Root mean square

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In mathematics, the root mean square (abbreviated RMS or rms), also known as the quadratic mean, is a statistical measure of the magnitude of a varying quantity. (Wikipedia.org)






Conferences related to Root mean square

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Oceans 2020 MTS/IEEE GULF COAST

To promote awareness, understanding, advancement and application of ocean engineering and marine technology. This includes all aspects of science, engineering, and technology that address research, development, and operations pertaining to all bodies of water. This includes the creation of new capabilities and technologies from concept design through prototypes, testing, and operational systems to sense, explore, understand, develop, use, and responsibly manage natural resources.

  • OCEANS 2018 MTS/IEEE Charleston

    Ocean, coastal, and atmospheric science and technology advances and applications

  • OCEANS 2017 - Anchorage

    Papers on ocean technology, exhibits from ocean equipment and service suppliers, student posters and student poster competition, tutorials on ocean technology, workshops and town meetings on policy and governmental process.

  • OCEANS 2016

    The Marine Technology Scociety and the Oceanic Engineering Society of the IEEE cosponor a joint annual conference and exposition on ocean science, engineering, and policy. The OCEANS conference covers four days. One day for tutorials and three for approx. 500 technical papers and 150 -200 exhibits.

  • OCEANS 2015

    The Marine Technology Scociety and the Oceanic Engineering Society of the IEEE cosponor a joint annual conference and exposition on ocean science, engineering, and policy. The OCEANS conference covers four days. One day for tutorials and three for approx. 450 technical papers and 150-200 exhibits.

  • OCEANS 2014

    The OCEANS conference covers four days. One day for tutorials and three for approx. 450 technical papers and 150-200 exhibits.

  • OCEANS 2013

    Three days of 8-10 tracks of technical sessions (400-450 papers) and concurent exhibition (150-250 exhibitors)

  • OCEANS 2012

    Ocean related technology. Tutorials and three days of technical sessions and exhibits. 8-12 parallel technical tracks.

  • OCEANS 2011

    The Marine Technology Society and the Oceanic Engineering Scociety of the IEEE cosponsor a joint annual conference and exposition on ocean science engineering, and policy.

  • OCEANS 2010

    The Marine Technology Society and the Oceanic Engineering Scociety of the IEEE cosponsor a joint annual conference and exposition on ocean science engineering, and policy.

  • OCEANS 2009

  • OCEANS 2008

    The Marine Technology Society (MTS) and the Oceanic Engineering Society (OES) of the Institute of Electrical and Electronic Engineers (IEEE) cosponsor a joint conference and exposition on ocean science, engineering, education, and policy. Held annually in the fall, it has become a focal point for the ocean and marine community to meet, learn, and exhibit products and services. The conference includes technical sessions, workshops, student poster sessions, job fairs, tutorials and a large exhibit.

  • OCEANS 2007

  • OCEANS 2006

  • OCEANS 2005

  • OCEANS 2004

  • OCEANS 2003

  • OCEANS 2002

  • OCEANS 2001

  • OCEANS 2000

  • OCEANS '99

  • OCEANS '98

  • OCEANS '97

  • OCEANS '96


2019 41st Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)

The conference program will consist of plenary lectures, symposia, workshops andinvitedsessions of the latest significant findings and developments in all the major fields ofbiomedical engineering.Submitted papers will be peer reviewed. Accepted high quality paperswill be presented in oral and postersessions, will appear in the Conference Proceedings and willbe indexed in PubMed/MEDLINE & IEEE Xplore


2019 56th ACM/IEEE Design Automation Conference (DAC)

EDA (Electronics Design Automation) is becoming ever more important with the continuous scaling of semiconductor devices and the growing complexities of their use in circuits and systems. Demands for lower-power, higher-reliability and more agile electronic systems raise new challenges to both design and design automation of such systems. For the past five decades, the primary focus of research track at DAC has been to showcase leading-edge research and practice in tools and methodologies for the design of circuits and systems.

