Exponential distribution

View this topic in
Exponential parameters: λ > 0 rate, or inverse scale support: x ∈ [0, ∞] pdf: λ e cdf: 1 − e mean: λ median: λ ln 2 mode: 0 variance: λ skewness: 2 kurtosis: 6 entropy: 1 − ln(λ) mgf: cf: In probability theory and statistics, the exponential distribution (a.k.a. (Wikipedia.org)






Conferences related to Exponential distribution

Back to Top

2019 56th ACM/IEEE Design Automation Conference (DAC)

EDA (Electronics Design Automation) is becoming ever more important with the continuous scaling of semiconductor devices and the growing complexities of their use in circuits and systems. Demands for lower-power, higher-reliability and more agile electronic systems raise new challenges to both design and design automation of such systems. For the past five decades, the primary focus of research track at DAC has been to showcase leading-edge research and practice in tools and methodologies for the design of circuits and systems.

  • 2022 59th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2021 58th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2020 57th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2018 55th ACM//IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC Description for TMRF The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading

  • 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 session on design methodologies and EDA tool developments, keynotes, panels, plus User Track presentations. A diverse worldwide community representing more than 1,000 organization attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers

  • 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference is the world s leading technical conference and tradeshow on electronic design and design automation. DAC is where the IC Design and EDA ecosystem learns, networks, and does business.

  • 2010 47th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers.

  • 2009 46th ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC is the premier event for the electronic design community. DAC offers the industry s most prestigious technical conference in combination with the biggest exhibition, bringing together design, design automation and manufacturing market influencers.

  • 2008 45th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 250 of the leading electronics design suppliers.

  • 2007 44th ACM/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier Electronic Design Automation (EDA) and silicon solution event. DAC features over 50 technical sessions covering the latest in design methodologies and EDA tool developments and an Exhibition and Demo Suite area with over 250 of the leading EDA, silicon and IP Providers.

  • 2006 43rd ACM/IEEE Design Automation Conference (DAC)

  • 2005 42nd ACM/IEEE Design Automation Conference (DAC)

  • 2004 41st ACM/IEEE Design Automation Conference (DAC)

  • 2003 40th ACM/IEEE Design Automation Conference (DAC)

  • 2002 39th ACM/IEEE Design Automation Conference (DAC)

  • 2001 38th ACM/IEEE Design Automation Conference (DAC)

  • 2000 37th ACM/IEEE Design Automation Conference (DAC)

  • 1999 36th ACM/IEEE Design Automation Conference (DAC)

  • 1998 35th ACM/IEEE Design Automation Conference (DAC)

  • 1997 34th ACM/IEEE Design Automation Conference (DAC)

  • 1996 33rd ACM/IEEE Design Automation Conference (DAC)


2019 IEEE 15th International Conference on Automation Science and Engineering (CASE)

The conference is the primary forum for cross-industry and multidisciplinary research in automation. Its goal is to provide a broad coverage and dissemination of foundational research in automation among researchers, academics, and practitioners.


2019 IEEE 20th International Workshop on Signal Processing Advances in Wireless Communications (SPAWC)

For its 20th year edition, the IEEE International Workshop on Signal Processing Advances in Wireless Communications (SPAWC) 2019, returns to the country that saw its birth, France. Held in Cannes, in the heart of the world renown “French Riviera” (Cote d’Azur in French), the SPAWC 2019 will exhibit a technical program complete with high profile plenaries, invited and contributed papers, all appearing under IEEE explore. A flagship workshop of the IEEE SP Society SPCOM technical committee, SPAWC 2019 will combine cutting edge research in the fields of signal processing, statistical learning, communication theory, wireless networking and more, together with an exciting social program on the glamorous and sunny Riviera.


2019 IEEE International Conference on Image Processing (ICIP)

The International Conference on Image Processing (ICIP), sponsored by the IEEE SignalProcessing Society, is the premier forum for the presentation of technological advances andresearch results in the fields of theoretical, experimental, and applied image and videoprocessing. ICIP 2019, the 26th in the series that has been held annually since 1994, bringstogether leading engineers and scientists in image and video processing from around the world.


