Jitter

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Jitter in technical terms is the deviation in or displacement of some aspect of the pulses in a high-frequency digital signal. (Wikipedia.org)






Conferences related to Jitter

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2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)

Annual International Symposium and Exhibition for Electromagnetic Compatibility Practitioners

  • 2016 IEEE International Symposium on Electromagnetic Compatibility - EMC 2016

    To provide a forum for networking and exchange of current EMC information.

  • 2015 IEEE International Symposium on Electromagnetic Compatibility - EMC 2015

    The EMC 2015 provides an excellent forum for presentation, discussion and exchange of the latest EMC problems and solutions from universities, research laboratories and industry.

  • 2014 IEEE International Symposium on Electromagnetic Compatibility - EMC 2014

    This conference will cover topics concerning EMC and signal integrity.

  • 2013 IEEE International Symposium on Electromagnetic Compatibility - EMC 2013

    The 2013 IEEE Denver EMC Symposium will cover nearly all aspects of electromagnetic compatibility to offer researchers, practicing engineers, academia, industry, and government agencies to present their progress, discoveries and share their experiences with colleagues and friends from around the globe.

  • 2012 IEEE International Symposium on Electromagnetic Compatibility - EMC 2012

    The 2012 IEEE Pitsburgh EMC Symposium will cover nearly all aspects of electromagnetic compatibility to offer researchers and practicing engineers from academia, industry, and government agencies to present the progress and results of their work, to exchange ideas, and share experiences with colleagues from around the world involved in EMC.

  • 2011 IEEE International Symposium on Electromagnetic Compatibility - EMC 2011

  • 2010 IEEE International Symposium on Electromagnetic Compatibility - EMC 2010

    The annual EMC Society technical symposium that fosters the exchange of current technology, information and networking. The event includes workshops, technical sessions, exhibits, awards banquet, youth and guest programs, technical committee meetings and collateral technical meetings.

  • 2009 IEEE International Symposium on Electromagnetic Compatibility - EMC 2009

    This is the annual conference sponsored by the IEEE EMC Society. There will be workshops, tutorials, special sessions, regular technical paper sessions, exhibitors providing the latest in EMC diagnostic, test and EMC modeling software, student paper contest, student design contest, experiments and demonstrations.

  • 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008


2013 15th International Conference on Advanced Communication Technology (ICACT)

Technology, standard, service, architecture, strategy, and policy in newly emerging systems and a variety of applications in the area of communications. ICACT2013 provides an open forum for scholar, researcher, engineer, policy maker, network planner, and service provider in the advanced communications technologies.

  • 2012 14th International Conference on Advanced Communication Technology (ICACT)

    Technology, service, architecture, strategy, and policy in newly emerging systems, standards, service, and a variety of applications in the area of telecommunicatons. ICACT 2012 provides an open forum for scholars, researchers, engineers, policy makers, network planners, and service providers in the advanced communication technologies.

  • 2011 13th International Conference on Advanced Communication Technology (ICACT)

    International Conference on Advanced Communication Technology (ICACT) provides an open forum for researchers, engineers, policy, network planners, and service providers in the advanced communication technologies. Extensive exchange of information will be provided on newly emerging systems, standards, services, and variety of applications on the area of telecommunications.

  • 2010 12th International Conference on Advanced Communication Technology (ICACT)

    ICACT is an annual conference providing an open forum for researchers, engineers, network planners, and service providers in telecommunications. Extensive exchange of information will be provided on newly emerging systems, standards, services, and variety of applications in the area of telecommunications.


2013 22nd Wireless and Optical Communication Conference (WOCC 2013)

The Wireless and Optical Communications Conference (WOCC) is held once a year to exchange information among, professionals from Mainland China, Taiwan, Hong-Kong, the United States and other counties and regions on the progress of technologies in the wireless and optical communications arena.The conference dated back to 1992, was initiated by Chinese professionals in the optical and wirelesscommunication fields in the United States with the support of major Chinese-American professional organizations. Through two decades, WOCC has expanded to be an International conference with its main objective to strengthen the technical and business relationships between the Asian, North American and other regions in the world. It also provides a unique forum to bring together experts and industry leaders to exchange advancement in wireless and optical communications technologies, business experiences, and jointly explore new opportunities.


2013 Design, Automation & Test in Europe Conference & Exhibition (DATE 2013)

DATE is the complete event for the European electronic and test community. A leading world conference and exhibition, DATE unites 2,000 professionals with approximately 60 exhibiting companies, cutting edge R&D, industrial designers and technical managers from around the world.

