Conferences related to Degradation

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2019 IEEE International Electric Machines & Drives Conference (IEMDC)

The IEEE International Electric Machines and Drives Conference (IEMDC) has been established to be one of the major events in the field of electrical machines and drives. IEMDC is a refernce forum to disseminate and exchange state of art in the filed of the Electrical Machines and Drives. The 2018 edition started in 1997 and the 2019 edition will be 11th one.


2019 IEEE/CVF International Conference on Computer Vision (ICCV)

Early Vision and Sensors Color, Illumination and Texture Segmentation and Grouping Motion and TrackingStereo and Structure from Motion Image -Based Modeling Physics -Based Modeling Statistical Methods and Learning in VisionVideo Surveillance and Monitoring Object, Event and Scene Recognition Vision - Based Graphics Image and Video RetrievalPerformance Evaluation Applications


2018 13th European Microwave Integrated Circuits Conference (EuMIC)

The EuMIC conference is jointly organized by GAAS® Association and EuMA and is the premierEuropean technical conference for RF microelectronics. Aim of the conference is to promote thediscussion of recent developments and trends, and to encourage the exchange of scientific andtechnical information covering a broad range of high-frequency related topics, from materialsand technologies to integrated circuits and applications, that will be addressed in all of theiraspects: theory, simulation, design and measurement. If you are interested in anything aboutmicrowave and RF IC's, the EuMIC conference is an exceptional venue to learn about the latestadvances in the field and meet recognized experts from both Industry and Academia.

  • 2017 12th European Microwave Integrated Circuits Conference (EuMIC)

    The EuMIC conference is jointly organized by GAAS® Association and EuMA and is the premier European technical conference for RF microelectronics. Aim of the conference is to promote the discussion of recent developments and trends, and to encourage the exchange of scientific and technical information covering a broad range of high-frequency related topics, from materials and technologies to integrated circuits and applications, that will be addressed in all of theiraspects: theory, simulation, design and measurement. If you are interested in anything about microwave and RF IC's, the EuMIC conference is an exceptional venue to learn about the latest advances in the field and meet recognized experts from both Industry and Academia.

  • 2016 11th European Microwave Integrated Circuits Conference (EuMIC)

    The EuMIC conference is jointly organized by GAAS® Association and EuMA and is the premier European technical conference for RF microelectronics. Aim of the conference is to promote the discussion of recent developments and trends, and to encourage the exchange of scientific and technical information covering a broad range of high-frequency related topics, from materials and technologies to integrated circuits and applications, that will be addressed in all of their aspects: theory, simulation, design and measurement. If you are interested in anything about microwave and RF IC's, the EuMIC conference is an exceptional venue to learn about the latest advances in the field and meet recognized experts from both Industry and Academia.

  • 2015 10th European Microwave Integrated Circuits Conference (EuMIC)

    The EuMIC conference is jointly organized by GAAS® Association and EuMA and is the premier European technical conference for RF microelectronics. Aim of the conference is to promote the discussion of recent developments and trends, and to encourage the exchange of scientific and technical information covering a broad range of high-frequency related topics, from materials and technologies to integrated circuits and applications, that will be addressed in all of their aspects: theory, simulation, design and measurement. If you are interested in anything about microwave and RF IC’s, the EuMIC conference is an exceptional venue to learn about the latest advances in the field and meet recognized experts from both Industry and Academia.

  • 2014 9th European Microwave Integrated Circuits Conference (EuMIC)

    The EuMIC conference is jointly organized by GAAS

  • 2013 European Microwave Integrated Circuit Conference (EuMIC)

    RF and microwave devices for telecommunication and sensor systems including UMTS/LTE, LMDS and other systems working in the microwave and millimetre -wave range. Covering recent development and trends in physical fundamentals, physical and behavoural modeling, microwave and opto-electric devices and monolithic design in GaAs, InP, SiGe, GaN and SiC technologies.

  • 2012 European Microwave Integrated Circuit Conference (EuMIC)

    Microwave integrated circuits: modelling, simulation and characterisation of devices and circuits; technologies and devices; circuit design and applications.

