Conferences related to Degradation

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2017 Annual Reliability and Maintainability Symposium (RAMS)

Tutorials and original papers on reliability, maintainability, safety, risk management, and logistics


2015 IEEE International Reliability Physics Symposium (IRPS)

Sharing information related to cause, effects and solutions in the deign and manufacture of electronics and related components


2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Sample Preparation, Metrology and Material Characterization Advanced Failure Analysis Techniques Die-Level / Package-Level Failure Analysis Case Study & Failure Mechanisms Product Reliability Evaluation and ApproachesNovel Device Reliability and Failure MechanismsNovel Gate Stack/Dielectrics and FEOL Reliability and Failure MechanismsAdvanced Interconnects and BEOL Reliability and Failure Mechanisms


2013 IEEE International Integrated Reliability Workshop (IIRW)

We invite you to submit a presentation proposal that addresses any semiconductor related reliability issue, including the following topics: resistive memories, high-k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III-V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI/PBTI, root cause defects (physical mechanisms and simulations), Cu interconnects and low-k dielectrics, impact of transistor degradation on circuit reliability, designing-in reliability (products, circuits,systems, processes), customer product reliability requirements / manufacturer reliability tasks, waferlevel reliability tests (test approaches and reliability test structures), reliability modeling and simulation,optoelectronics, and single event upsets.

  • 2012 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems.

  • 2011 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems through tutorials, paper presentations, discussion groups and special interest groups.

  • 2010 IEEE International Integrated Reliability Workshop (IIRW)

    The Integrated Reliability Workshop focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding, developing, and sharing reliability technology and test methodology for present and f

  • 2009 IEEE International Integrated Reliability Workshop (IRW)

    Semiconductor Reliability in general; and Wafer Level Reliability in specific. Covering areas like (but not limited to): Design-in Reliability, reliability characterization, deep sub-micron transistor and circuit reliability, customer reliability requirements, wafer level reliability tests, and reliability root cause analysis, etc.

  • 2008 IEEE International Integrated Reliability Workshop (IRW)

    The workshop focuses on ensuring device reliability through fabrication, design, testing, characterization and simulation as well as identification of the defects and mechanisms responsible for reliability problems. It provides a unique environment for understanding, developing and sharing reliability technology and test methodology.

  • 2007 IEEE International Integrated Reliability Workshop (IRW)

    The Workshop focuses on ensuring semiconductor reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliabilty problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding and developing reliability technology and test methodology.

  • 2006 IEEE International Integrated Reliability Workshop (IRW)


2013 IEEE/AIAA 32nd Digital Avionics Systems Conference (DASC)

DASC is the premier annual conference providing authors an opportunity for publication and presentation to an international audience of papers encompassing the field of avionics systems for aircraft/rotorcraft/unmanned aircraft (commercial, military, general aviation) launch vehicles, missiles, spacecraft, and space transportation systems, navigation, guidance/control of flight, computers, communications, sensors (radar, infrared, visual bands), avionics architectures and data networking, communications networks, software, crew interface, space and ground components needed for the operation of military, commercial, and business aircraft, and avionics electrical power generation and control, Student papers are entered into a judged competition.


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Periodicals related to Degradation

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Automation Science and Engineering, IEEE Transactions on

The IEEE Transactions on Automation Sciences and Engineering (T-ASE) publishes fundamental papers on Automation, emphasizing scientific results that advance efficiency, quality, productivity, and reliability. T-ASE encourages interdisciplinary approaches from computer science, control systems, electrical engineering, mathematics, mechanical engineering, operations research, and other fields. We welcome results relevant to industries such as agriculture, biotechnology, healthcare, home automation, maintenance, manufacturing, pharmaceuticals, retail, ...


Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...


Electron Device Letters, IEEE

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Electron Devices, IEEE Transactions on

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Reliability, IEEE Transactions on

Principles and practices of reliability, maintainability, and product liability pertaining to electrical and electronic equipment.


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Xplore Articles related to Degradation

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Individual load impedance specification for a stable DC distributed power system

Xiaogang Feng; Zhihong Ye; Kun Xing; F. C. Lee; D. Borojevic Applied Power Electronics Conference and Exposition, 1999. APEC '99. Fourteenth Annual, 1999

This paper continues the effort to define load impedance specification for a stable DC distributed power system. To improve the existing load impedance specification, an alternative forbidden region for Z0/Zi is proposed, based on which individual impedance specification for each load is defined. Theoretical verification, accompanied with simulation results, shows that the proposed impedance specification is a sufficient condition for ...


