Conferences related to Degradation

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2019 IEEE International Electric Machines & Drives Conference (IEMDC)

The IEEE International Electric Machines and Drives Conference (IEMDC) has been established to be one of the major events in the field of electrical machines and drives. IEMDC is a refernce forum to disseminate and exchange state of art in the filed of the Electrical Machines and Drives. The 2018 edition started in 1997 and the 2019 edition will be 11th one.


2019 IEEE/CVF International Conference on Computer Vision (ICCV)

Early Vision and Sensors Color, Illumination and Texture Segmentation and Grouping Motion and TrackingStereo and Structure from Motion Image -Based Modeling Physics -Based Modeling Statistical Methods and Learning in VisionVideo Surveillance and Monitoring Object, Event and Scene Recognition Vision - Based Graphics Image and Video RetrievalPerformance Evaluation Applications


2018 13th European Microwave Integrated Circuits Conference (EuMIC)

The EuMIC conference is jointly organized by GAAS® Association and EuMA and is the premierEuropean technical conference for RF microelectronics. Aim of the conference is to promote thediscussion of recent developments and trends, and to encourage the exchange of scientific andtechnical information covering a broad range of high-frequency related topics, from materialsand technologies to integrated circuits and applications, that will be addressed in all of theiraspects: theory, simulation, design and measurement. If you are interested in anything aboutmicrowave and RF IC's, the EuMIC conference is an exceptional venue to learn about the latestadvances in the field and meet recognized experts from both Industry and Academia.

  • 2017 12th European Microwave Integrated Circuits Conference (EuMIC)

    The EuMIC conference is jointly organized by GAAS® Association and EuMA and is the premier European technical conference for RF microelectronics. Aim of the conference is to promote the discussion of recent developments and trends, and to encourage the exchange of scientific and technical information covering a broad range of high-frequency related topics, from materials and technologies to integrated circuits and applications, that will be addressed in all of theiraspects: theory, simulation, design and measurement. If you are interested in anything about microwave and RF IC's, the EuMIC conference is an exceptional venue to learn about the latest advances in the field and meet recognized experts from both Industry and Academia.

  • 2016 11th European Microwave Integrated Circuits Conference (EuMIC)

    The EuMIC conference is jointly organized by GAAS® Association and EuMA and is the premier European technical conference for RF microelectronics. Aim of the conference is to promote the discussion of recent developments and trends, and to encourage the exchange of scientific and technical information covering a broad range of high-frequency related topics, from materials and technologies to integrated circuits and applications, that will be addressed in all of their aspects: theory, simulation, design and measurement. If you are interested in anything about microwave and RF IC's, the EuMIC conference is an exceptional venue to learn about the latest advances in the field and meet recognized experts from both Industry and Academia.

  • 2015 10th European Microwave Integrated Circuits Conference (EuMIC)

    The EuMIC conference is jointly organized by GAAS® Association and EuMA and is the premier European technical conference for RF microelectronics. Aim of the conference is to promote the discussion of recent developments and trends, and to encourage the exchange of scientific and technical information covering a broad range of high-frequency related topics, from materials and technologies to integrated circuits and applications, that will be addressed in all of their aspects: theory, simulation, design and measurement. If you are interested in anything about microwave and RF IC’s, the EuMIC conference is an exceptional venue to learn about the latest advances in the field and meet recognized experts from both Industry and Academia.

  • 2014 9th European Microwave Integrated Circuits Conference (EuMIC)

    The EuMIC conference is jointly organized by GAAS

  • 2013 European Microwave Integrated Circuit Conference (EuMIC)

    RF and microwave devices for telecommunication and sensor systems including UMTS/LTE, LMDS and other systems working in the microwave and millimetre -wave range. Covering recent development and trends in physical fundamentals, physical and behavoural modeling, microwave and opto-electric devices and monolithic design in GaAs, InP, SiGe, GaN and SiC technologies.