  • 2011 European Microwave Integrated Circuit Conference (EuMIC)

    RF and microwave devices for telecommunication and sensor systems including UMTS/LTE, LMDS and other systems working in the microwave and millimetre-wave range. Covering recent development and trends in physical fundamentals, physical and behavoural modeling, microwave and opto-electric devices and monolithic design in GaAs, InP, SiGe, GaN and SiC technologies.

  • 2010 European Microwave Integrated Circuits Conference (EuMIC)

    EuMIC is the leading conference for MMICs/RFICs and their applications in Europe. The aim of the conference is to promote the discussion of recent developments and trends, and encourage the exchange of scientific and technical information on physical fundamentals, material technology, process development and technology, physics based and empirical behavioral modeling of microwave and optoelectronic active devices and design of monolithic ICs

  • 2009 European Microwave Integrated Circuits Conference (EuMIC)

    The 4th European Microwave Integrated Circut Conference, EuMIC, in Amsterdam, The Netherlands, is one of four conferences at the European Microwave Week 2008, the largest event in Europe dedicated to microwave electronics. EuMIC is the leading European conference for RFIC/MMIC technology and applications. The aim of the conference is to cover recent research and development on material technology, process development/technology.

  • 2008 European Microwave Integrated Circuits Conference (EuMIC)

    The third European Microwave Integrated Circut Conference, EuMIC, in Amsterdam, The Netherlands, is one of four conferences at the European Microwave Week 2008, the largest event in Europe dedicated to microwave electronics. EuMIC is the leading European conference for RFIC/MMIC technology and applications. The aim of the conference is to cover recent research and development on material technology, process development/technology.

  • 2007 European Microwave Integrated Circuits Conference (EuMIC)

    RF and microwave devices for telecommunication and sensor systems including UMTS, LMDS and other systems working in the microwave and millimetre-wave range. Covering recent development and trends in physical fundamentals, physicas and behavoural modeling, microwave and opto-electric devices and monolithic design in GaAs, InP, SiGe, GaN and SiC technologies.

  • 2006 European Microwave Integrated Circuits Conference (EuMIC) (Formerly GAAS)

  • GAAS 2005 - European Gallium Arsenide and Other Semiconductors Application Symposium


2018 14th IEEE International Conference on Signal Processing (ICSP)

ICSP2018 includes sessions on all aspects of theory, design and applications of signal processing. Prospective authors are invited to propose papers in any of the following areas, but not limited to: A. Digital Signal Processing (DSP)B. Spectrum Estimation & ModelingC. TF Spectrum Analysis & WaveletD. Higher Order Spectral AnalysisE. Adaptive Filtering &SPF. Array Signal ProcessingG. Hardware Implementation for Signal ProcessingH Speech and Audio CodingI. Speech Synthesis & RecognitionJ. Image Processing & UnderstandingK. PDE for Image ProcessingL.Video compression &StreamingM. Computer Vision & VRN. Multimedia & Human-computer InteractionO. Statistic Learning & Pattern RecognitionP. AI & Neural NetworksQ. Communication Signal processingR. SP for Internet and Wireless CommunicationsS. Biometrics & AuthentificationT. SP for Bio-medical & Cognitive ScienceU


2018 15th IEEE Annual Consumer Communications & Networking Conference (CCNC)

IEEE CCNC 2018 will present the latest developments and technical solutions in the areas of home networking, consumer networking, enabling technologies (such as middleware) and novel applications and services. The conference will include a peer-reviewed program of technical sessions, special sessions, business application sessions, tutorials, and demonstration sessions


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Periodicals related to Degradation

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Advanced Packaging, IEEE Transactions on

The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.


Aerospace and Electronic Systems Magazine, IEEE

The IEEE Aerospace and Electronic Systems Magazine publishes articles concerned with the various aspects of systems for space, air, ocean, or ground environments.


Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Audio, Speech, and Language Processing, IEEE Transactions on

Speech analysis, synthesis, coding speech recognition, speaker recognition, language modeling, speech production and perception, speech enhancement. In audio, transducers, room acoustics, active sound control, human audition, analysis/synthesis/coding of music, and consumer audio. (8) (IEEE Guide for Authors) The scope for the proposed transactions includes SPEECH PROCESSING - Transmission and storage of Speech signals; speech coding; speech enhancement and noise reduction; ...