  • 2022 59th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2021 58th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2020 57th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2018 55th ACM//IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC Description for TMRF The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading

  • 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 session on design methodologies and EDA tool developments, keynotes, panels, plus User Track presentations. A diverse worldwide community representing more than 1,000 organization attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers

  • 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference is the world s leading technical conference and tradeshow on electronic design and design automation. DAC is where the IC Design and EDA ecosystem learns, networks, and does business.

  • 2010 47th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers.

  • 2009 46th ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC is the premier event for the electronic design community. DAC offers the industry s most prestigious technical conference in combination with the biggest exhibition, bringing together design, design automation and manufacturing market influencers.

  • 2008 45th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 250 of the leading electronics design suppliers.

  • 2007 44th ACM/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier Electronic Design Automation (EDA) and silicon solution event. DAC features over 50 technical sessions covering the latest in design methodologies and EDA tool developments and an Exhibition and Demo Suite area with over 250 of the leading EDA, silicon and IP Providers.

  • 2006 43rd ACM/IEEE Design Automation Conference (DAC)

  • 2005 42nd ACM/IEEE Design Automation Conference (DAC)

  • 2004 41st ACM/IEEE Design Automation Conference (DAC)

  • 2003 40th ACM/IEEE Design Automation Conference (DAC)

  • 2002 39th ACM/IEEE Design Automation Conference (DAC)

  • 2001 38th ACM/IEEE Design Automation Conference (DAC)

  • 2000 37th ACM/IEEE Design Automation Conference (DAC)

  • 1999 36th ACM/IEEE Design Automation Conference (DAC)

  • 1998 35th ACM/IEEE Design Automation Conference (DAC)

  • 1997 34th ACM/IEEE Design Automation Conference (DAC)

  • 1996 33rd ACM/IEEE Design Automation Conference (DAC)


2019 IEEE 58th Conference on Decision and Control (CDC)

The CDC is recognized as the premier scientific and engineering conference dedicated to the advancement of the theory and practice of systems and control. The CDC annually brings together an international community of researchers and practitioners in the field of automatic control to discuss new research results, perspectives on future developments, and innovative applications relevant to decision making, systems and control, and related areas.The 58th CDC will feature contributed and invited papers, as well as workshops and may include tutorial sessions.The IEEE CDC is hosted by the IEEE Control Systems Society (CSS) in cooperation with the Society for Industrial and Applied Mathematics (SIAM), the Institute for Operations Research and the Management Sciences (INFORMS), the Japanese Society for Instrument and Control Engineers (SICE), and the European Union Control Association (EUCA).


2019 IEEE International Conference on Systems, Man and Cybernetics (SMC)

2019 IEEE International Conference on Systems, Man, and Cybernetics (SMC2019) will be held in the south of Europe in Bari, one of the most beautiful and historical cities in Italy. The Bari region’s nickname is “Little California” for its nice weather and Bari's cuisine is one of Italian most traditional , based of local seafood and olive oil. SMC2019 is the flagship conference of the IEEE Systems, Man, and Cybernetics Society. It provides an international forum for researchers and practitioners to report up-to-the-minute innovations and developments, summarize state­of-the-art, and exchange ideas and advances in all aspects of systems science and engineering, human machine systems and cybernetics. Advances have importance in the creation of intelligent environments involving technologies interacting with humans to provide an enriching experience, and thereby improve quality of life.


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Periodicals related to Root mean square

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Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Circuits and Systems II: Express Briefs, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


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Most published Xplore authors for Root mean square

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Xplore Articles related to Root mean square

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Eddy currents in large slot-wound conductors

[{u'author_order': 1, u'full_name': u'A. B. Field'}] Proceedings of the American Institute of Electrical Engineers, 1905

The object of the present paper is the discussion of the more important causes of eddy currents in heavy conductors carrying alternating currents and surrounded on three sides by iron.


