Conferences related to Degradation

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2014 Annual Reliability and Maintainability Symposium (RAMS)

Tutorials and original papers on reliability, maintainability, safety, risk management, and logistics


2014 IEEE International Reliability Physics Symposium (IRPS)

reliability, physics, irps


2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Sample Preparation, Metrology and Material Characterization Advanced Failure Analysis Techniques Die-Level / Package-Level Failure Analysis Case Study & Failure Mechanisms Product Reliability Evaluation and Approaches Novel Device Reliability and Failure Mechanisms Novel Gate Stack/Dielectrics and FEOL Reliability and Failure Mechanisms Advanced Interconnects and BEOL Reliability and Failure Mechanisms


2013 IEEE International Integrated Reliability Workshop (IIRW)

We invite you to submit a presentation proposal that addresses any semiconductor related reliability issue, including the following topics: resistive memories, high-k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III-V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI/PBTI, root cause defects (physical mechanisms and simulations), Cu interconnects and low-k dielectrics, impact of transistor degradation on circuit reliab

  • 2012 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems.

  • 2011 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems through tutorials, paper presentations, discussion groups and special interest groups.

  • 2010 IEEE International Integrated Reliability Workshop (IIRW)

    The Integrated Reliability Workshop focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding, developing, and sharing reliability technology and test methodology for present and f

  • 2009 IEEE International Integrated Reliability Workshop (IRW)

    Semiconductor Reliability in general; and Wafer Level Reliability in specific. Covering areas like (but not limited to): Design-in Reliability, reliability characterization, deep sub-micron transistor and circuit reliability, customer reliability requirements, wafer level reliability tests, and reliability root cause analysis, etc.

  • 2008 IEEE International Integrated Reliability Workshop (IRW)

    The workshop focuses on ensuring device reliability through fabrication, design, testing, characterization and simulation as well as identification of the defects and mechanisms responsible for reliability problems. It provides a unique environment for understanding, developing and sharing reliability technology and test methodology.

  • 2007 IEEE International Integrated Reliability Workshop (IRW)

    The Workshop focuses on ensuring semiconductor reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliabilty problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding and developing reliability technology and test methodology.

  • 2006 IEEE International Integrated Reliability Workshop (IRW)


2013 IEEE/AIAA 32nd Digital Avionics Systems Conference (DASC)

DASC is the premier annual conference providing authors an opportunity for publication and presentation to an international audience of papers encompassing the field of avionics systems for aircraft/rotorcraft/unmanned aircraft (commercial, military, general aviation) launch vehicles, missiles, spacecraft, and space transportation systems, navigation, guidance/control of flight, computers, communications, sensors (radar, infrared, visual bands), avionics architectures and data networking, communications net

  • 2012 IEEE/AIAA 31st Digital Avionics Systems Conference (DASC)

    Digital avionics systems for aircraft/rotorcraft/unmanned aircraft (commercial, military, general aviation); communications, command and control; air traffic management; space systems (launch vehicles, spacecraft, and satellites); history of avionics systems and their contributions to exploring the earth and space; economic impact of avionics systems

  • 2011 IEEE/AIAA 30th Digital Avionics Systems Conference (DASC)

    Digital avionics systems for aircraft/rotorcraft/unmanned aircraft (commercial, military, general aviation);communications, command and control; air traffic management; space systems (launch vehicles, spacecraft, satellites);human systems interface; avionics software; avionics design tools

  • 2010 IEEE/AIAA 29th Digital Avionics Systems Conference (DASC)

    Digital Avionics Systems design, integration, operation, and support; air traffic management; space systems; integrated communication, navigation, and surveillance; systems engineering; unmanned aeronautical systems

  • 2009 IEEE/AIAA 28th Digital Avionics Systems Conference (DASC)

    The 28th DASC focuses on Digital Avionics. Technical Papers and tutorials are also provided on ATM/CNS, NextGen, flight critical systems, aviation security, synthetic vision, aerospace avionics, and systems engineering.

  • 2008 IEEE/AIAA 27th Digital Avionics Systems Conference (DASC)

    The theme of the 27th DASC is Integrated Modular Avionics. Technical Papers and tutorials are also provided on ATM/CNS, NextGen, flight critical systems, aviation security, synthetic vision, aerospace avionics, and systems engineering.

  • 2007 IEEE/AIAA 26th Digital Avionics Systems Conference (DASC)

    The purpose of the Conference is to provide a forum for the exchange of new knowledge in digital avionics among professionals and students in the fields of commerical, military, and general aviation and space applications. The Conference serves the needs and professional interests of AIAA/IEEE members and promotes, in a public environment, their contributions and achievements in the arts, sciences and technology of aeronautics and astronautics.

  • 2006 IEEE/AIAA 25th Digital Avionics Systems Conference (DASC)

    The purpose of the Conference is to provide a forum for the exchange of new knowledge in digital avionics among professionals and students in the fields of commerical, military, and general aviation and space applications. The Conference serves the needs and professional interests of AIAA/IEEE members and promotes, in a public environment, their contributions and achievements in the arts, sciences and technology of aeronautics and astronautics.


