Conferences related to Degradation

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2017 Annual Reliability and Maintainability Symposium (RAMS)

Tutorials and original papers on reliability, maintainability, safety, risk management, and logistics


2015 IEEE International Reliability Physics Symposium (IRPS)

Sharing information related to cause, effects and solutions in the deign and manufacture of electronics and related components


2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Sample Preparation, Metrology and Material Characterization Advanced Failure Analysis Techniques Die-Level / Package-Level Failure Analysis Case Study & Failure Mechanisms Product Reliability Evaluation and ApproachesNovel Device Reliability and Failure MechanismsNovel Gate Stack/Dielectrics and FEOL Reliability and Failure MechanismsAdvanced Interconnects and BEOL Reliability and Failure Mechanisms


2013 IEEE International Integrated Reliability Workshop (IIRW)

We invite you to submit a presentation proposal that addresses any semiconductor related reliability issue, including the following topics: resistive memories, high-k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III-V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI/PBTI, root cause defects (physical mechanisms and simulations), Cu interconnects and low-k dielectrics, impact of transistor degradation on circuit reliability, designing-in reliability (products, circuits,systems, processes), customer product reliability requirements / manufacturer reliability tasks, waferlevel reliability tests (test approaches and reliability test structures), reliability modeling and simulation,optoelectronics, and single event upsets.

  • 2012 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems.

  • 2011 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems through tutorials, paper presentations, discussion groups and special interest groups.

  • 2010 IEEE International Integrated Reliability Workshop (IIRW)

    The Integrated Reliability Workshop focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding, developing, and sharing reliability technology and test methodology for present and f

  • 2009 IEEE International Integrated Reliability Workshop (IRW)

    Semiconductor Reliability in general; and Wafer Level Reliability in specific. Covering areas like (but not limited to): Design-in Reliability, reliability characterization, deep sub-micron transistor and circuit reliability, customer reliability requirements, wafer level reliability tests, and reliability root cause analysis, etc.

  • 2008 IEEE International Integrated Reliability Workshop (IRW)

    The workshop focuses on ensuring device reliability through fabrication, design, testing, characterization and simulation as well as identification of the defects and mechanisms responsible for reliability problems. It provides a unique environment for understanding, developing and sharing reliability technology and test methodology.

  • 2007 IEEE International Integrated Reliability Workshop (IRW)

    The Workshop focuses on ensuring semiconductor reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliabilty problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding and developing reliability technology and test methodology.

  • 2006 IEEE International Integrated Reliability Workshop (IRW)


2013 IEEE/AIAA 32nd Digital Avionics Systems Conference (DASC)

DASC is the premier annual conference providing authors an opportunity for publication and presentation to an international audience of papers encompassing the field of avionics systems for aircraft/rotorcraft/unmanned aircraft (commercial, military, general aviation) launch vehicles, missiles, spacecraft, and space transportation systems, navigation, guidance/control of flight, computers, communications, sensors (radar, infrared, visual bands), avionics architectures and data networking, communications networks, software, crew interface, space and ground components needed for the operation of military, commercial, and business aircraft, and avionics electrical power generation and control, Student papers are entered into a judged competition.


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Periodicals related to Degradation

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Automation Science and Engineering, IEEE Transactions on

The IEEE Transactions on Automation Sciences and Engineering (T-ASE) publishes fundamental papers on Automation, emphasizing scientific results that advance efficiency, quality, productivity, and reliability. T-ASE encourages interdisciplinary approaches from computer science, control systems, electrical engineering, mathematics, mechanical engineering, operations research, and other fields. We welcome results relevant to industries such as agriculture, biotechnology, healthcare, home automation, maintenance, manufacturing, pharmaceuticals, retail, ...


Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...


Electron Device Letters, IEEE

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Electron Devices, IEEE Transactions on

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Reliability, IEEE Transactions on

Principles and practices of reliability, maintainability, and product liability pertaining to electrical and electronic equipment.


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Xplore Articles related to Degradation

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Effective strategy to compute forwarding tables for infiniBand networks

J. C. Sancho; A. Robles; J. Duato International Conference on Parallel Processing, 2001., 2001

InfiniBand is very likely to become the facto standard for communication between processing nodes and I/O devices as well as for interprocessor communication. The InifiniBand Architecture (IBA) defines a switch-based network with point-to-point links that support any topology defined by the user. Routing in IBA is distributed based on forwarding tables, and only considers the packet destination ID for routing ...


