Electrons

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IEEE Organizations related to Electrons

Aerospace & Electronics Systems
Antennas & Propagation
Circuits & Systems
Communications
Components, Packaging & Manufacturing Tech
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Conferences related to Electrons

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2020 IEEE 16th International Workshop on Advanced Motion Control (AMC)

AMC2020 is the 16th in a series of biennial international workshops on Advanced Motion Control which aims to bring together researchers from both academia and industry and to promote omnipresent motion control technologies and applications.

2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe)

Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for smarter grid, energy efficiency,technologies for sustainable energy systems, converters and power supplies

2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)

Photovoltaic materials, devices, systems and related science and technology

2019 IEEE Applied Power Electronics Conference and Exposition (APEC)

APEC focuses on the practical and applied aspects of the power electronics business. The conference addresses issues of immediate and long term importance to practicing power electronics engineer.

2019 IEEE International Electron Devices Meeting (IEDM)

the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart -power technologies, etc.

2021 IEEE International Electron Devices Meeting (IEDM)
the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart -power technologies, etc.
2020 IEEE International Electron Devices Meeting (IEDM)
the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart -power technologies, etc.
2018 IEEE International Electron Devices Meeting (IEDM)
the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart -power technologies, etc.
2017 IEEE International Electron Devices Meeting (IEDM)
the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart -power technologies, etc.
2016 IEEE International Electron Devices Meeting (IEDM)
the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart -power technologies, etc.
2015 IEEE International Electron Devices Meeting (IEDM)
the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart-power technologies, etc.
2014 IEEE International Electron Devices Meeting (IEDM)
IEDM is the world s pre-eminent forum for reporting technological breakthroughs in the areas of semiconductor and electronic device technology, design, manufacturing, physics, and modeling. IEDM is the flagship conference for nanometer-scale CMOS transistor technology, advanced memory, displays, sensors, MEMS devices, novel quantum and nano-scale devices and phenomenology, optoelectronics, devices for power and energy harvesting, high-speed devices, as well as process technology and device modeling and simulation.
2013 IEEE International Electron Devices Meeting (IEDM)
IEDM is the world s pre-eminent forum for reporting technological breakthroughs in the areas of semiconductor and electronic device technology, design, manufacturing, physics, and modeling. IEDM is the flagship conference for nanometer-scale CMOS transistor technology, advanced memory, displays, sensors, MEMS devices, novel quantum and nano-scale devices and phenomenology, optoelectronics, devices for power and energy harvesting, high-speed devices, as well as process technology and device modeling and simulation.
2012 IEEE International Electron Devices Meeting (IEDM)
2011 IEEE International Electron Devices Meeting (IEDM)
CMOS Devices Technology, Characterization, Reliability and Yield, Displays, sensors and displays, memory technology, modeling and simulation, process technology, solid state and nanoelectronic devices.
2010 IEEE International Electron Devices Meeting (IEDM)
2009 IEEE International Electron Devices Meeting (IEDM)
CMOS Devices Technology, Characterization, REliability and Yield, Displays, sensors and displays, memory technology, modeling and simulation, process technology, solid state and nanoelectronic devices
2008 IEEE International Electron Devices Meeting (IEDM)
Over the last 53 years, the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart-power technologies, etc.
2007 IEEE International Electron Devices Meeting (IEDM)
2006 IEEE International Electron Devices Meeting (IEDM)
2005 IEEE International Electron Devices Meeting (IEDM)
2004 IEEE International Electron Devices Meeting (IEDM)
2003 IEEE International Electron Devices Meeting (IEDM)
2002 IEEE International Electron Devices Meeting (IEDM)
2001 IEEE International Electron Devices Meeting (IEDM)
2000 IEEE International Electron Devices Meeting (IEDM)
1999 IEEE International Electron Devices Meeting (IEDM)
1998 IEEE International Electron Devices Meeting (IEDM)
1997 IEEE International Electron Devices Meeting (IEDM)
1996 IEEE International Electron Devices Meeting (IEDM)

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Periodicals related to Electrons

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Aerospace and Electronic Systems Magazine, IEEE

The IEEE Aerospace and Electronic Systems Magazine publishes articles concerned with the various aspects of systems for space, air, ocean, or ground environments.

Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.

Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission

Circuits and Systems for Video Technology, IEEE Transactions on

Video A/D and D/A, display technology, image analysis and processing, video signal characterization and representation, video compression techniques and signal processing, multidimensional filters and transforms, analog video signal processing, neural networks for video applications, nonlinear video signal processing, video storage and retrieval, computer vision, packet video, high-speed real-time circuits, VLSI architecture and implementation for video technology, multiprocessor systems--hardware and software-- ...

Circuits and Systems II: Express Briefs, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.

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Most published Xplore authors for Electrons

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Sun-Jong Lim
Chang-Hong Lee

Xplore Articles related to Electrons

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Emissive probe measurements of electron energy distribution function in radio-frequency plasma

[{u'author_order': 1, u'affiliation': u'Department of Electronics, Tokai University, Hiratsuka, 259-1292 Japan', u'full_name': u'Haruo Shindo'}, {u'author_order': 2, u'affiliation': u'Department of Electronics, Tokai University, Hiratsuka, 259-1292 Japan', u'full_name': u'Takayuki Ozawa'}, {u'author_order': 3, u'affiliation': u'Department of Electronics, Tokai University, Hiratsuka, 259-1292 Japan', u'full_name': u'Takayuki Fukasawa'}] IEEE Conference Record - Abstracts. 2005 IEEE International Conference on Plasma Science, 2005

Summary form only given. A new method to measure electron energy distribution function by an emissive probe has been proposed. The method is based on measurement of the functional relationship of the floating potential and the heating voltage of emissive probe. From the measured data of the floating potential change as a function of the heating voltage, the curve of ...

