Conferences related to End Of Life

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2015 IEEE International Reliability Physics Symposium (IRPS)

Sharing information related to cause, effects and solutions in the deign and manufacture of electronics and related components


2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Sample Preparation, Metrology and Material Characterization Advanced Failure Analysis Techniques Die-Level / Package-Level Failure Analysis Case Study & Failure Mechanisms Product Reliability Evaluation and ApproachesNovel Device Reliability and Failure MechanismsNovel Gate Stack/Dielectrics and FEOL Reliability and Failure MechanismsAdvanced Interconnects and BEOL Reliability and Failure Mechanisms


2013 IEEE International Integrated Reliability Workshop (IIRW)

We invite you to submit a presentation proposal that addresses any semiconductor related reliability issue, including the following topics: resistive memories, high-k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III-V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI/PBTI, root cause defects (physical mechanisms and simulations), Cu interconnects and low-k dielectrics, impact of transistor degradation on circuit reliability, designing-in reliability (products, circuits,systems, processes), customer product reliability requirements / manufacturer reliability tasks, waferlevel reliability tests (test approaches and reliability test structures), reliability modeling and simulation,optoelectronics, and single event upsets.

  • 2012 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems.

  • 2011 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems through tutorials, paper presentations, discussion groups and special interest groups.

  • 2010 IEEE International Integrated Reliability Workshop (IIRW)

    The Integrated Reliability Workshop focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding, developing, and sharing reliability technology and test methodology for present and f

  • 2009 IEEE International Integrated Reliability Workshop (IRW)

    Semiconductor Reliability in general; and Wafer Level Reliability in specific. Covering areas like (but not limited to): Design-in Reliability, reliability characterization, deep sub-micron transistor and circuit reliability, customer reliability requirements, wafer level reliability tests, and reliability root cause analysis, etc.

  • 2008 IEEE International Integrated Reliability Workshop (IRW)

    The workshop focuses on ensuring device reliability through fabrication, design, testing, characterization and simulation as well as identification of the defects and mechanisms responsible for reliability problems. It provides a unique environment for understanding, developing and sharing reliability technology and test methodology.

  • 2007 IEEE International Integrated Reliability Workshop (IRW)

    The Workshop focuses on ensuring semiconductor reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliabilty problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding and developing reliability technology and test methodology.

  • 2006 IEEE International Integrated Reliability Workshop (IRW)


2011 IEEE International Symposium on Technology and Society (ISTAS)

ISTAS is an annual international forum sponsored by the IEEE Society on Social Implications of Technology. ISTAS 2011 is co-sponsored by the ACM Special Interest Group on Computers and Society. ISTAS welcomes engineers; scientists; philosophers; researchers in social sciences, arts, law, and humanities; and policy experts in technology and society.

  • 2010 IEEE International Symposium on Technology and Society (ISTAS)

    Social Implications of Emerging Technologies

  • 2009 IEEE International Symposium on Technology and Society (ISTAS)

    The IEEE International Symposium on Technology and Society (ISTAS) is an annual international forum exploring the social implications of technology. ISTAS 09 will be held concurrently with the IEEE International Symposium on Sustainable Systems and Technology (ISSST), with joint sessions related to an overall conference theme of sustainability.



Periodicals related to End Of Life

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Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...


Dielectrics and Electrical Insulation, IEEE Transactions on

Electrical insulation common to the design and construction of components and equipment for use in electric and electronic circuits and distribution systems at all frequencies.


Electronics Packaging Manufacturing, IEEE Transactions on

Design for manufacturability, cost and process modeling, process control and automation, factory analysis and improvement, information systems, statistical methods, environmentally-friendly processing, and computer-integrated manufacturing for the production of electronic assemblies, products, and systems.


Industrial Informatics, IEEE Transactions on

IEEE Transactions on Industrial Informatics focuses on knowledge-based factory automation as a means to enhance industrial fabrication and manufacturing processes. This embraces a collection of techniques that use information analysis, manipulation, and distribution to achieve higher efficiency, effectiveness, reliability, and/or security within the industrial environment. The scope of the Transaction includes reporting, defining, providing a forum for discourse, and informing ...


Industry Applications, IEEE Transactions on

The development and application of electric systems, apparatus, devices, and controls to the processes and equipment of industry and commerce; the promotion of safe, reliable, and economic installations; the encouragement of energy conservation; the creation of voluntary engineering standards and recommended practices.