  • 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012)

    DATE is the complete event for the European electronic system and test community. A leading world conference and exhibition, DATE unites 2,000 professionals with some 60 exhibiting companies, cutting edge R&D, industrial designers and technical managers from around the world.

  • 2011 Design, Automation & Test in Europe Conference & Exhibition (DATE 2011)

    DATE is the complete event for the European electronic system and test community. A world leading conference and exhibition, DATE unites 2,000 professionals with some 60 exhibiting companies, cutting edge R&D, industrial designers and technical managers from around the world.

  • 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)

    All aspects of research into technologies for electronic and (embedded) systems engineering. It covers the design process, test, and tools for design automation of electronic products ranging from integrated circuits to distributed large-scale systems.

  • 2009 Design, Automation & Test in Europe Conference & Exhibition (DATE 2009)

    The Design, Automation, and Test in Europe (DATE) conference is the world's premier conference dedicated to electronics system design & test. The technical programme features: Four distinctive and integrated themes, covering all aspects of systems design and engineering. Two special days are focusing on SoC Development Strategies and Multicore Applications.

  • 2008 Design, Automation & Test in Europe Conference & Exhibition (DATE 2008)

    The 11th DATE conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems. It puts strong emphasis on ICs/SoCs, reconfigurable hardware and embedded systems, including embedded software. The five-day event consists of a conference with plenary invited papers, regular papers, panels, hot-topic sessions, tutorials.


2012 IEEE International Test Conference (ITC)

International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, des

  • 2011 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers.

  • 2010 IEEE International Test Conference (ITC)

    ITC is the world's premier conference dedicated to electronic test technology, covering the complete cycle from design verification,test, diagnosis, failure analysis back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces and learn how these challenges have been addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

  • 2009 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek(tm) events, is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers,

  • 2008 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek(tm), is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.

  • 2007 IEEE International Test Conference (ITC)

  • 2006 IEEE International Test Conference (ITC)

  • 2005 IEEE International Test Conference (ITC)


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Periodicals related to Jitter

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Circuits and Systems II: Express Briefs, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Communications, IEEE Transactions on

Telephone, telegraphy, facsimile, and point-to-point television, by electromagnetic propagation, including radio; wire; aerial, underground, coaxial, and submarine cables; waveguides, communication satellites, and lasers; in marine, aeronautical, space and fixed station services; repeaters, radio relaying, signal storage, and regeneration; telecommunication error detection and correction; multiplexing and carrier techniques; communication switching systems; data communications; and communication theory. In addition to the above, ...


Instrumentation and Measurement, IEEE Transactions on

Measurements and instrumentation utilizing electrical and electronic techniques.


Magnetics, IEEE Transactions on

Science and technology related to the basic physics and engineering of magnetism, magnetic materials, applied magnetics, magnetic devices, and magnetic data storage. The Transactions publishes scholarly articles of archival value as well as tutorial expositions and critical reviews of classical subjects and topics of current interest.


Microwave Theory and Techniques, IEEE Transactions on

Microwave theory, techniques, and applications as they relate to components, devices, circuits, and systems involving the generation, transmission, and detection of microwaves.




Xplore Articles related to Jitter

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Energy-constrained error control for wireless channels

M. Zorzi; R. R. Rao IEEE Personal Communications, 1997

When terminals powered by a finite battery source are used for wireless communications, energy constraints are likely to influence the choice of error control protocols. Therefore, we propose the average number of correctly transmitted packets during the lifetime of the battery as a new metric. In particular, we study the go-back-N retransmission protocol operating over a wireless channel using a ...


The transverse long-range wakefield in RDDS1 for the JLC/NLC X-band linacs

R. M. Jones; N. M. Kroll; R. H. Miller; T. Higo; Z. Li; R. D. Ruth; J. W. Wang Proceedings of the 1999 Particle Accelerator Conference (Cat. No.99CH36366), 1999

The re-designed RDDS (Rounded Damped Detuned Structure) consists of 206 cells with a rounded cell profile formed by a number of circular arcs and a straight section. In the previous analyses of the present structure all cells have been assumed to be coupled to the manifold via slots cut into the cells and, a perfect match to the HOM (Higher ...


A Reconfigurable IF to DC Sub-Sampling Receiver Architecture With Embedded Channel Filtering for 60 GHz Applications

Baptiste Grave; Antoine Frappé; Andreas Kaiser IEEE Transactions on Circuits and Systems I: Regular Papers, 2013

This paper presents the theoretical analysis and simulation results of an IF to DC subsampler for 60 GHz heterodyne receivers architectures. A particular arrangement of the frequency plan allows embedded anti-alias filtering. Down- conversion, channel filtering and IQ demodulation are merged into a unique operation at no extra cost in terms of area and power consumption. The adjacent and alternate ...


