Conferences related to Radioactive decay
Back to Top2020 IEEE International Conference on Plasma Science (ICOPS)
IEEE International Conference on Plasma Science (ICOPS) is an annual conference coordinated by the Plasma Science and Application Committee (PSAC) of the IEEE Nuclear & Plasma Sciences Society.
- 2021 IEEE International Conference on Plasma Science (ICOPS)
IEEE International Conference on Plasma Science (ICOPS) is an annual conference coordinated by the Plasma Science and Application Committee (PSAC) of the IEEE Nuclear & Plasma Sciences Society.
- 2018 IEEE International Conference on Plasma Science (ICOPS)
Plasma Science
- 2017 IEEE International Conference on Plasma Science (ICOPS)
The International Conference on Plasma Science (ICOPS) is an annual conference coordinatedby the Plasma Science and Application Committee (PSAC) of the IEEE Nuclear & PlasmaSciences Society. The program of the 43rd ICOPS covers both traditional areas of plasmascience and new areas of growth. The conference offers an outstanding forum for scientists andengineers to learn some of the greatest advances in plasma science and technology in recentyears and to discuss future directions.
- 2016 IEEE International Conference on Plasma Science (ICOPS)
The International Conference on Plasma Science (ICOPS) is an annual conference coordinated by the Plasma Science and Application Committee (PSAC) of the IEEE Nuclear & Plasma Sciences Society. The program of the 43rd ICOPS covers both traditional areas of plasma science and new areas of growth. The conference offers an outstanding forum for scientists and engineers to learn some of the greatest advances in plasma science and technology in recent years and to discuss future directions.
- 2015 IEEE International Conference on Plasma Sciences (ICOPS)
Basic Processes in Fully and Partially Ionized Plasmas; Microwave Generation and Plasma Interactions; Charged Particle Beams and Sources; High Energy Density Plasmas and Applications; Industrial, Commercial, and Medical Plasma Applications; Plasma Diagnostics; Pulsed Power and other Plasma Applications.
- 2014 IEEE 41st International Conference on Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS)
The International Conference on Plasma Science (ICOPS) is an annual conference coordinated by the Plasma Science and Application Committee (PSAC) of the IEEE Nuclear & Plasma Sciences Society. Promote physical understanding of neutral and non-neutral plasma physics, leading towards energy sources and applications.
- 2013 IEEE 40th International Conference on Plasma Sciences (ICOPS)
Combined conference of the IEEE International Conference on Plasma Science and the IEEE International Pulsed Power Conference
- 2012 IEEE 39th International Conference on Plasma Sciences (ICOPS)
Fully and partially ionized plasmas, microwave-plasma interaction, charged particle beams and sources; high energy density plasmas and applications, industrial and medical applications of plasmas; plasma diagnostics; pulsed power and other plasma applictions
- 2011 IEEE 38th International Conference on Plasma Sciences (ICOPS)
The ICOPS is the state of the art plasma science conference that covers all aspects of the general plasma science and its applications in various research fields.
- 2010 IEEE 37th International Conference on Plasma Sciences (ICOPS)
- 2009 IEEE 36th International Conference on Plasma Sciences (ICOPS)
The conference features an exciting technical program with reports from around the globe about new and innovative developments in the field of pulsed power, plasma science and engineering. Leading researchers gather to explore pulsed power plasmas, basic plasma physics, high-energy-density-plasmas, inertial confinement fusion, magnetic fusion, plasma diagnostics, microwave generation, lighting, micro and nano applications of plasmas, medical applications and plasma processing.
