Sensitivity analysis

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Sensitivity analysis (SA) is the study of how the variation (uncertainty) in the output of a statistical model can be attributed to different variations in the inputs of the model. (Wikipedia.org)






Conferences related to Sensitivity analysis

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2017 IEEE/MTT-S International Microwave Symposium - IMS 2017

The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2029 IEEE/MTT-S International Microwave Symposium - MTT 2029

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2021 IEEE/MTT-S International Microwave Symposium - IMS 2021

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2019 IEEE/MTT-S International Microwave Symposium - MTT 2019

    Comprehensive symposium on microwave theory and techniques including active and passive circuit components, theory and microwave systems.

  • 2018 IEEE/MTT-S International Microwave Symposium - MTT 2018

    Microwave theory and techniques, RF/microwave/millimeter-wave/terahertz circuit design and fabrication technology, radio/wireless communication.

  • 2016 IEEE/MTT-S International Microwave Symposium - IMS 2016

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2015 IEEE/MTT-S International Microwave Symposium - MTT 2015

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics. The IMS includes technical sessions, both oral and interactive, worksh

  • 2014 IEEE/MTT-S International Microwave Symposium - MTT 2014

    IMS2014 will cover developments in microwave technology from nano devices to system applications. Technical paper sessions, interactive forums, plenary and panel sessions, workshops, short courses, industrial exhibits, and a wide array of other technical activities will be offered.

  • 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter -wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2011 IEEE/MTT-S International Microwave Symposium - MTT 2011

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010

    Reports of research and development at the state-of-the-art of the theory and techniques related to the technology and applications of devices, components, circuits, modules and systems in the RF, microwave, millimeter-wave, submillimeter-wave and Terahertz ranges of the electromagnetic spectrum.

  • 2009 IEEE/MTT-S International Microwave Symposium - MTT 2009

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.


2014 IEEE International Symposium on Circuits and Systems (ISCAS)

The IEEE International Symposium on Circuits and Systems (ISCAS) is the flagship conference of the IEEE Circuits and Systems Society and the world

  • 2013 IEEE International Symposium on Circuits and Systems (ISCAS)

    The Symposium will focus on circuits and systems employing nanodevices (both extremely scaled CMOS and non-CMOS devices) and circuit fabrics (mixture of standard CMOS and evolving nano-structure elements) and their implementation cost, switching speed, energy efficiency, and reliability. The ISCAS 2010 will include oral and poster sessions; tutorials given by experts in state-of-the-art topics; and special sessions, with the aim of complementing the regular program with topics of particular interest to the community that cut across and beyond disciplines traditionally represented at ISCAS.

  • 2012 IEEE International Symposium on Circuits and Systems - ISCAS 2012

    2012 International Symposium on Circuits and Systems (ISCAS 2012) aims at providing the world's premier forum of leading researchers in circuits and systems areas from academia and industries, especially focusing on Convergence of BINET (BioInfoNanoEnviro Tech.) which represents IT, NT and ET and leading Human Life Revolutions. Prospective authors are invited to submit papers of their original works emphasizing contributions beyond the present state of the art. We also welcome proposals on special tuto

  • 2011 IEEE International Symposium on Circuits and Systems (ISCAS)

    The IEEE International Symposium on Circuits and Systems (ISCAS) is the world's premier networking forum of leading researchers in the highly active fields of theory, design and implementation of circuits and systems.

  • 2010 IEEE International Symposium on Circuits and Systems - ISCAS 2010

    ISCAS is a unique conference dealing with circuits and systems. It's the yearly "rendez-vous" of leading researchers, coming both from academia and industry, in the highly active fields of theory, design and implementation of circuits and systems. The Symposium will focus on circuits and systems for high quality life and consumer technologies, including mobile communications, advanced multimedia systems, sensor networks and Nano-Bio Circuit Fabrics and Systems.

