Degradation

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Conferences related to Degradation

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2013 Annual Reliability and Maintainability Symposium - Product Quality & Integrity (RAMS)


2013 IEEE International Reliability Physics Symposium (IRPS)

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Reliability studies and applications related to physics in the areas of electronics and solar


2012 13th International Symposium on Quality Electronic Design (ISQED)

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The International Symposium on Quality Electronic Design (ISQED) the premier Electronic Design conference bridges the gap between Electronic/Semiconductor ecosystem members providing electronic design tools\, integrated circuit technologies\, semiconductor technology\,packaging\, assembly & test to achieve design quality.

  • 2011 International Symposium on Quality Electronic Design (ISQED)

    ISQED is a premier Design & Design Automation conference bridges the gap between electronic design tools and processes\, integrated circuit technologies\, processes & manufacturing\, to achieve design quality. ISQED is the leading conference for design for manufacturability (DFM) and quality (DFQ) issues. It provides a forum to exchange ideas and promote research\, development\, and application of design techniques & methods\, design processes\, and EDA design methodologies and tools that address issues which impa

  • 2010 11th International Symposium on Quality of Electronic Design (ISQED)

    ISQED is the pioneer and leading conference dealing with design for manufacturability and quality issues, front to back.

  • 2009 10th International Symposium on Quality of Electronic Design (ISQED)

    The International Symposium on Quality Electronic Design (ISQED), is a premier Design & Design Automation conference, aimed at bridging the gap between and integration of, electronic design tools and processes, integrated circuit technologies, processes & manufacturing, to achieve design quality. ISQED is the pioneer and leading conference dealing with design for manufacturability and quality issues, front to back. The conference provides a forum to present and exchange ideas and to promote the research, de

  • 2008 9th International Symposium on Quality of Electronic Design (ISQED)

    The International Symposium on Quality Electronic Design (ISQED), is a premier Design & Design Automation conference, aimed at bridging the gap between and integration of, electronic design tools and processes, integrated circuit technologies, processes & manufacturing, to achieve design quality. ISQED is the pioneer and leading conference dealing with design for manufacturability and quality issues, front to back. The conference provides a forum to present and exchange ideas and to promote the research.


2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012)

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Devoted to fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability and yield\, especially those related to advanced process technologies.

  • 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011)

    IPFA 2011 will be devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability and yield, especially those related to advanced process technologies

  • 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010)

    Devoted to fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability and yield, especially those related to advanced process technologies

  • 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2009)

    The 16th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2009) is organized by the IEEE Reliability/CPMT/ED Singapore Chapter in co-operation with IEEE Nanjing Section in China. The Symposium is technically co-sponsored by the IEEE Electron Device Society, IEEE Reliability Society.

  • 2008 15th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2008)

    IPFA 2008 will be devoted to the fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability and yield, especially those related to advanced process technologies.

  • 2007 14th International Symposium on Physical & Failure Analysis of ICs (IPFA 2007)

    The Symposium is devoted to the fundamental understanding of the physical mechanisms of device failures and issues related to device reliability, especially those related to advanced process technologies.


2012 23rd European Symposium on Reliability of Electron Devices\, Failure Physics and Analysis - ESREF 2012

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This international symposium continues to focus on recent developments and future directions in quality and reliability management of materials\, devices and circuits for micro\, nano\, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.


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Xplore Articles related to Degradation

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  • Sensory-Updated Residual Life Distributions for Components With Exponential Degradation Patterns

    Gebraeel, N. Automation Science and Engineering, IEEE Transactions on, 2006

    Research on interpreting data communicated by smart sensors and distributed sensor networks, and utilizing these data streams in making critical decisions stands to provide significant advancements across a wide range of application domains such as maintenance management. In this paper, a stochastic degradation modeling framework is developed for computing and continuously updating residual life distributions of partially degraded components. The ...

  • Prognostics of products using time series analysis based on degradation data

    Tingting Huang; Li Wang; Tongmin Jiang Prognostics and Health Management Conference, 2010. PHM '10., 2010

    This paper presents a method to predict degradation path of products using time series modeling procedure based on product performance degradation data. The product performance degradation data are treated as a time series data and stochastic process are utilized to describe the degradation process for predicting long-term trend. A degradation test is processed for miniature bulbs until they failed and ...