  • 2012 European Microwave Integrated Circuit Conference (EuMIC)

    Microwave integrated circuits: modelling, simulation and characterisation of devices and circuits; technologies and devices; circuit design and applications.

  • 2011 European Microwave Integrated Circuit Conference (EuMIC)

    RF and microwave devices for telecommunication and sensor systems including UMTS/LTE, LMDS and other systems working in the microwave and millimetre-wave range. Covering recent development and trends in physical fundamentals, physical and behavoural modeling, microwave and opto-electric devices and monolithic design in GaAs, InP, SiGe, GaN and SiC technologies.

  • 2010 European Microwave Integrated Circuits Conference (EuMIC)

    EuMIC is the leading conference for MMICs/RFICs and their applications in Europe. The aim of the conference is to promote the discussion of recent developments and trends, and encourage the exchange of scientific and technical information on physical fundamentals, material technology, process development and technology, physics based and empirical behavioral modeling of microwave and optoelectronic active devices and design of monolithic ICs

  • 2009 European Microwave Integrated Circuits Conference (EuMIC)

    The 4th European Microwave Integrated Circut Conference, EuMIC, in Amsterdam, The Netherlands, is one of four conferences at the European Microwave Week 2008, the largest event in Europe dedicated to microwave electronics. EuMIC is the leading European conference for RFIC/MMIC technology and applications. The aim of the conference is to cover recent research and development on material technology, process development/technology.

  • 2008 European Microwave Integrated Circuits Conference (EuMIC)

    The third European Microwave Integrated Circut Conference, EuMIC, in Amsterdam, The Netherlands, is one of four conferences at the European Microwave Week 2008, the largest event in Europe dedicated to microwave electronics. EuMIC is the leading European conference for RFIC/MMIC technology and applications. The aim of the conference is to cover recent research and development on material technology, process development/technology.

  • 2007 European Microwave Integrated Circuits Conference (EuMIC)

    RF and microwave devices for telecommunication and sensor systems including UMTS, LMDS and other systems working in the microwave and millimetre-wave range. Covering recent development and trends in physical fundamentals, physicas and behavoural modeling, microwave and opto-electric devices and monolithic design in GaAs, InP, SiGe, GaN and SiC technologies.

  • 2006 European Microwave Integrated Circuits Conference (EuMIC) (Formerly GAAS)

  • GAAS 2005 - European Gallium Arsenide and Other Semiconductors Application Symposium


2018 14th IEEE International Conference on Signal Processing (ICSP)

ICSP2018 includes sessions on all aspects of theory, design and applications of signal processing. Prospective authors are invited to propose papers in any of the following areas, but not limited to: A. Digital Signal Processing (DSP)B. Spectrum Estimation & ModelingC. TF Spectrum Analysis & WaveletD. Higher Order Spectral AnalysisE. Adaptive Filtering &SPF. Array Signal ProcessingG. Hardware Implementation for Signal ProcessingH Speech and Audio CodingI. Speech Synthesis & RecognitionJ. Image Processing & UnderstandingK. PDE for Image ProcessingL.Video compression &StreamingM. Computer Vision & VRN. Multimedia & Human-computer InteractionO. Statistic Learning & Pattern RecognitionP. AI & Neural NetworksQ. Communication Signal processingR. SP for Internet and Wireless CommunicationsS. Biometrics & AuthentificationT. SP for Bio-medical & Cognitive ScienceU


2018 15th IEEE Annual Consumer Communications & Networking Conference (CCNC)

IEEE CCNC 2018 will present the latest developments and technical solutions in the areas of home networking, consumer networking, enabling technologies (such as middleware) and novel applications and services. The conference will include a peer-reviewed program of technical sessions, special sessions, business application sessions, tutorials, and demonstration sessions


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Periodicals related to Degradation

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Advanced Packaging, IEEE Transactions on

The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.


Aerospace and Electronic Systems Magazine, IEEE

The IEEE Aerospace and Electronic Systems Magazine publishes articles concerned with the various aspects of systems for space, air, ocean, or ground environments.


Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Audio, Speech, and Language Processing, IEEE Transactions on

Speech analysis, synthesis, coding speech recognition, speaker recognition, language modeling, speech production and perception, speech enhancement. In audio, transducers, room acoustics, active sound control, human audition, analysis/synthesis/coding of music, and consumer audio. (8) (IEEE Guide for Authors) The scope for the proposed transactions includes SPEECH PROCESSING - Transmission and storage of Speech signals; speech coding; speech enhancement and noise reduction; ...


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Most published Xplore authors for Degradation

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Xplore Articles related to Degradation

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Study on the Growth and Degradation Characteristics of Atrazine Degradation Strain Named J2

[{u'author_order': 1, u'full_name': u'Zhao Jiang'}, {u'author_order': 2, u'full_name': u'Jing Li'}, {u'author_order': 3, u'full_name': u'Xinran Peng'}, {u'author_order': 4, u'full_name': u'Yao Ma'}, {u'author_order': 5, u'full_name': u'Rongjuan Wang'}, {u'author_order': 6, u'full_name': u'Ying Zhang'}] 2009 International Conference on Environmental Science and Information Application Technology, 2009

This paper mainly studies the growth and degradation characteristics of the atrazine degradation strain J<sub>2</sub> isolated from the soil collected from the cornfield in northern China with a long history of atrazine application. The growth and the degradation characteristics at different pHs, temperatures and in mediums with different salinity are also studied. The results indicate that: when J<sub>2</sub> is inoculated ...


Real-Time Thermoelectrical Model of PV Panels for Degradation Assessment

[{u'author_order': 1, u'affiliation': u'Department of Electrical and Electronics Engineering, Holy Spirit University of Kaslik, Jounieh, Lebanon', u'full_name': u'Bechara Fadi Nehme'}, {u'author_order': 2, u'affiliation': u'Department of Electrical and Electronics Engineering, Holy Spirit University of Kaslik, Jounieh, Lebanon', u'full_name': u'Tilda Karkour Akiki'}, {u'author_order': 3, u'affiliation': u'LSIS UMR 7296, Aix Marseille Universit\xe9, Marseille, France', u'full_name': u'Aziz Naamane'}, {u'author_order': 4, u'affiliation': u'LSIS UMR 7296, Aix Marseille Universit\xe9, Marseille, France', u'full_name': u"Nacer K. M'Sirdi"}] IEEE Journal of Photovoltaics, 2017

In this paper, we develop a new real-time thermoelectrical model of a photovoltaic (PV) panel that takes degradations into consideration. The degradation modes under study are the potential-induced degradation, the light-induced degradation, the ultraviolet light degradation, the moisture- induced degradation, and the cell cracks. The effect of each degradation mode on the equivalent circuit of PV cells is described by ...


The growth curve and the best degradation training time of oil degradation bacterium in the soil

[{u'author_order': 1, u'affiliation': u'College of Environment and Resources, Key Laboratory of Groundwater Resources and Environment of Ministry of Education, Jilin University, Changchun, 130021, China', u'full_name': u'Xu Hou'}, {u'author_order': 2, u'affiliation': u'College of Environment and Resources, Key Laboratory of Groundwater Resources and Environment of Ministry of Education, Jilin University, Changchun, 130021, China', u'full_name': u'Xiaofan Ma'}, {u'author_order': 3, u'affiliation': u'College of Environment and Resources, Key Laboratory of Groundwater Resources and Environment of Ministry of Education, Jilin University, Changchun, 130021, China', u'full_name': u'Jiangtao Wang'}, {u'author_order': 4, u'affiliation': u'College of Environment and Resources, Key Laboratory of Groundwater Resources and Environment of Ministry of Education, Jilin University, Changchun, 130021, China', u'full_name': u'Ping Guo'}, {u'author_order': 5, u'affiliation': u'College of Environment and Resources, Key Laboratory of Groundwater Resources and Environment of Ministry of Education, Jilin University, Changchun, 130021, China', u'full_name': u'Yuzhen Ma'}, {u'author_order': 6, u'affiliation': u'College of Environment and Resources, Key Laboratory of Groundwater Resources and Environment of Ministry of Education, Jilin University, Changchun, 130021, China', u'full_name': u'Junjia Cui'}, {u'author_order': 7, u'affiliation': u'College of Environment and Resources, Key Laboratory of Groundwater Resources and Environment of Ministry of Education, Jilin University, Changchun, 130021, China', u'full_name': u'Chen Zhang'}] 2011 International Conference on Remote Sensing, Environment and Transportation Engineering, 2011

