Radioactive decay

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Radioactive decay is the process by which an atomic nucleus of an unstable atom loses energy by emitting ionizing particles. (Wikipedia.org)






Conferences related to Radioactive decay

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2020 IEEE International Conference on Plasma Science (ICOPS)

IEEE International Conference on Plasma Science (ICOPS) is an annual conference coordinated by the Plasma Science and Application Committee (PSAC) of the IEEE Nuclear & Plasma Sciences Society.


2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe)

Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for smarter grid, energy efficiency,technologies for sustainable energy systems, converters and power supplies


2019 IEEE International Electron Devices Meeting (IEDM)

the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart -power technologies, etc.


2019 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

This conference is the annual premier meeting on the use of instrumentation in the Nuclear and Medical fields. The meeting has a very long history of providing an exciting venue for scientists to present their latest advances, exchange ideas, renew existing collaboration and form new ones. The NSS portion of the conference is an ideal forum for scientists and engineers in the field of Nuclear Science, radiation instrumentation, software engineering and data acquisition. The MIC is one of the most informative venues on the state-of-the art use of physics, engineering, and mathematics in Nuclear Medicine and related imaging modalities, such as CT and increasingly so MRI, through the development of hybrid devices


2019 IEEE SENSORS

The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state-of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors.

  • 2018 IEEE SENSORS

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their relatedfields. It brings together researchers, developers, and practitioners from diverse fields includinginternational scientists and engineers from academia, research institutes, and companies topresent and discuss the latest results in the general field of sensors.

  • 2017 IEEE SENSORS

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their relatedfields. It brings together researchers, developers, and practitioners from diverse fields includinginternational scientists and engineers from academia, research institutes, and companies topresent and discuss the latest results in the general field of sensors.

  • 2016 IEEE Sensors

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors.

  • 2015 IEEE Sensors

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fieldsincluding international scientists and engineers from academia, research institutes, and companies topresent and discuss the latest results in the general field of sensors.

  • 2014 IEEE Sensors

    The IEEE Sensors Conference is a forum for presentation, discussion, andexchange of state -of-the art information including the latest research and development in sensors andtheir related fields. It brings together researchers, developers, and practitioners from diverse fieldsincluding international scientists and engineers from academia, research institutes, and companies topresent and discuss the latest results in the general field of sensors.

  • 2013 IEEE Sensors

    The IEEE SENSORS Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors.

  • 2012 IEEE Sensors

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state-of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors.

  • 2011 IEEE Sensors

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state-of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors. IEEE SENSORS 2011 will include keynote addresses by eminen

  • 2010 IEEE Sensors

    The IEEE SENSORS 2010 Conference is a forum for state-of-the-art presentations on sensors and related topics covering from theory to application, device to system, modeling to implementation and from macro/nano to scale.

  • 2009 IEEE Sensors

    IEEE Sensors Conference 2009 is intended to provide a common forum for researchers, scientists, engineers and practitioners throughout the world to present their latest research findings, ideas, developments and applications in the area of sensors and sensing technology. IEEE Sensors Conference 2009 will include keynote addresses by eminent scientists as well as special, regular and poster sessions.

  • 2008 IEEE Sensors

    IEEE SENSORS 2008 solicits original and state-of-the-art contributions to sensors and related topics, covering from theory to application, from device to system, from modeling to implementation, and from macro to micro/nano in scale. Topics of interest include,but are not limitid to: Phenomena, Modeling, and Evaluation (Novel Sensing Principles, Theory and Modeling, Sensors Characterization, Evaluation and Testing, Data Handling and Mining) Chemical and Gas Sensors (Materials, Devices, Electronics N

  • 2007 IEEE Sensors

    IEEE SENSORS 2007 solicits original and state-of-the-art contributions to sensors and related topics, covering from theory to application, from device to system, from modeling to implementation, and from macro to micro/nano in scale.

  • 2006 IEEE Sensors

  • 2005 IEEE Sensors

  • 2004 IEEE Sensors

  • 2003 IEEE Sensors

  • 2002 IEEE Sensors


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Periodicals related to Radioactive decay

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Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Computing in Science & Engineering

Physics, medicine, astronomy—these and other hard sciences share a common need for efficient algorithms, system software, and computer architecture to address large computational problems. And yet, useful advances in computational techniques that could benefit many researchers are rarely shared. To meet that need, Computing in Science & Engineering (CiSE) presents scientific and computational contributions in a clear and accessible format. ...


