Conferences related to Degradation

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2016 Annual Reliability and Maintainability Symposium (RAMS)

Tutorials and original papers on reliability, maintainability, safety, risk management, and logistics


2015 IEEE International Reliability Physics Symposium (IRPS)

Sharing information related to cause, effects and solutions in the deign and manufacture of electronics and related components


2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Sample Preparation, Metrology and Material Characterization Advanced Failure Analysis Techniques Die-Level / Package-Level Failure Analysis Case Study & Failure Mechanisms Product Reliability Evaluation and ApproachesNovel Device Reliability and Failure MechanismsNovel Gate Stack/Dielectrics and FEOL Reliability and Failure MechanismsAdvanced Interconnects and BEOL Reliability and Failure Mechanisms


2013 IEEE International Integrated Reliability Workshop (IIRW)

We invite you to submit a presentation proposal that addresses any semiconductor related reliability issue, including the following topics: resistive memories, high-k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III-V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI/PBTI, root cause defects (physical mechanisms and simulations), Cu interconnects and low-k dielectrics, impact of transistor degradation on circuit reliability, designing-in reliability (products, circuits,systems, processes), customer product reliability requirements / manufacturer reliability tasks, waferlevel reliability tests (test approaches and reliability test structures), reliability modeling and simulation,optoelectronics, and single event upsets.

  • 2012 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems.

  • 2011 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems through tutorials, paper presentations, discussion groups and special interest groups.

  • 2010 IEEE International Integrated Reliability Workshop (IIRW)

    The Integrated Reliability Workshop focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding, developing, and sharing reliability technology and test methodology for present and f

  • 2009 IEEE International Integrated Reliability Workshop (IRW)

    Semiconductor Reliability in general; and Wafer Level Reliability in specific. Covering areas like (but not limited to): Design-in Reliability, reliability characterization, deep sub-micron transistor and circuit reliability, customer reliability requirements, wafer level reliability tests, and reliability root cause analysis, etc.

  • 2008 IEEE International Integrated Reliability Workshop (IRW)

    The workshop focuses on ensuring device reliability through fabrication, design, testing, characterization and simulation as well as identification of the defects and mechanisms responsible for reliability problems. It provides a unique environment for understanding, developing and sharing reliability technology and test methodology.

  • 2007 IEEE International Integrated Reliability Workshop (IRW)

    The Workshop focuses on ensuring semiconductor reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliabilty problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding and developing reliability technology and test methodology.

  • 2006 IEEE International Integrated Reliability Workshop (IRW)


2013 IEEE/AIAA 32nd Digital Avionics Systems Conference (DASC)

DASC is the premier annual conference providing authors an opportunity for publication and presentation to an international audience of papers encompassing the field of avionics systems for aircraft/rotorcraft/unmanned aircraft (commercial, military, general aviation) launch vehicles, missiles, spacecraft, and space transportation systems, navigation, guidance/control of flight, computers, communications, sensors (radar, infrared, visual bands), avionics architectures and data networking, communications networks, software, crew interface, space and ground components needed for the operation of military, commercial, and business aircraft, and avionics electrical power generation and control, Student papers are entered into a judged competition.


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Periodicals related to Degradation

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Automation Science and Engineering, IEEE Transactions on

The IEEE Transactions on Automation Sciences and Engineering (T-ASE) publishes fundamental papers on Automation, emphasizing scientific results that advance efficiency, quality, productivity, and reliability. T-ASE encourages interdisciplinary approaches from computer science, control systems, electrical engineering, mathematics, mechanical engineering, operations research, and other fields. We welcome results relevant to industries such as agriculture, biotechnology, healthcare, home automation, maintenance, manufacturing, pharmaceuticals, retail, ...


Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...


Electron Device Letters, IEEE

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Electron Devices, IEEE Transactions on

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Reliability, IEEE Transactions on

Principles and practices of reliability, maintainability, and product liability pertaining to electrical and electronic equipment.


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Xplore Articles related to Degradation

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Critical Current Degradation Behavior in YBCO Coated Conductors Under Torsional Strain

Hyung-Seop Shin; John Ryan C. Dizon; Tae-Hyung Kim; Dong-Woo Ha; Sang-Soo Oh IEEE Transactions on Applied Superconductivity, 2007

The Ic degradation behaviors of a YBCO coated conductor (CC) tape (RABiTS/MOD) was investigated using a sample holder which gives torsional angles to HTS tapes. The Ic degradation in YBCO CC tape under torsional strains occurred gradually which is a characteristic feature under torsion. Uniform torsional deformation was induced in the YBCO CC tape evident from the consistent Ic degradation ...