An Improved Landweber Method for Restoration of Aero-Optically Degraded Images

Wenxia Yang; Chao Cai; Mingyue Ding; Chengping Zhou 2008 International Conference on Computer Science and Software Engineering, 2008

Aero-optic effects cause distortions, including blurring, vibration, deformation and spatial shifting, of the objects in the image obtained by the infra-red sensor. Contributions of this paper are in the following two aspects. First, the correctness of the theoretical point spread function (PSF) representing the aero-optic effects, which had been derived in our previous research, is validated experimentally. Second, in order ...


Management of non-conformant traffic in OpenFlow environments

Luca Boero; Marco Cello; Chiara Garibotto; Mario Marchese; Maurizio Mongelli 2015 International Symposium on Performance Evaluation of Computer and Telecommunication Systems (SPECTS), 2015

Nowadays many systems and applications require the identification of traffic classes, which must be compliant to specific pre-defined constraints. Traditional networking approaches are based on traffic shaping, which is used to force the traffic to comply to the service agreements. This task is usually demanded to the underlying devices and this choice causes limited flexibility since the network functionalities are ...


Hierarchical OAM Infrastructure for Proactive Control of SDN-Based Elastic Optical Networks

Francesco Paolucci; Andrea Sgambelluri; Nicola Sambo; Filippo Cugini; Piero Castoldi 2015 IEEE Global Communications Conference (GLOBECOM), 2015

Elastic Optical Networks will drive a high degree of flexibility enabling dynamic configurable lightpaths provisioning and re- optimization due to next generation bandwidth variable transponders and switches. In order to guarantee quality of transmission (QoT), novel Operation Administration and Maintenance (OAM) solutions are necessary with respect to existing standard management protocols. For optical networks, scalable mechanisms providing fast and effective ...


High-power UV light generation in picosecond pulse trains

Mikhail Martyanov; Marta Divall; Ekaterina Gacheva; Christoph Hessler; Valentin Fedosseev 2013 Conference on Lasers & Electro-Optics Europe & International Quantum Electronics Conference CLEO EUROPE/IQEC, 2013

This paper focuses on the investigation of detrimental UV induced effects during fourth harmonic generation (FHG) in BBO crystals. An accumulation of partly recoverable UV two-photon induced optical defects has been observed in the 140 s train generated by frequency quadrupled 1.5 GHz Nd:YLF laser with about 300 W UV power per train, even for a relatively low peak pulse ...


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Educational Resources on Degradation

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eLearning

Individual load impedance specification for a stable DC distributed power system

Xiaogang Feng; Zhihong Ye; Kun Xing; F. C. Lee; D. Borojevic Applied Power Electronics Conference and Exposition, 1999. APEC '99. Fourteenth Annual, 1999

This paper continues the effort to define load impedance specification for a stable DC distributed power system. To improve the existing load impedance specification, an alternative forbidden region for Z0/Zi is proposed, based on which individual impedance specification for each load is defined. Theoretical verification, accompanied with simulation results, shows that the proposed impedance specification is a sufficient condition for ...


An Improved Landweber Method for Restoration of Aero-Optically Degraded Images

Wenxia Yang; Chao Cai; Mingyue Ding; Chengping Zhou 2008 International Conference on Computer Science and Software Engineering, 2008

Aero-optic effects cause distortions, including blurring, vibration, deformation and spatial shifting, of the objects in the image obtained by the infra-red sensor. Contributions of this paper are in the following two aspects. First, the correctness of the theoretical point spread function (PSF) representing the aero-optic effects, which had been derived in our previous research, is validated experimentally. Second, in order ...


Management of non-conformant traffic in OpenFlow environments

Luca Boero; Marco Cello; Chiara Garibotto; Mario Marchese; Maurizio Mongelli 2015 International Symposium on Performance Evaluation of Computer and Telecommunication Systems (SPECTS), 2015

Nowadays many systems and applications require the identification of traffic classes, which must be compliant to specific pre-defined constraints. Traditional networking approaches are based on traffic shaping, which is used to force the traffic to comply to the service agreements. This task is usually demanded to the underlying devices and this choice causes limited flexibility since the network functionalities are ...