Electron Device Letters, IEEE

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Electron Devices, IEEE Transactions on

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


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Xplore Articles related to Radioactive decay

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Influence Of The Radioactivity Of Thorium On The Starting Of Metal Halide Lamps

[{u'author_order': 1, u'affiliation': u'GTE Electrical Products', u'full_name': u'S.R. Hunter'}] IEEE Conference Record - Abstracts. 1991 IEEE International Conference on Plasma Science, 1991

None


Positron emission tomographic images and expectation maximization: a VLSI architecture for multiple iterations per second

[{u'author_order': 1, u'affiliation': u'Comput. Technol. & Imaging Inc., Knoxville, TN, USA', u'authorUrl': u'https://ieeexplore.ieee.org/author/37268574300', u'full_name': u'W.F. Jones', u'id': 37268574300}, {u'author_order': 2, u'affiliation': u'Comput. Technol. & Imaging Inc., Knoxville, TN, USA', u'authorUrl': u'https://ieeexplore.ieee.org/author/37268271400', u'full_name': u'L.G. Byars', u'id': 37268271400}, {u'author_order': 3, u'affiliation': u'Comput. Technol. & Imaging Inc., Knoxville, TN, USA', u'authorUrl': u'https://ieeexplore.ieee.org/author/37268412600', u'full_name': u'M.E. Casey', u'id': 37268412600}] IEEE Transactions on Nuclear Science, 1988

A digital electronic architecture for parallel processing of the expectation maximization (EM) algorithm for positron-emission-tomography (PET) image reconstruction is proposed. Rapid (0.2-s) EM iterations on high-resolution (256*256) images are supported. Arrays of two VLSI chips perform forward and back projection calculations. The architecture is described, including data flow and partitioning relevant to EM and parallel processing. EM images are shown ...


A Novel Feature Selection Method and its Application on the Heart SPECT Standard Data

[{u'author_order': 1, u'authorUrl': u'https://ieeexplore.ieee.org/author/38096547900', u'full_name': u'Azadeh Sadooghi', u'id': 38096547900}, {u'author_order': 2, u'authorUrl': u'https://ieeexplore.ieee.org/author/37856864800', u'full_name': u'Mohammad Mikaili', u'id': 37856864800}] 2008 2nd International Conference on Bioinformatics and Biomedical Engineering, 2008

Feature selection is used for finding a feature subset that has the most discriminative information from the original feature set. Large number of features often includes many garbage features. We propose a novel feature selection method on the basis of the estimation of Bayes discrimination boundary. The experimental results on heart single proton emission computed tomography (SPECT) data shows the ...


A four-layer depth of interaction detector block for small animal PET

[{u'author_order': 1, u'affiliation': u'Graduate Sch. of Sci. & Technol., Chiba Univ., Japan', u'authorUrl': u'https://ieeexplore.ieee.org/author/37268930900', u'full_name': u'T. Tsuda', u'id': 37268930900}, {u'author_order': 2, u'authorUrl': u'https://ieeexplore.ieee.org/author/37268465800', u'full_name': u'H. Murayama', u'id': 37268465800}, {u'author_order': 3, u'authorUrl': u'https://ieeexplore.ieee.org/author/37276925700', u'full_name': u'K. Kitamura', u'id': 37276925700}, {u'author_order': 4, u'authorUrl': u'https://ieeexplore.ieee.org/author/37268458200', u'full_name': u'T. Yamaya', u'id': 37268458200}, {u'author_order': 5, u'authorUrl': u'https://ieeexplore.ieee.org/author/37268456200', u'full_name': u'E. Yoshida', u'id': 37268456200}, {u'author_order': 6, u'authorUrl': u'https://ieeexplore.ieee.org/author/37268461200', u'full_name': u'T. Omura', u'id': 37268461200}, {u'author_order': 7, u'authorUrl': u'https://ieeexplore.ieee.org/author/37278090500', u'full_name': u'H. Kawai', u'id': 37278090500}, {u'author_order': 8, u'authorUrl': u'https://ieeexplore.ieee.org/author/37268459900', u'full_name': u'N. Inadama', u'id': 37268459900}, {u'author_order': 9, u'authorUrl': u'https://ieeexplore.ieee.org/author/37268477900', u'full_name': u'N. Orita', u'id': 37268477900}] 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515), 2003

We are now planning to develop a positron emission tomograph dedicated to small animals such as rats and mice which meets the demand for higher sensitivity. We propose a new depth of interaction (DOI) detector arrangement to obtain DOI information by using a four-layer detector with all the same crystal elements. In this DOI detector, we control the behavior of ...


Modeling soft-error susceptibility for IP blocks

[{u'author_order': 1, u'affiliation': u'Div. of Phys. IP, ARM, Sunnyvale, CA, USA', u'authorUrl': u'https://ieeexplore.ieee.org/author/37280157800', u'full_name': u'R. Aitken', u'id': 37280157800}, {u'author_order': 2, u'affiliation': u'Div. of Phys. IP, ARM, Sunnyvale, CA, USA', u'authorUrl': u'https://ieeexplore.ieee.org/author/37662271200', u'full_name': u'B. Hold', u'id': 37662271200}] 11th IEEE International On-Line Testing Symposium, 2005

As device geometries continue to shrink, single event upsets are becoming of concern to a wider spectrum of system designers. These "soft errors" can be a nuisance or catastrophic, depending on the application, but they must be understood and their effects budgeted for. Ultimately, experimental measurement is needed to quantify soft error rates, but after-the-fact measurement is too late to ...


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