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Xplore Articles related to Degradation

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Coordinated Optimization of Multiservice Dispatch for Energy Storage Systems with Degradation Model for Utility Applications

[{u'author_order': 1, u'affiliation': u'National Renewable Energy Laboratory, 53405 Golden, Colorado United States (e-mail: Murali.M.Baggu@ieee.org)', u'full_name': u'Murali Mohan Baggu'}, {u'author_order': 2, u'affiliation': u'Distribution Energy Systems Integration, NREL, Golden, Colorado United States 80401 (e-mail: adarsh.nagarajan@nrel.gov)', u'full_name': u'Adarsh Nagarajan'}, {u'author_order': 3, u'affiliation': u'National Renewable Energy Laboratory, 53405 Golden, Colorado United States (e-mail: Dylan.Cutler@nrel.gov)', u'full_name': u'Dylan Cutler'}, {u'author_order': 4, u'affiliation': u'National Renewable Energy Laboratory, 53405 Golden, Colorado United States 80401-3393 (e-mail: Dan.Olis@nrel.gov)', u'full_name': u'Dan Olis'}, {u'author_order': 5, u'affiliation': u'Smart Grid, San Diego Gas & Electric Co., San Diego, California United States 92123 (e-mail: tbialek@semprautilities.com)', u'full_name': u'Thomas Owen Bialek'}, {u'author_order': 6, u'affiliation': u'National Renewable Energy Laboratory, 53405 Golden, Colorado United States (e-mail: Martha.Symko.Davies@nrel.gov)', u'full_name': u'Martha Symko-Davies'}] IEEE Transactions on Sustainable Energy, None

The rapid development of energy storage technologies is motivating researchers to understand the possible value of energy storage. This paper evaluates the multiservice dispatch of distribution-sited energy storage systems with realistic degradation models by integrating a multiservice optimization model with a distribution system simulator. This work attempts to define the theoretical value energy storage can bring when multiple value streams ...


A Detailed Study on Light-Induced Degradation of Cz-Si PERC-Type Solar Cells: Evidence of Rear Surface-Related Degradation

[{u'author_order': 1, u'affiliation': u'Department of Physics, University of Konstanz, Konstanz 78457, Germany (e-mail: Axel.Herguth@uni-konstanz.de).', u'full_name': u'Axel Herguth'}, {u'author_order': 2, u'affiliation': u'Department of Physics, University of Konstanz, Konstanz 78457, Germany (e-mail: Christian.Derricks@uni-konstanz.de).', u'full_name': u'Christian Derricks'}, {u'author_order': 3, u'affiliation': u'Department of Physics, University of Konstanz, Konstanz 78457, Germany (e-mail: David.Sperber@uni-konstanz.de).', u'full_name': u'David Sperber'}] IEEE Journal of Photovoltaics, None

A light-induced degradation phenomenon of unknown origin in p-type Cz-Si passivated emitter and rear cell (PERC)-type solar cells is thoroughly investigated by collating results from different measurement techniques and predictions from various simulations. The observed degradation manifests in slight losses in j$_text{sc}$, strong losses in V$_text{oc}$, and devastating losses in FF, and thus massively impacts efficiency. It is found that ...


Quantification of Environmental Effects on PV Module Degradation: A Physics-Based Data-Driven Modeling Method

[{u'author_order': 1, u'affiliation': u'Arizona State University, Tempe, AZ 85281 USA (e-mail: abalas18@asu.edu)', u'full_name': u'Arun Bala Subramaniyan'}, {u'author_order': 2, u'affiliation': u'Arizona State University, Tempe, AZ 85281 USA (e-mail: rong.pan@asu.edu)', u'full_name': u'Rong Pan'}, {u'author_order': 3, u'affiliation': u'Arizona State University, Tempe, AZ 85281 USA (e-mail: kuitche@asu.edu)', u'full_name': u'Joseph Kuitche'}, {u'author_order': 4, u'affiliation': u'Arizona State University, Tempe, AZ 85281 USA (e-mail: manit@asu.edu)', u'full_name': u'GovindaSamy TamizhMani'}] IEEE Journal of Photovoltaics, None

This paper explains the fusion of the physics-based material degradation mechanism with the statistics-based data modeling approach for predicting the degradation rate of photovoltaic (PV) modules. The degradation of PV module is mainly associated with the module construction type and climatic condition at its use location. The aim of this paper is to quantify the effect of dynamic environmental stresses ...


