Sensitivity analysis

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(Replaced) IEEE Standard VHDL Language Reference Manual

his standard revises and enhances the VHDL language reference manual (LRM) by including a standard C language interface specification; specifications from previously separate, but related, standards IEEE Std 1164 -1993,1 IEEE Std 1076.2 -1996, and IEEE Std 1076.3-1997; and general language enhancements in the areas of design and verification of electronic systems.



Jobs related to Sensitivity analysis

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