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Periodicals related to Degradation

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Automation Science and Engineering, IEEE Transactions on

The IEEE Transactions on Automation Sciences and Engineering (T-ASE) publishes fundamental papers on Automation, emphasizing scientific results that advance efficiency, quality, productivity, and reliability. T-ASE encourages interdisciplinary approaches from computer science, control systems, electrical engineering, mathematics, mechanical engineering, operations research, and other fields. We welcome results relevant to industries such as agriculture, biotechnology, healthcare, home automation, maintenance, manufacturing, pharmaceuticals, retail, ...


Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...


Electron Device Letters, IEEE

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Electron Devices, IEEE Transactions on

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Reliability, IEEE Transactions on

Principles and practices of reliability, maintainability, and product liability pertaining to electrical and electronic equipment.


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Xplore Articles related to Degradation

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Sensory-Updated Residual Life Distributions for Components With Exponential Degradation Patterns

Gebraeel, N. Automation Science and Engineering, IEEE Transactions on, 2006

Research on interpreting data communicated by smart sensors and distributed sensor networks, and utilizing these data streams in making critical decisions stands to provide significant advancements across a wide range of application domains such as maintenance management. In this paper, a stochastic degradation modeling framework is developed for computing and continuously updating residual life distributions of partially degraded components. The ...


Prognostics of products using time series analysis based on degradation data

Tingting Huang; Li Wang; Tongmin Jiang Prognostics and Health Management Conference, 2010. PHM '10., 2010

This paper presents a method to predict degradation path of products using time series modeling procedure based on product performance degradation data. The product performance degradation data are treated as a time series data and stochastic process are utilized to describe the degradation process for predicting long-term trend. A degradation test is processed for miniature bulbs until they failed and ...


Inhibition Effects of Full Degradation Barley Straws on Algal

Li-Juan Cui; Xin-Sheng Zhao; Wei Li Intelligent System Design and Engineering Applications (ISDEA), 2013 Third International Conference on, 2013

How to control water eutrophication bloom having been the difficulties in the field of environmental engineering. Various measures have been taken to control the occurrence of algal blooms and slow down the outbreak of the frequency, such as source control (non-point source pollution control and abatement nutrient loading, sediment dredging, etc.), inhibition algaecide measures (artificial salvage or kill algae, etc.) ...


Modeling and analysis for degradation with an initiation time

Huairui Guo; Gerokostopoulos, A.; Haitao Liao; Pengying Niu Reliability and Maintainability Symposium (RAMS), 2013 Proceedings - Annual, 2013

For failure modes that are caused by a degradation mechanism, almost all of the existing models assume that degradation starts once a product begins operation. However, under some situations, there is a degradation free period where degradation starts only after an initiation time. Both the initiation period and the degradation growth period affect the product reliability. The lengths of these ...


Improved Reliability Using Accelerated Degradation & Design of Experiments

Huairui Guo; Mettas, A. Reliability and Maintainability Symposium, 2007. RAMS '07. Annual, 2007

For many products, an underlying degradation process is the root cause of failures. Often, such degradation processes are not directly observable and all that can be learned from the test is the time of failure. In order to get useful information in a short time, accelerated degradation testing is frequently used. Most of the existing degradation analysis methods assume that ...


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Educational Resources on Degradation

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eLearning

Introduction to Optical Fiber Communication Systems

Willner, Alan Introduction to Optical Fiber Communication Systems, 2007

As point-to-point links become more sophisticated, single-channel and WDM systems must dynamically adapt to changing environmental and traffic conditions in order to avoid SNR degradation. This scenario erupts into a much greater challenge when channels originate at different locations, as is the case with add/drop multiplexers, reconfigurable cross-connects, circuit- switched networking, and, eventually, optical packet switching. This course is intended ...


Maximum Power Point Tracking (MPPT): Algorithms and Applications

Petrone, Giovanni; Spagnuolo, Giovanni Maximum Power Point Tracking (MPPT): Algorithms and Applications, 2012

This webinar explains the issue of counterfeit drugs in emerging markets and about how Sproxil empowers consumers in the fight against fake drugs. Sproxil provides software and systems that capture market intelligence in emerging markets using cell phones. Our service provides automatic protection against counterfeiters. Brand and product pirates in emerging markets pose a significant risk to legitimate manufacturers, leading ...


Fighting Against Counterfeit Drugs with Sproxil

Mitra, Meliza Fighting Against Counterfeit Drugs with Sproxil, 2011

This webinar explains the issue of counterfeit drugs in emerging markets and about how Sproxil empowers consumers in the fight against fake drugs. Sproxil provides software and systems that capture market intelligence in emerging markets using cell phones. Our service provides automatic protection against counterfeiters. Brand and product pirates in emerging markets pose a significant risk to legitimate manufacturers, leading ...


IEEE-USA E-Books

No IEEE-USA E-Books are currently tagged "Degradation"



Standards related to Degradation

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IEEE Guide for Assessing, Monitoring, and Mitigating Aging Effects on Class 1E Equipment Used in Nuclear Power Generating Stations

This document provides the guidelines for assessing, monitoring, and mitigating aging degradation effects on class 1E equipment used in nuclear power generating stations.



Jobs related to Degradation

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Student Intern - R&D Support Technical Undergrad Yr Rnd Sandia National Laboratories
Head of Electrical Engineering Siemens Medical Solutions USA, Inc.
Electrical Engineer IV - (E4) Applied Materials
Electronics Engineer Federal Government Jobs
Electronics Technician Federal Government Jobs