In petroleum and petrochemical industry, spillage and overflow of petroleum products produce crude oil on the ground, which is soil environment problem. Some ingredients in the oil, especially PAHs, can be accumulated in agricultural products to enter the food chain, and, may produce “three cause” effects (teratogenic, cancer, mutation), which is harmful to both human health and ecological environmental security. ...


Bayesian Degradation Analysis With Inverse Gaussian Process Models Under Time-Varying Degradation Rates

[{u'author_order': 1, u'affiliation': u'Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, China', u'full_name': u'Weiwen Peng'}, {u'author_order': 2, u'affiliation': u'Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, China', u'full_name': u'Yan-Feng Li'}, {u'author_order': 3, u'affiliation': u'Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, China', u'full_name': u'Yuan-Jian Yang'}, {u'author_order': 4, u'affiliation': u'Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, China', u'full_name': u'Jinhua Mi'}, {u'author_order': 5, u'affiliation': u'Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, China', u'full_name': u'Hong-Zhong Huang'}] IEEE Transactions on Reliability, 2017

Degradation observations of modern engineering systems, such as manufacturing systems, turbine engines, and high-speed trains, often demonstrate various patterns of time-varying degradation rates. General degradation process models are mainly introduced for constant degradation rates, which cannot be used for time-varying situations. Moreover, the issue of sparse degradation observations and the problem of evolving degradation observations both are practical challenges for ...


Degradation of PCB52 in Aqueous Solution by ultrasound/Fenton process

[{u'author_order': 1, u'affiliation': u'Department of Environment Science and Engineering, Beijing University of Chemical Technology, China', u'full_name': u'Huan wen Xu'}, {u'author_order': 2, u'affiliation': u'Department of Environment Science and Engineering, Beijing University of Chemical Technology, China', u'full_name': u'Liu Feng'}] 2011 Second International Conference on Mechanic Automation and Control Engineering, 2011

The degradation of PCB52 in aqueous solution by ultrasound/Fenton process was investigated. And the effects of ultrasonic power, ultrasonic frequency, initial pH values of the solution and dosage of hydrogen peroxide and ferrous ions on the degradation efficiency were studied. The results indicated that the degradation efficiency increased with the decrease of pH value, and the ultrasonic frequency, ultrasonic power, ...


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Educational Resources on Degradation

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eLearning

No eLearning Articles are currently tagged "Degradation"

IEEE-USA E-Books

  • Thermal Degradation and Termination Behavior of Thick Film Resistors

    Thermal stability was measured for Du Pont 1420 (102ohims/square), Du Pont 1440 (104ohms/square), Cermalloy 540 (104ohms/square), and Cermalloy 550 (105ohms/square) thick film resistor materials. Samples were aged at 200, 300 and 400°c. In addition, effects of resistor-conductor termination area, laser trimming, and applied bias voltage on thermal stability were evaluated. For 200 and 300°C exposure, the sheet resistivity increased for all materials. Maximum increase after 5000 hours exposure as +8%. For 400°C exposure, sheet resistivity decreased for all materials. Maximum decrease was -20% for 5000 hours exposure. The termination region had no significant effect on either asfired resistance or thermal degradation behavior. Laser trimming tended to stabilize resistors slightly and applied bias voltage had no significant effect.

