Conferences related to Degradation

Back to Top

2016 Annual Reliability and Maintainability Symposium (RAMS)

Tutorials and original papers on reliability, maintainability, safety, risk management, and logistics


2015 IEEE International Reliability Physics Symposium (IRPS)

Sharing information related to cause, effects and solutions in the deign and manufacture of electronics and related components


2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Sample Preparation, Metrology and Material Characterization Advanced Failure Analysis Techniques Die-Level / Package-Level Failure Analysis Case Study & Failure Mechanisms Product Reliability Evaluation and ApproachesNovel Device Reliability and Failure MechanismsNovel Gate Stack/Dielectrics and FEOL Reliability and Failure MechanismsAdvanced Interconnects and BEOL Reliability and Failure Mechanisms


2013 IEEE International Integrated Reliability Workshop (IIRW)

We invite you to submit a presentation proposal that addresses any semiconductor related reliability issue, including the following topics: resistive memories, high-k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III-V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI/PBTI, root cause defects (physical mechanisms and simulations), Cu interconnects and low-k dielectrics, impact of transistor degradation on circuit reliability, designing-in reliability (products, circuits,systems, processes), customer product reliability requirements / manufacturer reliability tasks, waferlevel reliability tests (test approaches and reliability test structures), reliability modeling and simulation,optoelectronics, and single event upsets.

  • 2012 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems.

  • 2011 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems through tutorials, paper presentations, discussion groups and special interest groups.

  • 2010 IEEE International Integrated Reliability Workshop (IIRW)

    The Integrated Reliability Workshop focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding, developing, and sharing reliability technology and test methodology for present and f

  • 2009 IEEE International Integrated Reliability Workshop (IRW)

    Semiconductor Reliability in general; and Wafer Level Reliability in specific. Covering areas like (but not limited to): Design-in Reliability, reliability characterization, deep sub-micron transistor and circuit reliability, customer reliability requirements, wafer level reliability tests, and reliability root cause analysis, etc.

  • 2008 IEEE International Integrated Reliability Workshop (IRW)

    The workshop focuses on ensuring device reliability through fabrication, design, testing, characterization and simulation as well as identification of the defects and mechanisms responsible for reliability problems. It provides a unique environment for understanding, developing and sharing reliability technology and test methodology.

  • 2007 IEEE International Integrated Reliability Workshop (IRW)

    The Workshop focuses on ensuring semiconductor reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliabilty problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding and developing reliability technology and test methodology.

  • 2006 IEEE International Integrated Reliability Workshop (IRW)


2013 IEEE/AIAA 32nd Digital Avionics Systems Conference (DASC)

DASC is the premier annual conference providing authors an opportunity for publication and presentation to an international audience of papers encompassing the field of avionics systems for aircraft/rotorcraft/unmanned aircraft (commercial, military, general aviation) launch vehicles, missiles, spacecraft, and space transportation systems, navigation, guidance/control of flight, computers, communications, sensors (radar, infrared, visual bands), avionics architectures and data networking, communications networks, software, crew interface, space and ground components needed for the operation of military, commercial, and business aircraft, and avionics electrical power generation and control, Student papers are entered into a judged competition.


More Conferences

Periodicals related to Degradation

Back to Top

Automation Science and Engineering, IEEE Transactions on

The IEEE Transactions on Automation Sciences and Engineering (T-ASE) publishes fundamental papers on Automation, emphasizing scientific results that advance efficiency, quality, productivity, and reliability. T-ASE encourages interdisciplinary approaches from computer science, control systems, electrical engineering, mathematics, mechanical engineering, operations research, and other fields. We welcome results relevant to industries such as agriculture, biotechnology, healthcare, home automation, maintenance, manufacturing, pharmaceuticals, retail, ...


Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...


Electron Device Letters, IEEE

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Electron Devices, IEEE Transactions on

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Reliability, IEEE Transactions on

Principles and practices of reliability, maintainability, and product liability pertaining to electrical and electronic equipment.


More Periodicals


Xplore Articles related to Degradation

Back to Top

A New Method Based on Stochastic Process Models for Machine Remaining Useful Life Prediction

Yaguo Lei; Naipeng Li; Jing Lin IEEE Transactions on Instrumentation and Measurement, 2016

Remaining useful life (RUL) prediction is a key process in condition-based maintenance for machines. It contributes to reducing risks and maintenance costs and increasing the maintainability, availability, reliability, and productivity of machines. This paper proposes a new method based on stochastic process models for machine RUL prediction. First, a new stochastic process model is constructed considering the multiple variability sources ...


