Conferences related to Degradation

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2015 Annual Reliability and Maintainability Symposium (RAMS)

This conf covers all facets of the assurance sciences.


2015 IEEE International Reliability Physics Symposium (IRPS)

Sharing information related to cause, effects and solutions in the deign and manufacture of electronics and related components


2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Sample Preparation, Metrology and Material Characterization Advanced Failure Analysis Techniques Die-Level / Package-Level Failure Analysis Case Study & Failure Mechanisms Product Reliability Evaluation and ApproachesNovel Device Reliability and Failure MechanismsNovel Gate Stack/Dielectrics and FEOL Reliability and Failure MechanismsAdvanced Interconnects and BEOL Reliability and Failure Mechanisms


2013 IEEE International Integrated Reliability Workshop (IIRW)

We invite you to submit a presentation proposal that addresses any semiconductor related reliability issue, including the following topics: resistive memories, high-k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III-V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI/PBTI, root cause defects (physical mechanisms and simulations), Cu interconnects and low-k dielectrics, impact of transistor degradation on circuit reliability, designing-in reliability (products, circuits,systems, processes), customer product reliability requirements / manufacturer reliability tasks, waferlevel reliability tests (test approaches and reliability test structures), reliability modeling and simulation,optoelectronics, and single event upsets.

  • 2012 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems.

  • 2011 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems through tutorials, paper presentations, discussion groups and special interest groups.

  • 2010 IEEE International Integrated Reliability Workshop (IIRW)

    The Integrated Reliability Workshop focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding, developing, and sharing reliability technology and test methodology for present and f

  • 2009 IEEE International Integrated Reliability Workshop (IRW)

    Semiconductor Reliability in general; and Wafer Level Reliability in specific. Covering areas like (but not limited to): Design-in Reliability, reliability characterization, deep sub-micron transistor and circuit reliability, customer reliability requirements, wafer level reliability tests, and reliability root cause analysis, etc.

  • 2008 IEEE International Integrated Reliability Workshop (IRW)

    The workshop focuses on ensuring device reliability through fabrication, design, testing, characterization and simulation as well as identification of the defects and mechanisms responsible for reliability problems. It provides a unique environment for understanding, developing and sharing reliability technology and test methodology.

  • 2007 IEEE International Integrated Reliability Workshop (IRW)

    The Workshop focuses on ensuring semiconductor reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliabilty problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding and developing reliability technology and test methodology.

  • 2006 IEEE International Integrated Reliability Workshop (IRW)


2013 IEEE/AIAA 32nd Digital Avionics Systems Conference (DASC)

DASC is the premier annual conference providing authors an opportunity for publication and presentation to an international audience of papers encompassing the field of avionics systems for aircraft/rotorcraft/unmanned aircraft (commercial, military, general aviation) launch vehicles, missiles, spacecraft, and space transportation systems, navigation, guidance/control of flight, computers, communications, sensors (radar, infrared, visual bands), avionics architectures and data networking, communications networks, software, crew interface, space and ground components needed for the operation of military, commercial, and business aircraft, and avionics electrical power generation and control, Student papers are entered into a judged competition.


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Periodicals related to Degradation

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Automation Science and Engineering, IEEE Transactions on

The IEEE Transactions on Automation Sciences and Engineering (T-ASE) publishes fundamental papers on Automation, emphasizing scientific results that advance efficiency, quality, productivity, and reliability. T-ASE encourages interdisciplinary approaches from computer science, control systems, electrical engineering, mathematics, mechanical engineering, operations research, and other fields. We welcome results relevant to industries such as agriculture, biotechnology, healthcare, home automation, maintenance, manufacturing, pharmaceuticals, retail, ...


Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...


Electron Device Letters, IEEE

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Electron Devices, IEEE Transactions on

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Reliability, IEEE Transactions on

Principles and practices of reliability, maintainability, and product liability pertaining to electrical and electronic equipment.


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Xplore Articles related to Degradation

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Sensory-Updated Residual Life Distributions for Components With Exponential Degradation Patterns

Gebraeel, N. Automation Science and Engineering, IEEE Transactions on, 2006

Research on interpreting data communicated by smart sensors and distributed sensor networks, and utilizing these data streams in making critical decisions stands to provide significant advancements across a wide range of application domains such as maintenance management. In this paper, a stochastic degradation modeling framework is developed for computing and continuously updating residual life distributions of partially degraded components. The ...


Prognostics of products using time series analysis based on degradation data

Tingting Huang; Li Wang; Tongmin Jiang Prognostics and Health Management Conference, 2010. PHM '10., 2010

This paper presents a method to predict degradation path of products using time series modeling procedure based on product performance degradation data. The product performance degradation data are treated as a time series data and stochastic process are utilized to describe the degradation process for predicting long-term trend. A degradation test is processed for miniature bulbs until they failed and ...


Analysis of Destructive Degradation Tests for a Product With Random Degradation Initiation Time

Ye Zhang; Haitao Liao Reliability, IEEE Transactions on, 2015

Most research on degradation models and analyses focuses on nondestructive degradation test data. In practice, destructive tests are often conducted to gain insights into the changes of the physical properties of products or materials over time. Such tests sometimes provide more reliable degradation information than nondestructive tests that may only yield indirect degradation measures, such as temperature, amount of metal ...


Inhibition Effects of Full Degradation Barley Straws on Algal

Li-Juan Cui; Xin-Sheng Zhao; Wei Li Intelligent System Design and Engineering Applications (ISDEA), 2013 Third International Conference on, 2013

How to control water eutrophication bloom having been the difficulties in the field of environmental engineering. Various measures have been taken to control the occurrence of algal blooms and slow down the outbreak of the frequency, such as source control (non-point source pollution control and abatement nutrient loading, sediment dredging, etc.), inhibition algaecide measures (artificial salvage or kill algae, etc.) ...


Modeling and analysis for degradation with an initiation time

Huairui Guo; Gerokostopoulos, A.; Haitao Liao; Pengying Niu Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual, 2013

For failure modes that are caused by a degradation mechanism, almost all of the existing models assume that degradation starts once a product begins operation. However, under some situations, there is a degradation free period where degradation starts only after an initiation time. Both the initiation period and the degradation growth period affect the product reliability. The lengths of these ...


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Educational Resources on Degradation

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Standards related to Degradation

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IEEE Guide for Assessing, Monitoring, and Mitigating Aging Effects on Class 1E Equipment Used in Nuclear Power Generating Stations

This document provides the guidelines for assessing, monitoring, and mitigating aging degradation effects on class 1E equipment used in nuclear power generating stations.



Jobs related to Degradation

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