Spectral precoding for rectangularly pulsed OFDM

Char-Dir Chung IEEE Transactions on Communications, 2008

Spectrally precoded orthogonal frequency-division multiplexing (OFDM) is a promising rectangularly pulsed OFDM signaling format which can provide very small power spectral sidelobes, while allowing for efficient implementation by fast Fourier transform and guard interval insertion. In this paper, general constraints on spectral precoding are developed for OFDM signals with zero padding (ZP-OFDM) or cyclic prefix (CP-OFDM) to warrant the desirable ...


Evaluation method of deterioration of polyetheretherketone using dielectric relaxation characteristics

Chung Lee; Boo-Hyung Ryu; Kee-Joe Lim; Sun-Chul Jung 2008 International Conference on Condition Monitoring and Diagnosis, 2008

A novel deterioration evaluation method of class 1E cable insulation, Polyetheretherketone (PEEK), are proposed by using dielectric relaxation characteristic in order to evaluate the deterioration process for the accelerated aged PEEK. The procedure of accelerated ageing consists of 3 steps, 60Co gamma-ray irradiation, thermal ageing, and loss of coolant accident (LOCA) simulation. Also, the proposed evaluation method was compared with ...


Multi-agent based particle filter for moving object tracking

Yongping Li; Yanjiang Wang; Yujuan Qi; Hui Li 2010 International Conference on Computer Application and System Modeling (ICCASM 2010), 2010

When tracking the moving targets in video image sequences with the existing particle filter, usually the tracking performance is not satisfactory due to the particle degradation and particle diversity loss. In this paper, we propose a novel particle filtering algorithm. In the algorithm, the multi- agent co-evolutionary mechanism is introduced into the particle re-sampling process and make the particle become ...


Increased Deep-Level Hole Trapping by Combined Negative-Bias Temperature and Channel Hot-Hole Stress

T. J. J. Ho; D. S. Ang; K. C. Leong IEEE Electron Device Letters, 2011

Trapping of holes at deep energy states under negative-bias-temperature instability (NBTI) is examined in the presence of a nonzero drain bias [i.e., channel hot-hole (CHH) effect]. While the total density of switching hole traps is unchanged after the combined NBTI and CHH stress (implying no additional creation of such traps for the conditions studied), evidence shows that the density of ...


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Educational Resources on Degradation

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eLearning

Effective strategy to compute forwarding tables for infiniBand networks

J. C. Sancho; A. Robles; J. Duato International Conference on Parallel Processing, 2001., 2001

InfiniBand is very likely to become the facto standard for communication between processing nodes and I/O devices as well as for interprocessor communication. The InifiniBand Architecture (IBA) defines a switch-based network with point-to-point links that support any topology defined by the user. Routing in IBA is distributed based on forwarding tables, and only considers the packet destination ID for routing ...


Spectral precoding for rectangularly pulsed OFDM

Char-Dir Chung IEEE Transactions on Communications, 2008

Spectrally precoded orthogonal frequency-division multiplexing (OFDM) is a promising rectangularly pulsed OFDM signaling format which can provide very small power spectral sidelobes, while allowing for efficient implementation by fast Fourier transform and guard interval insertion. In this paper, general constraints on spectral precoding are developed for OFDM signals with zero padding (ZP-OFDM) or cyclic prefix (CP-OFDM) to warrant the desirable ...


Evaluation method of deterioration of polyetheretherketone using dielectric relaxation characteristics

Chung Lee; Boo-Hyung Ryu; Kee-Joe Lim; Sun-Chul Jung 2008 International Conference on Condition Monitoring and Diagnosis, 2008

A novel deterioration evaluation method of class 1E cable insulation, Polyetheretherketone (PEEK), are proposed by using dielectric relaxation characteristic in order to evaluate the deterioration process for the accelerated aged PEEK. The procedure of accelerated ageing consists of 3 steps, 60Co gamma-ray irradiation, thermal ageing, and loss of coolant accident (LOCA) simulation. Also, the proposed evaluation method was compared with ...


Multi-agent based particle filter for moving object tracking

Yongping Li; Yanjiang Wang; Yujuan Qi; Hui Li 2010 International Conference on Computer Application and System Modeling (ICCASM 2010), 2010

When tracking the moving targets in video image sequences with the existing particle filter, usually the tracking performance is not satisfactory due to the particle degradation and particle diversity loss. In this paper, we propose a novel particle filtering algorithm. In the algorithm, the multi- agent co-evolutionary mechanism is introduced into the particle re-sampling process and make the particle become ...


Increased Deep-Level Hole Trapping by Combined Negative-Bias Temperature and Channel Hot-Hole Stress

T. J. J. Ho; D. S. Ang; K. C. Leong IEEE Electron Device Letters, 2011

Trapping of holes at deep energy states under negative-bias-temperature instability (NBTI) is examined in the presence of a nonzero drain bias [i.e., channel hot-hole (CHH) effect]. While the total density of switching hole traps is unchanged after the combined NBTI and CHH stress (implying no additional creation of such traps for the conditions studied), evidence shows that the density of ...