Vertical InGaAs/InP Tunnel FETs With Tunneling Normal to the Gate

Guangle Zhou; Yeqing Lu; Rui Li; Qin Zhang; Wan Sik Hwang; Qingmin Liu; Tim Vasen; Chen Chen; Haijun Zhu; Jenn-Ming Kuo; Siyuranga Koswatta; Tom Kosel; Mark Wistey; Patrick Fay; Alan Seabaugh; Huili Xing IEEE Electron Device Letters, 2011

Vertical n-channel tunnel field-effect transistors (FETs) based on compound semiconductors, in a new geometry with tunneling normal to the gate, are demonstrated for the first time using an n+ In0.53Ga0.47As/n+ /n+,=0.53- >;1 GaAs/p+ InP heterojunction. At 300 K, the TFETs show an on-current of ~20 μA/μm and a minimum subthreshold swing (SS) of 130 mV/dec using an Al2O3 gate dielectric ...


R66-81 A Hybrid-Code Differential Analyzer

H. K. Skramstad IEEE Transactions on Electronic Computers, 1966

None


A semi-blind detection algorithm for V-BLAST system

Jianming Wang; Chunming Zhao Global Telecommunications Conference, 2003. GLOBECOM '03. IEEE, 2003

The channel information is required in conventional V-BLAST algorithm. When the training sequences are short, the channel estimation is very noisy, which incurs the system performance degradation. We propose a semi-blind detection algorithm in this paper. Signals transmitted from different antennas are separated blindly first based on the statistical independence of the signals. Short training sequences are then utilized to ...


Effects of pile-turning frequency on compost quality and changes of chemical and physical properties during plant-scale composting

Pan Siliang; Qunhui Wang; Zou Dexun; Sun Xiaohong; Wu Chuanfu 2010 International Conference on Mechanic Automation and Control Engineering, 2010

Pile-turning is an important technical means to control the ventilation, oxygen supply and material blending during trough composting. In order to examine the effect of pile-turning frequency on composting process and product quality, we set up four different control methods of pile-turning. The results show that treatment with pile-turning is better than the one without it in compost maturity level. ...


More Xplore Articles

Educational Resources on Degradation

Back to Top

eLearning

A New Method Based on Stochastic Process Models for Machine Remaining Useful Life Prediction

Yaguo Lei; Naipeng Li; Jing Lin IEEE Transactions on Instrumentation and Measurement, 2016

Remaining useful life (RUL) prediction is a key process in condition-based maintenance for machines. It contributes to reducing risks and maintenance costs and increasing the maintainability, availability, reliability, and productivity of machines. This paper proposes a new method based on stochastic process models for machine RUL prediction. First, a new stochastic process model is constructed considering the multiple variability sources ...


Vertical InGaAs/InP Tunnel FETs With Tunneling Normal to the Gate

Guangle Zhou; Yeqing Lu; Rui Li; Qin Zhang; Wan Sik Hwang; Qingmin Liu; Tim Vasen; Chen Chen; Haijun Zhu; Jenn-Ming Kuo; Siyuranga Koswatta; Tom Kosel; Mark Wistey; Patrick Fay; Alan Seabaugh; Huili Xing IEEE Electron Device Letters, 2011

Vertical n-channel tunnel field-effect transistors (FETs) based on compound semiconductors, in a new geometry with tunneling normal to the gate, are demonstrated for the first time using an n+ In0.53Ga0.47As/n+ /n+,=0.53- >;1 GaAs/p+ InP heterojunction. At 300 K, the TFETs show an on-current of ~20 μA/μm and a minimum subthreshold swing (SS) of 130 mV/dec using an Al2O3 gate dielectric ...


R66-81 A Hybrid-Code Differential Analyzer

H. K. Skramstad IEEE Transactions on Electronic Computers, 1966

None


A semi-blind detection algorithm for V-BLAST system

Jianming Wang; Chunming Zhao Global Telecommunications Conference, 2003. GLOBECOM '03. IEEE, 2003

The channel information is required in conventional V-BLAST algorithm. When the training sequences are short, the channel estimation is very noisy, which incurs the system performance degradation. We propose a semi-blind detection algorithm in this paper. Signals transmitted from different antennas are separated blindly first based on the statistical independence of the signals. Short training sequences are then utilized to ...


Effects of pile-turning frequency on compost quality and changes of chemical and physical properties during plant-scale composting

Pan Siliang; Qunhui Wang; Zou Dexun; Sun Xiaohong; Wu Chuanfu 2010 International Conference on Mechanic Automation and Control Engineering, 2010

Pile-turning is an important technical means to control the ventilation, oxygen supply and material blending during trough composting. In order to examine the effect of pile-turning frequency on composting process and product quality, we set up four different control methods of pile-turning. The results show that treatment with pile-turning is better than the one without it in compost maturity level. ...


More eLearning Resources

IEEE-USA E-Books

  • ContentBased Image RetrievalResearch Issues 1995, NEC Research Institute, Inc. All rights reserved.