Bayes Estimation of Reliability for Special k-out-of-m:G Systems

[{u'author_order': 1, u'affiliation': u'Institute of Applied Mathematics; National Tsing Hua University; Hsinchu, 300 TAIWAN.', u'authorUrl': u'https://ieeexplore.ieee.org/author/37717574900', u'full_name': u'Anne Chao', u'id': 37717574900}, {u'author_order': 2, u'affiliation': u'National Tsing Hua University, Hsinchu; Dept. of Mathematics; National Cheng-Kung University; Tainan 700, TAIWAN.', u'authorUrl': u'https://ieeexplore.ieee.org/author/37889385400', u'full_name': u'Wen-Dean Hwang', u'id': 37889385400}] IEEE Transactions on Reliability, 1983

Component lifetimes of a k-out-of-m: G system are s-independent and exponentially distributed. The Bayes-quadratic-loss estimator of reliability for the system is obtained using a conjugate (1-parameter case) or a noninformative (2-parameter case) prior when data are type-II censored. A simple approximation formula for the mean square error of the Bayes estimator is proposed. Based on the mean square-error criterion, the ...


On the Use of Phase Congruency to Evaluate Image Similarity

[{u'author_order': 1, u'affiliation': u'VIVA lab, School of Information Technology and Engineering (SITE), University of Ottawa, 800 King Edward, Ottawa, Ontario, K1N 6N5 Canada', u'authorUrl': u'https://ieeexplore.ieee.org/author/37274619300', u'full_name': u'Zheng Liu', u'id': 37274619300}, {u'author_order': 2, u'authorUrl': u'https://ieeexplore.ieee.org/author/37269576500', u'full_name': u'R. Laganiere', u'id': 37269576500}] 2006 IEEE International Conference on Acoustics Speech and Signal Processing Proceedings, 2006

Measuring image similarity is important in many applications. Different algorithms propose to compare images using pixel-based mean square error methods others use structure-based image quality index. We present, here, a new feature-based approach that utilizes image phase congruency measurement to quantify the assessment of the similarities or differences between two images


Mixed phase ARMA system identification by bispectrum: a group delay approach

[{u'author_order': 1, u'affiliation': u'Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, Que., Canada', u'authorUrl': u'https://ieeexplore.ieee.org/author/37414368300', u'full_name': u'S.V. Narasimhan', u'id': 37414368300}, {u'author_order': 2, u'affiliation': u'Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, Que., Canada', u'authorUrl': u'https://ieeexplore.ieee.org/author/38138531500', u'full_name': u'G.R. Reddy', u'id': 38138531500}, {u'author_order': 3, u'affiliation': u'Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, Que., Canada', u'authorUrl': u'https://ieeexplore.ieee.org/author/37282467700', u'full_name': u'E.I. Plotkin', u'id': 37282467700}, {u'author_order': 4, u'affiliation': u'Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, Que., Canada', u'authorUrl': u'https://ieeexplore.ieee.org/author/37274448600', u'full_name': u'M.N.S. Swamy', u'id': 37274448600}] [Proceedings] ICASSP 91: 1991 International Conference on Acoustics, Speech, and Signal Processing, 1991

A method of identification of a mixed-phase system (driven by a zero mean nonGaussian white noise) from its output, by an autoregressive moving-average (ARMA) model is proposed. This is achieved by relating the bispectrum phase and magnitude to the system group delay functions. The method uses only the bispectrum information and it is applicable for MA, AR, or ARMA systems ...