Bit Error Probability Analysis of OFDM Systems in the Presence of Channel Estimation Error over Rayleigh and Ricean Fading Channels

Peng Tan; Norman C. Beaulieu 2006 IEEE International Conference on Communications, 2006

A characteristic function-based method is used to derive closed-form bit error probability (BEP) expressions for orthogonal frequency-division multiplexing (OFDM) systems in the presence of channel estimation error over frequency- selective Rayleigh fading channels and frequency-selective Ricean fading channels. Both single channel reception and diversity reception with maximal ratio combining (MRC) are examined. The BEP expressions are shown to sums of ...


Isolation and characterization of isoquinoline-degrading strain Y-4

Wang Guanghua; Yang Shuqin; Li Wenbing; Lei Qi; Liu Xueqin; Liu Wenmin; Liu Qi; Liu Tiejun; Jiang Lijuan Materials for Renewable Energy & Environment (ICMREE), 2011 International Conference on, 2011

Isoquinoline is a recalcitrant pollution of PAHs (polycyclic aromatic hydrocarbons) in coking wastewater processing system, the content of which has a direct impact on the effect of biochemical treatment and the quality of recycling water. This study focuses on the decreasing of isoquinoline content in coking wastewater. The Y-4 strain, isolated and screened from the long-term polluted sludge of the ...


An improved method of embedding data into pictures by modulo masking

K. Hara; T. Shimomura; T. Hasegawa; M. Nakagawa IEEE Transactions on Communications, 1988

An improved scheme using vertical block allocation to embed data in industrial-quality monochrome analog pictures by modulo masking is investigated. The video signal on each scan line is sampled, and a data bit is inserted into a block of three pels by a scrambling of the luminance level of only one pel in the block. The performance of the system ...


Temperature response of irradiated MOSFETs

S. S. Lornakin; G. I. Zebrev; D. V. Ivashin Microelectronics, 2002. MIEL 2002. 23rd International Conference on, 2002

It was shown experimentally that above threshold transconductance in investigated n-MOSFETs degrades after irradiation and short-term anneal only in subthreshold and moderate inversion regions. Subsequent durable anneal degrades transconductance on the whole operating gate bias range.


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Educational Resources on Degradation

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eLearning

Critical Current Degradation Behavior in YBCO Coated Conductors Under Torsional Strain

Hyung-Seop Shin; John Ryan C. Dizon; Tae-Hyung Kim; Dong-Woo Ha; Sang-Soo Oh IEEE Transactions on Applied Superconductivity, 2007

The Ic degradation behaviors of a YBCO coated conductor (CC) tape (RABiTS/MOD) was investigated using a sample holder which gives torsional angles to HTS tapes. The Ic degradation in YBCO CC tape under torsional strains occurred gradually which is a characteristic feature under torsion. Uniform torsional deformation was induced in the YBCO CC tape evident from the consistent Ic degradation ...


Bit Error Probability Analysis of OFDM Systems in the Presence of Channel Estimation Error over Rayleigh and Ricean Fading Channels

Peng Tan; Norman C. Beaulieu 2006 IEEE International Conference on Communications, 2006

A characteristic function-based method is used to derive closed-form bit error probability (BEP) expressions for orthogonal frequency-division multiplexing (OFDM) systems in the presence of channel estimation error over frequency- selective Rayleigh fading channels and frequency-selective Ricean fading channels. Both single channel reception and diversity reception with maximal ratio combining (MRC) are examined. The BEP expressions are shown to sums of ...


Isolation and characterization of isoquinoline-degrading strain Y-4

Wang Guanghua; Yang Shuqin; Li Wenbing; Lei Qi; Liu Xueqin; Liu Wenmin; Liu Qi; Liu Tiejun; Jiang Lijuan Materials for Renewable Energy & Environment (ICMREE), 2011 International Conference on, 2011

Isoquinoline is a recalcitrant pollution of PAHs (polycyclic aromatic hydrocarbons) in coking wastewater processing system, the content of which has a direct impact on the effect of biochemical treatment and the quality of recycling water. This study focuses on the decreasing of isoquinoline content in coking wastewater. The Y-4 strain, isolated and screened from the long-term polluted sludge of the ...


An improved method of embedding data into pictures by modulo masking

K. Hara; T. Shimomura; T. Hasegawa; M. Nakagawa IEEE Transactions on Communications, 1988

An improved scheme using vertical block allocation to embed data in industrial-quality monochrome analog pictures by modulo masking is investigated. The video signal on each scan line is sampled, and a data bit is inserted into a block of three pels by a scrambling of the luminance level of only one pel in the block. The performance of the system ...