    This chapter surveys the research problems and directions in the field of image retrieval by content-based query. The central problem is to find high- speed methods for finding which images within a large collection best match a given image template. To be of practical use, a solution should be able to do detailed analyses at a rate of about 1000 images per second, which, when coupled with descriptor-based search techniques to select candidates for analysis, will enable effective search of libraries containing millions of images. An attractive approach is to perform the search on compressed versions of the images. Reduction in data volume reduces I/O time, and should reduce processing time as well. Fourier-domain compression and wavelet compression are the major directions for this research. The advantage of Fourier-domain compression is that it provides an efficient computational means to determine which position within an image best matches a specified pattern. However, the cost of performing Fourier transforms is a computational bottleneck, forcing researchers to consider other alternatives that may yield faster searches. Wavelet compression has the advantage that correlation peaks can be detected in the wavelet domain, thus eliminating the need to invert the wavelet transform. But searching within a wavelet transform is more costly than in a Fourier domain. One might obtain the best of both transforms by combining Fourier transforms with wavelet functions. For both wavelet and Fourier-domain computations, architectural support can reduce access-time delays to near zero on critical paths within the memory hierarchy because all of the accesses are known in advance. Memory-access time is the main source of performance degradation in the memory hierarchy. It may be possible to use the knowledge of future reference patterns to schedule dat a movement at various levels of the memory hierarchy in order to reduce the access time delay to zero for the critical accesses. Ideally, image streams will arrive at an arithmetic unit just in time to be processed, and the results will be returned to an external disk (or other form of memory) just as the write head reaches the region where the data are to be written. The gains from both architectural support and processing of compressed images may yield the performance improvement required to meet our goal.

  • A CostEffective, HighBandwidth Storage Architecture

    This paper describes the Network-Attached Secure Disk (NASD) storage architecture, prototype implementations of NASD drives, array management for our architecture, and three filesystems built on our prototype. NASD provides scalable storage bandwidth without the cost of servers used primarily for transferring data from peripheral networks (e.g. SCSI) to client networks (e.g. ethernet). Increasing dataset sizes, new attachment technologies, the convergence of peripheral and interprocessor switched networks, and the increased availability of on-drive transistors motivate and enable this new architecture. NASD is based on four main principles: direct transfer to clients, secure interfaces via cryptographic support, asynchronous non- criticalpath oversight, and variably-sized data objects. Measurements of our prototype system show that these services can be cost-effectively integrated into a next generation disk drive ASIC. End-to-end measurements of our prototype drive and filesystems suggest that NASD can support conventional distributed filesystems without performance degradation. More importantly, we show scalable bandwidth for NASD-specialized filesystems. Using a parallel data mining application, NASD drives deliver a linear scaling of 6.2 MB/s per client-drive pair, tested with up to eight pairs in our lab.

  • High Temperature Hybrids for use up to 275CDrift and Lifetime

    This paper reviews the drift and lifetime performance of 275°C hybrid microcircuits that were recently developed by Teledyne Philbrick and Sandia National Laboratories. This hybrid technology is based on temperature tolerant thick films and discrete silicon JFETs. The results of high temperature circuit testing are reviewed; component and circuit degradation and fail ure modes are described and compared to predictions; and finally, design rules are given to maximize lifetimes and to minimize performance drift for up to 10,000 hours of operation at 275°C. Although these circuits were developed for instrumenting geothermal bqreholes, many other applications for this technology exist in such areas as fossil fuel exploration and production systems, jet engine monitors, and nuclear reactor monitors.

  • No title

    Adaptive detection of signals embedded in correlated Gaussian noise has been an active field of research in the last decades. This topic is important in many areas of signal processing such as, just to give some examples, radar, sonar, communications, and hyperspectral imaging. Most of the existing adaptive algorithms have been designed following the lead of the derivation of Kelly's detector which assumes perfect knowledge of the target steering vector. However, in realistic scenarios, mismatches are likely to occur due to both environmental and instrumental factors. When a mismatched signal is present in the data under test, conventional algorithms may suffer severe performance degradation. The presence of strong interferers in the cell under test makes the detection task even more challenging. An effective way to cope with this scenario relies on the use of "tunable" detectors, i.e., detectors capable of changing their directivity through the tuning of proper parameters. The aim o this book is to present some recent advances in the design of tunable detectors and the focus is on the so-called two-stage detectors, i.e., adaptive algorithms obtained cascading two detectors with opposite behaviors. We derive exact closed-form expressions for the resulting probability of false alarm and the probability of detection for both matched and mismatched signals embedded in homogeneous Gaussian noise. It turns out that such solutions guarantee a wide operational range in terms of tunability while retaining, at the same time, an overall performance in presence of matched signals commensurate with Kelly's detector. Table of Contents: Introduction / Adaptive Radar Detection of Targets / Adaptive Detection Schemes for Mismatched Signals / Enhanced Adaptive Sidelobe Blanking Algorithms / Conclusions