Performance Analysis of Signal-to-Noise Ratio Estimators in AWGN and Fading Channels

[{u'author_order': 1, u'affiliation': u'Department of Electrical/Communication Engineering and Computing, School of Engineering and Science, Curtin University of Technology, Miri, Malaysia. lenin@curtin.edu.my', u'authorUrl': u'https://ieeexplore.ieee.org/author/37395353500', u'full_name': u'Lenin Gopal', u'id': 37395353500}, {u'author_order': 2, u'affiliation': u'Faculty of Engineering, Multimedia University, Cyberjaya, Kuala Lumpur, Malaysia. mlsim@mmu.edu.my', u'authorUrl': u'https://ieeexplore.ieee.org/author/37326295900', u'full_name': u'Moh Lim Sim', u'id': 37326295900}] 2008 6th National Conference on Telecommunication Technologies and 2008 2nd Malaysia Conference on Photonics, 2008

Additive White Gaussian Noise (AWGN) and Rayleigh fading severely degrade the performance of the wireless communication systems. Most of the wireless communication systems require knowledge of the channel Signal-to-Noise ratio. In this paper a few methods are proposed to estimate the SNR in the presence of AWGN and Rayleigh fading. The mean square error (MSE) and root mean square error ...


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Educational Resources on Root mean square

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IEEE-USA E-Books

  • Alternating Current Circuits

    This chapter contains sections titled: * AC Voltage and Current Sources, Root Mean Square Values (RMS), and Power * Sinusoidal Steady State: Time and Frequency Domains * Time Domain Equations: Frequency Domain Impedance and Phasors * Power in AC Circuits * Dependent Voltage and Current Sources * Summary of Key Points * Further Reading * Problems

  • Collaborative Position Location

    This chapter describes collaborative position location, that is, position location techniques where the nodes to be localized collaborate to determine their positions. This is sometimes also called cooperative position location or network position location to distinguish it from traditional position location techniques which localize a single node. After a brief introduction and definition of the problem, the chapter examines two main bounds for collaborative positioning, namely, the Cramer‐Rao lower bound (CRLB) and the weighted least squares (LS) solution. Although the bounds are somewhat different, they both provide guidance as to the achievable performance. The chapter describes several suboptimal approaches and compares their performance in various network configurations. Non‐line‐of‐sight (NLOS) propagation is a prominent phenomenon for the position location applications. The chapter examines the impact of NLOS propagation and describes one particular technique to mitigate the effects of NLOS propagation.



Standards related to Root mean square

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IEEE Recommended Practice for Determining the Peak Spatial-Average Specific Absorption Rate (SAR) in the Human Head from Wireless Communications Devices: Measurement Techniques

To specify protocols for the measurement of the peak spatial-average specific absorption rate (SAR) in a simplified model of the head of users of hand-held radio transceivers used for personal wireless communications services and intended to be operated while held next to the ear. It applies to contemporary and future devices with the same or similar operational characteristics as contemporary ...


IEEE Standard for Safety Levels With Respect to Human Exposure to Electromagnetic Fields, 0-3 kHz

Develop safety levels for human exposure to electromagnetic fields from 0 to 3kHz. This standard will be based on the results of an evaluation of the relevant scientific literature and proven effects which are well established and for which thresholds of reaction are understood. Field limits will be derived from threshold current densities or internal electric fields.


IEEE Standard for Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields, 3 kHz to 300 GHz

Recommendations are made to protect against established adverse health effects in human beings associated with exposure to electric, magnetic and electromagnetic fields in the frequency range of 3 kHz to 300 GHz. The recommendations are expressed in terms of basic restrictions (BRs) and maximum permissible exposure (MPE) values. The BRs are limits on internal fields, specific absorption rate (SAR), and ...


IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers


Recommended Practice for Measurements and Computation of Electric, Magnetic and Electromagnetic Fields With Respect to Human Exposure to Such Fields, 0 - 100 kHz

This recommended practice describes 1) methods for measuring external electric and magnetic fields and contact currents to which persons may be exposed, 2) instrument characteristics and the methods for calibrating such instruments, and 3) methods for computation and the measurement of the resulting fields and currents that are induced in bodies of humans exposed to these fields. This recommended practice ...



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