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Conferences related to MIM devices

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2013 IEEE 63rd Electronic Components and Technology Conference (ECTC)

premier components\, packaging and technology conference

  • 2019 IEEE 69th Electronic Components and Technology Conference (ECTC)

    premier components\, packaging and technology conference

  • 2017 IEEE 67th Electronic Components and Technology Conference (ECTC)

    premier components\, packaging and technology conference

  • 2016 IEEE 66th Electronic Components and Technology Conference (ECTC)

    premier components\, packaging and technology conference

  • 2014 IEEE 64th Electronic Components and Technology Conference (ECTC)

    Premier components\, packaging and technology

  • 2012 IEEE 62nd Electronic Components and Technology Conference (ECTC)

    ECTC is the premier international electronics symposium that brings together the best in packaging\, components and microelectronic systems science\, technology and education in an environment of cooperation and technical exchange.

  • 2011 IEEE 61st Electronic Components and Technology Conference (ECTC)

    ECTC is the premier international electronics symposium that brings together the best in packaging, components and microelectronic systems science, technology and education in an environment of cooperation and technical exchange

  • 2010 IEEE 60th Electronic Components and Technology Conference (ECTC 2010)

    ECTC is the premier international electronics symposium that brings together the best in packaging, components and microelectronic systems science, technology and education in an environment of cooperation and technical exchange.

  • 2009 IEEE 59th Electronic Components and Technology Conference (ECTC 2009)

    Advanced packaging, electronic components & RF, emerging technologies, materials & processing, manufacturing technology, interconnections, quality & reliability, modeling & simulation, optoelectronics.

  • 2008 IEEE 58th Electronic Components and Technology Conference (ECTC 2008)


2013 IEEE International Electron Devices Meeting (IEDM)

  • 2021 IEEE International Electron Devices Meeting (IEDM)

    the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology\, design\, manufacturing\, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers\, from compound semiconductor materials to nanotechnology devices and architectures\, from micromachined devices to smart -power technologies\, etc.

  • 2019 IEEE International Electron Devices Meeting (IEDM)

    the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology\, design\, manufacturing\, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers\, from compound semiconductor materials to nanotechnology devices and architectures\, from micromachined devices to smart -power technologies\, etc.

  • 2017 IEEE International Electron Devices Meeting (IEDM)

    the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology\, design\, manufacturing\, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers\, from compound semiconductor materials to nanotechnology devices and architectures\, from micromachined devices to smart -power technologies\, etc.

  • 2015 IEEE International Electron Devices Meeting (IEDM)

    the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart-power technologies, etc.

  • 2014 IEEE International Electron Devices Meeting (IEDM)

  • 2012 IEEE International Electron Devices Meeting (IEDM)

  • 2011 IEEE International Electron Devices Meeting (IEDM)

  • 2010 IEEE International Electron Devices Meeting (IEDM)

  • 2009 IEEE International Electron Devices Meeting (IEDM)

    CMOS Devices Technology, Characterization, REliability and Yield, Displays, sensors and displays, memory technology, modeling and simulation, process technology, solid state and nanoelectronic devices

  • 2008 IEEE International Electron Devices Meeting (IEDM)

    Over the last 53 years, the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart-power technologies, etc.

  • 2007 IEEE International Electron Devices Meeting (IEDM)


2013 IEEE/MTT-S International Microwave Symposium - MTT 2013

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The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2021 IEEE/MTT-S International Microwave Symposium - MTT 2021

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies\, to passives and actives components to system over a wide range of frequencies including VHF\, UHF\, RF\, microwave\, millimeter-wave\, terahertz\, and optical. The conference will encompass the latest in RFIC\, MIC\, MEMS and filter technologies\, advances in CAD\, modeling\, EM simulation\, wireless systems\, RFID and related topics.

  • 2019 IEEE/MTT-S International Microwave Symposium - MTT 2019

    Comprehensive symposium on microwave theory and techniques including active and passive circuit components, theory and microwave systems.

  • 2018 IEEE/MTT-S International Microwave Symposium - MTT 2018

    Microwave theory and techniques, RF/microwave/millimeter-wave/terahertz circuit design and fabrication technology, radio/wireless communication.