  • Towards Persistent Localization and Mapping with a Continuous Appearance-Based Topology

    Appearance-based localization can provide loop closure detection at vast scales regardless of accumulated metric error. However, the computation time and memory requirements of current appearance-based methods scale not only with the size of the environment but also with the operation time of the platform. Additionally, repeated visits to locations will develop multiple competing representations, which will reduce recall performance over time. These properties impose severe restrictions on long-term autonomy for mobile robots, as loop closure performance will inevitably degrade with increased operation time. In this paper we present a graphical extension to CAT-SLAM, a particle filter-based algorithm for appearancebased localization and mapping, to provide constant computation and memory requirements over time and minimal degradation of recall performance during repeated visits to locations. We demonstrate loop closure detection in a large urban environment with capped computation time and memory requirements and performance exceeding previous appearance-based methods by a factor of 2. We discuss the limitations of the algorithm with respect to environment size, appearance change over time and applications in topological planning and navigation for long-term robot operation.

  • A GaAs Integrated Differential Amplifier for Operation up to 300C

    A technology for GaAs integrated circuits for operation up to 300°C is presented. As an example a differential amplifier with a temperature compensated current source was fabricated and characterized at d.c. and at frequencies up to 5 MHz. The measured d.c. voltage gain shows good stability up to 300°C.The decrease in a.c. signal amplification with temperature is constant for all frequencies. No degradation of the performance was observed after prolonged periods of thermal stress.

  • Performance of Optimum and Suboptimum Synchronizers

    The optimum (maximum-likelihood) synchronizer for extracting bit synchronization directly from a binary data stream is presented along with some simple suboptimum synchronizers that perform almost all well. The manner in which the performances of these systems depend on the pertinent system parameters as determined by a combined program of analysis, simulation, and laboratory experimentation are reported. Both synchronizer jitter and the degradation in error rate due to jitter are considered.

  • Satellite Orbits and Constellations

    This chapter begins with Kepler's laws, equations that describe the motion of Earth orbiting satellites under idealized conditions using a set of Keplerian parameters. It then discusses the deviation of actual satellite orbits from those predicted by Kepler's laws, and how these deviations from ideal are handled in satnav. The chapter introduces some basics of satnav constellations, since satnav requires multiple satellites both to provide coverage over large portions of the Earth's surface and to provide the needed number of measurements. Constellations are typically designed to provide graceful degradation of satellite geometry in the absence of a few satellites, as well as to accommodate additional satellites that may be launched before an on-orbit satellite has failed and needs replacement. The chapter presents some useful calculations of geometry between satellites and receivers, showing how the geometry maps into characteristics of received signals.

  • MetalGaAs Interaction and Contact Degradation in Microwave MESFETs

    This work reports and critically reviews failure mechanisms induced by metal- GaAs interaction and contact degradation in low and medium power GaAs MESFETs in the framework of a comprehensive reliability evaluation test plan, performed mainly on commercially purchased devices manufactured by different technologies. The results show that, at least as regards contact degradation phenomena, these technologies have reached sufficient maturity, and significant reliability levels have been achieved even for the most severe applications and environments. Devices coming from some suppliers still suffer from reliability problems, such as sinking of Au-based gate metallization into the active channel, Al electromigration, Al/GaAs interdiffusion enhanced by high contact current density, source and drain ohmic contact resistance increase, ohmic contacts electromigration, surface metal migration and short circuiting of closely spaced electrodes on GaAs with a non-suitable surface preparation and/or passivation. All these failure mechanisms have been identified by means of suitable microanalytical techniques, correlated with device electrical degradation and thoroughly discussed in this paper by comparison with results previously reported in the technical literature.

  • Scaling Challenge Of Nand Flash Memory Cells

    This chapter discusses the scaling challenges of the NAND flash memory cell with a multilevel cell beyond 20-nm feature sizes. One important physical phenomenon is the floating-gate (FG) capacitive coupling interference that causes a Vt shift by programming neighbor cells. An increase in Vt distribution width will result in the degradation of read window margin (RWM). The other major physical phenomena to have an impact on RWM are electron injection spread (EIS) and random telegraph noise (RTN). Except for the RWM degradation, there are several other problems, such as control gate (CG) formations between FGs, the word line (WL) high-field problem, and reducing the number of stored electrons. The RWM of a self-aligned shallow trench isolation cell (SA-STI cell) is discussed for NAND flash memories over 2X to 0X-nm generations. The chapter also discusses several scaling problems and limitations over 2X to 0X-nm generations.



Standards related to Degradation

Back to Top

IEEE Guide for Assessing, Monitoring, and Mitigating Aging Effects on Class 1E Equipment Used in Nuclear Power Generating Stations

This document provides the guidelines for assessing, monitoring, and mitigating aging degradation effects on class 1E equipment used in nuclear power generating stations.