  • 2009 IEEE International Symposium on Circuits and Systems - ISCAS 2009

    Analog Signal Processing, Biomedical Circuits and Systems, Blind Signal Processing, Cellular Neural Networks and Array Computing, Circuits and Systems for Communications, Computer-Aided Network Design, Digital Signal Processing, Life-Science Systems and Applications, Multimedia Systems and Applications, Nanoelectronics and Gigascale Systems, Neural Systems and Applications, Nonlinear Circuits and Applications, Power Systems and Power Electronic Circuits, Sensory Systems, Visual Signal Processing and Communi

  • 2008 IEEE International Symposium on Circuits and Systems - ISCAS 2008

  • 2007 IEEE International Symposium on Circuits and Systems - ISCAS 2007

  • 2006 IEEE International Symposium on Circuits and Systems - ISCAS 2006


2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013)

EPTC aims to provide a good coverage of technological developments in allareas of electronic packaging from design to manufacturing and operation. It is a major forum for theexchange of knowledge and provides opportunities to network and meet leading experts in the field.


2012 Chinese Control Conference (CCC)

The Chinese Control Conference (CCC) is an annual international conference organized by the Technical Committee on Control Theory (TCCT), Chinese Association of Automation (CAA). It provides a forum for scientists and engineers over the world to present their new theoretical results and techniques in the field of systems and control. The conference consists of pre-conference workshops, plenary talks, panel discussions, invited sessions, oral sessions and poster sessions etc. for academic exchanges.

  • 2011 30th Chinese Control Conference (CCC)

    Systems and Control

  • 2010 29th Chinese Control Conference (CCC)

    S1 System Theory and Control Theory S2 Nonlinear Systems and Control S3 Complexity and Complex System Theory S4 Distributed Parameter Systems S5 Stability and Stabilization S6 Large Scale Systems S7 Stochastic Systems S8 System Modeling and System Identification S9 DEDS and Hybrid Systems S10 Optimal Control S11 Optimization and Scheduling S12 Robust Control S13 Adaptive Control and Learning Control S14 Variable Structure Control S15 Neural


2012 International Symposium on Signals, Systems and Electronics (ISSSE)

Electronics for Communications; Circuits & Systems; Wireless, Optical and Cable-based Systems; Devices and Techniques for RF, Microwaves and Millimeter-waves, Baseband Circuits and Photonics; Radar Techniques and Applications.

  • 2010 International Symposium on Signals, Systems and Electronics (ISSSE)

    Technical papers in any area of interest to the URSI Commissions C and D will be considered. Broadly-defined topics include (but not limited to)Electronics for Communications, Sensing and Control, Circuits & Systems; DSP and SDR; Wireless, Optical and Cable-based Systems; Devices and Techniques for RF, Microwaves and Millimetre-waves, Baseband Circuits and Photonics; Radar Techniques and Applications; Circuit and System Simulation; Coding, Channel, Modulation, Detection Strategies; Smart Antennas/MIMO Te

  • 2007 International Symposium on Signals, Systems and Electronics (ISSSE '07)

    Electronics for Communications, Sensing and Control, Circuits & Systems; DSP and SDR; Wireless, Optical and Cable-based Systems; Devices and Techniques for RF, Microwaves and Millimetre-waves, Baseband Circuits and Photonics; Radar Techniques and Applications; Circuit and System Stimulation; Coding, Channel, Modulation, Detection Strategies; Smart Antennas/MIMO Techniques, Electronic System Partitioning & Interface; Networks & Signals; Numerical and CAD Techniques


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Periodicals related to Sensitivity analysis

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Circuits and Systems I: Regular Papers, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Medical Imaging, IEEE Transactions on

Imaging methods applied to living organisms with emphasis on innovative approaches that use emerging technologies supported by rigorous physical and mathematical analysis and quantitative evaluation of performance.


Microwave Theory and Techniques, IEEE Transactions on

Microwave theory, techniques, and applications as they relate to components, devices, circuits, and systems involving the generation, transmission, and detection of microwaves.


