Jitter

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Jitter in technical terms is the deviation in or displacement of some aspect of the pulses in a high-frequency digital signal. (Wikipedia.org)






Conferences related to Jitter

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2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)

Annual International Symposium and Exhibition for Electromagnetic Compatibility Practitioners

  • 2016 IEEE International Symposium on Electromagnetic Compatibility - EMC 2016

    To provide a forum for networking and exchange of current EMC information.

  • 2015 IEEE International Symposium on Electromagnetic Compatibility - EMC 2015

    The EMC 2015 provides an excellent forum for presentation, discussion and exchange of the latest EMC problems and solutions from universities, research laboratories and industry.

  • 2014 IEEE International Symposium on Electromagnetic Compatibility - EMC 2014

    This conference will cover topics concerning EMC and signal integrity.

  • 2013 IEEE International Symposium on Electromagnetic Compatibility - EMC 2013

    The 2013 IEEE Denver EMC Symposium will cover nearly all aspects of electromagnetic compatibility to offer researchers, practicing engineers, academia, industry, and government agencies to present their progress, discoveries and share their experiences with colleagues and friends from around the globe.

  • 2012 IEEE International Symposium on Electromagnetic Compatibility - EMC 2012

    The 2012 IEEE Pitsburgh EMC Symposium will cover nearly all aspects of electromagnetic compatibility to offer researchers and practicing engineers from academia, industry, and government agencies to present the progress and results of their work, to exchange ideas, and share experiences with colleagues from around the world involved in EMC.

  • 2011 IEEE International Symposium on Electromagnetic Compatibility - EMC 2011

  • 2010 IEEE International Symposium on Electromagnetic Compatibility - EMC 2010

    The annual EMC Society technical symposium that fosters the exchange of current technology, information and networking. The event includes workshops, technical sessions, exhibits, awards banquet, youth and guest programs, technical committee meetings and collateral technical meetings.

  • 2009 IEEE International Symposium on Electromagnetic Compatibility - EMC 2009

    This is the annual conference sponsored by the IEEE EMC Society. There will be workshops, tutorials, special sessions, regular technical paper sessions, exhibitors providing the latest in EMC diagnostic, test and EMC modeling software, student paper contest, student design contest, experiments and demonstrations.

  • 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008


2013 15th International Conference on Advanced Communication Technology (ICACT)

Technology, standard, service, architecture, strategy, and policy in newly emerging systems and a variety of applications in the area of communications. ICACT2013 provides an open forum for scholar, researcher, engineer, policy maker, network planner, and service provider in the advanced communications technologies.

  • 2012 14th International Conference on Advanced Communication Technology (ICACT)

    Technology, service, architecture, strategy, and policy in newly emerging systems, standards, service, and a variety of applications in the area of telecommunicatons. ICACT 2012 provides an open forum for scholars, researchers, engineers, policy makers, network planners, and service providers in the advanced communication technologies.

  • 2011 13th International Conference on Advanced Communication Technology (ICACT)

    International Conference on Advanced Communication Technology (ICACT) provides an open forum for researchers, engineers, policy, network planners, and service providers in the advanced communication technologies. Extensive exchange of information will be provided on newly emerging systems, standards, services, and variety of applications on the area of telecommunications.

  • 2010 12th International Conference on Advanced Communication Technology (ICACT)

    ICACT is an annual conference providing an open forum for researchers, engineers, network planners, and service providers in telecommunications. Extensive exchange of information will be provided on newly emerging systems, standards, services, and variety of applications in the area of telecommunications.


2013 22nd Wireless and Optical Communication Conference (WOCC 2013)

The Wireless and Optical Communications Conference (WOCC) is held once a year to exchange information among, professionals from Mainland China, Taiwan, Hong-Kong, the United States and other counties and regions on the progress of technologies in the wireless and optical communications arena.The conference dated back to 1992, was initiated by Chinese professionals in the optical and wirelesscommunication fields in the United States with the support of major Chinese-American professional organizations. Through two decades, WOCC has expanded to be an International conference with its main objective to strengthen the technical and business relationships between the Asian, North American and other regions in the world. It also provides a unique forum to bring together experts and industry leaders to exchange advancement in wireless and optical communications technologies, business experiences, and jointly explore new opportunities.


