Nitrogen

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Nitrogen is a chemical element that has the symbol N, atomic number of 7 and atomic mass 14.00674 u. (Wikipedia.org)






Conferences related to Nitrogen

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2018 IEEE International Power Modulator and High Voltage Conference (IPMHVC)

This conference provides an exchange of technical topics in the fields of Solid State Modulators and Switches, Breakdown and Insulation, Compact Pulsed Power Systems, High Voltage Design, High Power Microwaves, Biological Applications, Analytical Methods and Modeling, and Accelerators.


2017 12th International Forum on Strategic Technology (IFOST)

New materials and nanotechnologies , Information and communication technologies , Information and communication technologies , Power engineering and electric power electronics , etc


2017 16th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)

ITherm 2017 is the leading international conference for scientific and engineering exploration of thermal, thermomechanicaland emerging technology issues associated with electronic devices, packages, and systems.


2017 17th International Workshop on Junction Technology (IWJT)

Junction Technology Doping Technology Silicide and Contact Technology


2017 19th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS)

The world's premiere conference in MEMS sensors, actuators and integrated micro and nano systems welcomes you to attend this four-day event showcasing major technological, scientific and commercial breakthroughs in mechanical, optical, chemical and biological devices and systems using micro and nanotechnology. The major areas of activity in the development of Transducers solicited and expected at this conference include but are not limited to: Bio, Medical, Chemical, and Micro Total Analysis Systems, Fabrication and Packaging, Mechanical and Physical Sensors, Materials and Characterization, Design, Simulation and Theory, Actuators, Optical MEMS, RF MEMS, Nanotechnology, Energy and Power


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Periodicals related to Nitrogen

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Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...


Dielectrics and Electrical Insulation, IEEE Transactions on

Electrical insulation common to the design and construction of components and equipment for use in electric and electronic circuits and distribution systems at all frequencies.


Electron Device Letters, IEEE

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


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Most published Xplore authors for Nitrogen

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Xplore Articles related to Nitrogen

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IEEE Engineering in Medicine and Biology Group

IEEE Transactions on Biomedical Engineering, 1967

Provides a listing of current staff, committee members and society officers.


The measurements of microwave characteristics of Josephson Junction at liquid nitrogen temperature

Shu-Zhen Cai; Yun-Sen Hou; En-Ki Yu; Zhi-Wei Bao Millimeter Wave and Far-Infrared Technology, 1989. ICMWFT '89. International Conference on, 1989

In this paper we report the measurement results of microwave characteristics of Josephson junction at liquid nitrogen temperature and compare these results with RSJ model of Josephson junction.


Life Expectancy of Liquid - Nitrogen Taped Cable Insulation

B. M. Weedy; S. G. Swingler IEEE Transactions on Electrical Insulation, 1979

Tests are described on lapped taped cable models impregnated with liquid nitrogen to investigate discharge activity and insulation life. A number of polymeric materials are discussed with an emphasis on high density polyethylene. For all the polymers a life expectancy-stress relationship of the form tEn = constant is obtained. The exponent n is seen to be strohgly dependent on the ...


Air Mass Factor Calculations Based on Support Vector Regression Machine

Dong Han; Liangfu Chen; Guojiang Chen; Zifeng Wang; Shenshen Li 2009 Second International Conference on Environmental and Computer Science, 2009

Nitrogen dioxide (NO2) plays a key role in the chemistry of the atmosphere. Based on the space borne measurements, the Differential Optical Absorption Spectroscopy (DOAS) method determines the NO2 slant column density (SCD) along the light path through the atmosphere in a given spectral window between 405 and 465 nm. Based on radiative transfer model, a Look-Up-Table (LUT) of Air ...


Short-Term Electrical Insulating Characteristics of Some Polymeric Materials Immersed in Liquid Nitrogen

R. J. Densley; A. T. Bulinski; T. S. Sudarshan IEEE Transactions on Electrical Insulation, 1979

This paper reports the short-term partial-discharge and electrical breakdown characteristics of some film-type and fibrous materials and laminates of fibrous and film-type materials immersed in liquid nitrogen (LN2) Partial discharge inception and extinction voltages, and also the distribution of their magnitude and repetition rate are studied in the various specimens with and without artificial cavities at pressures up to 0.4 ...


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Educational Resources on Nitrogen

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eLearning

IEEE Engineering in Medicine and Biology Group

IEEE Transactions on Biomedical Engineering, 1967

Provides a listing of current staff, committee members and society officers.


The measurements of microwave characteristics of Josephson Junction at liquid nitrogen temperature

Shu-Zhen Cai; Yun-Sen Hou; En-Ki Yu; Zhi-Wei Bao Millimeter Wave and Far-Infrared Technology, 1989. ICMWFT '89. International Conference on, 1989

In this paper we report the measurement results of microwave characteristics of Josephson junction at liquid nitrogen temperature and compare these results with RSJ model of Josephson junction.