  • 2017 IEEE/MTT-S International Microwave Symposium - MTT 2017

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies\, to passives and actives components to system over a wide range of frequencies including VHF\, UHF\, RF\, microwave\, millimeter-wave\, terahertz\, and optical. The conference will encompass the latest in RFIC\, MIC\, MEMS and filter technologies\, advances in CAD\, modeling\, EM simulation\, wireless systems\, RFID and related topics.

  • 2016 IEEE/MTT-S International Microwave Symposium - MTT 2016

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF\, RF\, wireless\, microwave\, millimeter-wave\, terahertz\, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC\, MIC\, MEMS and filter technologies\, advances in CAD\, modeling\, EM simulation and more. The IMS includes technical and interactive sessions\, exhibits\, student competitions\, panels\, workshops\, tutorials\, and networking events.

  • 2015 IEEE/MTT-S International Microwave Symposium - MTT 2015

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics. The IMS includes technical sessions, both oral and interactive, worksh

  • 2014 IEEE/MTT-S International Microwave Symposium - MTT 2014

    IMS2014 will cover developments in microwave technology from nano devices to system applications. Technical paper sessions, interactive forums, plenary and panel sessions, workshops, short courses, industrial exhibits, and a wide array of other technical activities will be offered.

  • 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2011 IEEE/MTT-S International Microwave Symposium - MTT 2011

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.


2012 4th IEEE International Memory Workshop (IMW)

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This conference brings the memory community together in a workshop environment to discuss the memory process and design technologies\, applications\, market needs and strategies. The IMW is a unique forum for specialists in all aspects of memory (nonvolatile & volatile) microelectronics and people with different backgrounds who wish to gain a better understanding of the field.


2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM

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Premier international forum for bipolar/BiCMOS research.


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Xplore Articles related to MIM devices

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  • A novel way to characterize Metal-Insulator-Metal devices via nanoindentation

    Periasamy, P.; O'Hayre, R.P.; Berry, J.J.; Parilla, Philip A.; Ginley, D.S.; Packard, C.E. Photovoltaic Specialists Conference (PVSC), 2011 37th IEEE, 2011

    Metal-Insulator-Metal (MIM) devices are crucial components for applications ranging from optical rectennas for harvesting sunlight to infrared detectors. To date, the relationship between materials properties and device performance in MIM devices is not fully understood, partly due to the difficulty in making and reproducing reliable devices. One configuration that is popular due to its simplicity and ease of fabrication is ...

  • High Work-Function Oxygen-Bearing Electrodes for Improved Performance in MANOS Charge-Trap NVM and MIM-DRAM Type Devices

    Gilmer, D.C.; Goel, N.; Park, H.; Park, C.; Barnett, J.; Kirsch, P.D.; Jammy, R. Memory Workshop, 2009. IMW '09. IEEE International, 2009

    We demonstrate for the first time molybdenum based oxygen-bearing electrodes for improved performance in MANOS (Metal-Alumina-Nitride-Oxide) charge-trap NVM, and also MIM-DRAM type devices. The meta-stable high work- function (Wfn) molybdenum-oxynitride (MoON) electrodes result in improved retention and erase saturation for the charge trap NVM devices and improved leakage for the MIM devices. Although some of the observed improvements, compared to ...

  • Mass Production Worthy MIM Capacitor On Gate polysilicon(MIM-COG) Structure using HfO<inf>2</inf>/HfO<inf>x</inf>C<inf>y</inf>N<inf>z</inf>/HfO<inf>2</inf> Dielectric for Analog/RF/Mixed Signal Application

    Jung-Min Park; Min-Woo Song; Weon-Hong Kim; Pan-Kwi Park; Yong-Kuk Jung; Ju-Youn Kim; Won, Seok-Jun; Jong-Ho Lee; Nae-In Lee; Ho-Kyu Kang Electron Devices Meeting, 2007. IEDM 2007. IEEE International, 2007

    We have successfully integrated a mass production worthy MIM capacitor on gate polysilicon (MIM-COG) structure using HfO<sub>2</sub>/HfO<sub>x</sub>C<sub>y</sub>N<sub>z</sub>/HfO<sub>2</sub>(HNH) dielectric for the analog/RF/mixed signal application. The insertion of HfO<sub>x</sub>C<sub>y</sub>N<sub>z</sub> into HfO<sub>2</sub> films can successfully suppress the crystallization. As a result, HNH film shows superior breakdown and VCC-a characteristics compared to HfO<sub>2</sub>-AI<sub>2</sub>O<sub>3</sub> multilayer stack. In addition, we suggest novel MIM-COG structure, which can ...