2013 Design, Automation & Test in Europe Conference & Exhibition (DATE 2013)

DATE is the complete event for the European electronic and test community. A leading world conference and exhibition, DATE unites 2,000 professionals with approximately 60 exhibiting companies, cutting edge R&D, industrial designers and technical managers from around the world.

  • 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012)

    DATE is the complete event for the European electronic system and test community. A leading world conference and exhibition, DATE unites 2,000 professionals with some 60 exhibiting companies, cutting edge R&D, industrial designers and technical managers from around the world.

  • 2011 Design, Automation & Test in Europe Conference & Exhibition (DATE 2011)

    DATE is the complete event for the European electronic system and test community. A world leading conference and exhibition, DATE unites 2,000 professionals with some 60 exhibiting companies, cutting edge R&D, industrial designers and technical managers from around the world.

  • 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)

    All aspects of research into technologies for electronic and (embedded) systems engineering. It covers the design process, test, and tools for design automation of electronic products ranging from integrated circuits to distributed large-scale systems.

  • 2009 Design, Automation & Test in Europe Conference & Exhibition (DATE 2009)

    The Design, Automation, and Test in Europe (DATE) conference is the world's premier conference dedicated to electronics system design & test. The technical programme features: Four distinctive and integrated themes, covering all aspects of systems design and engineering. Two special days are focusing on SoC Development Strategies and Multicore Applications.

  • 2008 Design, Automation & Test in Europe Conference & Exhibition (DATE 2008)

    The 11th DATE conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems. It puts strong emphasis on ICs/SoCs, reconfigurable hardware and embedded systems, including embedded software. The five-day event consists of a conference with plenary invited papers, regular papers, panels, hot-topic sessions, tutorials.


2012 IEEE International Test Conference (ITC)

International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, des

  • 2011 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers.

  • 2010 IEEE International Test Conference (ITC)

    ITC is the world's premier conference dedicated to electronic test technology, covering the complete cycle from design verification,test, diagnosis, failure analysis back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces and learn how these challenges have been addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

  • 2009 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek(tm) events, is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers,

  • 2008 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek(tm), is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.

  • 2007 IEEE International Test Conference (ITC)

  • 2006 IEEE International Test Conference (ITC)

  • 2005 IEEE International Test Conference (ITC)


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Periodicals related to Jitter

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Circuits and Systems II: Express Briefs, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Communications, IEEE Transactions on

Telephone, telegraphy, facsimile, and point-to-point television, by electromagnetic propagation, including radio; wire; aerial, underground, coaxial, and submarine cables; waveguides, communication satellites, and lasers; in marine, aeronautical, space and fixed station services; repeaters, radio relaying, signal storage, and regeneration; telecommunication error detection and correction; multiplexing and carrier techniques; communication switching systems; data communications; and communication theory. In addition to the above, ...


Instrumentation and Measurement, IEEE Transactions on

Measurements and instrumentation utilizing electrical and electronic techniques.


Magnetics, IEEE Transactions on

Science and technology related to the basic physics and engineering of magnetism, magnetic materials, applied magnetics, magnetic devices, and magnetic data storage. The Transactions publishes scholarly articles of archival value as well as tutorial expositions and critical reviews of classical subjects and topics of current interest.


Microwave Theory and Techniques, IEEE Transactions on

Microwave theory, techniques, and applications as they relate to components, devices, circuits, and systems involving the generation, transmission, and detection of microwaves.




Xplore Articles related to Jitter

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One-way delay measurement system for local area network delay and jitter characterization

Bálint Ferencz; Tamás Kovácsházy Proceedings of the 2014 15th International Carpathian Control Conference (ICCC), 2014

The IEEE 1588 Standard for A Precision Clock Synchronization Protocol for Networked Measurement and Control Systems (PTP) has been developed to provide better quality in-band clock synchronization in distributed measurement and control systems and other network embedded systems. Using IEEE 1588 compliant Ethernet equipment (network interface cards and switches) it is possible to provide sub 1 microsecond precision of slave ...