Life Expectancy of Liquid - Nitrogen Taped Cable Insulation

B. M. Weedy; S. G. Swingler IEEE Transactions on Electrical Insulation, 1979

Tests are described on lapped taped cable models impregnated with liquid nitrogen to investigate discharge activity and insulation life. A number of polymeric materials are discussed with an emphasis on high density polyethylene. For all the polymers a life expectancy-stress relationship of the form tEn = constant is obtained. The exponent n is seen to be strohgly dependent on the ...


Air Mass Factor Calculations Based on Support Vector Regression Machine

Dong Han; Liangfu Chen; Guojiang Chen; Zifeng Wang; Shenshen Li 2009 Second International Conference on Environmental and Computer Science, 2009

Nitrogen dioxide (NO2) plays a key role in the chemistry of the atmosphere. Based on the space borne measurements, the Differential Optical Absorption Spectroscopy (DOAS) method determines the NO2 slant column density (SCD) along the light path through the atmosphere in a given spectral window between 405 and 465 nm. Based on radiative transfer model, a Look-Up-Table (LUT) of Air ...


Short-Term Electrical Insulating Characteristics of Some Polymeric Materials Immersed in Liquid Nitrogen

R. J. Densley; A. T. Bulinski; T. S. Sudarshan IEEE Transactions on Electrical Insulation, 1979

This paper reports the short-term partial-discharge and electrical breakdown characteristics of some film-type and fibrous materials and laminates of fibrous and film-type materials immersed in liquid nitrogen (LN2) Partial discharge inception and extinction voltages, and also the distribution of their magnitude and repetition rate are studied in the various specimens with and without artificial cavities at pressures up to 0.4 ...


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IEEE-USA E-Books

  • Emission Control Systems

    The operation of power plants to convert chemical, mechanical, thermal, or other energy resources to electrical energy for the transmission of energy to end users involves some production of byproducts. Operational permitting requirements place limits on both the quantity and quality of these emissions of byproducts. This chapter reviews some of the restrictions on power generation facility operating emissions and the technologies used to control these emissions. All aspects of the power plant operation are subject to regulation of emissions including any water streams from the plant including rainwater runoff, air emissions, and solid waste emissions. There are various concerns with the air emissions of a power plant which include particulate emissions, nitrogen oxide emission, and sulfur oxide emissions. Continuous emissions monitoring systems (CEMS) are used to continuously monitor the air emissions from a power generation facility to ensure compliance with permitting requirements.

  • Review of Imbalanced Data Learning for Protein Methylation Prediction

    In this chapter, the authors focus on the study of computational predictions on this particular PTM-protein arginine methylation. They provide a comprehensive review of the study of arginine methylation prediction. They extensively investigate all existing methylation prediction methods and servers; thoroughly review all feature extracting schemes used for sequence encoding; and carefully summarize and compare all processing steps in their methodologies, including data collection, feature extraction and selection, classifier training and evaluation, and result discussion. Finally, the authors suggest several future directions that are worthy of continuous research on methylation predictions.

  • Device Processing of Silicon Carbide

    Many processing steps are required to fabricate complex electronic devices, including doping by ion implantation, patterning, etching, oxidation, passivation, and metallization. The process flow in SiC device fabrication is similar to that in silicon technology but several unique processes, with particular requirements, are also needed because of the unique physical and chemical properties of SiC. This chapter introduces the fundamental aspects and technological development of ion implantation, etching, oxidation, interface passivation, and Schottky and ohmic contacts in SiC.

  • Cryogenics

    This chapter discusses ways of cooling detectors, some associated calculations, measuring the temperatures, and the safety hazards. Work at low temperatures require calculations of the time required for components to cool, the ultimate temperature they will reach, and the amount of cryogen used in the cooling process. The chapter also discusses the thermal properties and how the required calculations are done. Conduction from room temperature into the cryogen is minimized by using supports with the smallest possible cross section and as long as possible. The measurement of temperatures is an important part of cryogenics. Several potential safety hazards exist when working with cryogens, but simple precautions are available to protect against all of them. If miniature gas lines (used to supply gaseous nitrogen to open‐cycle refrigerators) should break while under pressure, they can whip around, causing serious cuts or eye damage.

  • Characterization Techniques and Defects in Silicon Carbide

    Characterization of the physical properties, doping densities, and defects in SiC is a fundamental tool in the development of SiC devices. Measurement of physical properties and identification of defect structures are important subjects of academic study. It is important to understand the various defects in SiC because many of them can adversely affect device performance and reliability. In this chapter we describe the fundamental material characterization techniques and present an overview of extended and point defects in SiC.



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