Jitter

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Jitter in technical terms is the deviation in or displacement of some aspect of the pulses in a high-frequency digital signal. (Wikipedia.org)






Conferences related to Jitter

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2017 IEEE International Symposium on Electromagnetic Compatibility - EMC 2017

Annual International Symposium and Exhibition for Electromagnetic Compatibility Practitioners

  • 2016 IEEE International Symposium on Electromagnetic Compatibility - EMC 2016

    To provide a forum for networking and exchange of current EMC information.

  • 2015 IEEE International Symposium on Electromagnetic Compatibility - EMC 2015

    The EMC 2015 provides an excellent forum for presentation, discussion and exchange of the latest EMC problems and solutions from universities, research laboratories and industry.

  • 2014 IEEE International Symposium on Electromagnetic Compatibility - EMC 2014

    This conference will cover topics concerning EMC and signal integrity.

  • 2013 IEEE International Symposium on Electromagnetic Compatibility - EMC 2013

    The 2013 IEEE Denver EMC Symposium will cover nearly all aspects of electromagnetic compatibility to offer researchers, practicing engineers, academia, industry, and government agencies to present their progress, discoveries and share their experiences with colleagues and friends from around the globe.

  • 2012 IEEE International Symposium on Electromagnetic Compatibility - EMC 2012

    The 2012 IEEE Pitsburgh EMC Symposium will cover nearly all aspects of electromagnetic compatibility to offer researchers and practicing engineers from academia, industry, and government agencies to present the progress and results of their work, to exchange ideas, and share experiences with colleagues from around the world involved in EMC.

  • 2011 IEEE International Symposium on Electromagnetic Compatibility - EMC 2011

  • 2010 IEEE International Symposium on Electromagnetic Compatibility - EMC 2010

    The annual EMC Society technical symposium that fosters the exchange of current technology, information and networking. The event includes workshops, technical sessions, exhibits, awards banquet, youth and guest programs, technical committee meetings and collateral technical meetings.

  • 2009 IEEE International Symposium on Electromagnetic Compatibility - EMC 2009

    This is the annual conference sponsored by the IEEE EMC Society. There will be workshops, tutorials, special sessions, regular technical paper sessions, exhibitors providing the latest in EMC diagnostic, test and EMC modeling software, student paper contest, student design contest, experiments and demonstrations.

  • 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008


2013 15th International Conference on Advanced Communication Technology (ICACT)

Technology, standard, service, architecture, strategy, and policy in newly emerging systems and a variety of applications in the area of communications. ICACT2013 provides an open forum for scholar, researcher, engineer, policy maker, network planner, and service provider in the advanced communications technologies.

  • 2012 14th International Conference on Advanced Communication Technology (ICACT)

    Technology, service, architecture, strategy, and policy in newly emerging systems, standards, service, and a variety of applications in the area of telecommunicatons. ICACT 2012 provides an open forum for scholars, researchers, engineers, policy makers, network planners, and service providers in the advanced communication technologies.

  • 2011 13th International Conference on Advanced Communication Technology (ICACT)

    International Conference on Advanced Communication Technology (ICACT) provides an open forum for researchers, engineers, policy, network planners, and service providers in the advanced communication technologies. Extensive exchange of information will be provided on newly emerging systems, standards, services, and variety of applications on the area of telecommunications.

  • 2010 12th International Conference on Advanced Communication Technology (ICACT)

    ICACT is an annual conference providing an open forum for researchers, engineers, network planners, and service providers in telecommunications. Extensive exchange of information will be provided on newly emerging systems, standards, services, and variety of applications in the area of telecommunications.


2013 22nd Wireless and Optical Communication Conference (WOCC 2013)

The Wireless and Optical Communications Conference (WOCC) is held once a year to exchange information among, professionals from Mainland China, Taiwan, Hong-Kong, the United States and other counties and regions on the progress of technologies in the wireless and optical communications arena.The conference dated back to 1992, was initiated by Chinese professionals in the optical and wirelesscommunication fields in the United States with the support of major Chinese-American professional organizations. Through two decades, WOCC has expanded to be an International conference with its main objective to strengthen the technical and business relationships between the Asian, North American and other regions in the world. It also provides a unique forum to bring together experts and industry leaders to exchange advancement in wireless and optical communications technologies, business experiences, and jointly explore new opportunities.