Effect of impulse current degradation on the electrical properties and dielectric relaxations of ZnO-based ceramic varistors

[{u'author_order': 1, u'affiliation': u'State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Shapingba District, Chongqing 400044, China', u'full_name': u'Xuetong Zhao'}, {u'author_order': 2, u'affiliation': u'State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Shapingba District, Chongqing 400044, China', u'full_name': u'Chao Xu'}, {u'author_order': 3, u'affiliation': u'State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Shapingba District, Chongqing 400044, China', u'full_name': u'Lulu Ren'}, {u'author_order': 4, u'affiliation': u'State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Shapingba District, Chongqing 400044, China', u'full_name': u'Ruijin Liao'}, {u'author_order': 5, u'affiliation': u'State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Shapingba District, Chongqing 400044, China', u'full_name': u'Lijun Yang'}, {u'author_order': 6, u'affiliation': u'State Key Laboratory of Power Transmission Equipment & System Security and New Technology, Chongqing University, Shapingba District, Chongqing 400044, China', u'full_name': u'Jian Li'}, {u'author_order': 7, u'affiliation': u"State Key Laboratory of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Xi'an, Shaanxi, 710049, China", u'full_name': u'Jianying Li'}] IEEE Transactions on Dielectrics and Electrical Insulation, 2018

The effects of impulse current degradation on the electrical properties and dielectric relaxations of zinc oxide (ZnO) ceramic varistors are systematically investigated in this work. The J-E characteristics show that the breakdown field E1mA (electric field at 1mA/cm2) increases, stabilizes, and then decreases with increasing impulse degradation, while the nonlinear coefficient α drops significantly over the entire degradation process. The ...


Development of a Portable Muography Detector for Infrastructure Degradation Investigation

[{u'author_order': 1, u'affiliation': u'Department of Advance Energy Engineering Science, IGSES, Kyushu University, Japan.', u'full_name': u'Kullapha Chaiwongkhot'}, {u'author_order': 2, u'affiliation': u'Department of Advance Energy Engineering Science, IGSES, Kyushu University, Japan.', u'full_name': u'Tadahiro Kin'}, {u'author_order': 3, u'affiliation': u'Department of Advance Energy Engineering Science, IGSES, Kyushu University, Japan.', u'full_name': u'Hiroaki Ohno'}, {u'author_order': 4, u'affiliation': u'Department of Advance Energy Engineering Science, IGSES, Kyushu University, Japan.', u'full_name': u'Ryo Sasaki'}, {u'author_order': 5, u'affiliation': u'Department of Advance Energy Engineering Science, IGSES, Kyushu University, Japan.', u'full_name': u'Yuta Nagata'}, {u'author_order': 6, u'affiliation': u'Department of Advance Energy Engineering Science, IGSES, Kyushu University, Japan.', u'full_name': u'Kazuhiro Kondo'}, {u'author_order': 7, u'affiliation': u'Department of Advance Energy Engineering Science, IGSES, Kyushu University, Japan.', u'full_name': u'Yukinobu Watanabe'}] IEEE Transactions on Nuclear Science, None

A portable muography detector was developed for measuring infrastructure degradation and its performance was tested. The detector consists of two muon position sensitive detectors (mu-PSDs) of the area of 140 mm × 140 mm, placed in a compact light-shielding box. Each mu-PSD consists of plastic scintillating fibers (PSFs) connected to multi-pixel photon counters (MPPCs). To suppress the gain deviation of ...


