Exponential distribution

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Exponential parameters: λ > 0 rate, or inverse scale support: x ∈ [0, ∞] pdf: λ e cdf: 1 − e mean: λ median: λ ln 2 mode: 0 variance: λ skewness: 2 kurtosis: 6 entropy: 1 − ln(λ) mgf: cf: In probability theory and statistics, the exponential distribution (a.k.a. (Wikipedia.org)






Conferences related to Exponential distribution

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2019 IEEE 15th International Conference on Automation Science and Engineering (CASE)

The conference is the primary forum for cross-industry and multidisciplinary research in automation. Its goal is to provide a broad coverage and dissemination of foundational research in automation among researchers, academics, and practitioners.


2019 IEEE 20th International Workshop on Signal Processing Advances in Wireless Communications (SPAWC)

For its 20th year edition, the IEEE International Workshop on Signal Processing Advances in Wireless Communications (SPAWC) 2019, returns to the country that saw its birth, France. Held in Cannes, in the heart of the world renown “French Riviera” (Cote d’Azur in French), the SPAWC 2019 will exhibit a technical program complete with high profile plenaries, invited and contributed papers, all appearing under IEEE explore. A flagship workshop of the IEEE SP Society SPCOM technical committee, SPAWC 2019 will combine cutting edge research in the fields of signal processing, statistical learning, communication theory, wireless networking and more, together with an exciting social program on the glamorous and sunny Riviera.


2018 11th International Symposium on Communication Systems, Networks and Digital Signal Processing (CSNDSP)

Communication, Networking and Broadcast TechnologiesFields, Waves and ElectromagneticsPhotonics and optical communicationsSignal Processing and Analysis


2018 25th IEEE International Conference on Image Processing (ICIP)

The International Conference on Image Processing (ICIP), sponsored by the IEEE Signal Processing Society, is the premier forum for the presentation of technological advances and research results in the fields of theoretical, experimental, and applied image and video processing. ICIP 2018, the 25th in the series that has been held annually since 1994, brings together leading engineers and scientists in image and video processing from around the world.


2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC)

The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2022 59th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2021 58th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2020 57th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2019 56th ACM/ESDA/IEEE Design Automation Conference (DAC)

    EDA (Electronics Design Automation) is becoming ever more important with the continuous scaling of semiconductor devices and the growing complexities of their use in circuits and systems. Demands for lower-power, higher-reliability and more agile electronic systems raise new challenges to both design and design automation of such systems. For the past five decades, the primary focus of research track at DAC has been to showcase leading-edge research and practice in tools and methodologies for the design of circuits and systems.

  • 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC Description for TMRF The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading

  • 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 session on design methodologies and EDA tool developments, keynotes, panels, plus User Track presentations. A diverse worldwide community representing more than 1,000 organization attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers

  • 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference is the world s leading technical conference and tradeshow on electronic design and design automation. DAC is where the IC Design and EDA ecosystem learns, networks, and does business.

  • 2010 47th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers.

  • 2009 46th ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC is the premier event for the electronic design community. DAC offers the industry s most prestigious technical conference in combination with the biggest exhibition, bringing together design, design automation and manufacturing market influencers.

  • 2008 45th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 250 of the leading electronics design suppliers.

  • 2007 44th ACM/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier Electronic Design Automation (EDA) and silicon solution event. DAC features over 50 technical sessions covering the latest in design methodologies and EDA tool developments and an Exhibition and Demo Suite area with over 250 of the leading EDA, silicon and IP Providers.

  • 2006 43rd ACM/IEEE Design Automation Conference (DAC)

  • 2005 42nd ACM/IEEE Design Automation Conference (DAC)

  • 2004 41st ACM/IEEE Design Automation Conference (DAC)

  • 2003 40th ACM/IEEE Design Automation Conference (DAC)

  • 2002 39th ACM/IEEE Design Automation Conference (DAC)

  • 2001 38th ACM/IEEE Design Automation Conference (DAC)

  • 2000 37th ACM/IEEE Design Automation Conference (DAC)

  • 1999 36th ACM/IEEE Design Automation Conference (DAC)

  • 1998 35th ACM/IEEE Design Automation Conference (DAC)

  • 1997 34th ACM/IEEE Design Automation Conference (DAC)

  • 1996 33rd ACM/IEEE Design Automation Conference (DAC)


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Periodicals related to Exponential distribution

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Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Broadcasting, IEEE Transactions on

Broadcast technology, including devices, equipment, techniques, and systems related to broadcast technology, including the production, distribution, transmission, and propagation aspects.


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Most published Xplore authors for Exponential distribution

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Xplore Articles related to Exponential distribution

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Workforce planning for Global Network Delivery Model

[{u'author_order': 1, u'affiliation': u'Tata Consultancy Services Limited, Kolkata, India', u'full_name': u'Sumit Raut'}, {u'author_order': 2, u'affiliation': u'Tata Consultancy Services Limited, Chennai, India', u'full_name': u'Kishore Padmanabhan'}, {u'author_order': 3, u'affiliation': u'Tata Consultancy Services Limited, Chennai, India', u'full_name': u'Muralidharan Somasundaram'}, {u'author_order': 4, u'affiliation': u'Tata Consultancy Services Limited, Chennai, India', u'full_name': u'Natarajan Vijayarangan'}] 2014 IEEE International Conference on Industrial Engineering and Engineering Management, None

A steep competition in IT services and customers' demand for high quality of service makes IT service providers to investigate new ways of delivering services. To gain competitive advantage, Tata Consultancy Services Limited proposes Global Network Delivery Model (GNDM) to deliver services seamlessly and uniformly for global customers from multiple delivery locations such as India, China, Europe, North America and ...