Hierarchical OAM Infrastructure for Proactive Control of SDN-Based Elastic Optical Networks

Francesco Paolucci; Andrea Sgambelluri; Nicola Sambo; Filippo Cugini; Piero Castoldi 2015 IEEE Global Communications Conference (GLOBECOM), 2015

Elastic Optical Networks will drive a high degree of flexibility enabling dynamic configurable lightpaths provisioning and re- optimization due to next generation bandwidth variable transponders and switches. In order to guarantee quality of transmission (QoT), novel Operation Administration and Maintenance (OAM) solutions are necessary with respect to existing standard management protocols. For optical networks, scalable mechanisms providing fast and effective ...


High-power UV light generation in picosecond pulse trains

Mikhail Martyanov; Marta Divall; Ekaterina Gacheva; Christoph Hessler; Valentin Fedosseev 2013 Conference on Lasers & Electro-Optics Europe & International Quantum Electronics Conference CLEO EUROPE/IQEC, 2013

This paper focuses on the investigation of detrimental UV induced effects during fourth harmonic generation (FHG) in BBO crystals. An accumulation of partly recoverable UV two-photon induced optical defects has been observed in the 140 s train generated by frequency quadrupled 1.5 GHz Nd:YLF laser with about 300 W UV power per train, even for a relatively low peak pulse ...


More eLearning Resources

IEEE-USA E-Books

  • Current Concerns

    This chapter contains section titled: What Soil Degradation Means, The Importance of Soil Chemistry, The Road Ahead

  • SONOS Nonvolatile Semiconductor Memories

    This chapter contains sections titled: Introduction The SONOS Nonvolatile Memory Transistor Memory Array Circuitry Degradation Mechanisms Typical Characteristics This chapter contains sections titled: References

  • Core Lamination Insulation Failure and Repair

    This chapter discusses the most common causes of stator and rotor core failures in both induction and synchronous machines, together with proven repair methods. Degradation of the core condition due to the effects of thermal aging can occur in all rotating machine laminated cores. Electrical aging occurs when the voltage across the lamination insulation induced by magnetic fluxes, electromagnetic forces, or high ground-fault currents causes deterioration. The most common causes of mechanical degradation in cores are inadequate core pressure applied in manufacture, core pressure reduction in service due to relaxation of the core support structure, core vibration, back- of-core looseness, and mechanical damage causing smearing of the core surface at the bore. A number of different core insulation defects can be introduced during manufacture and these may not be detected if adequate quality assurance (QA) checks are not performed.

  • Towards Persistent Localization and Mapping with a Continuous Appearance-Based Topology

    Appearance-based localization can provide loop closure detection at vast scales regardless of accumulated metric error. However, the computation time and memory requirements of current appearance-based methods scale not only with the size of the environment but also with the operation time of the platform. Additionally, repeated visits to locations will develop multiple competing representations, which will reduce recall performance over time. These properties impose severe restrictions on long-term autonomy for mobile robots, as loop closure performance will inevitably degrade with increased operation time. In this paper we present a graphical extension to CAT-SLAM, a particle filter-based algorithm for appearancebased localization and mapping, to provide constant computation and memory requirements over time and minimal degradation of recall performance during repeated visits to locations. We demonstrate loop closure detection in a large urban environment with capped computation time and memory requirements and performance exceeding previous appearance-based methods by a factor of 2. We discuss the limitations of the algorithm with respect to environment size, appearance change over time and applications in topological planning and navigation for long-term robot operation.

  • Appendix A: Full Soil History Regression Equations for China, 1930s–1980s

    In this book Peter Lindert evaluates environmental concerns about soil degradation in two very large countries--China and Indonesia--where anecdotal evidence has suggested serious problems. Lindert does what no scholar before him has done: using new archival data sets, he measures changes in soil productivity over long enough periods of time to reveal the influence of human activity.China and Indonesia are good test cases because of their geography and history. China has been at the center of global concerns about desertification and water erosion, which it may have accelerated with intense agriculture. Most of Indonesia¹s lands were created by volcanoes and erosion, and its rapid deforestation and shifting slash-burn agriculture have been singled out for international censure.Lindert's investigation suggests that human mismanagement is not on average worsening the soil quality in China and Indonesia. Human cultivation lowers soil nitrogen and organic matter, but has offsetting positive effects. Economic development and rising incomes may even lead to better soil. Beyond the importance of Lindert's immediate findings, this book opens a new area of study--quantitative soil history--and raises the standard for debating soil trends.