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Educational Resources on Degradation

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eLearning

No eLearning Articles are currently tagged "Degradation"

IEEE-USA E-Books

  • MetalGaAs Interaction and Contact Degradation in Microwave MESFETs

    This work reports and critically reviews failure mechanisms induced by metal- GaAs interaction and contact degradation in low and medium power GaAs MESFETs in the framework of a comprehensive reliability evaluation test plan, performed mainly on commercially purchased devices manufactured by different technologies. The results show that, at least as regards contact degradation phenomena, these technologies have reached sufficient maturity, and significant reliability levels have been achieved even for the most severe applications and environments. Devices coming from some suppliers still suffer from reliability problems, such as ?>sinking?> of Au-based gate metallization into the active channel, Al electromigration, Al/GaAs interdiffusion enhanced by high contact current density, source and drain ohmic contact resistance increase, ohmic contacts electromigration, surface metal migration and short circuiting of closely spaced electrodes on GaAs with a non-suitable surface preparation and/or passivation. All these failure mechanisms have been identified by means of suitable microanalytical techniques, correlated with device electrical degradation and thoroughly discussed in this paper by comparison with results previously reported in the technical literature.

  • Thermal Degradation and Termination Behavior of Thick Film Resistors

    Thermal stability was measured for Du Pont 1420 (102 ohims/square), Du Pont 1440 (104 ohms/square), Cermalloy 540 (104 ohms/square), and Cermalloy 550 (105 ohms/square) thick film resistor materials. Samples were aged at 200, 300 and 400¿¿c. In addition, effects of resistor-conductor termination area, laser trimming, and applied bias voltage on thermal stability were evaluated. For 200 and 300¿¿C exposure, the sheet resistivity increased for all materials. Maximum increase after 5000 hours exposure as +8%. For 400¿¿C exposure, sheet resistivity decreased for all materials. Maximum decrease was -20% for 5000 hours exposure. The termination region had no significant effect on either asfired resistance or thermal degradation behavior. Laser trimming tended to stabilize resistors slightly and applied bias voltage had no significant effect.

  • Self‐Healing

    This chapter contains sections titled: Introduction Cell Degradation Detection Cell Degradation Diagnosis and Prediction Cell Outage Compensation References

  • Inter‐layer Mobility Optimization

    This chapter summarizes some potentially useful concepts and information for handling mobility in multi‐layer long‐term evolution (LTE) networks. The mobility design problem can be split into two regimes: coverage and capacity‐limited cases. The chapter focuses on inter‐layer mobility of a classical cellular network without small cells. It elaborates the idle mode cell selection/reselection and measurement process in LTE. The chapter details the user equipment (UE) measurement process, with some examples of how commercial LTE UEs implement the sometimes mystifying third generation partnership project (3GPP) idle mode measurement requirements. It summarizes inter‐layer measurements in connected mode. The UE needs measurement gaps to perform inter‐frequency or inter‐radio access technologies (RATs) measurements. A UE supporting carrier aggregation may be able to do inter‐frequency measurements without gaps. To alleviate long‐term intra‐ and cross‐layer congestion, network capacity needs to be increased by physical optimization and addition of new cells.

  • Transceiver Budgets

    This chapter illustrates how to carry out the system design of a transceiver in order to fulfill a given set of requirements while taking into consideration the limitations in its physical implementation. Two approaches can be followed. We can decide a priori on an architecture that is theoretically able to fulfill the different requirements we have for a transceiver. We can then carry out the budget of the line‐up to refine the balance of the constraints between the different blocks of the line‐up, and then check that we can achieve the desired performance. In practice, these two approaches can be seen as the two sequences of an iterative process that leads to the optimization of the final implementation of a transceiver. Finally the chapter illustrates how to budget a transceiver for a selected architecture, and reviews the functions embedded in the direct conversion receiver.

  • Security and Dependability in Train Control Systems

    During the last 15 years, the interest in vehicular communication has grown, especially in the automotive industry. Due to the envisioned mass market, projects focusing on Car-to-X communication experience high public visibility. This book presents vehicular communication in a broader perspective that includes more than just its application to the automotive industry. It provides, researchers, engineers, decision makers and graduate students in wireless communications with an introduction to vehicular communication focussing on car-to-x and train-based systems. **Key Features:**  * Emphasises important perspectives of vehicular communication including market area, application areas, and standardisation issues as well as selected topics featuring aspects of developing, prototyping, and testing vehicular communication systems. * Supports the reader in understanding common characteristics and differences between the various application areas of vehicular com unication. * Offers both an overview of the application area and an in-depth discussion of key technologies in these areas. * Written by a wide range of experts in the field.

