Neutron radiation effects
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The RADECS Conference features a technical program dedicated to the latest developments and experimental observations related to radiation effects on electronic and photonic components.
2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012)
This workshop is part of the NSREC 2012 conference (cr# 15402). The intent of the workshop is to provide data and facilities information to support design and radiation testing activities.
All aspects of the theory and applications of nuclear science and engineering, including instrumentation for the detection and measurement of ionizing radiation; particle accelerators and their controls; nuclear medicine and its application; effects of radiation on materials, components, and systems; reactor instrumentation and controls; and measurement of radiation in space.
Anderson, W.T.; Harrison, R.C.; Gerdes, J.; Beall, J.M.; Roussos, J.A. Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1988. Technical Digest 1988., 10th Annual IEEE, 1988
A study was made of combined radiation effects in GaAs MMICs (microwave monolithic integrated circuits) to separate the transient effects of pulsed neutron and gamma radiation GaAs FETs and MMICs were measured in three radiation environments: pulsed neutron, flash X-ray, and combined pulsed neutron and flash X-ray. Synergistic effects were measured under combined pulsed irradiation. Evidence is presented for short-term ...
Torok, Z.; Platt, S.P.; Cai Xiao Xiao Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on, 2007
We analyse the SEE-inducing effects of cosmic rays using scientific CCDs and make direct comparison of results obtained in the natural cosmic ray field at altitude with those from accelerated test in neutron beams.
von Przewoski, B.; Baxter, D.V.; Bogdanov, A.; Clark, S.; Derenchuk, V.P.; Ellis, T.; Lavelle, C.M.; Leuschner, M.B.; Remmes, N.; Rinckel, T.; Sokol, P.E.; Turflinger, T. Radiation Effects Data Workshop, 2006 IEEE, 2006
An accelerator-based facility for simulation of neutron-induced single event effects in electronics is under development at Indiana University Cyclotron Facility. The neutron spectrum has been characterized using foil activation techniques and calibrated transistors
Radiation Effects Data Workshop, 2003. IEEE, 2003
The following topics are dealt with: ground-based, and in-flight single event effects on piece-part commercial off the shelf as well as space qualified components; total ionizing dose, including ELDRS and displacement damage; and proton and neutron test facilities in the United States, Canada, and Russia.
Deng, Y.; Fjeldly, T.A.; Ytterdal, T.; Shur, M.S. Nuclear Science, IEEE Transactions on, 2003
For the purpose of simulating the effects of neutron radiation damage on bipolar circuit performance, we have developed a bipolar junction transistor SPICE model that incorporates displacement damage effects. A physics-based formalism is used for describing the radiation effects within the framework of the Gummel-Poon model. A model structure that includes the dependence of neutron fluence on the relevant SPICE ...
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