- 2008 IEEE 35th International Conference on Plasma Sciences (ICOPS)
The 35th IEEE International Conference on Plasma Science will feature an exciting technical program with reports from around the globe about new and innovative developments in the field of plasma science and engineering: 1. Basic processes in fully and partially ionized plasmas 2. Microwave generation and plasma interactions 3. Charged particle beams and sources 4. High energy density plasmas applications 5. Industrial, commercial and medical plasma applications 6. Plasma diagnostics 7. Pulsed power
- 2007 IEEE 34th International Conference on Plasma Science (ICOPS)
- 2006 IEEE 33rd International Conference on Plasma Sciences (ICOPS)
- 2005 IEEE 32nd International Conference on Plasma Sciences (ICOPS)
- 2004 IEEE 31st International Conference on Plasma Sciences (ICOPS)
- 2003 IEEE 30th International Conference on Plasma Sciences (ICOPS)
- 2002 IEEE 29th International Conference on Plasma Sciences (ICOPS)
- 2000 IEEE 27th International Conference on Plasma Sciences (ICOPS)
- 1999 IEEE 26th International Conference on Plasma Sciences (ICOPS)
- 1998 IEEE 25th International Conference on Plasma Sciences (ICOPS)
- 1997 IEEE 24th International Conference on Plasma Sciences (ICOPS)
- 1996 IEEE 23rd International Conference on Plasma Sciences (ICOPS)
2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe)
Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for smarter grid, energy efficiency,technologies for sustainable energy systems, converters and power supplies
- 2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe)
Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for smarter grid, energy efficiency,technologies for sustainable energy systems, converters and power supplies
- 2017 19th European Conference on Power Electronics and Applications (EPE'17 ECCE Europe)
Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for the smarter grid, energy efficiency, technologies for sustainable energy systems, converters and power supplies
- 2016 18th European Conference on Power Electronics and Applications (EPE'16 ECCE Europe)
Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for the smarter grid, energy efficiency, technologies for sustainable energy systems, converters and power supplies
- 2015 IEEE 17th European Conference on Power Electronics and Applications (EPE ECCE-Europe)
Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for the smarter grid, energy efficiency, technologies for sustainable energy systems, converters and power supplies
- 2014 16th European Conference on Power Electronics and Applications (EPE'14-ECCE Europe)
Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for the smarter grid, energy efficiency, energy efficient technologies for sustainable energy systems.
- 2013 15th European Conference on Power Electronics and Applications (EPE)
Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for the smarter grid, electric mobility, sustainable transportation systems
- 2011 14th European Conference on Power Electronics and Applications (EPE)
Energy conversion and conditioning technologies, power electronics and adjustable speed drives
- 2009 13th European Conference on Power Electronics and Applications (EPE)
Energy COnversion and conditioning technologies, power electronics and adjustable speed drives
- 2007 European Conference on Power Electronics and Applications (EPE)
- 2005 European Conference on Power Electronics and Applications (EPE)
2019 IEEE International Electron Devices Meeting (IEDM)
the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart -power technologies, etc.
- 2021 IEEE International Electron Devices Meeting (IEDM)
the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart -power technologies, etc.
- 2020 IEEE International Electron Devices Meeting (IEDM)
the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart -power technologies, etc.
- 2018 IEEE International Electron Devices Meeting (IEDM)
the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart -power technologies, etc.
- 2017 IEEE International Electron Devices Meeting (IEDM)
the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart -power technologies, etc.
- 2016 IEEE International Electron Devices Meeting (IEDM)
the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart -power technologies, etc.
- 2015 IEEE International Electron Devices Meeting (IEDM)
the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart-power technologies, etc.
- 2014 IEEE International Electron Devices Meeting (IEDM)
IEDM is the world s pre-eminent forum for reporting technological breakthroughs in the areas of semiconductor and electronic device technology, design, manufacturing, physics, and modeling. IEDM is the flagship conference for nanometer-scale CMOS transistor technology, advanced memory, displays, sensors, MEMS devices, novel quantum and nano-scale devices and phenomenology, optoelectronics, devices for power and energy harvesting, high-speed devices, as well as process technology and device modeling and simulation.