Optimizing Speed of a True Random Number Generator in FPGA by Spectral Analysis

Knut Wold; Slobodan Petrovic 2009 Fourth International Conference on Computer Sciences and Convergence Information Technology, 2009

Security and speed are two important properties of today's communication systems. In order to generate initialization vectors and keys for such communication fast enough, a true random number generator (TRNG) with a high bit rate is needed. In this paper an FPGA implementation of a TRNG based on several equal length oscillator rings that achieves a high bit rate is ...


Dependence of the SNS transfer lines and accumulator ring on linac energy

D. Raparia; Y. Y. Lee; J. Wei; W. T. Weng PACS2001. Proceedings of the 2001 Particle Accelerator Conference (Cat. No.01CH37268), 2001

One of the options considered for the SNS linac, to reduce the cost, was to lower the energy to 840 MeV and leave space in the tunnel for a future upgrade to 1.3 GeV either by adding cryo-modules or increasing the gradient in the SC linac. A linac energy other than 1.0 GeV will have an impact on the transfer ...


Nonlinear-optical-loop-mirror-based, phase-preserving 2R regeneration of a high-duty-cycle RZ-DPSK signal

Lu Li; Michael Vasilyev; T. I. Lakoba 2014 Conference on Lasers and Electro-Optics (CLEO) - Laser Science to Photonic Applications, 2014

We use a NOLM with a directional attenuator for regeneration of 50% duty-cycle RZ-DPSK signal and demonstrate eye-opening improvement of 1.5 dB for a signal degraded by a combination of ASE noise and amplitude jitter.


Experiences with videoconferencing over cdma2000

A. Khan; W. Hamdy; S. Kandukuri The 57th IEEE Semiannual Vehicular Technology Conference, 2003. VTC 2003-Spring., 2003

This paper provides details about the lab and field experiments done for facilitating videoconferencing over cdma2000TM. We provide details about the lab setup, the experimental results obtained, and the different system parameters that can be tuned to provide a good videoconferencing experience over cdma2000. Objective results such as power expended and fraction of time the channel is utilized, as well ...


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Educational Resources on Jitter

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eLearning

One-way delay measurement system for local area network delay and jitter characterization

Bálint Ferencz; Tamás Kovácsházy Proceedings of the 2014 15th International Carpathian Control Conference (ICCC), 2014

The IEEE 1588 Standard for A Precision Clock Synchronization Protocol for Networked Measurement and Control Systems (PTP) has been developed to provide better quality in-band clock synchronization in distributed measurement and control systems and other network embedded systems. Using IEEE 1588 compliant Ethernet equipment (network interface cards and switches) it is possible to provide sub 1 microsecond precision of slave ...


Optimizing Speed of a True Random Number Generator in FPGA by Spectral Analysis

Knut Wold; Slobodan Petrovic 2009 Fourth International Conference on Computer Sciences and Convergence Information Technology, 2009

Security and speed are two important properties of today's communication systems. In order to generate initialization vectors and keys for such communication fast enough, a true random number generator (TRNG) with a high bit rate is needed. In this paper an FPGA implementation of a TRNG based on several equal length oscillator rings that achieves a high bit rate is ...


Dependence of the SNS transfer lines and accumulator ring on linac energy

D. Raparia; Y. Y. Lee; J. Wei; W. T. Weng PACS2001. Proceedings of the 2001 Particle Accelerator Conference (Cat. No.01CH37268), 2001

One of the options considered for the SNS linac, to reduce the cost, was to lower the energy to 840 MeV and leave space in the tunnel for a future upgrade to 1.3 GeV either by adding cryo-modules or increasing the gradient in the SC linac. A linac energy other than 1.0 GeV will have an impact on the transfer ...


Nonlinear-optical-loop-mirror-based, phase-preserving 2R regeneration of a high-duty-cycle RZ-DPSK signal

Lu Li; Michael Vasilyev; T. I. Lakoba 2014 Conference on Lasers and Electro-Optics (CLEO) - Laser Science to Photonic Applications, 2014

We use a NOLM with a directional attenuator for regeneration of 50% duty-cycle RZ-DPSK signal and demonstrate eye-opening improvement of 1.5 dB for a signal degraded by a combination of ASE noise and amplitude jitter.