Temperature response of irradiated MOSFETs

S. S. Lornakin; G. I. Zebrev; D. V. Ivashin Microelectronics, 2002. MIEL 2002. 23rd International Conference on, 2002

It was shown experimentally that above threshold transconductance in investigated n-MOSFETs degrades after irradiation and short-term anneal only in subthreshold and moderate inversion regions. Subsequent durable anneal degrades transconductance on the whole operating gate bias range.


More eLearning Resources

IEEE-USA E-Books

  • Biomaterials for Tissue Engineering

    Biomaterials are used to provide structural support during the tissue and organ fabrication process and are designed to simulate properties of the mammalian extracellular matrix. In this chapter, we provide a broad overview of biomaterials as they apply to tissue engineering. We provide a working definition of biomaterials and discuss biomaterial classification schemes and biomaterial platforms. During the course of this chapter, we also study biomaterial properties, including tensile properties, degradation kinetics, biocompatibility and biomimetic properties.

  • A HighLevel Design and Optimization Tool for Analog RF Receiver FrontEnds

    This paper presents a high-level analysis and optimization tool for the design of analog RF receiver front-ends, which takes all design parameters and all aspects of performance degradation (noise, distortion, self-mixing¿) into account. The simulations are performed in the spectral domain with a behavioral model library for the RF building blocks. The tool allows to explore alternative RF receiver topologies as well as to investigate design trade-offs within each topology. By having integrated the performance analysis routine within a simulated annealing optimization loop, the tool can also perform an optimal high-level synthesis of a given topology towards a specific application. It then determines the optimal specifications for the RF building blocks such that the required receiver signal quality is met while the overall power and/or area consumption is minimized.

  • Viterbi Decoding for Satellite and Space Communication

    Convolutional coding and Viterbi decoding, along with binary phase-shift keyed modulation, is presented as an efficient system for reliable communication on power limited satellite and space channels. Performance results, obtained theoretically and through computer simulation, are given for optimum short constraint length codes for a range of code constraint lengths and code rates. System efficiency is compared for hard receiver quantization and 4 and 8 level soft quantization. The effects on performance of varying of certain parameters relevant to decoder complexity and cost is examined. Quantitative performance degradation due to imperfect carrier phase coherence is evaluated and compared to that of an uncoded system. As an example of decoder performance versus complexity, a recently implemented 2-Mbit/s constraint length 7 Viterbi decoder is discussed. Finally a comparison is made between Viterbi and sequential decoding in terms of suitability to various system requirements.

  • Conclusions and Implications

    In this book Peter Lindert evaluates environmental concerns about soil degradation in two very large countries--China and Indonesia--where anecdotal evidence has suggested serious problems. Lindert does what no scholar before him has done: using new archival data sets, he measures changes in soil productivity over long enough periods of time to reveal the influence of human activity.China and Indonesia are good test cases because of their geography and history. China has been at the center of global concerns about desertification and water erosion, which it may have accelerated with intense agriculture. Most of Indonesia¹s lands were created by volcanoes and erosion, and its rapid deforestation and shifting slash-burn agriculture have been singled out for international censure.Lindert's investigation suggests that human mismanagement is not on average worsening the soil quality in China and Indonesia. Human cultivation lowers soil nitrogen and organic matter, but has offsetting positive effects. Economic development and rising incomes may even lead to better soil. Beyond the importance of Lindert's immediate findings, this book opens a new area of study--quantitative soil history--and raises the standard for debating soil trends.

  • Power System Restoration The Second Task Force Report

    In its second report, the Power System Restoration Task Force (PSR-TF) (1) reviews the 1979-83 North American Electric Reliability Council (NERC) Reports on Major Bulk Power System Disturbances (2), identifying restoration problems which have been encountered during that 5-year period. Generally, these problems fall into three phases of restoration activities: planning for restart, reintegration and restoration of the bulk power supply; control actions during system degradation for saving and retaining critical sources of power; and restoration after a major disturbance when the power system has stabilized. The report also briefly discusses the applicability of several existing programs to the system restoration process. The opinions and conclusions expressed in this paper are those of the authors; they are based on the referenced reports and have not been reviewed with NERC or the reporting utilities.