2013 Design, Automation & Test in Europe Conference & Exhibition (DATE 2013)

DATE is the complete event for the European electronic and test community. A leading world conference and exhibition, DATE unites 2,000 professionals with approximately 60 exhibiting companies, cutting edge R&D, industrial designers and technical managers from around the world.

  • 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012)

    DATE is the complete event for the European electronic system and test community. A leading world conference and exhibition, DATE unites 2,000 professionals with some 60 exhibiting companies, cutting edge R&D, industrial designers and technical managers from around the world.

  • 2011 Design, Automation & Test in Europe Conference & Exhibition (DATE 2011)

    DATE is the complete event for the European electronic system and test community. A world leading conference and exhibition, DATE unites 2,000 professionals with some 60 exhibiting companies, cutting edge R&D, industrial designers and technical managers from around the world.

  • 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)

    All aspects of research into technologies for electronic and (embedded) systems engineering. It covers the design process, test, and tools for design automation of electronic products ranging from integrated circuits to distributed large-scale systems.

  • 2009 Design, Automation & Test in Europe Conference & Exhibition (DATE 2009)

    The Design, Automation, and Test in Europe (DATE) conference is the world's premier conference dedicated to electronics system design & test. The technical programme features: Four distinctive and integrated themes, covering all aspects of systems design and engineering. Two special days are focusing on SoC Development Strategies and Multicore Applications.

  • 2008 Design, Automation & Test in Europe Conference & Exhibition (DATE 2008)

    The 11th DATE conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems. It puts strong emphasis on ICs/SoCs, reconfigurable hardware and embedded systems, including embedded software. The five-day event consists of a conference with plenary invited papers, regular papers, panels, hot-topic sessions, tutorials.


2012 IEEE International Test Conference (ITC)

International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, des

  • 2011 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers.

  • 2010 IEEE International Test Conference (ITC)

    ITC is the world's premier conference dedicated to electronic test technology, covering the complete cycle from design verification,test, diagnosis, failure analysis back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces and learn how these challenges have been addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

  • 2009 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek(tm) events, is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers,

  • 2008 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek(tm), is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.

  • 2007 IEEE International Test Conference (ITC)

  • 2006 IEEE International Test Conference (ITC)

  • 2005 IEEE International Test Conference (ITC)


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Periodicals related to Jitter

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Circuits and Systems II: Express Briefs, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Communications, IEEE Transactions on

Telephone, telegraphy, facsimile, and point-to-point television, by electromagnetic propagation, including radio; wire; aerial, underground, coaxial, and submarine cables; waveguides, communication satellites, and lasers; in marine, aeronautical, space and fixed station services; repeaters, radio relaying, signal storage, and regeneration; telecommunication error detection and correction; multiplexing and carrier techniques; communication switching systems; data communications; and communication theory. In addition to the above, ...


Instrumentation and Measurement, IEEE Transactions on

Measurements and instrumentation utilizing electrical and electronic techniques.


Magnetics, IEEE Transactions on

Science and technology related to the basic physics and engineering of magnetism, magnetic materials, applied magnetics, magnetic devices, and magnetic data storage. The Transactions publishes scholarly articles of archival value as well as tutorial expositions and critical reviews of classical subjects and topics of current interest.


Microwave Theory and Techniques, IEEE Transactions on

Microwave theory, techniques, and applications as they relate to components, devices, circuits, and systems involving the generation, transmission, and detection of microwaves.




Xplore Articles related to Jitter

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An Investigation Into Baseband Techniques for Single-Channel Full-Duplex Wireless Communication Systems

Shenghong Li; Ross D. Murch IEEE Transactions on Wireless Communications, 2014

Full-duplex wireless communication is becoming an important research area because of its potential for increasing spectral efficiency. The challenge of such systems lies in cancelling the self-interference. In this paper, we focus on the design of digital cancellation schemes and use them to supplement RF/analog cancellation techniques. The performance of digital cancellation is limited by the non-ideal characteristics of different ...


The statistical distribution of switch-on delay in single-mode semiconductor lasers I: equilibrium off-condition

G. H. B. Thompson; J. H. Fraser; B. Garrett IEEE Journal of Quantum Electronics, 1995

The theory of stochastic processes as applied to photon emission and absorption events is used to calculate the distribution of delay in switch-on from a sub-threshold condition in directly modulated semiconductor lasers down to a probability of 10-10. This involves the derivation of the relative probability distribution of photon number in the laser late enough in the switch-on process such ...