  • DATA‐DRIVEN PROGNOSTICS FOR BATTERIES SUBJECT TO HARD FAILURE

    This chapter considers data‐driven remaining useful life (RUL) of a battery prediction, which is typically made on the basis of projecting the trajectory of the system's health indicator, often called the degradation signal. Two most commonly used health indicators of batteries are capacity and internal resistance, while other health‐dependent variables such as battery self‐discharge rate may also be considered. By analyzing the evolution paths of the health indicating variables/degradation signals, it is possible to infer not only the current but also the future health status of the unit being studied. The chapter introduces a method specifically developed for battery RUL prediction under hard failure. In this method, a joint modeling scheme is used to take into consideration both the degradation data and the time‐to‐failure data. To better assess the performance of the prognostic algorithm, alternative interval prediction, the maximum power interval (MPI), is introduced as opposed to confidence intervals and mean/median‐based intervals.

  • PHM of Light‐Emitting Diodes

    This chapter provides an overview of the prognostics and health management (PHM) methods applied to light‐emitting diodes (LEDs). These methods include optimizing LED design with simulations, shortening qualification test times, enabling condition‐based maintenance (CBM) for LED systems, and providing information for return on investment (ROI) analysis. The simulation has unique characteristics for LED lighting systems, such as parameter selections and assumptions. The chapter describes the latest information regarding the prognostics of high‐power white LEDs and physical modeling and failure analysis for LEDs. It also provides an overview of the available prognostic methods and models that have been applied to both LED devices and LED systems. These methods include statistical regression, static Bayesian network (BN), Kalman filtering (KF), particle filtering (PF), artificial neural network (ANN), and physics‐based methods. Degradation processes vary one‐directionally and are monotonic, for example, light output degradation processes of LEDs.

  • Health and Remaining Useful Life Estimation of Electronic Circuits

    This chapter develops a kernel‐based learning technique to estimate the health degradation of an electronic circuit due to parametric deviation in the circuit components. A model‐based filtering method is developed for predicting the remaining useful life (RUL) of electronic circuit‐comprising components exhibiting parametric faults. The existing approaches for predicting failures resulting from electronic component parametric faults emphasize identifying monotonically deviating parameters and modeling their progression over time. The existing literature is classified and reviewed based on the approach employed for health estimation and failure prediction ‐ either the component‐centric approach or the circuit‐centric approach. The chapter presents the developed first‐principles‐based model to capture the degradation in circuit performance. It discusses the stochastic algorithm used for joint state‐parameter estimation and RUL prediction. The chapter describes the validation results using data obtained from simulation‐based experiments on the critical circuits of a direct‐current (DC)‐DC converter system.

  • Introduction to PHM

    Prognostics and systems health management (PHM) is a multifaceted discipline for the assessment of product degradation and reliability. This chapter provides a basic understanding of prognostics and health monitoring of products and the techniques being developed to enable prognostics for electronic products. PHM consists of sensing, anomaly detection, diagnostics, prognostics, and decision support. To enable PHM, the physics‐of‐failure (PoF)‐, canary‐, data‐driven‐, and fusion‐based approaches have been studied. The chapter explains each of these approaches. It then presents various applications using these approaches and discusses how to implement PHM in a system of systems. The chapter further introduces the opportunities of Internet of Things (IoT)‐based PHM for industrial applications. The key conclusion is that IoT‐based PHM is expected to have considerable influence on the implementation of reliability assessment, prediction and risk mitigation, and create new business opportunities.

  • MetalGaAs Interaction and Contact Degradation in Microwave MESFETs

    This work reports and critically reviews failure mechanisms induced by metal- GaAs interaction and contact degradation in low and medium power GaAs MESFETs in the framework of a comprehensive reliability evaluation test plan, performed mainly on commercially purchased devices manufactured by different technologies. The results show that, at least as regards contact degradation phenomena, these technologies have reached sufficient maturity, and significant reliability levels have been achieved even for the most severe applications and environments. Devices coming from some suppliers still suffer from reliability problems, such as?>sinking?> of Au-based gate metallization into the active channel, Al electromigration, Al/GaAs interdiffusion enhanced by high contact current density, source and drain ohmic contact resistance increase, ohmic contacts electromigration, surface metal migration and short circuiting of closely spaced electrodes on GaAs with a non-suitable surface preparation and/or passivation. All these failure mechanisms have been identified by means of suitable microanalytical techniques, correlated with device electrical degradation and thoroughly discussed in this paper by comparison with results previously reported in the technical literature.