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Xplore Articles related to End Of Life

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High-efficiency GaAs/CuInSe<sub>2</sub> and AlGaAs/CuInSe<sub>2 </sub> thin-film tandem solar cells

R. P. Gale; R. W. McClelland; B. D. Dingle; J. V. Gormley; R. M. Burgess; N. P. Kim; R. A. Mickelsen; B. J. Stanbery IEEE Conference on Photovoltaic Specialists, 1990

Tandem cell throughput has been increased, and quantities of cells that produce tens of watts of power in total were fabricated. An improved efficiency of 23.1% AM0/one sun at 28°C has been obtained for 4 cm2 tandem cells. The mechanically stacked tandem cells consist of an n+:AlGaAs/n:GaAs/p:GaAs/p+:A thin-film top cell and an n+:CdZnS/p:CuInSe2 thin-film bottom cell. In addition to being ...


Mineral oil lifetime estimation using activation energy

L. V. Badicu; L. M. Dumitran; P. V. Notingher; R. Setnescu; T. Setnescu 2011 IEEE International Conference on Dielectric Liquids, 2011

Lifetime estimation of mineral oil is based on IEC 60216-1/2001, using accelerated thermal ageing at three temperatures), method which requires a long experimental time. In order to reduce the experimental times, this paper proposes a simpler method to draw the lifetime curve by determining an experimental point (carrying out only a thermal ageing at the highest temperature - which requires ...


Remanufacturing

N. Nasr; E. Varel; R. Bauer Innovation in Technology Management - The Key to Global Leadership. PICMET '97: Portland International Conference on Management and Technology, 1997

Summary form only given as follows. Deterioration of our ecosystem has forced government, consumers and manufacturers to question production methods, products used, and product disposal. It is becoming no longer feasible to make goods without taking into consideration the end of a product's useful life. Remanufacturing as the ultimate form of recycling is a relatively unknown end- of-life process which ...


Sensors for the non-destructive evaluation of ACSR, deployed with live-line robotics

Nicolas Pouliot; Serge Montambaut 2017 12th International Conference on Live Maintenance (ICOLIM), 2017

Summary form only given. For more than 15 years, Hydro-Quebec's IREQ have been the developing and promoting the use of live-line robots for the live-line inspection of power lines. LineROVer and LineScout initiatives have been extensively used to perform visual inspections in critical situations such as hard to reach river crossings or mountain spans. Other simple yet effective manipulation tasks ...


IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits

IEEE Std C62.36-1994, 1995

Methods are established for testing and measuring the characteristics of surge protectors used in low-voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V rms or 1200 Vdc. The surge protectors are designed to limit voltage surges, current surges, or both. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear ...


More Xplore Articles

Educational Resources on End Of Life

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eLearning

High-efficiency GaAs/CuInSe<sub>2</sub> and AlGaAs/CuInSe<sub>2 </sub> thin-film tandem solar cells

R. P. Gale; R. W. McClelland; B. D. Dingle; J. V. Gormley; R. M. Burgess; N. P. Kim; R. A. Mickelsen; B. J. Stanbery IEEE Conference on Photovoltaic Specialists, 1990

Tandem cell throughput has been increased, and quantities of cells that produce tens of watts of power in total were fabricated. An improved efficiency of 23.1% AM0/one sun at 28°C has been obtained for 4 cm2 tandem cells. The mechanically stacked tandem cells consist of an n+:AlGaAs/n:GaAs/p:GaAs/p+:A thin-film top cell and an n+:CdZnS/p:CuInSe2 thin-film bottom cell. In addition to being ...


Mineral oil lifetime estimation using activation energy

L. V. Badicu; L. M. Dumitran; P. V. Notingher; R. Setnescu; T. Setnescu 2011 IEEE International Conference on Dielectric Liquids, 2011

Lifetime estimation of mineral oil is based on IEC 60216-1/2001, using accelerated thermal ageing at three temperatures), method which requires a long experimental time. In order to reduce the experimental times, this paper proposes a simpler method to draw the lifetime curve by determining an experimental point (carrying out only a thermal ageing at the highest temperature - which requires ...


Remanufacturing

N. Nasr; E. Varel; R. Bauer Innovation in Technology Management - The Key to Global Leadership. PICMET '97: Portland International Conference on Management and Technology, 1997

Summary form only given as follows. Deterioration of our ecosystem has forced government, consumers and manufacturers to question production methods, products used, and product disposal. It is becoming no longer feasible to make goods without taking into consideration the end of a product's useful life. Remanufacturing as the ultimate form of recycling is a relatively unknown end- of-life process which ...


Sensors for the non-destructive evaluation of ACSR, deployed with live-line robotics

Nicolas Pouliot; Serge Montambaut 2017 12th International Conference on Live Maintenance (ICOLIM), 2017

Summary form only given. For more than 15 years, Hydro-Quebec's IREQ have been the developing and promoting the use of live-line robots for the live-line inspection of power lines. LineROVer and LineScout initiatives have been extensively used to perform visual inspections in critical situations such as hard to reach river crossings or mountain spans. Other simple yet effective manipulation tasks ...


IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits

IEEE Std C62.36-1994, 1995

Methods are established for testing and measuring the characteristics of surge protectors used in low-voltage data, communications, and signaling circuits with voltages less than or equal to 1000 V rms or 1200 Vdc. The surge protectors are designed to limit voltage surges, current surges, or both. The surge protectors covered are multiple-component series or parallel combinations of linear or nonlinear ...


More eLearning Resources

IEEE.tv Videos

Recycling: Computers & Electronics (com legendas em portugues)
Bill Woodward presents NEEDLES: 2016 End to End Trust and Security Workshop for the Internet of Things
Closing Panel at 2016 End to End Trust and Security Workshop for the Internet of Things
Bob Martin on Industrial Internet Reference Architecture: 2016 End to End Trust and Security Workshop for the Internet of Things
Oral History: Jerry Minter
Ulf Lindqvist presents the IEEE Cybersecurity Initiative (CybSI): 2016 End to End Trust and Security Workshop for the Internet of Things
William J. Miller on Sensei-IoT: 2016 End to End Trust and Security Workshop for the Internet of Things
IMS MicroApps: Silicon Technology Solutions for Wireless Front End Modules
Opening Panel: 2016 End to End Trust and Security Workshop for the Internet of Things
IEEE Life Scences - Paolo Bonato Interview
Two Pathways to 5G: Spectrum Sharing and Aggregation - 5G Summit, Seattle 2016
Juan Carlos Zuniga on Wi-Fi Privacy at IEEE 802 & IETF: 2016 End to End Trust and Security Workshop for the Internet of Things
Virtual World Symposium - Second Life Tech Tour
Lillie Coney on the IoT and the Ability to Defend Against the Silent Intruder: 2016 End to End Trust and Security Workshop for the Internet of Things
Life in a World of Ubiquitous sensing
Giving Small Robots New Ways to Move
Glenn Fink on Priorities for IoT Security and Privacy From Here to 2020: End to End Trust and Security Workshop for the Internet of Things 2016
The Internet of Things, An Overview: Karen O'Donoghue Addresses Issues and Challenges of a More Connected World -- 2016 End to End Trust and Security Workshop for the Internet of Things
IEEE World Forum on Internet of Things - Milan, Italy - Narang N. Kishor - Designing Comprehensive and End to End IoT Solutions; Challenges, Opportunities, and Approaches to Develop New IPs - Part 3
IEEE World Forum on Internet of Things - Milan, Italy - Narang N. Kishor - Designing Comprehensive and End to End IoT Solutions; Challenges, Opportunities, and Approaches to Develop New IPs - Part 2

IEEE-USA E-Books

  • A REVIEW ON END¿¿?OF¿¿?LIFE BATTERY MANAGEMENT: CHALLENGES, MODELING, AND SOLUTION METHODS

    End¿¿?of¿¿?life (EOL) battery packs may have significant residual value for secondary use and are too expensive to simply recycle. Quality variation adds complexity to EOL decision¿¿?making among multiple EOL options including disposal, recycling, remanufacturing, and reuse in secondary applications. The aim of the modeling and analysis for battery¿¿?remanufacturing systems is to determine the battery's optimal EOL decisions that maximize cost savings or minimize life cycle cost. This chapter considers the quality variation of EOL returns, resulting in different EOL decisions as well as different routes of remanufacturing processes and inventory level. It discusses some of the basics of battery remanufacturing, including the economic and ecological benefits, principles, operational strategy, and processes of battery remanufacturing. Several emerging issues of battery remanufacturing have been discussed with a main focus on modeling and analysis of electric vehicles (EVs) battery¿¿?remanufacturing system as well as decision¿¿?making related to the remanufacturing processes, inventory control, and reassembly strategy.

  • Regulatory and Voluntary Drivers for Environmental Improvement: Hazardous Substances, LifeCycle Design, and End of Life

    This chapter contains sections titled: Introduction Substances of Environmental Concern Design for Environment/Energy Efficiency Recycling and Take-Back Summary References

  • Sustainable Software Development

    While most of the ongoing work in Green IT is focused on manufacturing, deployment and disposal of IT hardware, there is still little awareness regarding the environmental impact of software itself. For example, a new piece of demanding software that requires a hardware upgrade generates e-waste, because it forces the user to dispose a computer that still has not reached its physical end-of-life. Such concern is rarely considered during the software development process. This chapter describes the issues associated with software and sustainability, and it introduces a methodology to measure and incrementally minimize the environmental, social and economic impact of software production. This methodology introduces a set of metrics that can be easily integrated into the team's current software development process, while also bringing business value to stakeholders.



Standards related to End Of Life

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IEEE Recommended Practice for the Selection, Field Testing, and Life Expectancy of Molded Case Circuit Breakers for Industrial Applications

To provide the user with a recommended procedure that is safe and easily understood, for the selection, application, and determination of the remaining life in molded case circuit breakers.



Jobs related to End Of Life

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