Experiences with videoconferencing over cdma2000

A. Khan; W. Hamdy; S. Kandukuri The 57th IEEE Semiannual Vehicular Technology Conference, 2003. VTC 2003-Spring., 2003

This paper provides details about the lab and field experiments done for facilitating videoconferencing over cdma2000TM. We provide details about the lab setup, the experimental results obtained, and the different system parameters that can be tuned to provide a good videoconferencing experience over cdma2000. Objective results such as power expended and fraction of time the channel is utilized, as well ...


More eLearning Resources

IEEE-USA E-Books

  • Flying-Adder Direct Period Synthesis Architecture

    This chapter contains sections titled: The Working Principle The Major Challenges in the Flying-Adder Circuit The Circuit of Proof of Concept The Working Circuitry Frequency Transfer Function, Frequency Range, Frequency Resolution, and Frequency Switching Speed The Technique of Post Divider Fractional Bits Recovery Flying-Adder PLL: FAPLL Flying-Adder Fractional Divider Integer-Flying-Adder Architecture The Algorithm to Search Optimum Parameters The Construction of the Accumulator The Construction of the High Speed Multiplex Non-2's Power Flying-Adder Circuit Expanding VCO Frequency Range in Nanometer CMOS Processes Multiple Flying-Adder Synthesizers Flying-Adder Implementation Styles Simulation Approaches The Impact of Input Mismatch on Output Jitter Flying-Adder Circuit as Digital Controlled Oscillator Flying-Adder Terminology Flying-Adder Synthesizer and Time-Average-Frequency: The Experimental Evidence Time-Average-Frequency and Setup Constraint: Revisit Sense the Frequency Difference: The Time-Average-Frequency Way Flying-Adder and Direct Digital Synthesis (DDS): The Difference Flying-Adder for Phase (Delay) Synthesis Flying-Adder for Duty Cycle Control Flying-Adder Synthesizer in Reducing the Number of PLLs in SoC Bibliography

  • A Monolithic 2.3nW Clock and Data Recovery Circuit in Silicon Bipolar Technology

    A monolithic clock and data recovery PLL circuit is implemented in a digital silicon bipolar technology without modification. The only external component used is the loop filter capacitor. A self-aligned data recovery architecture combined with a novel phase-detector design eliminates the need for nonlinear rocessing and phase shifter stages. This enables a simpler design with low power and reduced dependence on the bit rate. At 2.3 Gb/s, the test chip consumes 100 mW from a -3.6-V supply, excluding the input and output buffers. The worst-case rms jitter of the recovered clock is less than 14 ps with 223 - 1 pseudorandom bit sequence.

  • A New PhaseLocked Loop Timing Recovery Method for Digital Regenerators

    Timing can be extracted at low cost from a random baseband digital data signal by locking a local oscillator to the reshaped bit streac. To avoid use of a very stable oscillator, a narrowband phase-locked loop is forced to synchronize to the scrambled but otherise unrestricted data by means of an auxiliary frequency sensitive loop. The novel comparator vhich can measure the phase and frequency difference between a local oscillator and a random data signal is described. The method is simple to implement even at high frequency, synchronizes rapidly, and has excellent acquisition and jitter control performance when operated in a cascade of regenerators. A loop with an acquisition range of greater than ±20 percent of the data rate and 0.1 percent noise bandvidth has been demonstrated.

  • Clock and Data Recovery

    Comprehensive coverage of recent developments in phase-locked loop technology The rapid growth of high-speed semiconductor and communication technologies has helped make phase-locked loops (PLLs) an essential part of memories, microprocessors, radio-frequency (RF) transceivers, broadband data communication systems, and other burgeoning fields. Complementing his 1996 Monolithic Phase-Locked Loops and Clock Recovery Circuits (Wiley-IEEE Press), Behzad Razavi now has collected the most important recent writing on PLL into a comprehensive, self-contained look at PLL devices, circuits, and architectures. Phase-Locking in High-Performance Systems: From Devices to Architectures' five original tutorials and eighty-three key papers provide an eminently readable foundation in phase-locked systems. Analog and digital circuit designers will glean a wide range of practical information from the book's . . . * Tutorials dealing with devices, delay-locked loops (DLLs), fractional-N synthesizers, bang-bang PLLs, and simulation of phase noise and jitter * In-depth discussions of passive devices such as inductors, transformers, and varactors * Papers on the analysis of phase noise and jitter in various types of oscillators * Concentrated examinations of building blocks, including the design of oscillators, frequency dividers, and phase/frequency detectors * Articles addressing the problem of clock generation by phase-locking for timing and digital applications, RF synthesis, and the application of phase-locking to clock and data recovery circuits In tandem with its companion volume, Phase-Locking in High-Performance Systems: From Devices to Architectures is a superb reference for anyone working on, or seeking to better understand, this rapidly-developing and increasingly centra l technology.

