Conferences related to Protons

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2019 IEEE 15th International Conference on Automation Science and Engineering (CASE)

The conference is the primary forum for cross-industry and multidisciplinary research in automation. Its goal is to provide a broad coverage and dissemination of foundational research in automation among researchers, academics, and practitioners.


2019 IEEE Pulsed Power & Plasma Science (PPPS)

Combined conference of the IEEE International Conference on Plasma Science and the IEEE International Pulsed Power Conference


2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe)

Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for smarter grid, energy efficiency,technologies for sustainable energy systems, converters and power supplies


2018 7th Electronic System-Integration Technology Conference (ESTC)

This international event brings together both academic as well as the industry leaders to discuss and debate about the state-of-art and future trends in electronics packaging and integration technologies.


2018 9th International Particle Accelerator Conference (IPAC)

Topics cover a complete survey of the field of charged particle accelerator science and technology and infrastructure.


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Periodicals related to Protons

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Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Components and Packaging Technologies, IEEE Transactions on

Component parts, hybrid microelectronics, materials, packaging techniques, and manufacturing technology.


Dielectrics and Electrical Insulation, IEEE Transactions on

Electrical insulation common to the design and construction of components and equipment for use in electric and electronic circuits and distribution systems at all frequencies.


Electron Device Letters, IEEE

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


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Xplore Articles related to Protons

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A Comparison of K-, L-, and M-X-Rays Produced by Proton and Electron Excitation

[{u'author_order': 1, u'affiliation': u"St. Mary's University, One Camino Santa Maria, San Antonio, Texas 78284", u'full_name': u'Homer D. Fetzer'}, {u'author_order': 2, u'affiliation': u"St. Mary's University, One Camino Santa Maria, San Antonio, Texas 78284", u'full_name': u'Craig Kuebker'}, {u'author_order': 3, u'affiliation': u"St. Mary's University, One Camino Santa Maria, San Antonio, Texas 78284", u'full_name': u'Michael A. Heath'}, {u'author_order': 4, u'affiliation': u"St. Mary's University, One Camino Santa Maria, San Antonio, Texas 78284", u'full_name': u'Joseph T. Dodd'}] IEEE Transactions on Nuclear Science, 1979

Characteristic x-rays excited by protons and electrons having energies of 150 keV and less, were compared. Thick targets of Ti, Cr, Fe, Ni, Cu, and Zn were used to obtain K x-ray data; Zr, Mo, Ag, Cd, and In were used for L x-ray data; and Au, Pb, and U for M x-ray data. The number of K x-rays produced ...


L Subshell Ionization Cross Sections of Pr, Sm, Tb, Ho, and Yb for 150-400 KeV Protons

[{u'author_order': 1, u'affiliation': u'State University of New York College at Cortland Cortland, New York 13045', u'full_name': u'R. M. Wheeler'}, {u'author_order': 2, u'affiliation': u'State University of New York College at Cortland Cortland, New York 13045', u'full_name': u'R. P. Chaturvedi'}, {u'author_order': 3, u'affiliation': u'State University of New York College at Cortland Cortland, New York 13045', u'full_name': u'S. Amey'}] IEEE Transactions on Nuclear Science, 1979

Thick target x-ray yields of Pr, Sm, Tb, Ho, and Yb have been measured for incident protons in the energy range of 150-400 keV. Yields of the La12, LY1, and LY23 transitions were first converted into x-ray cross sections, then to L-subshell ionization cross sections by the use of theoretical Coster-Kronig decay rates, fluorescence yields, and radiative decay rates. The ...


BPW34 Commercial <emphasis emphasistype="italic">p-i-n</emphasis> Diodes for High-Level 1-MeV Neutron Equivalent Fluence Monitoring

[{u'author_order': 1, u'affiliation': u'Phys. Dept., CERN, Geneva', u'full_name': u'Federico Ravotti'}, {u'author_order': 2, u'full_name': u'Maurice Glaser'}, {u'author_order': 3, u'full_name': u'Michael Moll'}, {u'author_order': 4, u'full_name': u'Fr\xc9d\xc9ric Saigne'}] IEEE Transactions on Nuclear Science, 2008

The BPW34 p-i-n diode was characterized at CERN in view of its utilization as radiation monitor at the LHC to cover the broad 1-MeV neutron equivalent fluence (Phieq) range expected for the LHC machine and experiments during operation. Electrical measurements for both forward and reverse bias were used to characterize the device and to understand its behavior under irradiation. When ...