2019 IEEE International Symposium on Electromagnetic Compatibility - EMC 2019

The IEEE Electromagnetic Compatibility Society is the world's largest organization dedicated to the development and distribution of information, tools and techniques for reducing electromagnetic interference. The society's field of interest includes standards, measurement techniques and test procedures, instrumentation, equipment and systems characteristics, interference control techniques and components, education, computational analysis, and spectrum management, along with scientific, technical, industrial, professional or other activities that contribute to this field


More Conferences

Periodicals related to Exponential distribution

Back to Top

Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Broadcasting, IEEE Transactions on

Broadcast technology, including devices, equipment, techniques, and systems related to broadcast technology, including the production, distribution, transmission, and propagation aspects.


More Periodicals

Most published Xplore authors for Exponential distribution

Back to Top

Xplore Articles related to Exponential distribution

Back to Top

Scale‐Free Networks

[{u'author_order': 1, u'affiliation': u'Naval Post Graduate School, Monterey, California', u'full_name': u'Ted G. Lewis'}] Network Science: Theory and Applications, None

This chapter contains sections titled:Generating a Scale‐Free NetworkProperties of Scale‐Free NetworksNavigation in Scale‐Free NetworksAnalysisExercises


Product Life and Reliability Assessment

[{u'author_order': 1, u'full_name': u'Lih-Tyng Hwang'}, {u'author_order': 2, u'full_name': u'Tzyy-Sheng Jason Horng'}] 3D IC and RF SiPs: Advanced Stacking and Planar Solutions for 5G Mobility, None

In this chapter, the authors devote themselves to discussions of product life estimation and reliability assessment. Estimating a product's life is a necessity and a challenging task for a company. A product's life is also product's time to fail (TTF). The authors illustrate how average mean time‐to‐fail (MTTF) can be obtained from a failure rate density function, and how MTTF ...


Continuous Random Variables

[{u'author_order': 1, u'full_name': u'Zachary Taylor'}, {u'author_order': 2, u'full_name': u'Subramanyam Ranganathan'}] Designing High Availability Systems: DFSS and Classical Reliability Techniques with Practical Real Life Examples, None

This chapter provides a brief introduction to the continuous random variables in particular and contrasting this concept with discrete random variables. Several important continuous random variables are applicable to reliability theory. We will see in later chapters how these concepts are applied to more practical reliability problems.


BERa performance of coherent DPSK free-space optical systems with APD over turbulence channels

[{u'author_order': 1, u'affiliation': u'Department of Information and Communications, Gwangju Institute of Science and Technology, 1 Oryong-dong, Buk-gu, Gwangju, 500-712, Republic of Korea', u'authorUrl': u'https://ieeexplore.ieee.org/author/37068146000', u'full_name': u'Wansu Lim', u'id': 37068146000}, {u'author_order': 2, u'affiliation': u'Department of Information and Communications, Gwangju Institute of Science and Technology, 1 Oryong-dong, Buk-gu, Gwangju, 500-712, Republic of Korea', u'authorUrl': u'https://ieeexplore.ieee.org/author/37283330000', u'full_name': u'Tae-Sik Cho', u'id': 37283330000}, {u'author_order': 3, u'affiliation': u'Korea Ocean Research and Development Institute, Ansan P.O.Box 29, 425-600 Korea', u'authorUrl': u'https://ieeexplore.ieee.org/author/37268135100', u'full_name': u'Changho Yun', u'id': 37268135100}, {u'author_order': 4, u'authorUrl': u'https://ieeexplore.ieee.org/author/37280247300', u'full_name': u'Kiseon Kim', u'id': 37280247300}] 2009 14th OptoElectronics and Communications Conference, 2009

We investigate the average bit error rate (BER) performance of coherent DPSK free space optical systems with APD over atmospheric turbulence channels. For validation of the average BER performance, we use Gauss-Hermite quadrature formula.


Maintenance mission oriented number determination method of maintenance equipment for aircraft

[{u'author_order': 1, u'affiliation': u"The Engineering Institute, Air Force Engineering University, Xi'an, China", u'authorUrl': u'https://ieeexplore.ieee.org/author/38466177600', u'full_name': u'Dawei Li', u'id': 38466177600}, {u'author_order': 2, u'affiliation': u"The Engineering Institute, Air Force Engineering University, Xi'an, China", u'authorUrl': u'https://ieeexplore.ieee.org/author/37600582900', u'full_name': u'Yunxiang Chen', u'id': 37600582900}, {u'author_order': 3, u'affiliation': u"The Engineering Institute, Air Force Engineering University, Xi'an, China", u'authorUrl': u'https://ieeexplore.ieee.org/author/38466908200', u'full_name': u'Huachun Xiang', u'id': 38466908200}] 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, 2012

Number identification of maintenance equipment is an emergent problem of support resources deployment for aircraft in design and development phase. Taking maintenance mission requirements as input, queuing model of batch arrival LRU (Line Replaceable Units) based on Queuing Theory is constructed. Effects of maintenance equipment failure on queuing model are analyzed. Being subjected to the constraint of average waiting time ...