Inference for a Step-Stress Model With Competing Risks for Failure From the Generalized Exponential Distribution Under Type-I Censoring

[{u'author_order': 1, u'affiliation': u'Department of Management Science & Statistics, University of Texas, San Antonio, Texas, USA', u'full_name': u'David Han'}, {u'author_order': 2, u'affiliation': u'Department of Mathematics & Statistics, Indian Institute of Technology, Kanpur, India', u'full_name': u'Debasis Kundu'}] IEEE Transactions on Reliability, 2015

In a reliability experiment, accelerated life-testing allows higher-than- normal stress levels on test units. In a special class of accelerated life tests known as step-stress tests, the stress levels are increased at some pre- planned time points, allowing the experimenter to obtain information on the lifetime parameters more quickly than under normal operating conditions. Also, when a test unit fails, ...


Rayleigh Mixture Model-Based Hidden Markov Modeling and Estimation of Noise in Noisy Speech Signals

[{u'author_order': 1, u'affiliation': u'Dept. of Commun. Technol., Aalborg Univ.', u'full_name': u'Karsten Vandborg Sorensen'}, {u'author_order': 2, u'full_name': u'Sren Vang Andersen'}] IEEE Transactions on Audio, Speech, and Language Processing, 2007

In this paper, we propose a new statistical model for noise periodogram modeling and estimation. The proposed model is a hidden Markov model (HMM) with a Rayleigh mixture model (RMM) in each state. For this new model, we derive an expectation-maximization (EM) training algorithm and a minimum mean- square error (MMSE) noise periodogram estimator. It is shown that when compared ...


Exponential Evolutionary Programming Without Self-Adaptive Strategy Parameter

[{u'author_order': 1, u'affiliation': u'Department of Information & Computer Engineering, Faculty of Engineering, Okayama University of Science, 1-1 Ridai-cho, Okayama, 700-0005, JAPAN, email: narihisa@ice.ous.ac.jp', u'full_name': u'H. Narihisa'}, {u'author_order': 2, u'full_name': u'T. Taniguchi'}, {u'author_order': 3, u'full_name': u'M. Ohta'}, {u'author_order': 4, u'full_name': u'K. Katayama'}] 2006 IEEE International Conference on Evolutionary Computation, None

Evolutionary programming (EP) uses strategy parameter with self-adaptation. This strategy parameter corresponds to a search step size in solution search algorithm. Exponential evolutionary programming (EEP) uses exponential mutation instead of Gaussian mutation of conventional evolutionary programming (CEP). Therefore, the search step size of EEP depends on the parameter value of exponential distribution as well as self-adaptation. Generally, the strategy parameter ...


Research and Analysis about the Length of Vertex-Degree Sequence of Complex Networks with Poisson Distribution

[{u'author_order': 1, u'affiliation': u'Sch. of Comput. Sci. & Eng., South China Univ. of Technol., Guangzhou, China', u'full_name': u'Zhanying Zhang'}, {u'author_order': 2, u'affiliation': u'Sch. of Software Eng., South China Univ. of Technol., Guangzhou, China', u'full_name': u'Wenjun Xiao'}, {u'author_order': 3, u'affiliation': u'Sch. of Math. & Big Data, Foshan Univ., Foshan, China', u'full_name': u'Minfan He'}, {u'author_order': 4, u'affiliation': u'Sch. of Software Eng., South China Univ. of Technol., Guangzhou, China', u'full_name': u'Jianqing Xi'}, {u'author_order': 5, u'affiliation': u'Sch. of Math. & Inf., South China Univ. of Agric., Guangzhou, China', u'full_name': u'Yijun Mao'}] 2017 IEEE International Conference on Computational Science and Engineering (CSE) and IEEE International Conference on Embedded and Ubiquitous Computing (EUC), None

Degree distribution is an important characteristic of complex networks. To better understand the mechanism of complex networks, it is necessary to analyze their vertex-degree sequences. We had shown before that, for a complex network model with power law distribution or exponential distribution or general degree distribution, the length l of the unequal vertex-degree sequence is of order logN. Poisson distribution ...


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eLearning

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IEEE-USA E-Books

  • Mobility Modeling and Opportunistic Network Performance Analysis

    This chapter contains sections titled: Unicast in Opportunistic Networks Broadcast in Opportunistic Networks References

  • Continuous Random Variables

    This chapter provides a brief introduction to the continuous random variables in particular and contrasting this concept with discrete random variables. Several important continuous random variables are applicable to reliability theory. We will see in later chapters how these concepts are applied to more practical reliability problems.

  • Scale‐Free Networks

    This chapter contains sections titled: Generating a Scale‐Free Network Properties of Scale‐Free Networks Navigation in Scale‐Free Networks Analysis Exercises

  • Product Life and Reliability Assessment

    In this chapter, the authors devote themselves to discussions of product life estimation and reliability assessment. Estimating a product's life is a necessity and a challenging task for a company. A product's life is also product's time to fail (TTF). The authors illustrate how average mean time‐to‐fail (MTTF) can be obtained from a failure rate density function, and how MTTF can be modeled as a function environmental or current density variables. From the model, the results from harsher test conditions are then used to predict the MTTF (or the product's Life) of products at normal operating conditions. Reliability assessments are necessary to remove the potential failure modes, in addition to product life prediction. Many trades groups are interested in establishing reliability assessment standards for obvious reason: reliability is a vital part of their industry.



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