Tutorials and original papers on reliability, maintainability, safety, risk management, and logistics

Tutorials and original papers on reliability, maintainability, safety, risk management, and logistics

This conf covers all facets of the assurance sciences.

Tutorials and original papers on reliability, maintainability, safety, risk management, and logistics

Tutorials and original papers on reliability, maintainability, safety, risk management and logistics.

Includes tutorials and current papers on reliability, maintainability, logistics and safety. Covers diverse industries and organizations.

All facets of the Assurance Sciences

For over 40 years, IRPS has been the premier conference for engineers and scientists to present new and original work in the area of microelectronic device reliability.

Reliability analysis related to electronics, semiconductors, solar including test

Reliability issues related to the electronics industry including solutions

IRPS is the premiere conference in microelectronic reliability and the physics of failure of microelectronic components. This includes the identification of new or the improvement in the understanding and modeling of failure mechanisms in electronic and optoelectronic devices, materials, and systems, as well as the impact of device and circuit design, as well as material and process selection on reliability.

The IRPS offers its attendees technical sessions, tutorials, workshops, a year-in-review seminar and a poster session, all covering state-of-the-art developments in electronic and optoelectronic reliability as well as equipment demonstrations during the symposium.

IPFA 2011 will be devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability and yield, especially those related to advanced process technologies

Devoted to fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability and yield, especially those related to advanced process technologies

The 16th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2009) is organized by the IEEE Reliability/CPMT/ED Singapore Chapter in co-operation with IEEE Nanjing Section in China. The Symposium is technically co-sponsored by the IEEE Electron Device Society, IEEE Reliability Society.

IPFA 2008 will be devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability and yield, especially those related to advanced process technologies.

The Symposium is devoted to the fundamental understanding of the physical mechanisms of device failures and issues related to device reliability, especially those related to advanced process technologies.

Reliability management of materials\, devices and circuits and innovative failure analysis techniques for micro\, nano and optoelectronics.

The conference is intended to bring together young researchers, scientists, engineers and famous experts working in the field of reliability of the consolidated and the emerging electron devices. Researchers in academia are expected to join the workshop, but also engineers in small start-up companies and from major industries are strongly interested in participating.

This international symposium focuses on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics during Product Development and Life Cycle. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.

This international symposium focuses on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics during Product Development and Life Cycle. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.

Focus on software security, safety, and reliability for researchers and practitioners to exchange best-of-breed practices for developing reliable, secure, and trustworthy software systems in a more effective and efficient way.

Focus on software security and reliability for researchers and practitioners to exchange best-of-breed practices for developing reliable, secure, and trustworthy software systems in a more effective and efficient way.

SSIRI 2009 is a forum for the exchange of methods, theories and ideas related to the development of reliable, secure, and trustworthy software. Researchers and practitioners will present innovative theories and methods and discuss ideas, experiences and practices for ensuring the security and reliability of software in a more effective and efficient way.

SSIRI 2008 focuses on integrating tools and approaches for developing reliable, secure and trustworthy systems. Papers of innovative approaches, concepts and experiences throughout the entire product development cycle in software, hardware and systems are welcome.The conference will bridge theory, applications, experience reports and best practices.