Rotation Waves and Turbulence in a Multispecies Plasma

[{u'author_order': 1, u'affiliation': u'Plasma Physics Division, Naval Research Laboratory, Washington DC 20375', u'authorUrl': u'https://ieeexplore.ieee.org/author/37273097500', u'full_name': u'Gurudas Ganguli', u'id': 37273097500}, {u'author_order': 2, u'affiliation': u'Icarus Research Inc., PO Box 30780, Bethesda, MD 20824-0780', u'authorUrl': u'https://ieeexplore.ieee.org/author/37273123900', u'full_name': u'Leonid Rudakov', u'id': 37273123900}] IEEE Conference Record - Abstracts. 2005 IEEE International Conference on Plasma Science, 2005

Summary form only given. We show that in an electron-light ion-heavy ion plasma, the light component can rotate with a frequency, Omegar = (ZnH/ne)OmegaL where nH and ne are their densities, Z is the heavy ion charge state, and OmegaL is the light ion gyro-frequency. There is a current perpendicular to the magnetic field due to the light ion and ...

A new type of gallium arsenide field-effect phototransistor

[{u'author_order': 1, u'affiliation': u'RCA Labs., Princeton, NJ, USA', u'full_name': u'G. Swartz'}, {u'author_order': 2, u'full_name': u'A. Gonzalez'}, {u'author_order': 3, u'full_name': u'A. Dreeben'}] 1971 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1971

A gallium-arsenide field-effect phototransistor, which responds to infrared radiation at a wavelength of 1.5 μ will be covered. The device is fabricated from chromium-doped semi-insulating GaAs with a thin epitaxial N-type surface layer.

CCD image sensor for single sensor color camera

[{u'author_order': 1, u'affiliation': u'Nippon Electric Central Res. Labs., Kawasaki, Japan', u'full_name': u'Y. Ishirara'}, {u'author_order': 2, u'full_name': u'E. Takeuchi'}, {u'author_order': 3, u'full_name': u'N. Teranishi'}, {u'author_order': 4, u'full_name': u'A. Kohono'}, {u'author_order': 5, u'full_name': u'T. Aizawa'}, {u'author_order': 6, u'full_name': u'K. Arai'}, {u'author_order': 7, u'full_name': u'H. Shiraki'}] 1980 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1980

A 384(H) × 490(V) element interline CCD image sensor, using PN+ junction photodiodes without overlayer electrodes, a low-noise charge detector and CCD registers with large charge-handling capability, will be discussed. SNR is 71dB at device saturation light level of 1.51ux.

Plasma Enhanced Chemical Vapor deposition modeling

[{u'author_order': 1, u'affiliation': u'Science Applications International Corporation', u'full_name': u'E. Hyman'}, {u'author_order': 2, u'full_name': u'K. Tsang'}, {u'author_order': 3, u'full_name': u'J. Lottati'}, {u'author_order': 4, u'full_name': u'A. Drobot'}] IEEE Conference Record - Abstracts. 1991 IEEE International Conference on Plasma Science, 1991

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IEEE.tv Videos

Electrons May Be the New Pharmaceutical Drug

The Josephson Effect: Brian Josephson Debates John Bardeen

IEEE-USA E-Books

Electrons Applied and Appropriated
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Corpuscles and Electrons
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Philosophical Electrons
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Picture Credits
The Societies of the IEEE
Presidents of the IRE
Presidents of the IEEE
AIEEIRE Merger Committee
Electrons in War and Peace
This chapter contains sections titled: * War Stimulates Invention * Radar Began with Hertz * Microwave Radar * Countermeasures * Termination of the Work * Spin-Offs in Peace Time * Sonar: Underwater ��Radar�� * Electronic Aids to Navigation * Mobile Communications * From Missiles to Satellites * Satellites that Talk Back * Eyes in the Skies * For Further Reading ]]>
Electrons and Holes: Much From Little
This chapter contains sections titled: * A Name for a New Field * Semiconductors: Key to Solid-State Electronics * Developments During World War II * Why Transistors? * The Three Inventors * The Minority Movement in Semiconductors * The Point-Contact Transistor is Invented * The P-N Junction: Key to the Junction Transistor * The Junction Transistor * Achievements of the Junction Transistor * Changing forms of the Junction Transistor * Transistors, Et Cetera, on a Chip * How Integrated Circuits are Made * The Many Uses of Solid-State Electronics * For Further Reading ]]>

Standards related to Electrons

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IEEE Application Guide for Distributed Digital Control and Monitoring for Power Plants

IEEE Application Guide for Low-Voltage AC Power Circuit Breakers Applied with Separately-Mounted Current-Limiting Fuses

This guide applies to low-voltage ac power circuit breakers of the 635 V maximum voltage class with separately-mounted current-limiting fuses for use on ac circuits with available short-circuit currents of 200 000 A (rms symmetrical) or less. Low-voltage ac fused power circuit breakers and combinations of fuses and molded-case circuit breakers are not covered by this guide. This guide sets ...

This recommended practice provides overhead contact system maintenance practices and procedures including maintenance techniques, site inspection and test procedures, and maintenance tolerances, for heavy rail, light rail, and trolley bus systems.

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information

The scope of this trial-use standard is the definition of an exchange format, using eXtensible Markup Language (XML), for identifying all of the hardware, software, and documentation that may be used to test and diagnose a UUT on an automatic test system (ATS).

IEEE Standard for Local and metropolitan area networks - Secure Device Identity

This standard specifies unique per-device identifiers (DevID) and the management and cryptographic binding of a device to its identifiers, the relationship between an initially installed identity and subsequent locally significant identities, and interfaces and methods for use of DevIDs with existing and new provisioning and authentication protocols.

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