40 Gbps SiGe pattern generator IC with variable clock skew and output levels

M. J. Zahller; G. S. La Rue 2006 IEEE Workshop on Microelectronics and Electron Devices, 2006. WMED '06., 2006

A single-chip 40 Gbps pattern generator design in 0.18 mum SiGe BiCMOS technology is described. An on-chip 128times128 bit RAM with an access time of 3 ns stores the data pattern. A hybrid 128:1 CMOS/ECL multiplexer increases the output data rate from the RAM to 40 Gbps. The output driver is back terminated with 50 ohms and provides programmable levels ...


Analysis and comparison of DDR3/DDR4 clock duty-cycle-distortion (DCD) for UDIMM and discrete SDRAM component configurations

Gawon Kim; June Feng; Marjan Mokhtaari; Janmejay Adhyaru; Raheel Shaikh; Balaji Natarajan; Dan Oh IEEE Electromagnetic Compatibility Magazine, 2016

In this paper, the clock duty cycle distortion (DCD) jitter will be investigated and the results will be compared for two channel configurations: using a general UDIMM topology and using discrete SDRAM component topology. These channel configurations will be simulated and analyzed for ISI effects, such as channel loss and reflection. The outcome of this investigation will show the primary ...


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Educational Resources on Jitter

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eLearning

Energy-constrained error control for wireless channels

M. Zorzi; R. R. Rao IEEE Personal Communications, 1997

When terminals powered by a finite battery source are used for wireless communications, energy constraints are likely to influence the choice of error control protocols. Therefore, we propose the average number of correctly transmitted packets during the lifetime of the battery as a new metric. In particular, we study the go-back-N retransmission protocol operating over a wireless channel using a ...


The transverse long-range wakefield in RDDS1 for the JLC/NLC X-band linacs

R. M. Jones; N. M. Kroll; R. H. Miller; T. Higo; Z. Li; R. D. Ruth; J. W. Wang Proceedings of the 1999 Particle Accelerator Conference (Cat. No.99CH36366), 1999

The re-designed RDDS (Rounded Damped Detuned Structure) consists of 206 cells with a rounded cell profile formed by a number of circular arcs and a straight section. In the previous analyses of the present structure all cells have been assumed to be coupled to the manifold via slots cut into the cells and, a perfect match to the HOM (Higher ...


A Reconfigurable IF to DC Sub-Sampling Receiver Architecture With Embedded Channel Filtering for 60 GHz Applications

Baptiste Grave; Antoine Frappé; Andreas Kaiser IEEE Transactions on Circuits and Systems I: Regular Papers, 2013

This paper presents the theoretical analysis and simulation results of an IF to DC subsampler for 60 GHz heterodyne receivers architectures. A particular arrangement of the frequency plan allows embedded anti-alias filtering. Down- conversion, channel filtering and IQ demodulation are merged into a unique operation at no extra cost in terms of area and power consumption. The adjacent and alternate ...


40 Gbps SiGe pattern generator IC with variable clock skew and output levels

M. J. Zahller; G. S. La Rue 2006 IEEE Workshop on Microelectronics and Electron Devices, 2006. WMED '06., 2006

A single-chip 40 Gbps pattern generator design in 0.18 mum SiGe BiCMOS technology is described. An on-chip 128times128 bit RAM with an access time of 3 ns stores the data pattern. A hybrid 128:1 CMOS/ECL multiplexer increases the output data rate from the RAM to 40 Gbps. The output driver is back terminated with 50 ohms and provides programmable levels ...


Analysis and comparison of DDR3/DDR4 clock duty-cycle-distortion (DCD) for UDIMM and discrete SDRAM component configurations

Gawon Kim; June Feng; Marjan Mokhtaari; Janmejay Adhyaru; Raheel Shaikh; Balaji Natarajan; Dan Oh IEEE Electromagnetic Compatibility Magazine, 2016

In this paper, the clock duty cycle distortion (DCD) jitter will be investigated and the results will be compared for two channel configurations: using a general UDIMM topology and using discrete SDRAM component topology. These channel configurations will be simulated and analyzed for ISI effects, such as channel loss and reflection. The outcome of this investigation will show the primary ...