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IEEE.tv Videos

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IEEE-USA E-Books

  • Floating Gate Planar Devices

    This chapter contains sections titled: Introduction Cell Structres and Operation Memory Array Circuitry Process Technology Degradation Mechanisms Typical Current-Voltage (I-V) Characteristics This chapter contains sections titled: References

  • Floating Gate Nonplanar Devices

    This chapter contains sections titled: Introduction Cell Structures and Operation Process Technology Memory Array Circuitry Degradation Mechanisms Typical Characteristics This chapter contains sections titled: Referencs

  • SONOS Nonvolatile Semiconductor Memories

    This chapter contains sections titled: Introduction The SONOS Nonvolatile Memory Transistor Memory Array Circuitry Degradation Mechanisms Typical Characteristics This chapter contains sections titled: References

  • Hebbian reinforcement learning in a modular dynamic network

    We present a multi-population dynamic neural network model with binary activation and a random interaction pattern. The weights parameters have been specified in order to distinguish excitatory populations from inhibitory populations. Under specific parameters, we design functional modules composed of two populations, one of excitatory neurons, one of inhibitory neurons. Such modules are found to display a weak chaotic activity, and to react toward incoming stimulations with increasing synchronization. We also present the design of topologically structured neural maps. We then combine such modules for the design of a perception/action network composed of one sensory module and two concurrent motor modules. Such a network is coupled with the dynamics of an inverted pendulum, showing spontaneous phase transitions toward various attractors, each attractor corresponding to a particular structural coupling within the agent/environment system. This spontaneous versatility is then exploited in a reinforcement learning paradigm where two separate reinforcement path are defined, one for the positive rewards, the other for the negative rewards. The learning experiment shows a fast adaptation to the constraints, followed by a slower phase where the behavior is improved. No degradation of the behavior is found for continuing learning, i.e. the learned behavior is preserved for long lasting time.

  • DATA¿¿?DRIVEN PROGNOSTICS FOR BATTERIES SUBJECT TO HARD FAILURE

    This chapter considers data¿¿?driven remaining useful life (RUL) of a battery prediction, which is typically made on the basis of projecting the trajectory of the system's health indicator, often called the degradation signal. Two most commonly used health indicators of batteries are capacity and internal resistance, while other health¿¿?dependent variables such as battery self¿¿?discharge rate may also be considered. By analyzing the evolution paths of the health indicating variables/degradation signals, it is possible to infer not only the current but also the future health status of the unit being studied. The chapter introduces a method specifically developed for battery RUL prediction under hard failure. In this method, a joint modeling scheme is used to take into consideration both the degradation data and the time¿¿?to¿¿?failure data. To better assess the performance of the prognostic algorithm, alternative interval prediction, the maximum power interval (MPI), is introduced as opposed to confidence intervals and mean/median¿¿?based intervals.

  • Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices

    The paper addresses the problem of analyzing the performance degradation caused by noise in power supply lines for deep submicron CMOS devices. We first propose a statistical modeling technique for the power supply noise including inductive ?>_I_ noise and power net _IR_ voltage drop. The model is then integrated with a statistical timing analysis framework to estimate the performance degradation caused by the power supply noise. Experimental results of our analysis framework, validated by HSPICE, for benchmark circuits implemented on both 0.25 µ, 2.5 V and 0.55 µ, 3.3 V technologies are presented and discussed. The results show that on average, with the consideration of this noise effect, the circuit critical path delays increase by 33% and 18%, respectively for circuits implemented on these two technologies

  • Reliability of High Temperature I2L Integrated Circuits

    Silicon based I2 L circuits have survived a life test for over 5000 hours at 340° C without degradation. These chips used aluminum metallization with current densities below 10,000 ampl sq.cm to avoid electromigration failures. The need for a gold based metal system for high temperature applications has lead to the development of Ti-W diffusion barriers which have withstood temperatures of 360°C for longer than 3500 hours without change. MSI integrated circuits with a Ti-W/Au metallization system have withstood stress tests of over 2000 hours at 360° C. Gold hillock formation has been shown to be caused by the compressive strains induced in the gold film by thermal expansion mismatches. The driving force for gold hillock formation may be eliminated by depositing the gold film at elevated temperatures.