  • Practical Thermal Performance of LEDs

    This chapter discusses thermal performance of light emitting diodes (LEDs). The most immediately noticeable performance change of LEDs with temperature is that their forward voltage drops. This is a die phenomenon, and so varies from manufacturer to manufacturer. Thermal effects on electrical performance of LEDs depend only on the die. There are the effects of temperature on the light beyond the efficacy drop. One more performance consideration is the effect of pulsing current into the LED. Pulse¿¿¿width modulation (PWM) of the current into the LED is a preferred method of dimming. The LED itself has a lifetime that is probably enormous, perhaps hundreds of thousands of hours. This lifetime is set by catastrophic failures, such as bond wires breaking or lightning strikes. In a real circuit, the negative feedback effect is overbalanced by a positive feedback effect.

  • OLED Fabrication Process

    This chapter describes the fabrication processes of OLED devices. In general, OLEDs are fabricated by either a dry process or a wet process. The commonly used dry process is vacuum evaporation. Three types of vacuum evaporation techniques are reviewed. In wet processes, there are processes for coating without fine patterning and processes for making fine patterns.In addition to deposition techniques of each organic layer, RGB patterning technologies are important. These RGB patterning technologies are vacuum deposition using fine metal masks, wet processes such as ink¿¿¿jet, nozzle printing, relief printing, etc., and laser patterning process.

  • DATA¿¿¿DRIVEN PROGNOSTICS FOR BATTERIES SUBJECT TO HARD FAILURE

    This chapter considers data¿¿¿driven remaining useful life (RUL) of a battery prediction, which is typically made on the basis of projecting the trajectory of the system's health indicator, often called the degradation signal. Two most commonly used health indicators of batteries are capacity and internal resistance, while other health¿¿¿dependent variables such as battery self¿¿¿discharge rate may also be considered. By analyzing the evolution paths of the health indicating variables/degradation signals, it is possible to infer not only the current but also the future health status of the unit being studied. The chapter introduces a method specifically developed for battery RUL prediction under hard failure. In this method, a joint modeling scheme is used to take into consideration both the degradation data and the time¿¿¿to¿¿¿failure data. To better assess the performance of the prognostic algorithm, alternative interval prediction, the maximum power interval (MPI), is introduced as opposed to confidence intervals and mean/median¿¿¿based intervals.

  • LITHIUM¿¿¿ION BATTERY REMAINING USEFUL LIFE ESTIMATION BASED ON ENSEMBLE LEARNING WITH LS¿¿¿SVM ALGORITHM

    This chapter proposes the integrated use of parameter¿¿¿selection¿¿¿based ensemble learning (PSBEL) and least square support vector machine (LS¿¿¿SVM) algorithm for lithium¿¿¿ion battery remaining useful life (RUL) estimation. Technically, given a set of monitoring parameters, some groups of parameters are randomly selected to construct LS¿¿¿SVM submodels. On the basis of these submodels, ensemble learning is utilized to achieve a final result, which overcomes the difficulty of accurately determining the model parameters and significantly improves the precision and stability of RUL estimation. The proposed approach provides practitioners with confidence intervals and probability distributions of RUL estimates for uncertainty management. The validity and applicability of the PSBEL with LS¿¿¿SVM for RUL estimation are demonstrated using capacity¿¿¿changing data of lithium¿¿¿ion batteries during discharging cycles. To analyze the impact of different submodels on the precision of final RUL prediction and to improve the uncertainty representation, more advanced ensemble learning techniques should be considered.



Standards related to Degradation

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IEEE Guide for Assessing, Monitoring, and Mitigating Aging Effects on Class 1E Equipment Used in Nuclear Power Generating Stations

This document provides the guidelines for assessing, monitoring, and mitigating aging degradation effects on class 1E equipment used in nuclear power generating stations.



Jobs related to Degradation

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