  • Hebbian reinforcement learning in a modular dynamic network

    We present a multi-population dynamic neural network model with binary activation and a random interaction pattern. The weights parameters have been specified in order to distinguish excitatory populations from inhibitory populations. Under specific parameters, we design functional modules composed of two populations, one of excitatory neurons, one of inhibitory neurons. Such modules are found to display a weak chaotic activity, and to react toward incoming stimulations with increasing synchronization. We also present the design of topologically structured neural maps. We then combine such modules for the design of a perception/action network composed of one sensory module and two concurrent motor modules. Such a network is coupled with the dynamics of an inverted pendulum, showing spontaneous phase transitions toward various attractors, each attractor corresponding to a particular structural coupling within the agent/environment system. This spontaneous versatility is then exploited in a reinforcement learning paradigm where two separate reinforcement path are defined, one for the positive rewards, the other for the negative rewards. The learning experiment shows a fast adaptation to the constraints, followed by a slower phase where the behavior is improved. No degradation of the behavior is found for continuing learning, i.e. the learned behavior is preserved for long lasting time.

  • Towards Persistent Localization and Mapping with a Continuous Appearance-Based Topology

    Appearance-based localization can provide loop closure detection at vast scales regardless of accumulated metric error. However, the computation time and memory requirements of current appearance-based methods scale not only with the size of the environment but also with the operation time of the platform. Additionally, repeated visits to locations will develop multiple competing representations, which will reduce recall performance over time. These properties impose severe restrictions on long-term autonomy for mobile robots, as loop closure performance will inevitably degrade with increased operation time. In this paper we present a graphical extension to CAT-SLAM, a particle filter-based algorithm for appearancebased localization and mapping, to provide constant computation and memory requirements over time and minimal degradation of recall performance during repeated visits to locations. We demonstrate loop closure detection in a large urban environment with capped computation time and memory requirements and performance exceeding previous appearance-based methods by a factor of 2. We discuss the limitations of the algorithm with respect to environment size, appearance change over time and applications in topological planning and navigation for long-term robot operation.

  • No title

    Although the solar energy industry has experienced rapid growth recently, high-level management of photovoltaic (PV) arrays has remained an open problem. As sensing and monitoring technology continues to improve, there is an opportunity to deploy sensors in PV arrays in order to improve their management. In this book, we examine the potential role of sensing and monitoring technology in a PV context, focusing on the areas of fault detection, topology optimization, and performance evaluation/data visualization. First, several types of commonly occurring PV array faults are considered and detection algorithms are described. Next, the potential for dynamic optimization of an array's topology is discussed, with a focus on mitigation of fault conditions and optimization of power output under non- fault conditions. Finally, monitoring system design considerations such as type and accuracy of measurements, sampling rate, and communication protocols are considered. It is our hope that the ben fits of monitoring presented here will be sufficient to offset the small additional cost of a sensing system, and that such systems will become common in the near future. Table of Contents: Introduction / Overview of Photovoltaics / Causes Performance Degradation and Outage / Fault Detection Methods / Array Topology Optimization / Monitoring of PV Systems / Summary

  • Thermal Degradation and Termination Behavior of Thick Film Resistors

    Thermal stability was measured for Du Pont 1420 (102 ohims/square), Du Pont 1440 (104 ohms/square), Cermalloy 540 (104 ohms/square), and Cermalloy 550 (105 ohms/square) thick film resistor materials. Samples were aged at 200, 300 and 400°c. In addition, effects of resistor-conductor termination area, laser trimming, and applied bias voltage on thermal stability were evaluated. For 200 and 300°C exposure, the sheet resistivity increased for all materials. Maximum increase after 5000 hours exposure as +8%. For 400°C exposure, sheet resistivity decreased for all materials. Maximum decrease was -20% for 5000 hours exposure. The termination region had no significant effect on either asfired resistance or thermal degradation behavior. Laser trimming tended to stabilize resistors slightly and applied bias voltage had no significant effect.

  • A Thread in Time Saves Tabling Time

    The use of tabling in logic programming has been recognized as a powerful evaluation technique. Currently available tabling systems are mostly based on variant checks and hence are limited in their ability to recognize reusable subcomputations. Tabling systems based on call subsumption can yield superior performance by recognizing a larger set of reusable computations. However, a straightforward adaptation of the mechanisms used in variant-based systems to reuse these computations can in fact result in considerable performance degradation. In this paper we propose a novel organization of tables using Dynamic Threaded Sequential Automata (DTSA) which permits efficient reuse of previously computed results in a subsumptive system. We describe an implementation of the tables using DTSA and the associated access mechanisms. We also report experimental results which show that a subsumptive tabling system implemented by extending the XSB logic programming system with our table access techniques can perform significantly better than the original variant-based system.



Standards related to Degradation

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IEEE Guide for Assessing, Monitoring, and Mitigating Aging Effects on Class 1E Equipment Used in Nuclear Power Generating Stations

This document provides the guidelines for assessing, monitoring, and mitigating aging degradation effects on class 1E equipment used in nuclear power generating stations.