Experimental Study of the Timing Jitter of a Passively Mode-Locked External-Cavity Semiconductor Laser Subject to Repetition Rate Transitions and Optical Feedback

Simon Rauch; Lukas Drzewietzki; Andreas Klehr; Joachim Sacher; Wolfgang Elsäßer; Stefan Breuer IEEE Journal of Quantum Electronics, 2015

We experimentally investigate the timing jitter (TJ) of a passively mode- locked external-cavity diode laser. Variation of the gain current and the absorber reverse bias voltage allows transitions from fundamental mode-locking up to seventh harmonic mode-locking. Hereby, a reduction of the TJ as a function of the harmonic mode-locking order is found. Furthermore, the application of optical feedback results in ...


An integrated CMOS PLL for low-jitter applications

F. Herzel; G. Fischer; H. Gustat; P. Weger IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, 2002

This brief presents a fully integrated integer-N frequency synthesizer with a frequency-tuning range from 2.4 to 2.9 GHz and root-mean-square (rms) jitter below 2.5 ps over 350 MHz. The employed architecture using an inductance- capacitance (L-C) oscillator with two control inputs combines a wide tuning range with a low noise sensitivity. Potential applications include clock generation in microprocessors and clock ...


Fast and accurate transaction-level model of a wormhole network-on-chip with priority preemptive virtual channel arbitration

Leandro Soares Indrusiak; Osmar Marchi dos Santos 2011 Design, Automation & Test in Europe, 2011

Simulation is a bottleneck in the design flow of on-chip multiprocessors. This paper addresses that problem by reducing the simulation time of complex on- chip interconnects through transaction-level modelling (TLM). A particular on- chip interconnect architecture was chosen, namely a wormhole network-on-chip with priority preemptive virtual channel arbitration, because its mechanisms can be modelled at transaction level in such a ...


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Educational Resources on Jitter

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eLearning

An Investigation Into Baseband Techniques for Single-Channel Full-Duplex Wireless Communication Systems

Shenghong Li; Ross D. Murch IEEE Transactions on Wireless Communications, 2014

Full-duplex wireless communication is becoming an important research area because of its potential for increasing spectral efficiency. The challenge of such systems lies in cancelling the self-interference. In this paper, we focus on the design of digital cancellation schemes and use them to supplement RF/analog cancellation techniques. The performance of digital cancellation is limited by the non-ideal characteristics of different ...


The statistical distribution of switch-on delay in single-mode semiconductor lasers I: equilibrium off-condition

G. H. B. Thompson; J. H. Fraser; B. Garrett IEEE Journal of Quantum Electronics, 1995

The theory of stochastic processes as applied to photon emission and absorption events is used to calculate the distribution of delay in switch-on from a sub-threshold condition in directly modulated semiconductor lasers down to a probability of 10-10. This involves the derivation of the relative probability distribution of photon number in the laser late enough in the switch-on process such ...


Experimental Study of the Timing Jitter of a Passively Mode-Locked External-Cavity Semiconductor Laser Subject to Repetition Rate Transitions and Optical Feedback

Simon Rauch; Lukas Drzewietzki; Andreas Klehr; Joachim Sacher; Wolfgang Elsäßer; Stefan Breuer IEEE Journal of Quantum Electronics, 2015

We experimentally investigate the timing jitter (TJ) of a passively mode- locked external-cavity diode laser. Variation of the gain current and the absorber reverse bias voltage allows transitions from fundamental mode-locking up to seventh harmonic mode-locking. Hereby, a reduction of the TJ as a function of the harmonic mode-locking order is found. Furthermore, the application of optical feedback results in ...


An integrated CMOS PLL for low-jitter applications

F. Herzel; G. Fischer; H. Gustat; P. Weger IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing, 2002

This brief presents a fully integrated integer-N frequency synthesizer with a frequency-tuning range from 2.4 to 2.9 GHz and root-mean-square (rms) jitter below 2.5 ps over 350 MHz. The employed architecture using an inductance- capacitance (L-C) oscillator with two control inputs combines a wide tuning range with a low noise sensitivity. Potential applications include clock generation in microprocessors and clock ...


Fast and accurate transaction-level model of a wormhole network-on-chip with priority preemptive virtual channel arbitration

Leandro Soares Indrusiak; Osmar Marchi dos Santos 2011 Design, Automation & Test in Europe, 2011

Simulation is a bottleneck in the design flow of on-chip multiprocessors. This paper addresses that problem by reducing the simulation time of complex on- chip interconnects through transaction-level modelling (TLM). A particular on- chip interconnect architecture was chosen, namely a wormhole network-on-chip with priority preemptive virtual channel arbitration, because its mechanisms can be modelled at transaction level in such a ...


More eLearning Resources

IEEE-USA E-Books

  • Timing, Jitter, and Wander

    This chapter contains sections titled: The Primary Reference Source The Phase-Lock Loop Bit, Frame, and Payload Synchronization Synchronization Impairments Network Hierarchy Theoretical Foundation of Timing Error Traffic Probability and Signal Quality Jitter and Wander Wander References Standards

  • A LowNoise FastLock PhaseLocked Loop with Adaptive Bandwidth Control

    This paper presents a salient analog phase-locked loop (PLL) that adaptively controls the loop bandwidth according to the locking status and the phase error amount. When the phase error is large, such as in the locking mode, the PLL increases the loop bandwidth and achieves fast locking. On the other hand, when the phase error is small, this PLL decreases the loop bandwidth and minimizes output jitters. Based on an analog recursive bandwidth control algorithm, the PLL achieves the phase and frequency lock in less than 30 clock cycles without pre-training, and maintains the cycle-to-cycle jitter within 20 ps (peak-to-peak) in the tracking mode. A feed forward-type duty-cycle corrector is designed to keep the 50% duty cycle ratio over all operating frequency range.

  • A Fully Integrated SiGe Receiver IC for 10Gb/s Data Rate

    A silicon germanium (SiGe) receiver IC is presented here which integrates most of the 10-Gb/s SONET receiver functions. The receiver combines an automatic gain control and clock and data recovery circuit (CDR) with a binary-type phase-locked loop, 1 : 8 demultiplexer, and a 27 - 1 pseudorandom bit sequence generator for self-testing. This work demonstrates a higher level of integration compared to other silicon designs as well as a CDR with SONET- compliant jitter characteristics. The receiver has a die size of 4.5 x 4.5 mm2 and consumes 4.5 W from -5 V.

  • A LowJitter 1251250MHz ProcessIndependent and RipplePoleless 0.18m CMOS PLL Based on a SampleReset Loop Filter

    This paper describes a low-jitter phase-locked loop (PLL) implemented in a 0.18-µpm CMOS process. A sample-reset loop filter architecture is used that averages the oscillator proportional control current which provides the feedforward zero over an entire update period and hence leads to a ripple-free control signal. The ripple-free control current eliminates the need for an additional filtering pole, leading to a nearly 90° phase margin which minimizes input jitter peaking and transient locking overshoot. The PLL damping factor is made insensitive to process variations by making it dependent only upon a bandgap voltage and ratios of circuit elements. This ensures tracking between the natural frequency and the stabilizing zero. The PLL has a frequency range of 125-1250 MHz, frequency resolution better than 500 kHz, and rms jitter less than 0.9% of the oscillator period.

  • A 10Gb/s CMOS Clock and Data Recovery Circuit with a HalfRate Linear Phase Detector

    A 10-Gb/s phase-locked clock and data recovery circuit incorporates an interpolating voltage-controlled oscillator and a half-rate phase detector. The phase detector provides a linear characteristic while retiming and demultiplexing the data with no systematic phase offset. Fabricated in a 0.18-µm CMOS technology in an area of 1.1 x 0.9 mm2, the circuit exhibits an RMS jitter of 1 ps, a peak-to-peak jitter of 14.5 ps in the recovered clock, and a bit-error rate of 1.28 x 10-6, with random data input of length 223 - 1. The power dissipation is 72 mW from a 2.5-V supply.

  • A Monolithic 156 Mb/s Clock and Data Recobery PLL Circuit Using the SampleandHold Technique

    The PLL circuit described here performs the function of data and clock recovery for random data patterns by using a sample-and-hold technique, and four component circuits (a phase comparator, a delay circuit, a voltage- controlled oscillator, and a S/H switch with a low-pass-filter) were specially designed to further stabilize the PLL operation. A test chip fabricated using Si bipolar process technology demonstrated error-free operation with an input of 223-1 PRBS data at 156 Mb/s. The rms data pattern jitter was reduced to only 1.2 degrees with only an external power supply bypass capacitor.

  • A DualLoop DelayLocked Loop Using Multiple VoltageControlled Delay Lines

    This paper describes a dual-loop delay-locked loop (DLL) which overcomes the problem of a limited delay range by using multiple voltage-controlled delay lines (VCDLs). A reference loop generates quadrature clocks, which are then delayed with controllable amounts by four VCDLs and multiplexed to generate the output clock in a main loop. This architecture enables the DLL to emulate the infinite-length VCDL with multiple finite-length VCDLs. The DLL incorporates a replica biasing circuit for low-jitter characteristics and a duty cycle corrector immune to prevalent process mismatches. A test chip has been fabricated using a 0.25-µm CMOS process. At 400 MHz, the peak-to-peak jitter with a quiet 2.5-V supply is 54 ps, and the supply-noise sensitivity is 0.32 ps/m V.

  • Clock Generation by PLLs and DLLs

    Comprehensive coverage of recent developments in phase-locked loop technology The rapid growth of high-speed semiconductor and communication technologies has helped make phase-locked loops (PLLs) an essential part of memories, microprocessors, radio-frequency (RF) transceivers, broadband data communication systems, and other burgeoning fields. Complementing his 1996 Monolithic Phase-Locked Loops and Clock Recovery Circuits (Wiley-IEEE Press), Behzad Razavi now has collected the most important recent writing on PLL into a comprehensive, self-contained look at PLL devices, circuits, and architectures. Phase-Locking in High-Performance Systems: From Devices to Architectures' five original tutorials and eighty-three key papers provide an eminently readable foundation in phase-locked systems. Analog and digital circuit designers will glean a wide range of practical information from the book's . . . * Tutorials dealing with devices, delay-locked loops (DLLs), fractio al-N synthesizers, bang-bang PLLs, and simulation of phase noise and jitter * In-depth discussions of passive devices such as inductors, transformers, and varactors * Papers on the analysis of phase noise and jitter in various types of oscillators * Concentrated examinations of building blocks, including the design of oscillators, frequency dividers, and phase/frequency detectors * Articles addressing the problem of clock generation by phase-locking for timing and digital applications, RF synthesis, and the application of phase-locking to clock and data recovery circuits In tandem with its companion volume, Phase-Locking in High-Performance Systems: From Devices to Architectures is a superb reference for anyone working on, or seeking to better understand, this rapidly-developing and increasingly central technology.

  • A 10Gb/s CMOS Clock and Data Recovery Circuit with Frequency Detection

    Comprehensive coverage of recent developments in phase-locked loop technology The rapid growth of high-speed semiconductor and communication technologies has helped make phase-locked loops (PLLs) an essential part of memories, microprocessors, radio-frequency (RF) transceivers, broadband data communication systems, and other burgeoning fields. Complementing his 1996 Monolithic Phase-Locked Loops and Clock Recovery Circuits (Wiley-IEEE Press), Behzad Razavi now has collected the most important recent writing on PLL into a comprehensive, self-contained look at PLL devices, circuits, and architectures. Phase-Locking in High-Performance Systems: From Devices to Architectures' five original tutorials and eighty-three key papers provide an eminently readable foundation in phase-locked systems. Analog and digital circuit designers will glean a wide range of practical information from the book's . . . * Tutorials dealing with devices, delay-locked loops (DLLs), fractio al-N synthesizers, bang-bang PLLs, and simulation of phase noise and jitter * In-depth discussions of passive devices such as inductors, transformers, and varactors * Papers on the analysis of phase noise and jitter in various types of oscillators * Concentrated examinations of building blocks, including the design of oscillators, frequency dividers, and phase/frequency detectors * Articles addressing the problem of clock generation by phase-locking for timing and digital applications, RF synthesis, and the application of phase-locking to clock and data recovery circuits In tandem with its companion volume, Phase-Locking in High-Performance Systems: From Devices to Architectures is a superb reference for anyone working on, or seeking to better understand, this rapidly-developing and increasingly central technology.

  • A 6GHz 60mW BiCMOS PhaseLocked Loop with 2V Supply

    The design of a 6 GHz fully monolithic phaselocked loop fabricated in a 1 µm, 20 GHz BiCMOS technology is described. The circuit lilcorporates a voltage- controlled oscillator that senses and combines the transitions in a ring oscillator to achieve a period equal to two ECL gate delays. A mixer topology is also used that exhibits full symmetry with respect to its inputs and operates with supply voltages as low as 1.5 V. Dissipating 60 mW from a 2 V supplyt the dreuit has a tracking range of 300 MHz, ail nos jitter of 3.1 ps and phase noise of -75 dBc/Hz at 1 kHz offset.



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