- 2013 IEEE International Electron Devices Meeting (IEDM)
IEDM is the world s pre-eminent forum for reporting technological breakthroughs in the areas of semiconductor and electronic device technology, design, manufacturing, physics, and modeling. IEDM is the flagship conference for nanometer-scale CMOS transistor technology, advanced memory, displays, sensors, MEMS devices, novel quantum and nano-scale devices and phenomenology, optoelectronics, devices for power and energy harvesting, high-speed devices, as well as process technology and device modeling and simulation.
- 2012 IEEE International Electron Devices Meeting (IEDM)
- 2011 IEEE International Electron Devices Meeting (IEDM)
CMOS Devices Technology, Characterization, Reliability and Yield, Displays, sensors and displays, memory technology, modeling and simulation, process technology, solid state and nanoelectronic devices.
- 2010 IEEE International Electron Devices Meeting (IEDM)
- 2009 IEEE International Electron Devices Meeting (IEDM)
CMOS Devices Technology, Characterization, REliability and Yield, Displays, sensors and displays, memory technology, modeling and simulation, process technology, solid state and nanoelectronic devices
- 2008 IEEE International Electron Devices Meeting (IEDM)
Over the last 53 years, the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart-power technologies, etc.
- 2007 IEEE International Electron Devices Meeting (IEDM)
- 2006 IEEE International Electron Devices Meeting (IEDM)
- 2005 IEEE International Electron Devices Meeting (IEDM)
- 2004 IEEE International Electron Devices Meeting (IEDM)
- 2003 IEEE International Electron Devices Meeting (IEDM)
- 2002 IEEE International Electron Devices Meeting (IEDM)
- 2001 IEEE International Electron Devices Meeting (IEDM)
- 2000 IEEE International Electron Devices Meeting (IEDM)
- 1999 IEEE International Electron Devices Meeting (IEDM)
- 1998 IEEE International Electron Devices Meeting (IEDM)
- 1997 IEEE International Electron Devices Meeting (IEDM)
- 1996 IEEE International Electron Devices Meeting (IEDM)
2019 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
This conference is the annual premier meeting on the use of instrumentation in the Nuclear and Medical fields. The meeting has a very long history of providing an exciting venue for scientists to present their latest advances, exchange ideas, renew existing collaboration and form new ones. The NSS portion of the conference is an ideal forum for scientists and engineers in the field of Nuclear Science, radiation instrumentation, software engineering and data acquisition. The MIC is one of the most informative venues on the state-of-the art use of physics, engineering, and mathematics in Nuclear Medicine and related imaging modalities, such as CT and increasingly so MRI, through the development of hybrid devices
- 2020 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
All areas of ionizing radiation detection - detectors, signal processing, analysis of results, PET development, PET results, medical imaging using ionizing radiation
- 2018 IEEE Nuclear Science Symposium and Medical Imaging Conference (NISS/MIC)
The use of radiation detectors in physics, industry, and medical imaging
- 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
Detectors, data acquisition and data analysis in a wide variety of disciplines that use radiation devices, radioisotopes, and related technologies such as magnetic resonance and X-Ray CT.
- 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)
The NSS/MIC offers an outstanding opportunity for scientists and engineers interested in the fields of nuclear science, radiation detection, accelerators, high energy physics and astrophysics, and related software to present their latest developments and ideas. The scientific program provides a comprehensive review of the latest developments in technology and covers a wide range of applications from radiation and accelerator instrumentation, new detector materials, to complex detector systems for physical sciences, and advanced imaging systems for biological and medical research.
- 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
The scope of the conference is to present advancements in the field of nuclear science (detectors, electronics and algorithms) as applied to high energy and nuclear physics, as well as various imaging techniques used in Medicine. The conference fosters interactions between instrumentation research and 'end user' application expertise, thus highlighting interdisciplinary aspects of nuclear science.