Reliability, IEEE Transactions on

Principles and practices of reliability, maintainability, and product liability pertaining to electrical and electronic equipment.



Most published Xplore authors for Sensitivity analysis

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Xplore Articles related to Sensitivity analysis

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Design of an interdigitated microelectrode biosensor using a-SiC:H surface to capture E. coli

José Herrera-Celis; Claudia Reyes-Betanzo; Abdu Orduña-Díaz 2015 30th Symposium on Microelectronics Technology and Devices (SBMicro), 2015

This work proposes an interdigitated microelectrode biosensor (IMB), which includes hydrogenated amorphous silicon carbide (a-SiC:H) as surface to be functionalized. Accordingly, two a-SiC:H films are included, one on top of SiO2, and another on top of microelectrodes. The design along with the medium were simulated on CoventorWare® software, taking into account that the IMB proposed will be for the detection ...


Sensitivity analysis of the nodal position in the adaptive refinement of finite element meshes

G. Henneberger; G. Meunier; J. C. Sabonnadiere; P. K. Sattler; D. Shen IEEE Transactions on Magnetics, 1990

A sensitivity analysis has been used to determine the energy perturbation of the nodal position in a finite-element mesh. The sensitivity of the nodal position gives the refinement indication and can therefore be used in the adaptive procedure. This method provides an alternative approach to adaptive mesh generation and is illustrated by numerical examples


Calibration of the interferometric X-SAR system on SRTM

M. Zink; D. Geudtner Geoscience and Remote Sensing Symposium, 1999. IGARSS '99 Proceedings. IEEE 1999 International, 1999

The authors present the interferometric calibration of the X-SAR system on SRTM. From a height sensitivity analysis they identify key system parameters influencing the height reconstruction performance. Possible error sources in the radar instrument and the geometry determination are discussed. They outline the methods for calibrating the electronics and the geometric parameters and present first results of simulations


Planarization by transformation

M. van Lier; R. Otten IEEE Transactions on Circuit Theory, 1973

A new approach to star-polygon transformations is introduced. For star- connectedR-networks and for a certain class of polygon-connectedR-networks the "terminal value" is defined. This concept allows for an elegant derivation of the necessary and sufficient conditions for the existence of a polygon-into- star transformation. The related formulas appear to be simple and easy to remember. More important, the terminal value ...


Sensitivity Analysis of Industrial Multicrystalline PERC Silicon Solar Cells by Means of 3-D Device Simulation and Metamodeling

Matthias Müller; Pietro P. Altermatt; Hannes Wagner; Gerd Fischer IEEE Journal of Photovoltaics, 2014

How successfully an improved solar cell concept is transferred to mass production depends not only on the realized cell efficiency, but crucially on the stability of the fabrication process, i.e., on the distribution of the current-voltage (I-V) parameters. To model such distributions, we use three- dimensional (3-D) full-size device simulations of passivated emitter and rear cells (PERCs). The number of ...


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Educational Resources on Sensitivity analysis

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eLearning

Design of an interdigitated microelectrode biosensor using a-SiC:H surface to capture E. coli

José Herrera-Celis; Claudia Reyes-Betanzo; Abdu Orduña-Díaz 2015 30th Symposium on Microelectronics Technology and Devices (SBMicro), 2015

This work proposes an interdigitated microelectrode biosensor (IMB), which includes hydrogenated amorphous silicon carbide (a-SiC:H) as surface to be functionalized. Accordingly, two a-SiC:H films are included, one on top of SiO2, and another on top of microelectrodes. The design along with the medium were simulated on CoventorWare® software, taking into account that the IMB proposed will be for the detection ...


