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2014 36th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)
The conference program will consist of plenary lectures, symposia, workshops and invited sessions of the latest significant findings and developments in all the major fields of biomedical engineering. Submitted papers will be peer reviewed. Accepted high quality papers will be presented in oral and poster sessions, will appear in the Conference Proceedings and will be indexed in PubMed/MEDLINE.
This conference provides an idea-exchange platform for the engineers and academia interested in the hottest issue such as intelligent design, computer-aided design and intelligent manufacturing to explore new technologies, exchange new ideas. The aim is to promote the research of computing, control and industrial engineering from theoretical and applicable viewpoint.
Chan, H.A. Electronic Components and Technology Conference, 1994. Proceedings., 44th , 1994
Although hard-defects may be detectable in factory tests, weak products may exhibit failures or degrade only under certain stress conditions. Without stress testing, these weak products may often be shipped to customers causing early failures in the field. A candidate product for stress testing needs to get more business benefits to more than pay off the cost of stress testing. ...
Coit, D.W.; English, J.R. Reliability and Maintainability Symposium, 1999. Proceedings. Annual , 1999
A system reliability modeling procedure is described and demonstrated to accommodate the case when component failure times are statistically correlated because of the shared environmental exposure of components within a system. When component failure times are correlated, independence assumptions are not valid, and thus, many common reliability modeling practices are inappropriate. If component reliability is influenced by environmental exposure, then ...
Saarinen, K.; Frisk, L. Device and Materials Reliability, IEEE Transactions on , 2013
Accelerated environmental tests can be used to study the effects of environmental stresses on reliability. The environmental tests are commonly run in parallel. One test is performed for one set of test samples, and new sets of test samples are used for other possible tests. However, the subsequent use of different tests for the same set of test samples may ...
Loncar-Turukalo, T.; Bajic, D.; Sarenac, O.; Japundzic-Zigon, N.; Boskovic, A. Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE , 2009
Radiotelemetred male Wistar outbrad rats and borderline hypertensive rats (BHR) were exposed to acute and chronic environmental stress. Approximate entropy (ApEn) approach is applied in order to investigate the pulse interval (PI) response to two different types of environmental stress: shaker and restrain stress. The performance of ApEn method was evaluated from the parameter selection point of view. The purpose ...
Xian-chao Zhang; Chuan-ri Li; Xiao-xi Guo Industrial Engineering and Engineering Management (IE&EM;), 2011 IEEE 18Th International Conference on , 2011
Environmental stresses are usually crucial factors leading to the fault of Electronic Equipments. In the past, Stress-Strength Interference Model (SSI) was applied extensively to analyze the reliability of Electronic Equipments suffering environmental stresses, correspondingly, the reliability was acquired as a fixed value. However, the reliability decreases as time goes on. For that reason, this paper establishes the function of the ...
NPI/Hardware Test Technician Manufacturing Schweitzer Engineering Laboratories, Inc.
2013 IEEE Medal for Environmental and Safety Technologies
2012 IEEE Honors - Medal for Environmental and Safety Technologies
ISSCC 2012 - David Perlmutter Plenary
Care Innovations: Toxics In Electronics (com legendas em portugues)
Care Innovations: Responsibility For Being Green (com legendas em portugues)
Technology Discourse: Bio Fuels
Designing for Sustainability - GHTC 2012 Session - Christopher Freitas
GEOSS Forest Fire Awareness and Assessment
26th Annual MTT-AP Symposium and Mini Show - Dr. AnhVu Pham
2011 IEEE Robert N. Noyce Medal - Pasquale Pistorio
IEEE Medal of Honor Recipient (2008): Dr. Gordon Moore
GHTC 2012 Jim Fruchterman Keynote
Denmark Solar House
Larson Collection interview with Chauncey Starr
Lighting the Way: Optical Sensors in the Life Sciences
The 2010 IEEE Honors Ceremony
Larson Collection interview with Alvin Weinberg
2011 IEEE Awards James H. Mulligan, Jr. Education Medal - Raj Mittra
This Standard defines environmental performance standards for personal computer products, including desktop computers, notebook computers, and computer monitors that are marketed to institutions, and includes key concepts and implementation procedures relating to reduction or elimination of environmentally sensitive materials, materials selection, design for end of life, life cycle extension, energy conservation, end of life management, corporate performance and packaging.
Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission
Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...
Principles and practices of reliability, maintainability, and product liability pertaining to electrical and electronic equipment.