- 2014 IEEE Nuclear Science Symposium and Medical Imaging Conference (2014 NSS/MIC)
The conference emphasizes the latest developments in technology and instrumentation and their implementation in experiments for space, accelerators, other radiation environments, homeland security, and Medical Imaging Sciences
- 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC)
Detectors, software, signal processing and systems for ionizing radiation. Medical imaging detector and system development for PET, SPECT and other imaging based on nuclear techniques.
- 2012 IEEE Nuclear Science Symposium and Medical Imaging Conference (2012 NSS/MIC)
Forum for exchange of scientist and engineers working Nuclear Physics and Medical Imaging in technology and instrumentation and their implementation in experiments for particle physics, space, accelerators and other applications of radiation detection such as the technological and mathematical aspects of radiotracer-based medical imaging and other areas of non-Nuclear Molecular Imaging technologies.
- 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference (2011 NSS/MIC)
Detectors, software, signal processing and systems for ionizing radiation. Medical imaging detector and system development for PET, SPECT and other imaging based on nuclear techniques.
- 2010 IEEE Nuclear Science Symposium and Medical Imaging Conference (2010 NSS/MIC)
Detectors, software, signal processing and systems for ionizing radiation. Medical imaging detector and system development for PET, SPECT and other imaging based on nuclear techniques.
- 2009 IEEE Nuclear Science Symposium and Medical Imaging Conference (2009 NSS/MIC)
Radiation Detectors and Instrumentation and their applications in Physics, Biology, Space,Material Science,Medical Physics, and Homeland Security
- 2008 IEEE Nuclear Science Symposium and Medical Imaging Conference (2008 NSS/MIC)
Detectors, software, signal processing and systems for ionizing radiation. Medical imaging detector and system development for PET, SPECT and other imaging based on nuclear techniques.
- 2007 IEEE Nuclear Science Symposium and Medical Imaging Conference (2007 NSS/MIC)
- 2006 IEEE Nuclear Science Symposium and Medical Imaging Conference (2006 NSS/MIC)
- 2005 IEEE Nuclear Science Symposium and Medical Imaging Conference (2005 NSS/MIC)
- 2004 IEEE Nuclear Science Symposium and Medical Imaging Conference (2004 NSS/MIC)
- 2003 IEEE Nuclear Science Symposium and Medical Imaging Conference (2003 NSS/MIC)
- 2002 IEEE Nuclear Science Symposium and Medical Imaging Conference (2002 NSS/MIC)
- 2001 IEEE Nuclear Science Symposium and Medical Imaging Conference (2001 NSS/MIC)
- 2000 IEEE Nuclear Science Symposium and Medical Imaging Conference (2000 NSS/MIC)
- 1999 IEEE Nuclear Science Symposium - NSS '99
- 1998 IEEE Nuclear Science Symposium - NSS '98
- 1997 IEEE Nuclear Science Symposium - NSS '97
- 1996 IEEE Nuclear Science Symposium - NSS '96
2019 IEEE SENSORS
The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state-of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors.
- 2018 IEEE SENSORS
The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their relatedfields. It brings together researchers, developers, and practitioners from diverse fields includinginternational scientists and engineers from academia, research institutes, and companies topresent and discuss the latest results in the general field of sensors.
- 2017 IEEE SENSORS
The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their relatedfields. It brings together researchers, developers, and practitioners from diverse fields includinginternational scientists and engineers from academia, research institutes, and companies topresent and discuss the latest results in the general field of sensors.
- 2016 IEEE Sensors
The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors.
- 2015 IEEE Sensors
The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fieldsincluding international scientists and engineers from academia, research institutes, and companies topresent and discuss the latest results in the general field of sensors.
- 2014 IEEE Sensors
The IEEE Sensors Conference is a forum for presentation, discussion, andexchange of state -of-the art information including the latest research and development in sensors andtheir related fields. It brings together researchers, developers, and practitioners from diverse fieldsincluding international scientists and engineers from academia, research institutes, and companies topresent and discuss the latest results in the general field of sensors.
- 2013 IEEE Sensors
The IEEE SENSORS Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors.
- 2012 IEEE Sensors
The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state-of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors.
- 2011 IEEE Sensors
The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state-of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors. IEEE SENSORS 2011 will include keynote addresses by eminen
- 2010 IEEE Sensors
The IEEE SENSORS 2010 Conference is a forum for state-of-the-art presentations on sensors and related topics covering from theory to application, device to system, modeling to implementation and from macro/nano to scale.
- 2009 IEEE Sensors
IEEE Sensors Conference 2009 is intended to provide a common forum for researchers, scientists, engineers and practitioners throughout the world to present their latest research findings, ideas, developments and applications in the area of sensors and sensing technology. IEEE Sensors Conference 2009 will include keynote addresses by eminent scientists as well as special, regular and poster sessions.
- 2008 IEEE Sensors
IEEE SENSORS 2008 solicits original and state-of-the-art contributions to sensors and related topics, covering from theory to application, from device to system, from modeling to implementation, and from macro to micro/nano in scale. Topics of interest include,but are not limitid to: Phenomena, Modeling, and Evaluation (Novel Sensing Principles, Theory and Modeling, Sensors Characterization, Evaluation and Testing, Data Handling and Mining) Chemical and Gas Sensors (Materials, Devices, Electronics N
- 2007 IEEE Sensors
IEEE SENSORS 2007 solicits original and state-of-the-art contributions to sensors and related topics, covering from theory to application, from device to system, from modeling to implementation, and from macro to micro/nano in scale.
- 2006 IEEE Sensors
- 2005 IEEE Sensors
- 2004 IEEE Sensors
- 2003 IEEE Sensors
- 2002 IEEE Sensors
Periodicals related to Radioactive decay
Back to TopAntennas and Propagation, IEEE Transactions on
Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.
Applied Superconductivity, IEEE Transactions on
Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission
Computing in Science & Engineering
Physics, medicine, astronomy—these and other hard sciences share a common need for efficient algorithms, system software, and computer architecture to address large computational problems. And yet, useful advances in computational techniques that could benefit many researchers are rarely shared. To meet that need, Computing in Science & Engineering (CiSE) presents scientific and computational contributions in a clear and accessible format. ...
Electron Device Letters, IEEE
Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.
Electron Devices, IEEE Transactions on
Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.
More Periodicals Xplore Articles related to Radioactive decay
Back to TopInfluence Of The Radioactivity Of Thorium On The Starting Of Metal Halide Lamps
[{u'author_order': 1, u'affiliation': u'GTE Electrical Products', u'full_name': u'S.R. Hunter'}] IEEE Conference Record - Abstracts. 1991 IEEE International Conference on Plasma Science, 1991
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Positron emission tomographic images and expectation maximization: a VLSI architecture for multiple iterations per second
[{u'author_order': 1, u'affiliation': u'Comput. Technol. & Imaging Inc., Knoxville, TN, USA', u'authorUrl': u'https://ieeexplore.ieee.org/author/37268574300', u'full_name': u'W.F. Jones', u'id': 37268574300}, {u'author_order': 2, u'affiliation': u'Comput. Technol. & Imaging Inc., Knoxville, TN, USA', u'authorUrl': u'https://ieeexplore.ieee.org/author/37268271400', u'full_name': u'L.G. Byars', u'id': 37268271400}, {u'author_order': 3, u'affiliation': u'Comput. Technol. & Imaging Inc., Knoxville, TN, USA', u'authorUrl': u'https://ieeexplore.ieee.org/author/37268412600', u'full_name': u'M.E. Casey', u'id': 37268412600}] IEEE Transactions on Nuclear Science, 1988
A digital electronic architecture for parallel processing of the expectation maximization (EM) algorithm for positron-emission-tomography (PET) image reconstruction is proposed. Rapid (0.2-s) EM iterations on high-resolution (256*256) images are supported. Arrays of two VLSI chips perform forward and back projection calculations. The architecture is described, including data flow and partitioning relevant to EM and parallel processing. EM images are shown ...
