IEEE Organizations related to Drain avalanche hot carrier injection

Back to Top


Conferences related to Drain avalanche hot carrier injection

Back to Top

2013 IEEE International Integrated Reliability Workshop (IIRW)

We invite you to submit a presentation proposal that addresses any semiconductor related reliability issue, including the following topics: resistive memories, high-k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III-V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI/PBTI, root cause defects (physical mechanisms and simulations), Cu interconnects and low-k dielectrics, impact of transistor degradation on circuit reliability, designing-in reliability (products, circuits,systems, processes), customer product reliability requirements / manufacturer reliability tasks, waferlevel reliability tests (test approaches and reliability test structures), reliability modeling and simulation,optoelectronics, and single event upsets.

  • 2012 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems.

  • 2011 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems through tutorials, paper presentations, discussion groups and special interest groups.

  • 2010 IEEE International Integrated Reliability Workshop (IIRW)

    The Integrated Reliability Workshop focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding, developing, and sharing reliability technology and test methodology for present and f

  • 2009 IEEE International Integrated Reliability Workshop (IRW)

    Semiconductor Reliability in general; and Wafer Level Reliability in specific. Covering areas like (but not limited to): Design-in Reliability, reliability characterization, deep sub-micron transistor and circuit reliability, customer reliability requirements, wafer level reliability tests, and reliability root cause analysis, etc.

  • 2008 IEEE International Integrated Reliability Workshop (IRW)

    The workshop focuses on ensuring device reliability through fabrication, design, testing, characterization and simulation as well as identification of the defects and mechanisms responsible for reliability problems. It provides a unique environment for understanding, developing and sharing reliability technology and test methodology.

  • 2007 IEEE International Integrated Reliability Workshop (IRW)

    The Workshop focuses on ensuring semiconductor reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliabilty problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding and developing reliability technology and test methodology.

  • 2006 IEEE International Integrated Reliability Workshop (IRW)

  • 2005 IEEE International Integrated Reliability Workshop (IRW)



Periodicals related to Drain avalanche hot carrier injection

Back to Top

Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...


Electron Device Letters, IEEE

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Electron Devices, IEEE Transactions on

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.



Most published Xplore authors for Drain avalanche hot carrier injection

Back to Top

Xplore Articles related to Drain avalanche hot carrier injection

Back to Top

Large-scale maximum likelihood-based phylogenetic analysis on the IBM BlueGene/L

Ott, M.; Zola, J.; Stamatakis, A.; Aluru, S. Supercomputing, 2007. SC '07. Proceedings of the 2007 ACM/IEEE Conference on, 2007

Phylogenetic inference is a grand challenge in Bioinformatics due to immense computational requirements. The increasing popularity of multi-gene alignments in biological studies, which typically provide a stable topological signal due to a more favorable ratio of the number of base pairs to the number of sequences, coupled with rapid accumulation of sequence data in general, poses new challenges for high ...


Age-based packet arbitration in large-radix k-ary n-cubes

Abts, D.; Weisser, Deborah Supercomputing, 2007. SC '07. Proceedings of the 2007 ACM/IEEE Conference on, 2007

As applications scale to increasingly large processor counts, the interconnection network is frequently the limiting factor in application performance. In order to achieve application scalability, the interconnect must maintain high bandwidth while minimizing variation in packet latency. As the offered load in the network increases with growing problem sizes and processor counts, so does the expected maximum packet latency in ...


Experimental evidence for nonlucky electron model effect in 0.15-μm NMOSFETs

Sang-Gi Lee; Hwang, Jeong-Mo; Hi-Deok Lee Electron Devices, IEEE Transactions on, 2002

It is shown that in 0.15-μm NMOSFETs the device lifetime under channel hot- carrier (CHC) stress is lower than that under drain avalanche hot-carrier (DAHC) stress and therefore the hot-carrier stress-induced device degradation in 0.15-μm NMOSFETs cannot be explained in the framework of the lucky electron model (LEM). Our investigation suggests that such a "non-LEM effect" may be due to ...


Beating the heat [CMOS hot-carrier reliability]

Sugiharto, D.S.; Yang, Cary Y.; Huy Le; Chung, J.E. Circuits and Devices Magazine, IEEE, 1998

CMOS hot-carrier reliability at both transistor and circuit levels has been examined. Accurate reliability assessment requires defining suitable criteria for acceptable performance for both circuit and individual transistors. As device designers meet demands for greater speed and more complex circuitry accompanied by shrinking the size of transistor into the deep-submicron regime, they have to contend with increase in current densities ...


A drain avalanche hot carrier lifetime model for n- and p-channel MOSFETs

Koike, N.; Tatsuuma, K. Device and Materials Reliability, IEEE Transactions on, 2004

A simple and physical drain avalanche hot carrier lifetime model has been proposed. The model is based on a mechanism of interface trap generation caused by recombination of hot electrons and hot holes. The lifetime is modeled as τ(Id/W)2∝(Isub/Id)-m. The formula is different from the conventional τId/W-Isub/Id model in that the exponent of Id/W is 2, which results from the ...


More Xplore Articles

Educational Resources on Drain avalanche hot carrier injection

Back to Top

eLearning

No eLearning Articles are currently tagged "Drain avalanche hot carrier injection"

IEEE.tv Videos

No IEEE.tv Videos are currently tagged "Drain avalanche hot carrier injection"

IEEE-USA E-Books

No IEEE-USA E-Books are currently tagged "Drain avalanche hot carrier injection"



Standards related to Drain avalanche hot carrier injection

Back to Top

No standards are currently tagged "Drain avalanche hot carrier injection"


Jobs related to Drain avalanche hot carrier injection

Back to Top