Use of advanced solar cells for commercial communication satellites

[{u'author_order': 1, u'affiliation': u'NASA Lewis Res. Center, Cleveland, OH, USA', u'full_name': u'S. G. Bailey'}, {u'author_order': 2, u'full_name': u'G. A. Landis'}] Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC), None

The current generation of communications satellites are located primarily in geosynchronous Earth orbit (GEO). Over the next decade, however, a new generation of communications satellites will be built and launched, designed to provide a world-wide interconnection of portable telephones. For this mission, the satellites must be positioned in lower polar and near-polar orbits. To provide complete coverage large numbers of ...


Hardness Assurance Testing for Proton Direct Ionization Effects

[{u'author_order': 1, u'affiliation': u'Sandia National Laboratories, Albuquerque, NM, USA', u'full_name': u'James R. Schwank'}, {u'author_order': 2, u'affiliation': u'Sandia National Laboratories, Albuquerque, NM, USA', u'full_name': u'Marty R. Shaneyfelt'}, {u'author_order': 3, u'affiliation': u'ESA/ESTEC, The Netherlands', u'full_name': u'V\xe9ronique Ferlet-Cavrois'}, {u'author_order': 4, u'affiliation': u'Sandia National Laboratories, Albuquerque, NM, USA', u'full_name': u'Paul E. Dodd'}, {u'author_order': 5, u'affiliation': u'TRIUMF, Vancouver, Canada', u'full_name': u'Ewart W. Blackmore'}, {u'author_order': 6, u'affiliation': u'NASA Goddard Spaceflight Center, Greenbelt, MD, USA', u'full_name': u'Jonathan A. Pellish'}, {u'author_order': 7, u'affiliation': u'IBM T.J. Watson Research Center, Yorktown Heights', u'full_name': u'Kenneth P. Rodbell'}, {u'author_order': 8, u'affiliation': u'IBM T.J. Watson Research Center, Yorktown Heights', u'full_name': u'David F. Heidel'}, {u'author_order': 9, u'affiliation': u'NASA consultant on radiation effects, Brookneal, VA, USA', u'full_name': u'Paul W. Marshall'}, {u'author_order': 10, u'affiliation': u'NASA Goddard Spaceflight Center, Greenbelt, MD, USA', u'full_name': u'Kenneth A. LaBel'}, {u'author_order': 11, u'affiliation': u'MIT Lincoln Laboratory, Lexington, MA, USA', u'full_name': u'Pascale M. Gouker'}, {u'author_order': 12, u'affiliation': u'Marvell, Santa Clara, CA, USA', u'full_name': u'Nelson Tam'}, {u'author_order': 13, u'affiliation': u'Cisco Systems, San Jose, CA, USA', u'full_name': u'Richard Wong'}, {u'author_order': 14, u'affiliation': u'Cisco Systems, San Jose, CA, USA', u'full_name': u'Shi-Jie Wen'}, {u'author_order': 15, u'affiliation': u'Vanderbilt University, Nashville, TN, USA', u'full_name': u'Robert A. Reed'}, {u'author_order': 16, u'affiliation': u'Sandia National Laboratories, Albuquerque, NM, USA', u'full_name': u'Scott M. Dalton'}, {u'author_order': 17, u'affiliation': u'Sandia National Laboratories, Albuquerque, NM, USA', u'full_name': u'Scot E. Swanson'}] IEEE Transactions on Nuclear Science, 2012

The potential for using the degraded beam of high-energy proton radiation sources for proton hardness assurance testing for ICs that are sensitive to proton direct ionization effects are explored. SRAMs were irradiated using high energy proton radiation sources (~67-70 MeV). The proton energy was degraded using plastic or Al degraders. Peaks in the SEU cross section due to direct ionization ...


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