Integrated circuit noise
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Methods, algorithms, and human-machine interfaces for physical and logical design, including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, and documentation of integrated-circuit and systems designs of all complexities. Practical applications of aids resulting in producible analog, digital, optical, or microwave integrated circuits are emphasized.
Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.
Measurements and instrumentation utilizing electrical and electronic techniques.
Microwave theory, techniques, and applications as they relate to components, devices, circuits, and systems involving the generation, transmission, and detection of microwaves.
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as device modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete ...
Lynch, M.W.; Holdenried, C.D.; Haslett, J.W. Radio Frequency Integrated Circuits (RFIC) Symposium, 2003 IEEE, 2003
Future wireless data access will involve gigabit-per-second radios operating at RF frequencies above 10 GHz. This paper presents the design, simulation and measurement of a 17 GHz direct down-conversion mixer intended for these systems. The mixer was fabricated in a low-fT (47 GHz) SiGe process, achieving a midband conversion gain of 12 dB and a double sideband noise figure of ...
Shey-Shi Lu; Hung-Wei Chiu Microwave Theory and Techniques, IEEE Transactions on, 2009
Head, L.M. Integrated Reliability Workshop Final Report, 1997 IEEE International, 1997
Noise measurements taken under accelerated stressing conditions do not work for the prediction of VLSI interconnect lifetime. This is because a crucial feature of the resistance changes under accelerated bias, which could provide insight into metallization reliability, is obscured by spectral analysis. Distinctive resistance transients occur sporadically during accelerated life testing and it is the presence of these transients that ...
Aufinger, K.; Knapp, H.; Boguth, S.; Meister, T.F.; Bock, J.; Wurzer, M.; ZOschg, D.; Treitinger, L. EUROCOMM 2000. Information Systems for Enhanced Public Safety and Security. IEEE/AFCEA, 2000
The high-frequency and noise characteristics of advanced silicon-based bipolar transistors are presented and discussed. For the design of receivers both the noise at the RF signal carrier frequency and the phase noise of the system are critical issues. The first is dominated by the high-frequency noise properties of the transistors in the first amplifying stage of the receiver, the latter ...
Arnaud, A. Integrated Circuits and Systems Design, 18th Symposium on, 2005
In this paper, a chopper amplifier built with Gm-C filters that are alternatively turned on and off will be introduced. First, a theoretical framework to estimate the output of a generic switched continuous-time filter in the frequency domain is presented. This study is later employed to determine the behaviour of the chopper amplifier: transfer function, and noise. Final conclusions and ...
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