More eLearning Resources

IEEE-USA E-Books

  • Devices

    Comprehensive coverage of recent developments in phase-locked loop technology The rapid growth of high-speed semiconductor and communication technologies has helped make phase-locked loops (PLLs) an essential part of memories, microprocessors, radio-frequency (RF) transceivers, broadband data communication systems, and other burgeoning fields. Complementing his 1996 Monolithic Phase-Locked Loops and Clock Recovery Circuits (Wiley-IEEE Press), Behzad Razavi now has collected the most important recent writing on PLL into a comprehensive, self-contained look at PLL devices, circuits, and architectures. Phase-Locking in High-Performance Systems: From Devices to Architectures' five original tutorials and eighty-three key papers provide an eminently readable foundation in phase-locked systems. Analog and digital circuit designers will glean a wide range of practical information from the book's . . . * Tutorials dealing with devices, delay-locked loops (DLLs), fractio al-N synthesizers, bang-bang PLLs, and simulation of phase noise and jitter * In-depth discussions of passive devices such as inductors, transformers, and varactors * Papers on the analysis of phase noise and jitter in various types of oscillators * Concentrated examinations of building blocks, including the design of oscillators, frequency dividers, and phase/frequency detectors * Articles addressing the problem of clock generation by phase-locking for timing and digital applications, RF synthesis, and the application of phase-locking to clock and data recovery circuits In tandem with its companion volume, Phase-Locking in High-Performance Systems: From Devices to Architectures is a superb reference for anyone working on, or seeking to better understand, this rapidly-developing and increasingly central technology.

  • Flying-Adder Direct Period Synthesis Architecture

    This chapter contains sections titled: The Working Principle The Major Challenges in the Flying-Adder Circuit The Circuit of Proof of Concept The Working Circuitry Frequency Transfer Function, Frequency Range, Frequency Resolution, and Frequency Switching Speed The Technique of Post Divider Fractional Bits Recovery Flying-Adder PLL: FAPLL Flying-Adder Fractional Divider Integer-Flying-Adder Architecture The Algorithm to Search Optimum Parameters The Construction of the Accumulator The Construction of the High Speed Multiplex Non-2's Power Flying-Adder Circuit Expanding VCO Frequency Range in Nanometer CMOS Processes Multiple Flying-Adder Synthesizers Flying-Adder Implementation Styles Simulation Approaches The Impact of Input Mismatch on Output Jitter Flying-Adder Circuit as Digital Controlled Oscillator Flying-Adder Terminology Flying-Adder Synthesizer and Time-Average-Frequency: The Experimental Evidence Time-Average-Frequency and Setup Constraint: Revisit Sense the Frequency Difference: The Time-Average-Frequency Way Flying-Adder and Direct Digital Synthesis (DDS): The Difference Flying-Adder for Phase (Delay) Synthesis Flying-Adder for Duty Cycle Control Flying-Adder Synthesizer in Reducing the Number of PLLs in SoC Bibliography

  • Jitter in Ring Oscillators

    Jitter in ring oscillaton is theoretically described, and predictions are experimentally verified. A design procedure is developed in the context of time domain measures or oscillator Jitter in a plase-locked loop (PLL). A major contribution is the identification of a design figure of merit _k_, which is independent or the number of stages in the ring. This figure of merit is used to relate fundamental circuit-level noise sources (such as thermal and shot noise) to system-level jitter performance. The procedure is applied to a ring oscillator composed of bipolar differential pair delay stages. The theoretical predictions are tested on 155 and 622 MHz clock-recovery PLL's which have been fabricated in a dielectrically isolated, complementary bipolar process. The measured closed-loop Jitter is within 10% of the design procedure prediction.

  • Phase-Locked Loops

    This chapter contains sections titled: PLL Basic PLL Design Stability of the PLL Tracking Working Ranges of PLL Digital PLL PLL Phase Noise PLL Time Jitter Spurious Signals Synchronized Oscillators

  • Multipath

    Like uncorrelated interference, multipath introduces errors in receiver measurements of time of arrival and carrier phase, thus causing errors in the estimation of PVT. Unlike uncorrelated interference, however, multipath can have the same or similar characteristics over multiple correlation integration times, introducing constant or slowly varying errors rather than the rapidly fluctuating jitter caused by noise and interference. Multipath-induced errors can often be the largest source of PVT error with new and modernized satnav systems. This chapter describes the origin, characteristics, and effects of multipath, as well as ways to mitigate multipath and its effects, including the combination of multipath and shadowing. It provides models of multipath channels and characterizes different multipath environments. The chapter shows the effects of multipath on receiver processing and its performance. It addresses multipath mitigation at the system level and by receiver processing.