Sensitivity analysis of the nodal position in the adaptive refinement of finite element meshes

G. Henneberger; G. Meunier; J. C. Sabonnadiere; P. K. Sattler; D. Shen IEEE Transactions on Magnetics, 1990

A sensitivity analysis has been used to determine the energy perturbation of the nodal position in a finite-element mesh. The sensitivity of the nodal position gives the refinement indication and can therefore be used in the adaptive procedure. This method provides an alternative approach to adaptive mesh generation and is illustrated by numerical examples


Calibration of the interferometric X-SAR system on SRTM

M. Zink; D. Geudtner Geoscience and Remote Sensing Symposium, 1999. IGARSS '99 Proceedings. IEEE 1999 International, 1999

The authors present the interferometric calibration of the X-SAR system on SRTM. From a height sensitivity analysis they identify key system parameters influencing the height reconstruction performance. Possible error sources in the radar instrument and the geometry determination are discussed. They outline the methods for calibrating the electronics and the geometric parameters and present first results of simulations


Planarization by transformation

M. van Lier; R. Otten IEEE Transactions on Circuit Theory, 1973

A new approach to star-polygon transformations is introduced. For star- connectedR-networks and for a certain class of polygon-connectedR-networks the "terminal value" is defined. This concept allows for an elegant derivation of the necessary and sufficient conditions for the existence of a polygon-into- star transformation. The related formulas appear to be simple and easy to remember. More important, the terminal value ...


Sensitivity Analysis of Industrial Multicrystalline PERC Silicon Solar Cells by Means of 3-D Device Simulation and Metamodeling

Matthias Müller; Pietro P. Altermatt; Hannes Wagner; Gerd Fischer IEEE Journal of Photovoltaics, 2014

How successfully an improved solar cell concept is transferred to mass production depends not only on the realized cell efficiency, but crucially on the stability of the fabrication process, i.e., on the distribution of the current-voltage (I-V) parameters. To model such distributions, we use three- dimensional (3-D) full-size device simulations of passivated emitter and rear cells (PERCs). The number of ...


More eLearning Resources

IEEE.tv Videos

IMS 2012 Microapps - Improve Microwave Circuit Design Flow Through Passive Model Yield and Sensitivity Analysis
95uW 802.11g/n compliant fully-integrated wake-up receiver with -72dBm sensitivity in 14nm FinFET CMOS: RFIC Industry Showcase 2017
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IMS 2012 Microapps - Generation and Analysis Techniques for Cost-efficient SATCOM Measurements Richard Overdorf, Agilent
A Flexible Testbed for 5G Waveform Generation and Analysis: MicroApps 2015 - Keysight Technologies
Micro-Apps 2013: Power Added Efficiency (PAE) Analysis with 8990B Peak Power Analyzer
IMS 2011 Microapps - STAN Tool: A New Method for Linear and Nonlinear Stability Analysis of Microwave Circuits
Brooklyn 5G Summit 2014: Dr. Robert Heath on Coverage and Capacity Analysis of Dense Millimeter Wave Cellular System
IMS 2011 Microapps - Remcom's XFdtd and Wireless InSite: Advanced Tools for Advanced Communication Systems Analysis
Network Analysis: RF Boot Camp
MicroApps: New Technologies and Techniques for Wideband Analysis (Agilent Technologies)
Why Power Supplies Fail: A Real World Analysis - David Hill at APEC 2016
Receiver Design and Analysis: RF Boot Camp

IEEE-USA E-Books

  • Monte Carlo Simulation Models

    Monte Carlo simulation is a powerful technique used to characterize a range of system behavior based on assumed probability distributions of parameters associated with a model. Monte Carlo simulation has been applied to a wide range of problems, including financial predication. In terms of reliability modeling, we combine the probability distributions for many reliability parameters of interest in our model to predict the range of possible system availability and the likelihood of each outcome. These data is plotted for visual analysis. Based on these data, we can determine the likelihood of the minimum availability requirement of our system being met. Sensitivity analysis shows us which parameters have the most impact on system availability. With this information, we can focus our design activities on optimizing/ improving system behavior by improving the reliability of this parameter or minimizing their impacts. Time-based Monte Carlo simulation shows us when outages are most likely to occur on average given a large number of systems being simulated. A comparison of tools and simulation techniques helps us determine the benefit and limitations of each technique.