  • Methane Detection by MIM Sensor Devices Based on Nano ZnO Thin Films Obtained by Sol-Gel and by Anodization: A Comparative Study

    Bhattacharyya, P.; Basu, P.K.; Basu, S. Sensor Device Technologies and Applications (SENSORDEVICES), 2010 First International Conference on, 2010

    Amongst various gas sensor structures developed so far probably the least investigated one is the Metal- (Active) Insulator-Metal or (MIM) structure. It has been reported that the vertical electron transport mechanism of this structure offers high response with fast response and recovery for gases like H<sub>2</sub> and methane compared to the conventional planar configuration. In this paper we report on ...

  • MIM capacitor integration for mixed-signal/RF applications

    Chit Hwei Ng; Chaw-Sing Ho; Shao-Fu Sanford Chu; Shi-Chung Sun Electron Devices, IEEE Transactions on, 2005

    The relentless drive toward high-speed and high-density silicon-based integrated circuits (ICs) has necessitated significant advances in processing technology. The entrance of copper metallization in IC manufacturing has resulted in new challenges in metal-insulator-metal (MIM) capacitor fabrication, one of the key building blocks in analog/mixed signal/RFCMOS circuits. The requirement to reduce passive chip space has led to active researches for MIM ...

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Jobs related to MIM devices

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Circuit Analyst - Semiconductor Devices Sandia National Laboratories
Chair (W2/W3) of Organic Devices Technische Universität Dresden
Wireless Interface Virtuoso (Qualcomm Research San Diego) Qualcomm, Inc.
Engineering Test Technician Qualcomm, Inc.
Hardware Technician (5-6 months) Qualcomm, Inc.
UMTS Field Application Engineer, Moscow, Russia Qualcomm, Inc.
Software QA & validation engineer (temporary) Qualcomm, Inc.
UMTS Field Application Engineer - Qualcomm, ESG, Legos, Nigeria Qualcomm, Inc.
Embedded Engineer-Wearable Computing Qualcomm, Inc.
Embedded Engineer-Wearable Computing Qualcomm, Inc.
Embedded Engineer-Wearable Computing Qualcomm, Inc.
Sr. Systems Engineer - System on a Chip (SoC) Architecture (Qualcomm Research San Diego) Qualcomm, Inc.
Beyond 4G Architect (Qualcomm Research San Diego) Qualcomm, Inc.
ASIC Verification Engineer (Raleigh, NC - New Grads welcome) Qualcomm, Inc.
Test Technician Intermediate - Multimedia (Contract Role) Qualcomm, Inc.
Test Technician Intermediate - Multimedia (Contract Role) Qualcomm, Inc.
Test Technician Intermediate - Multimedia (Contract Role) Qualcomm, Inc.
Electrical Engineer (ref. EE) Delphi Corporation
UMTS Field Application Engineer Qualcomm, Inc.
Vuforia Augmented Reality SDK Integration and Test Engineer (Android) Qualcomm, Inc.
Mobile Application Developer - Wearable Computing Qualcomm, Inc.
Vuforia Augmented Reality SDK Integration and Test Engineer (Android) Qualcomm, Inc.
Electrical Engineer Bechtel Plant Machinery, Inc. (BPMI)
Senior/Staff Graphics ASIC Hardware Design Engineer (Boxborough, MA) Qualcomm, Inc.
Lead Power Management Verification and Integration Engineer - San Diego Qualcomm, Inc.

Educational Resources on MIM devices

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No education resources are currently tagged "MIM devices"


Standards related to MIM devices

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No standards are currently tagged "MIM devices"


Periodicals related to MIM devices

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  • Electron Devices, IEEE Transactions on

    Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.