  • Marx Generators and Marx???Like Circuits

    The simplest and most widely used high???voltage impulse generator is the device Erwin Marx introduced in 1925 for testing high???voltage components and equipment for the emerging power industry. This chapter discusses the principles of operation and overall performance of Marx generators. For instruction, the design formulas for simple Marx generators based on their equivalent circuits are given in considerable detail. A fully erected Marx generator is essentially a capacitive discharge. Thus, the load voltage depends not only on the characteristics of the Marx but also on the characteristics of the load. The chapter highlights some aspects in the discussion of modified Marx configurations. It reviews the importance of overvoltages to Marx operation, as well as advanced triggering techniques. The chapter also discusses various aspects of Marx generators such as electrical insulation, delay time and jitter, and the selection of components.

  • Modeling and Budgeting of Timing Jitter and Noise

    This chapter contains sections titled: Eye Diagram Bit Error Rate Jitter Sources and Budgets Noise Sources and Budgets Peak Distortion Analysis Methods Summary References Problems

  • Original Contributions

    Comprehensive coverage of recent developments in phase-locked loop technology The rapid growth of high-speed semiconductor and communication technologies has helped make phase-locked loops (PLLs) an essential part of memories, microprocessors, radio-frequency (RF) transceivers, broadband data communication systems, and other burgeoning fields. Complementing his 1996 Monolithic Phase-Locked Loops and Clock Recovery Circuits (Wiley-IEEE Press), Behzad Razavi now has collected the most important recent writing on PLL into a comprehensive, self-contained look at PLL devices, circuits, and architectures. Phase-Locking in High-Performance Systems: From Devices to Architectures' five original tutorials and eighty-three key papers provide an eminently readable foundation in phase-locked systems. Analog and digital circuit designers will glean a wide range of practical information from the book's . . . * Tutorials dealing with devices, delay-locked loops (DLLs), fractio al-N synthesizers, bang-bang PLLs, and simulation of phase noise and jitter * In-depth discussions of passive devices such as inductors, transformers, and varactors * Papers on the analysis of phase noise and jitter in various types of oscillators * Concentrated examinations of building blocks, including the design of oscillators, frequency dividers, and phase/frequency detectors * Articles addressing the problem of clock generation by phase-locking for timing and digital applications, RF synthesis, and the application of phase-locking to clock and data recovery circuits In tandem with its companion volume, Phase-Locking in High-Performance Systems: From Devices to Architectures is a superb reference for anyone working on, or seeking to better understand, this rapidly-developing and increasingly central technology.

  • Rotary TravelingWave Oscillator Arrays: A New Clock Technology

    Rotary traveling-wave oscillators (RTWOs) represent a new transmission-line approach to gigahertz-rate clock generation. Using the inherently stable LC characteristics of on-chip VLSI interconnect, the clock distribution network becomes a low-impedance distributed oscillator. The RTWO operates by creating a rotating traveling wave within a closed-loop differential transmission line. Distributed CMOS inverters serve as both transmission-line amplifiers and latches to power the oscillation and ensure rotational lock. Load capacitance is absorbed into the transmission-line constants whereby energy is recirculated giving an adiabatic quality. Unusually for an LC oscillator, multiphase (360°) square waves are produced directly. RTWO structures are compact and can be wired together to form rotary oscillator arrays (ROAs) to distribute a phase-locked clock over a large chip. The principle is scalable to very high clock frequencies. Issues related to interconnect and field coupling dominate the design process for RTWOs. Taking precautions to avoid unwanted signal couplings, the rise and fall times of 20 ps, suggested by simulation, may be realized at low power consumption. Experimental results of the 0.25-µm CMOS test chip with 950-MHz and 3.4-GHz rings are presented, indicating 5.5-ps jitter and 34-dB power supply rejection ratio (PSRR). Design errors in the test chip precluded meaningful rise and fall time measurements.

  • Jitter and Phase Noise in Ring Oscillators

    A companion analysis of clock jitter and phase noise of single-ended and differential ring oscillators is presented. The impulse sensitivity functions are used to derive expressions for the litter and phase noise of ring oscillators. The effect of the number of stages, power dissipation, frequency of oscillation. and shortchannel etleds on the jitter and phase noise of ring oscillators is analyzed. Jitter and pbase noise due to substrate and supply noise is discussed, and the effect of symmetry on the upconversion of 1/_f_ noise is demonstrated. Several new design insights are given for low jitter /phase-noise design. Good agreement between theory and measurements is observed.



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