  • A CostEffective, HighBandwidth Storage Architecture

    This paper describes the Network-Attached Secure Disk (NASD) storage architecture, prototype implementations of NASD drives, array management for our architecture, and three filesystems built on our prototype. NASD provides scalable storage bandwidth without the cost of servers used primarily for transferring data from peripheral networks (e.g. SCSI) to client networks (e.g. ethernet). Increasing dataset sizes, new attachment technologies, the convergence of peripheral and interprocessor switched networks, and the increased availability of on-drive transistors motivate and enable this new architecture. NASD is based on four main principles: direct transfer to clients, secure interfaces via cryptographic support, asynchronous non- criticalpath oversight, and variably-sized data objects. Measurements of our prototype system show that these services can be cost-effectively integrated into a next generation disk drive ASIC. End-to-end measurements of our prototype drive and filesystems suggest that NASD can support conventional distributed filesystems without performance degradation. More importantly, we show scalable bandwidth for NASD-specialized filesystems. Using a parallel data mining application, NASD drives deliver a linear scaling of 6.2 MB/s per client-drive pair, tested with up to eight pairs in our lab.

  • No title

    Current vision systems are designed to perform in normal weather condition. However, no one can escape from severe weather conditions. Bad weather reduces scene contrast and visibility, which results in degradation in the performance of various computer vision algorithms such as object tracking, segmentation and recognition. Thus, current vision systems must include some mechanisms that enable them to perform up to the mark in bad weather conditions such as rain and fog. Rain causes the spatial and temporal intensity variations in images or video frames. These intensity changes are due to the random distribution and high velocities of the raindrops. Fog causes low contrast and whiteness in the image and leads to a shift in the color. This book has studied rain and fog from the perspective of vision. The book has two main goals: 1) removal of rain from videos captured by a moving and static camera, 2) removal of the fog from images and videos captured by a moving single uncalibrated ca era system. The book begins with a literature survey. Pros and cons of the selected prior art algorithms are described, and a general framework for the development of an efficient rain removal algorithm is explored. Temporal and spatiotemporal properties of rain pixels are analyzed and using these properties, two rain removal algorithms for the videos captured by a static camera are developed. For the removal of rain, temporal and spatiotemporal algorithms require fewer numbers of consecutive frames which reduces buffer size and delay. These algorithms do not assume the shape, size and velocity of raindrops which make it robust to different rain conditions (i.e., heavy rain, light rain and moderate rain). In a practical situation, there is no ground truth available for rain video. Thus, no reference quality metric is very useful in measuring the efficacy of the rain removal algorithms. Temporal variance and spatiotemporal variance are presented in this book as no reference quality met ics. An efficient rain removal algorithm using meteorological properties of rain is developed. The relation among the orientation of the raindrops, wind velocity and terminal velocity is established. This relation is used in the estimation of shape- based features of the raindrop. Meteorological property-based features helped to discriminate the rain and non-rain pixels. Most of the prior art algorithms are designed for the videos captured by a static camera. The use of global motion compensation with all rain removal algorithms designed for videos captured by static camera results in better accuracy for videos captured by moving camera. Qualitative and quantitative results confirm that probabilistic temporal, spatiotemporal and meteorological algorithms outperformed other prior art algorithms in terms of the perceptual quality, buffer size, execution delay and system cost. The work presented in this book can find wide application in entertainment industries, transportation, tracking a d consumer electronics. Table of Contents: Acknowledgments / Introduction / Analysis of Rain / Dataset and Performance Metrics / Important Rain Detection Algorithms / Probabilistic Approach for Detection and Removal of Rain / Impact of Camera Motion on Detection of Rain / Meteorological Approach for Detection and Removal of Rain from Videos / Conclusion and Scope of Future Work / Bibliography / Authors' Biographies

  • Conclusions and Implications

    In this book Peter Lindert evaluates environmental concerns about soil degradation in two very large countries--China and Indonesia--where anecdotal evidence has suggested serious problems. Lindert does what no scholar before him has done: using new archival data sets, he measures changes in soil productivity over long enough periods of time to reveal the influence of human activity.China and Indonesia are good test cases because of their geography and history. China has been at the center of global concerns about desertification and water erosion, which it may have accelerated with intense agriculture. Most of Indonesia¹s lands were created by volcanoes and erosion, and its rapid deforestation and shifting slash-burn agriculture have been singled out for international censure.Lindert's investigation suggests that human mismanagement is not on average worsening the soil quality in China and Indonesia. Human cultivation lowers soil nitrogen and organic matter, but has offsetting positive effects. Economic development and rising incomes may even lead to better soil. Beyond the importance of Lindert's immediate findings, this book opens a new area of study--quantitative soil history--and raises the standard for debating soil trends.



Standards related to Degradation

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IEEE Guide for Assessing, Monitoring, and Mitigating Aging Effects on Class 1E Equipment Used in Nuclear Power Generating Stations

This document provides the guidelines for assessing, monitoring, and mitigating aging degradation effects on class 1E equipment used in nuclear power generating stations.



Jobs related to Degradation

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