  • Time-Average-Frequency and Special Clocking Techniques: Gapped Clock, Stretchable Clock, and Pausible Clock

    Gapped clocking is a commonly used technique in optical transport networks (OTNs), broadcast video, and other applications. This chapter discusses the stretchable and pausible clock in connection with the application environment of a NoC (network-on-chip). The gapped clock is produced by removing pulses from a clock signal generated by an untouchable clock source. The chapter also discusses the techniques, including the gapped clock, stretchable clock, pausible clock, and possible others all have the Time-Average-Frequency (TAF) concept work behind the scene. All these special clocking techniques illustrate the fact that the essence of clock frequency is the accomplishment of a specified number of operations within the time window of 1 s. An important topic related to the gapped clock, pausible clock, and stretched clock is clock jitter. It is crucial to understand that the pulse-length modification introduced by these special clocking techniques is an intended operation.

  • Jitter in Ring Oscillators

    Jitter in ring oscillaton is theoretically described, and predictions are experimentally verified. A design procedure is developed in the context of time domain measures or oscillator Jitter in a plase-locked loop (PLL). A major contribution is the identification of a design figure of merit _k_, which is independent or the number of stages in the ring. This figure of merit is used to relate fundamental circuit-level noise sources (such as thermal and shot noise) to system-level jitter performance. The procedure is applied to a ring oscillator composed of bipolar differential pair delay stages. The theoretical predictions are tested on 155 and 622 MHz clock-recovery PLL's which have been fabricated in a dielectrically isolated, complementary bipolar process. The measured closed-loop Jitter is within 10% of the design procedure prediction.

  • A 960Mb/s/pin Interface for SkewTolerant Bus Using Low Jitter PLL

    This paper describes an I/O scheme for use in a highspeed bus which eliminates setup and hold time requirements between clock and data by using an oversampling method. The I/O circuit uses a low jitter phase-locked loop (PLL) which suppresses the effect of supply noise. Measured results show peak-to- peak jitter of 150 ps and nos jitter of 15.7 ps on the clock line. Two experimental chips with 4-pin interface have been fabricated with a 0.6µm CMOS technology, which exhibits the bandwidth of 960 Mb/s per pin.

  • A PhaseLocked Loop with Digital Frequency Comparator for Timing Signal RecoveryThis work was supported by Telecomunicaes do Brasil S/A, under contract TELEBRS/UNICAMP 139/76.

    A Phase-Locked - Loop with a Digital Frequency Comparator for clock extraction in a PCM regenerative repeater is presented. With such a Frequency and Phase- Locked - Loop (FPLL) it is possible to extract the timing signal in a PCM repeater without resort to stable and expensive Voltage Controlled Oscillators. In addition, a small noise bandwidth and a wide pull-in range can be easily obtained, thus improving performance and increasing reliability. Unlike previous solutions which use analog frequency comparators, here we present a completely digital frequency comparator which is simple to implement and which presents a wide margin against spurious outputs produced by input jitter.

  • Time Domain Measurements

    This chapter contains sections titled: Basic Properties of Sample Variances Transfer Functions of Several Time Domain Frequency Stability Measures Time Jitter

  • Magnetically Induced Superresolution

    This chapter contains sections titled: Introduction Limit of Conventional Detection Outline of Magnetically Induced Superresolution Principle of MSR Disk Characteristics Optical Transfer function of Superresolution Data Recording and Jitter Analysis Other Superresolution Disks References



Standards related to Jitter

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