  • Analysis of PHM Patents for Electronics

    This chapter provides a comprehensive overview of prognostics and health management (PHM) patents from three aspects: PHM for electrical systems, PHM for mechanical systems, and general PHM methodologies. It deals with the PHM implementation methods, algorithms, and apparatus for specific electrical systems, electronic devices, or pieces of equipment. PHM patents for semiconductor components, computers, and their accessories, such as hard disk drives, memories, and mainboards, account for more than 60% of all PHM patents for electrical systems. Additionally, PHM patents for batteries represent less than a 10% share of patents for electrical systems up to 2015. Nearly all PHM patents for electric motors are based on the measurement of current, since it is closely related to the operating condition of electric motors. PHM patents for electrical devices in automobiles and aircraft are constantly being proposed. Although PHM technologies have matured, PHM patents for networks and communications facilities are currently insufficient.

  • Preface

    This book is the result of a project that began in New York in March 2012. The four of us met at a bar next to the New York University campus, where Michaël and Harish were graduate students at the time, to discuss new ways to study environmental politics. Our starting point was that a lot had been written about environmental issues in wealthy countries but we knew less about the sustainability challenge in emerging and developing countries.

  • LITHIUM‐ION BATTERY REMAINING USEFUL LIFE ESTIMATION BASED ON ENSEMBLE LEARNING WITH LS‐SVM ALGORITHM

    This chapter proposes the integrated use of parameter‐selection‐based ensemble learning (PSBEL) and least square support vector machine (LS‐SVM) algorithm for lithium‐ion battery remaining useful life (RUL) estimation. Technically, given a set of monitoring parameters, some groups of parameters are randomly selected to construct LS‐SVM submodels. On the basis of these submodels, ensemble learning is utilized to achieve a final result, which overcomes the difficulty of accurately determining the model parameters and significantly improves the precision and stability of RUL estimation. The proposed approach provides practitioners with confidence intervals and probability distributions of RUL estimates for uncertainty management. The validity and applicability of the PSBEL with LS‐SVM for RUL estimation are demonstrated using capacity‐changing data of lithium‐ion batteries during discharging cycles. To analyze the impact of different submodels on the precision of final RUL prediction and to improve the uncertainty representation, more advanced ensemble learning techniques should be considered.

  • PROGNOSTIC CLASSIFICATION PROBLEM IN BATTERY HEALTH MANAGEMENT

    Batteries are crucial power sources for many engineering systems. Once the power source fails, the whole system completely stops performing its intended function. To avoid such catastrophic consequences, effective data‐driven prognostic tools that can accurately predict the failure in advance are highly desired. Effective failure prognosis plays an important role in maintenance decision‐making. Traditionally, most existing prognostic methods focus on the remaining useful life (RUL) prediction. Recently proposed prognostic methods have capability of real‐time online model updating. This chapter compares the logistic regression method and joint prognostic model (JPM), which is one of the most advanced data‐driven prognostic methods. It discusses a potential issue of having imbalanced data to provide important insights into the practitioners. The first category of methods typically models the time‐to‐failure data using parametric distributions such as Weibull distribution. The performance evaluation criteria used in the chapter are AUC, accuracy, and sensitivity.



Standards related to Degradation

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IEEE Guide for Assessing, Monitoring, and Mitigating Aging Effects on Class 1E Equipment Used in Nuclear Power Generating Stations

This document provides the guidelines for assessing, monitoring, and mitigating aging degradation effects on class 1E equipment used in nuclear power generating stations.



Jobs related to Degradation

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