  • Inhibition Effects of Full Degradation Barley Straws on Algal

    Li-Juan Cui; Xin-Sheng Zhao; Wei Li Intelligent System Design and Engineering Applications (ISDEA), 2013 Third International Conference on, 2013

    How to control water eutrophication bloom having been the difficulties in the field of environmental engineering. Various measures have been taken to control the occurrence of algal blooms and slow down the outbreak of the frequency, such as source control (non-point source pollution control and abatement nutrient loading, sediment dredging, etc.), inhibition algaecide measures (artificial salvage or kill algae, etc.) ...

  • Improved Reliability Using Accelerated Degradation & Design of Experiments

    Huairui Guo; Mettas, A. Reliability and Maintainability Symposium, 2007. RAMS '07. Annual, 2007

    For many products, an underlying degradation process is the root cause of failures. Often, such degradation processes are not directly observable and all that can be learned from the test is the time of failure. In order to get useful information in a short time, accelerated degradation testing is frequently used. Most of the existing degradation analysis methods assume that ...

  • Reliability prediction based on degradation modeling for systems with multiple degradation measures

    Peng Wang; Coit, D.W. Reliability and Maintainability, 2004 Annual Symposium - RAMS, 2004

    This paper describes a general modeling and analysis approach for reliability prediction based on degradation modeling, considering multiple degradation measures. Previous research has been focusing on reliability prediction based on degradation modeling at the component failure mechanism level. In reality, a system may consist of multiple components or a component may have multiple degradation paths, so it is necessary to ...

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Educational Resources on Degradation

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  • Fighting Against Counterfeit Drugs with Sproxil

    Mitra, Meliza Fighting Against Counterfeit Drugs with Sproxil, 2011

    This webinar explains the issue of counterfeit drugs in emerging markets and about how Sproxil empowers consumers in the fight against fake drugs.<br><br>Sproxil provides software and systems that capture market intelligence in emerging markets using cell phones. Our service provides automatic protection against counterfeiters. Brand and product pirates in emerging markets pose a significant risk to legitimate manufacturers, leading to ...

  • Maximum Power Point Tracking (MPPT): Algorithms and Applications

    Mitra, Meliza Maximum Power Point Tracking (MPPT): Algorithms and Applications, 2012

    This webinar explains the issue of counterfeit drugs in emerging markets and about how Sproxil empowers consumers in the fight against fake drugs.<br><br>Sproxil provides software and systems that capture market intelligence in emerging markets using cell phones. Our service provides automatic protection against counterfeiters. Brand and product pirates in emerging markets pose a significant risk to legitimate manufacturers, leading to ...

  • Introduction to Optical Fiber Communication Systems

    Willner, Alan Introduction to Optical Fiber Communication Systems, 2007

    As point-to-point links become more sophisticated, single-channel and WDM systems must dynamically adapt to changing environmental and traffic conditions in order to avoid SNR degradation. This scenario erupts into a much greater challenge when channels originate at different locations, as is the case with add/drop multiplexers, reconfigurable cross-connects, circuit-switched networking, and, eventually, optical packet switching. This course is intended for ...

Standards related to Degradation

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Periodicals related to Degradation

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  • Automation Science and Engineering, IEEE Transactions on

    The IEEE Transactions on Automation Sciences and Engineering (T-ASE) publishes fundamental papers on Automation, emphasizing scientific results that advance efficiency, quality, productivity, and reliability. T-ASE encourages interdisciplinary approaches from computer science, control systems, electrical engineering, mathematics, mechanical engineering, operations research, and other fields. We welcome results relevant to industries such as agriculture, biotechnology, healthcare, home automation, maintenance, manufacturing, pharmaceuticals, retail, ...

  • Device and Materials Reliability, IEEE Transactions on

    Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...

  • Electron Device Letters, IEEE

    Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.

  • Electron Devices, IEEE Transactions on

    Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.

  • Reliability, IEEE Transactions on

    Principles and practices of reliability, maintainability, and product liability pertaining to electrical and electronic equipment.

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