  • Application of FTA to Real-Life Example

    This chapter provides a case study of Fault Tree Analysis (FTA) for a telecommunications project. We note a variety of factors could cause a system outage - including events outside the system itself, such as environmental or security issues. We examine one important aspect of system failure - call processing failure and identified issues or faults that could result in this failure. A good approach is to initially capture the fault tree in a modeling tool, such as Relex, and then transfer these data and relationships to a spreadsheet for easier manipulation. We identify the high risk nodes and used (Design of Experiments) DOE and Monte Carlo Analysis to determine the impact of these nodes on the system. This simulation results show how likely it is the system would achieve its five 9s availability requirement. The sensitivity analysis showed which failures have the largest impact on the system. Armed with this information, the design team can focus on the components that have the biggest impact on availability. By addressing these items, we greatly improve the probability of meeting our availability requirements.

  • No title

    The authors cover two general topics: basic engineering economics and risk analysis in this text. Within the topic of engineering economics are discussions on the time value of money and interest relationships. These interest relationships are used to define certain project criteria that are used by engineers and project managers to select the best economic choice among several alternatives. Projects examined will include both income- and service-producing investments. The effects of escalation, inflation, and taxes on the economic analysis of alternatives are discussed. Risk analysis incorporates the concepts of probability and statistics in the evaluation of alternatives. This allows management to determine the probability of success or failure of the project. Two types of sensitivity analyses are presented. The first is referred to as the range approach while the second uses probabilistic concepts to determine a measure of the risk involved. The authors have designed the text to as ist individuals to prepare to successfully complete the economics portions of the Fundamentals of Engineering Exam. Table of Contents: Introduction / Interest and the Time Value of Money / Project Evaluation Methods / Service Producing Investments / Income Producing Investments / Determination of Project Cash Flow / Financial Leverage / Basic Statistics and Probability / Sensitivity Analysis

  • Complex High Availability System Analysis

    This chapter applies many techniques we have explored in this chapter to a more complicated but practical system architecture frequently employed in the telecommunications industry. We consider a variety of techniques - including Markov analysis, Monte Carlo simulation, fault tree analysis, sensitivity analysis, and Matlab simulation. We see firsthand how state space explosion in Markov analysis can occur. Although with a variety of tools available, extracting information from the model is not difficult, understanding all of the possible interactions becomes increasingly difficult with state space explosion. We see that many of these interactions are either insignificant or nonexistence. By partitioning and/or simplifying the model, we lose little but gain valuable information on the system behavior and how we might improve it. We compare both the more complex models and the simplified models to show this. With the approach to solving complex analysis problems provided in this chapter, as well as the many other techniques for solving reliability problems and improving reliability explored in this text, the reliability analyst will be able to successfully tackle a wide variety of reliability analysis and design problems. These techniques applied optimally will help contribute to the improvement of the reliability of the systems and products the analyst encounters.

  • No title

    <p>In image processing and computer vision applications such as medical or scientific image data analysis, as well as in industrial scenarios, images are used as input measurement data. It is good scientific practice that proper measurements must be equipped with error and uncertainty estimates. For many applications, not only the measured values but also their errors and uncertainties, should be--and more and more frequently are--taken into account for further processing. This error and uncertainty propagation must be done for every processing step such that the final result comes with a reliable precision estimate.</p> <p>The goal of this book is to introduce the reader to the recent advances from the field of uncertainty quantification and error propagation for computer vision, image processing, and image analysis that are based on partial differential equations (PDEs). It presents a concept with which error propagation and sensitivity analysis can be formulated with a set of basic operations. The approach discussed in this book has the potential for application in all areas of quantitative computer vision, image processing, and image analysis. In particular, it might help medical imaging finally become a scientific discipline that is characterized by the classical paradigms of observation, measurement, and error awareness.</p> <p>This book is comprised of eight chapters. After an introduction to the goals of the book (Chapter 1), we present a brief review of PDEs and their numerical treatment (Chapter 2), PDE-based image processing (Chapter 3), and the numerics of stochastic PDEs (Chapter 4). We then proceed to define the concept of stochastic images (Chapter 5), describe how to accomplish image processing and computer vision with stochastic images (Chapter 6), and demonstrate the use of these principles for accomplishing sensitivity analysis (Chapter 7). Chapter 8 concludes the book and highlights new resea ch topics for the future.</p>