  • Co-Firing Issues

    In order to find a suitable solution to biomass energy technical and engineering issues, while at the same time reducing costs and creating better efficiency, particularly concerning the technical aspects, biomass properties to be analyzed objectively and adjusted accordingly. Problems that should be considered concerning biomass materials used as a viable fuel can range from hardware engineering issues (biomass milling, fuels mixing, combustion, and by-products) to access to unwanted chemicals in the fuels themselves. Hardware degradation is a major problem when using biomass materials for co-firing with coal. When the biomass materials selected for usage have been already examined and tested thoroughly, an environmentally friendly and economically sound co- firing method can be achieved from both a scientific/technical and commercial standpoint.

  • Practical Thermal Performance of LEDs

    This chapter contains sections titled: Mechanisms Behind Thermal Shifts Electrical Behavior of LEDs With Temperature Optical Behavior of LEDs With Temperature Other Performance Shifts With Temperature LED Lifetime: Lumen Degradation LED Lifetime: Catastrophic Failure Paralleling LEDs

  • High Temperature Electronics Using Complementary Heterostructure FET (CHFET) Technology

    The characteristics of Complementary Heterostructure FET (CHFET) devices and logic circuits to 500 °C are reponed. Several features of the CHFET's Al0.75GaAs/In0.25GaAs/GaAs heterostructure were found to improve PET operation at high temperatures. The n-channel CHFET maintained an extrinsic transconductance Gmin excess of 100 mS/mm at 500 °C and gate leakage was 5-10x lower than for bulk GaAs MESFETs. The CHFET heterostructure also provides a complementary p-channel PET which was temperature-tested. Buffered CHFET ring oscillators maintained propagation delays of 320 pS/gate at 400 °C with no degradation after 50 hours. Suggestions are offered to reduce sub- threshold leakage which limited the performance of devices in thisstudy.

  • China

    In this book Peter Lindert evaluates environmental concerns about soil degradation in two very large countries--China and Indonesia--where anecdotal evidence has suggested serious problems. Lindert does what no scholar before him has done: using new archival data sets, he measures changes in soil productivity over long enough periods of time to reveal the influence of human activity.China and Indonesia are good test cases because of their geography and history. China has been at the center of global concerns about desertification and water erosion, which it may have accelerated with intense agriculture. Most of Indonesia¹s lands were created by volcanoes and erosion, and its rapid deforestation and shifting slash-burn agriculture have been singled out for international censure.Lindert's investigation suggests that human mismanagement is not on average worsening the soil quality in China and Indonesia. Human cultivation lowers soil nitrogen and organic matter, but has offsetting positive effects. Economic development and rising incomes may even lead to better soil. Beyond the importance of Lindert's immediate findings, this book opens a new area of study--quantitative soil history--and raises the standard for debating soil trends.

  • A High Temperature Precision Amplifier

    A precision operational amplifier has been developed for instrumentation applications in which the circuitry must operate in ambient temperatures as high as 200°C. At 200°C the amplifier maintains an input offset voltage and current of less than 200 V and 1 nA respectively, a gain bandwidth product of 2.2 MHz, and a slew rate of 5.4 V/S. The amplifier is fabricated in a standard CMOS process and consumes 5.5 mW of power at a supply voltage of 5 V. A continuous time autozeroed amplifier topology is used to achieve the low offset voltage levels. At high temperatures the leakage currents of the sample and hold switches used to achieve auto-zeroing degrade the offset correction voltages stored on the hold capacitors. This degradation is reduced by using large external hold capacitors and by minimizing the diffusion area of the switches through the use of a doughnut shaped layout. The effect of the voltage degradation is reduced by sensing the offset correction voltage with a low sensitivity differential auxiliary input stage. A new input switch topology is used to reduce the amplifier's input offset current at high temperatures.



Standards related to Degradation

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IEEE Guide for Assessing, Monitoring, and Mitigating Aging Effects on Class 1E Equipment Used in Nuclear Power Generating Stations

This document provides the guidelines for assessing, monitoring, and mitigating aging degradation effects on class 1E equipment used in nuclear power generating stations.



Jobs related to Degradation

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