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2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)
The Annual International Conference of the IEEE Engineering in Medicine and Biology Society covers a broad spectrum of topics from biomedical engineering and physics to medical and clinical applications. The conference program will consist of invited plenary lectures, symposia, workshops, invited sessions, oral and poster sessions of unsolicited contributions. All papers will be peer reviewed and accepted papers of up to 4 pages will appear in the Conference Proceedings and be indexed by PubMed and EI. Prop
This conference provides an idea-exchange platform for the engineers and academia interested in the hottest issue such as intelligent design, computer-aided design and intelligent manufacturing to explore new technologies, exchange new ideas. The aim is to promote the research of computing, control and industrial engineering from theoretical and applicable viewpoint.
Chan, H.A. Electronic Components and Technology Conference, 1994. Proceedings., 44th, 1994
Although hard-defects may be detectable in factory tests, weak products may exhibit failures or degrade only under certain stress conditions. Without stress testing, these weak products may often be shipped to customers causing early failures in the field. A candidate product for stress testing needs to get more business benefits to more than pay off the cost of stress testing. ...
Coit, D.W.; English, J.R. Reliability and Maintainability Symposium, 1999. Proceedings. Annual, 1999
A system reliability modeling procedure is described and demonstrated to accommodate the case when component failure times are statistically correlated because of the shared environmental exposure of components within a system. When component failure times are correlated, independence assumptions are not valid, and thus, many common reliability modeling practices are inappropriate. If component reliability is influenced by environmental exposure, then ...
Saarinen, K.; Frisk, L. Device and Materials Reliability, IEEE Transactions on, 2013
Accelerated environmental tests can be used to study the effects of environmental stresses on reliability. The environmental tests are commonly run in parallel. One test is performed for one set of test samples, and new sets of test samples are used for other possible tests. However, the subsequent use of different tests for the same set of test samples may ...
Loncar-Turukalo, T.; Bajic, D.; Sarenac, O.; Japundzic-Zigon, N.; Boskovic, A. Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE, 2009
Radiotelemetred male Wistar outbrad rats and borderline hypertensive rats (BHR) were exposed to acute and chronic environmental stress. Approximate entropy (ApEn) approach is applied in order to investigate the pulse interval (PI) response to two different types of environmental stress: shaker and restrain stress. The performance of ApEn method was evaluated from the parameter selection point of view. The purpose ...
Chan, H.A. Reliability and Maintainability Symposium, 1994. Proceedings., Annual, 1994
Although hard-defects may be detectable in factory tests, weak products may exhibit failures or degrade only under certain stress conditions. Without stress testing, these weak products may often be shipped to customers causing early failures in the field. Early failures usually come from product weaknesses resulting in the presence of weak populations and the lower end of a broad main ...
2011 IEEE Medal for Environmental and Safety Technologies - Shoichi Sasaki
2012 IEEE Honors - Medal for Environmental and Safety Technologies
ISSCC 2012 - David Perlmutter Plenary
Care Innovations: Toxics In Electronics (com legendas em portugues)
Care Innovations: Responsibility For Being Green (com legendas em portugues)
Technology Discourse: Bio Fuels
Designing for Sustainability - GHTC 2012 Session - Christopher Freitas
GEOSS Forest Fire Awareness and Assessment
26th Annual MTT-AP Symposium and Mini Show - Dr. AnhVu Pham
2011 IEEE Robert N. Noyce Medal - Pasquale Pistorio
IEEE Medal of Honor Recipient (2008): Dr. Gordon Moore
GHTC 2012 Jim Fruchterman Keynote
Larson Collection interview with Chauncey Starr
Denmark Solar House
Lighting the Way: Optical Sensors in the Life Sciences
The 2010 IEEE Honors Ceremony
Larson Collection interview with Alvin Weinberg
2011 IEEE Awards James H. Mulligan, Jr. Education Medal - Raj Mittra
This Standard defines environmental performance standards for personal computer products, including desktop computers, notebook computers, and computer monitors that are marketed to institutions, and includes key concepts and implementation procedures relating to reduction or elimination of environmentally sensitive materials, materials selection, design for end of life, life cycle extension, energy conservation, end of life management, corporate performance and packaging.
Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission