Ionization

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Ionization is the physical process of converting an atom or molecule into an ion by adding or removing charged particles such as electrons or other ions. (Wikipedia.org)






Conferences related to Ionization

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2018 13th European Microwave Integrated Circuits Conference (EuMIC)

The EuMIC conference is jointly organized by GAAS® Association and EuMA and is the premierEuropean technical conference for RF microelectronics. Aim of the conference is to promote thediscussion of recent developments and trends, and to encourage the exchange of scientific andtechnical information covering a broad range of high-frequency related topics, from materialsand technologies to integrated circuits and applications, that will be addressed in all of theiraspects: theory, simulation, design and measurement. If you are interested in anything aboutmicrowave and RF IC's, the EuMIC conference is an exceptional venue to learn about the latestadvances in the field and meet recognized experts from both Industry and Academia.

  • 2017 12th European Microwave Integrated Circuits Conference (EuMIC)

    The EuMIC conference is jointly organized by GAAS® Association and EuMA and is the premier European technical conference for RF microelectronics. Aim of the conference is to promote the discussion of recent developments and trends, and to encourage the exchange of scientific and technical information covering a broad range of high-frequency related topics, from materials and technologies to integrated circuits and applications, that will be addressed in all of theiraspects: theory, simulation, design and measurement. If you are interested in anything about microwave and RF IC's, the EuMIC conference is an exceptional venue to learn about the latest advances in the field and meet recognized experts from both Industry and Academia.

  • 2016 11th European Microwave Integrated Circuits Conference (EuMIC)

    The EuMIC conference is jointly organized by GAAS® Association and EuMA and is the premier European technical conference for RF microelectronics. Aim of the conference is to promote the discussion of recent developments and trends, and to encourage the exchange of scientific and technical information covering a broad range of high-frequency related topics, from materials and technologies to integrated circuits and applications, that will be addressed in all of their aspects: theory, simulation, design and measurement. If you are interested in anything about microwave and RF IC's, the EuMIC conference is an exceptional venue to learn about the latest advances in the field and meet recognized experts from both Industry and Academia.

  • 2015 10th European Microwave Integrated Circuits Conference (EuMIC)

    The EuMIC conference is jointly organized by GAAS® Association and EuMA and is the premier European technical conference for RF microelectronics. Aim of the conference is to promote the discussion of recent developments and trends, and to encourage the exchange of scientific and technical information covering a broad range of high-frequency related topics, from materials and technologies to integrated circuits and applications, that will be addressed in all of their aspects: theory, simulation, design and measurement. If you are interested in anything about microwave and RF IC’s, the EuMIC conference is an exceptional venue to learn about the latest advances in the field and meet recognized experts from both Industry and Academia.

  • 2014 9th European Microwave Integrated Circuits Conference (EuMIC)

    The EuMIC conference is jointly organized by GAAS

  • 2013 European Microwave Integrated Circuit Conference (EuMIC)

    RF and microwave devices for telecommunication and sensor systems including UMTS/LTE, LMDS and other systems working in the microwave and millimetre -wave range. Covering recent development and trends in physical fundamentals, physical and behavoural modeling, microwave and opto-electric devices and monolithic design in GaAs, InP, SiGe, GaN and SiC technologies.

  • 2012 European Microwave Integrated Circuit Conference (EuMIC)

    Microwave integrated circuits: modelling, simulation and characterisation of devices and circuits; technologies and devices; circuit design and applications.

  • 2011 European Microwave Integrated Circuit Conference (EuMIC)

    RF and microwave devices for telecommunication and sensor systems including UMTS/LTE, LMDS and other systems working in the microwave and millimetre-wave range. Covering recent development and trends in physical fundamentals, physical and behavoural modeling, microwave and opto-electric devices and monolithic design in GaAs, InP, SiGe, GaN and SiC technologies.

  • 2010 European Microwave Integrated Circuits Conference (EuMIC)

    EuMIC is the leading conference for MMICs/RFICs and their applications in Europe. The aim of the conference is to promote the discussion of recent developments and trends, and encourage the exchange of scientific and technical information on physical fundamentals, material technology, process development and technology, physics based and empirical behavioral modeling of microwave and optoelectronic active devices and design of monolithic ICs

  • 2009 European Microwave Integrated Circuits Conference (EuMIC)

    The 4th European Microwave Integrated Circut Conference, EuMIC, in Amsterdam, The Netherlands, is one of four conferences at the European Microwave Week 2008, the largest event in Europe dedicated to microwave electronics. EuMIC is the leading European conference for RFIC/MMIC technology and applications. The aim of the conference is to cover recent research and development on material technology, process development/technology.

  • 2008 European Microwave Integrated Circuits Conference (EuMIC)

    The third European Microwave Integrated Circut Conference, EuMIC, in Amsterdam, The Netherlands, is one of four conferences at the European Microwave Week 2008, the largest event in Europe dedicated to microwave electronics. EuMIC is the leading European conference for RFIC/MMIC technology and applications. The aim of the conference is to cover recent research and development on material technology, process development/technology.

  • 2007 European Microwave Integrated Circuits Conference (EuMIC)

    RF and microwave devices for telecommunication and sensor systems including UMTS, LMDS and other systems working in the microwave and millimetre-wave range. Covering recent development and trends in physical fundamentals, physicas and behavoural modeling, microwave and opto-electric devices and monolithic design in GaAs, InP, SiGe, GaN and SiC technologies.

  • 2006 European Microwave Integrated Circuits Conference (EuMIC) (Formerly GAAS)

  • GAAS 2005 - European Gallium Arsenide and Other Semiconductors Application Symposium


2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz2018)

Covering terahertz, far infrared and millimeter wave science, technology and applications


2018 9th International Particle Accelerator Conference (IPAC)

Topics cover a complete survey of the field of charged particle accelerator science and technology and infrastructure.


2018 Asia-Pacific Microwave Conference (APMC)

The conference topics include microwave theory and techniques, and their related technologies and applications. They also include active devices and circuits, passive components, wireless systems, EMC and EMI, wireless power transfer and energy harvesting, antennas and propagation, and others.


2018 IEEE 45th Photovoltaic Specialists Conference (PVSC)

Promote science and engineering of photovoltaic materials, devices, systems and applications


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Periodicals related to Ionization

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Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Broadcasting, IEEE Transactions on

Broadcast technology, including devices, equipment, techniques, and systems related to broadcast technology, including the production, distribution, transmission, and propagation aspects.


Computational Biology and Bioinformatics, IEEE/ACM Transactions on

Specific topics of interest include, but are not limited to, sequence analysis, comparison and alignment methods; motif, gene and signal recognition; molecular evolution; phylogenetics and phylogenomics; determination or prediction of the structure of RNA and Protein in two and three dimensions; DNA twisting and folding; gene expression and gene regulatory networks; deduction of metabolic pathways; micro-array design and analysis; proteomics; ...


Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Methods, algorithms, and human-machine interfaces for physical and logical design, including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, and documentation of integrated-circuit and systems designs of all complexities. Practical applications of aids resulting in producible analog, digital, optical, or microwave integrated circuits are emphasized.


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Most published Xplore authors for Ionization

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Xplore Articles related to Ionization

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L Subshell Ionization Cross Sections of Pr, Sm, Tb, Ho, and Yb for 150-400 KeV Protons

[{u'author_order': 1, u'affiliation': u'State University of New York College at Cortland Cortland, New York 13045', u'full_name': u'R. M. Wheeler'}, {u'author_order': 2, u'affiliation': u'State University of New York College at Cortland Cortland, New York 13045', u'full_name': u'R. P. Chaturvedi'}, {u'author_order': 3, u'affiliation': u'State University of New York College at Cortland Cortland, New York 13045', u'full_name': u'S. Amey'}] IEEE Transactions on Nuclear Science, 1979

Thick target x-ray yields of Pr, Sm, Tb, Ho, and Yb have been measured for incident protons in the energy range of 150-400 keV. Yields of the La12, LY1, and LY23 transitions were first converted into x-ray cross sections, then to L-subshell ionization cross sections by the use of theoretical Coster-Kronig decay rates, fluorescence yields, and radiative decay rates. The ...


Analyzing corona breakdown with a finite element-based electromagnetic solver

[{u'author_order': 1, u'affiliation': u'Laboratory of Electromagnetics and Acoustics (LEMA), Ecole Polytechnique Fédérale de Lausanne (EPFL), CH-1015, Switzerland', u'full_name': u'Ioannis D. Koufogiannis'}, {u'author_order': 2, u'affiliation': u'Laboratory of Electromagnetics and Acoustics (LEMA), Ecole Polytechnique Fédérale de Lausanne (EPFL), CH-1015, Switzerland', u'full_name': u'Ed\xe9n Sorolla'}, {u'author_order': 3, u'affiliation': u'Laboratory of Electromagnetics and Acoustics (LEMA), Ecole Polytechnique Fédérale de Lausanne (EPFL), CH-1015, Switzerland', u'full_name': u'Juan R. Mosig'}, {u'author_order': 4, u'affiliation': u'Laboratory of Electromagnetics and Acoustics (LEMA), Ecole Polytechnique Fédérale de Lausanne (EPFL), CH-1015, Switzerland', u'full_name': u'Michael Mattes'}] 2013 7th European Conference on Antennas and Propagation (EuCAP), None

This paper demonstrates how an already developed finite element code for solving electromagnetic problems can be manipulated and simply extended so as to investigate complicated corona breakdowns. A safe criterion based on the eigenvalue analysis is used in order to predict the maximum electric field that a structure can withstand without suffering from a corona breakdown. Comparison with other semi-analytical ...


Hardness Assurance Testing for Proton Direct Ionization Effects

[{u'author_order': 1, u'affiliation': u'Sandia National Laboratories, Albuquerque, NM, USA', u'full_name': u'James R. Schwank'}, {u'author_order': 2, u'affiliation': u'Sandia National Laboratories, Albuquerque, NM, USA', u'full_name': u'Marty R. Shaneyfelt'}, {u'author_order': 3, u'affiliation': u'ESA/ESTEC, The Netherlands', u'full_name': u'V\xe9ronique Ferlet-Cavrois'}, {u'author_order': 4, u'affiliation': u'Sandia National Laboratories, Albuquerque, NM, USA', u'full_name': u'Paul E. Dodd'}, {u'author_order': 5, u'affiliation': u'TRIUMF, Vancouver, Canada', u'full_name': u'Ewart W. Blackmore'}, {u'author_order': 6, u'affiliation': u'NASA Goddard Spaceflight Center, Greenbelt, MD, USA', u'full_name': u'Jonathan A. Pellish'}, {u'author_order': 7, u'affiliation': u'IBM T.J. Watson Research Center, Yorktown Heights', u'full_name': u'Kenneth P. Rodbell'}, {u'author_order': 8, u'affiliation': u'IBM T.J. Watson Research Center, Yorktown Heights', u'full_name': u'David F. Heidel'}, {u'author_order': 9, u'affiliation': u'NASA consultant on radiation effects, Brookneal, VA, USA', u'full_name': u'Paul W. Marshall'}, {u'author_order': 10, u'affiliation': u'NASA Goddard Spaceflight Center, Greenbelt, MD, USA', u'full_name': u'Kenneth A. LaBel'}, {u'author_order': 11, u'affiliation': u'MIT Lincoln Laboratory, Lexington, MA, USA', u'full_name': u'Pascale M. Gouker'}, {u'author_order': 12, u'affiliation': u'Marvell, Santa Clara, CA, USA', u'full_name': u'Nelson Tam'}, {u'author_order': 13, u'affiliation': u'Cisco Systems, San Jose, CA, USA', u'full_name': u'Richard Wong'}, {u'author_order': 14, u'affiliation': u'Cisco Systems, San Jose, CA, USA', u'full_name': u'Shi-Jie Wen'}, {u'author_order': 15, u'affiliation': u'Vanderbilt University, Nashville, TN, USA', u'full_name': u'Robert A. Reed'}, {u'author_order': 16, u'affiliation': u'Sandia National Laboratories, Albuquerque, NM, USA', u'full_name': u'Scott M. Dalton'}, {u'author_order': 17, u'affiliation': u'Sandia National Laboratories, Albuquerque, NM, USA', u'full_name': u'Scot E. Swanson'}] IEEE Transactions on Nuclear Science, 2012

The potential for using the degraded beam of high-energy proton radiation sources for proton hardness assurance testing for ICs that are sensitive to proton direct ionization effects are explored. SRAMs were irradiated using high energy proton radiation sources (~67-70 MeV). The proton energy was degraded using plastic or Al degraders. Peaks in the SEU cross section due to direct ionization ...


Molecular Dissociation Produced by Fast Heavy Ion Bombardment

[{u'author_order': 1, u'affiliation': u'Department of Physics and Astronomy, University of Georgia, Athens 30602', u'full_name': u'A. K. Edwards'}, {u'author_order': 2, u'affiliation': u'Department of Physics and Astronomy, University of Georgia, Athens 30602', u'full_name': u'R. M. Wood'}, {u'author_order': 3, u'affiliation': u'Department of Physics and Astronomy, University of Georgia, Athens 30602', u'full_name': u'M. F. Steuer'}] IEEE Transactions on Nuclear Science, 1979

A technique has been developed to study the dissociative ionization of molecules by fast, heavy ions. A pulsed beam of projectiles is focused into a differentially-pumped chamber containing a gaseous, molecular target. The fragment ions from the molecular target are investigated by measuring their kinetic energy and their time-of-flight (TOF) from the collision region to a detector. The simultaneous measurement ...


Plane-Wave Born Approximation Calculations of Cross Sections for Direct Coulomb Ionization of M-Subshells by Bare Charged Particles and the Subsequent Emission of M-Shell X Rays

[{u'author_order': 1, u'affiliation': u"Department of Chemistry Texas Woman's University Denton, Texas 76204", u'full_name': u'D. E. Johnson'}, {u'author_order': 2, u'affiliation': u'Department of Physics North Texas State University Denton, Texas 76203', u'full_name': u'F. D. McDaniel'}, {u'author_order': 3, u'affiliation': u'Department of Physics North Texas State University Denton, Texas 76203', u'full_name': u'George Basbas'}] IEEE Transactions on Nuclear Science, 1979

Results of calculations performed in the plane-wave Born approximation for the atomic states of the M-shell are presented in the form of the excitation function I31(η,W), the universal function F31(η/θ2,θ), and the direct Coulomb ionization cross sections. A description of vacancy filling leading to x-ray production cross sections from incident carbon ions on 79Au, 82Pb, and 83Bi are compared with ...


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IEEE-USA E-Books

  • Electrical Breakdown in Gases

    This chapter discusses a short treatise on atomic collisions in gases and a description of Townsend's experiments in the early twentieth century. It presents the Paschen curve, and describes the predominant theories of spark formation. The chapter also discusses other breakdown phenomena, such as coronas and the hollow electrode carrier generation used in pseudosparks. Electrical breakdown occurs in a gas when a high¿¿¿conductivity channel is formed between cathode and anode. Before a study is made of the behavior of gases under the influence of an electric field, it is appropriate to review the basic principles of the kinetic theory of gases pertinent to gaseous ionization and breakdown. From there, the various concepts of ionic and electronic can be inferred. The chapter further discusses the efficient use of gaseous insulation with intershields. It concludes by discussing the important aspects of breakdown behavior in gaseous SF6.

  • Particle-Solid Scattering



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