More Xplore Articles

Educational Resources on Exponential distribution

Back to Top

eLearning

No eLearning Articles are currently tagged "Exponential distribution"

IEEE-USA E-Books

  • Scale‐Free Networks

    This chapter contains sections titled:Generating a Scale‐Free NetworkProperties of Scale‐Free NetworksNavigation in Scale‐Free NetworksAnalysisExercises

  • Product Life and Reliability Assessment

    In this chapter, the authors devote themselves to discussions of product life estimation and reliability assessment. Estimating a product's life is a necessity and a challenging task for a company. A product's life is also product's time to fail (TTF). The authors illustrate how average mean time‐to‐fail (MTTF) can be obtained from a failure rate density function, and how MTTF can be modeled as a function environmental or current density variables. From the model, the results from harsher test conditions are then used to predict the MTTF (or the product's Life) of products at normal operating conditions. Reliability assessments are necessary to remove the potential failure modes, in addition to product life prediction. Many trades groups are interested in establishing reliability assessment standards for obvious reason: reliability is a vital part of their industry.

  • Continuous Random Variables

    This chapter provides a brief introduction to the continuous random variables in particular and contrasting this concept with discrete random variables. Several important continuous random variables are applicable to reliability theory. We will see in later chapters how these concepts are applied to more practical reliability problems.

  • Network Simulation Elements: A Case Study Using CASiNO

    None

  • Parameter Estimation

    This chapter discusses techniques to estimate parameters and their accuracies. It studies two types of parameter estimation: maximum likelihood (ML) and linear regression (LR). Their accuracy and how they relate to graphical analysis are included. The relation of parameter estimation to graphical analysis is elaborated for the Weibull distribution, the exponential distribution, and the normal distribution. The chapter discusses the general aspects of parameter estimation and some characteristics of estimators in greater depth, with additional focus on the asymptotic behaviour of estimated parameters and their moments. The ML estimator is explained for both the uncensored case and the censored case. The LR estimator works with ranked plotting positions quite similar to graphical analysis with parametric plots. The chapter discusses the adjusted ranking method and the adjusted plotting position method for manipulating the ranked plotting positions.

  • System States, Reliability and Availability

    This chapter deals with techniques to determine the availability of systems that can come back into service after at least one down‐state. Markov chains offer an elegant method to determine availability, reliability and average down‐time. As an introduction to Markov chains, the most simple system consisting of one component is studied. The chapter discusses concepts such as states, state value, transition rates, availability, and steady state. It introduces the general approach with Markov chains and Laplace transform. States that do not allow repair cause permanent system failure. Such states are called 'absorbing states'. The chapter shows how the expected lifetime of a system with one or more absorbing states can be calculated. It introduces the concepts of the mean lifetime until first failure (MTTFF) and the mean lifetime between failures (MTBF) with an adapted Markov‐Laplace method.

  • Application to Asset and Incident Management

    This chapter presents various cases that illustrate the applications that are grouped in four categories: maintenance styles and grid design; health index (HI); testing and quality assurance; and incident management dealing with typical fault situations. Period‐based maintenance (PBM) typically follows directives on maintenance actions irrespective of the condition of the assets involved. The HI is an indicator that is used by many utilities to represent the condition of assets. The expert rules are precisely the core of the HI. There are various techniques for the set of expert rules, which comprise: failure root cause analysis (FRCA); failure modes and effects analysis (FMEA); failure modes, effects and criticality analysis (FMECA); and so on. There are two types of confidence limit discussed: beta distribution‐based for cases of random sampling from a large population, and regression error‐based for models based on samples.

  • Mobility Modeling and Opportunistic Network Performance Analysis

    This chapter contains sections titled:Unicast in Opportunistic NetworksBroadcast in Opportunistic NetworksReferences



Standards related to Exponential distribution

Back to Top

No standards are currently tagged "Exponential distribution"


Jobs related to Exponential distribution

Back to Top