A Novel Feature Selection Method and its Application on the Heart SPECT Standard Data
[{u'author_order': 1, u'authorUrl': u'https://ieeexplore.ieee.org/author/38096547900', u'full_name': u'Azadeh Sadooghi', u'id': 38096547900}, {u'author_order': 2, u'authorUrl': u'https://ieeexplore.ieee.org/author/37856864800', u'full_name': u'Mohammad Mikaili', u'id': 37856864800}] 2008 2nd International Conference on Bioinformatics and Biomedical Engineering, 2008
Feature selection is used for finding a feature subset that has the most discriminative information from the original feature set. Large number of features often includes many garbage features. We propose a novel feature selection method on the basis of the estimation of Bayes discrimination boundary. The experimental results on heart single proton emission computed tomography (SPECT) data shows the ...
A four-layer depth of interaction detector block for small animal PET
[{u'author_order': 1, u'affiliation': u'Graduate Sch. of Sci. & Technol., Chiba Univ., Japan', u'authorUrl': u'https://ieeexplore.ieee.org/author/37268930900', u'full_name': u'T. Tsuda', u'id': 37268930900}, {u'author_order': 2, u'authorUrl': u'https://ieeexplore.ieee.org/author/37268465800', u'full_name': u'H. Murayama', u'id': 37268465800}, {u'author_order': 3, u'authorUrl': u'https://ieeexplore.ieee.org/author/37276925700', u'full_name': u'K. Kitamura', u'id': 37276925700}, {u'author_order': 4, u'authorUrl': u'https://ieeexplore.ieee.org/author/37268458200', u'full_name': u'T. Yamaya', u'id': 37268458200}, {u'author_order': 5, u'authorUrl': u'https://ieeexplore.ieee.org/author/37268456200', u'full_name': u'E. Yoshida', u'id': 37268456200}, {u'author_order': 6, u'authorUrl': u'https://ieeexplore.ieee.org/author/37268461200', u'full_name': u'T. Omura', u'id': 37268461200}, {u'author_order': 7, u'authorUrl': u'https://ieeexplore.ieee.org/author/37278090500', u'full_name': u'H. Kawai', u'id': 37278090500}, {u'author_order': 8, u'authorUrl': u'https://ieeexplore.ieee.org/author/37268459900', u'full_name': u'N. Inadama', u'id': 37268459900}, {u'author_order': 9, u'authorUrl': u'https://ieeexplore.ieee.org/author/37268477900', u'full_name': u'N. Orita', u'id': 37268477900}] 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515), 2003
We are now planning to develop a positron emission tomograph dedicated to small animals such as rats and mice which meets the demand for higher sensitivity. We propose a new depth of interaction (DOI) detector arrangement to obtain DOI information by using a four-layer detector with all the same crystal elements. In this DOI detector, we control the behavior of ...
Modeling soft-error susceptibility for IP blocks
[{u'author_order': 1, u'affiliation': u'Div. of Phys. IP, ARM, Sunnyvale, CA, USA', u'authorUrl': u'https://ieeexplore.ieee.org/author/37280157800', u'full_name': u'R. Aitken', u'id': 37280157800}, {u'author_order': 2, u'affiliation': u'Div. of Phys. IP, ARM, Sunnyvale, CA, USA', u'authorUrl': u'https://ieeexplore.ieee.org/author/37662271200', u'full_name': u'B. Hold', u'id': 37662271200}] 11th IEEE International On-Line Testing Symposium, 2005
As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These "soft errors" can be a nuisance or catastrophic, depending on the application, but they must be understood and their effects budgeted for. Ultimately, experimental measurement is needed to quantify soft error rates, but after-the-fact measurement is too late to ...
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