  • Automation of IC Layout with Analog Constraints

    A methodology for the automatic synthesis of fullcustom IC layout with analog constraints is presented. The methodology guarantees that all performance constraints are met when feasible, or otherwise, infeasibility is detected as soon as possible, thus providing a robust and efficient design environment In the proposed approach, performance specifications are translated into lower- level bounds on parasitics or geometric parameters, using sensitivity analysis. Bounds can be used by a set of specialized layout tools performing stack generation, placement, routing, and compaction. For each tool, a detailed description is provided of its functionality, of the way constraints are mapped and enforced, and of its impact on the design flow. Examples drawn from industrial applications are reported to illustrate the effectiveness of the approach.

  • Sensitivity Calculation

    This chapter contains sections titled: Introduction Loss Sensitivity Calculation Calculation of Constrained Shift Sensitivity Factors Perturbation Method for Sensitivity Analysis Voltage Sensitivity Analysis Real-Time Application of Sensitivity Factors Simulation Results Conclusion References

  • Simulation and Optimization of the Power Distribution Network in VLSI Circuits

    In this paper, we present simulation techniques to estimate the worst-case voltage variation using a RC model for the power distribution network. Pattern independent maximum envelope currents are used as a periodic input for performing the frequency-domain steady-state simulation of the linear RC circuit to evaluate the worst-case instantaneous voltage drop for the RC power distribution networks. The proposed technique unlike existing techniques, is guaranteed to give the maximum voltage drop at nodes in the RC power distribution network. We present experimental results to compare the frequency-domain and time-domain simulation techniques for estimating the maximum instantaneous voltage drop. We also present frequency-domain sensitivity-analysis based decoupling capacitance placement for reducing the voltage variation in the power distribution network. Experimental results on circuits extracted from layout are presented to validate the simulation and optimization techniques.

  • DC grid power flow control devices

    This chapter presents an overview of DC power flow control devices (DCPFCs) and the effects of DCPFCs on DC grids. There are mainly three types of DCPFCs to realize the flexible power flow control: DC transformers, variable series resistors (VSR), and series voltage sources (SVS). DC transformers are shunt connected devices, while VSR and SVS are series connected devices. The chapter describes the topologies of power flow control devices and provides generic modeling of DCPFCs for power flow calculation of DC grids and the sensitivity analysis. It presents some case studies using a five-terminal DC grid with these facilities and case tests to investigate effects of DCPFCs on a DC grid based on the CIGRE test system. The chapter also provides a comparison of DCPFCs. Comparisons of the three devices have been made in terms of the control flexibility, the power rating, and power losses.

  • Quantification of Technical, Economic, Environmental and Social Benefits of Microgrid Operation

    This chapter provides an overview of microgrid benefits in economic, technical, environmental and social aspects for a number of representative European Union member states. Each benefit item is mapped to the related stakeholder with dotted lines. The identification of microgrid benefits is a multi-objective and multi-stakeholder interest coordination task. Due to the comparatively large number of different assumptions that could impact microgrid benefits, a basic standard test condition (STC) is defined to evaluate microgrid benefits under a most likely to happen scenario. A section demonstrates sensitivity analysis with regard to preset conditions being performed to evaluate microgrid performance under various evaluation indices. The effects of market price variations and different pricing policies on the total economic benefit on the consumer side are shown.



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