Conferences related to Degradation

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2014 Annual Reliability and Maintainability Symposium (RAMS)

Tutorials and original papers on reliability, maintainability, safety, risk management, and logistics


2014 IEEE International Reliability Physics Symposium (IRPS)


2013 14th International Symposium on Quality Electronic Design (ISQED)

The International Symposium on Quality Electronic Design (ISQED) the premier Electronic Design conference bridges the gap among Electronic/Semiconductor ecosystem members providing electronic design tools, integrated circuit technologies, semiconductor technology,packaging, assembly & test to achieve design quality.

  • 2012 13th International Symposium on Quality Electronic Design (ISQED)

    The International Symposium on Quality Electronic Design (ISQED) the premier Electronic Design conference bridges the gap between Electronic/Semiconductor ecosystem members providing electronic design tools, integrated circuit technologies, semiconductor technology,packaging, assembly & test to achieve design quality.

  • 2011 International Symposium on Quality Electronic Design (ISQED)

    ISQED is a premier Design & Design Automation conference bridges the gap between electronic design tools and processes, integrated circuit technologies, processes & manufacturing, to achieve design quality. ISQED is the leading conference for design for manufacturability (DFM) and quality (DFQ) issues. It provides a forum to exchange ideas and promote research, development, and application of design techniques & methods, design processes, and EDA design methodologies and tools that address issues which impa

  • 2010 11th International Symposium on Quality of Electronic Design (ISQED)

    ISQED is the pioneer and leading conference dealing with design for manufacturability and quality issues, front to back.

  • 2009 10th International Symposium on Quality of Electronic Design (ISQED)

    The International Symposium on Quality Electronic Design (ISQED), is a premier Design & Design Automation conference, aimed at bridging the gap between and integration of, electronic design tools and processes, integrated circuit technologies, processes & manufacturing, to achieve design quality. ISQED is the pioneer and leading conference dealing with design for manufacturability and quality issues, front to back. The conference provides a forum to present and exchange ideas and to promote the research, de

  • 2008 9th International Symposium on Quality of Electronic Design (ISQED)

    The International Symposium on Quality Electronic Design (ISQED), is a premier Design & Design Automation conference, aimed at bridging the gap between and integration of, electronic design tools and processes, integrated circuit technologies, processes & manufacturing, to achieve design quality. ISQED is the pioneer and leading conference dealing with design for manufacturability and quality issues, front to back. The conference provides a forum to present and exchange ideas and to promote the research.


2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

Sample Preparation, Metrology and Material Characterization Advanced Failure Analysis Techniques Die-Level / Package-Level Failure Analysis Case Study & Failure Mechanisms Product Reliability Evaluation and Approaches Novel Device Reliability and Failure Mechanisms Novel Gate Stack/Dielectrics and FEOL Reliability and Failure Mechanisms Advanced Interconnects and BEOL Reliability and Failure Mechanisms


2013 7th IEEE International Conference on Software Security and Reliability (SERE)

Focuses on software security, safety, reliability, and quality assurance for researchers and practitioners to exchange ideas and best-of-breed practices for developing trustworthy software in a more effective and efficient way.


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Xplore Articles related to Degradation

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Sensory-Updated Residual Life Distributions for Components With Exponential Degradation Patterns

Gebraeel, N. Automation Science and Engineering, IEEE Transactions on, 2006

Research on interpreting data communicated by smart sensors and distributed sensor networks, and utilizing these data streams in making critical decisions stands to provide significant advancements across a wide range of application domains such as maintenance management. In this paper, a stochastic degradation modeling framework is developed for computing and continuously updating residual life distributions of partially degraded components. The ...


Prognostics of products using time series analysis based on degradation data

Tingting Huang; Li Wang; Tongmin Jiang Prognostics and Health Management Conference, 2010. PHM '10., 2010

This paper presents a method to predict degradation path of products using time series modeling procedure based on product performance degradation data. The product performance degradation data are treated as a time series data and stochastic process are utilized to describe the degradation process for predicting long-term trend. A degradation test is processed for miniature bulbs until they failed and ...


Inhibition Effects of Full Degradation Barley Straws on Algal

Li-Juan Cui; Xin-Sheng Zhao; Wei Li Intelligent System Design and Engineering Applications (ISDEA), 2013 Third International Conference on, 2013

How to control water eutrophication bloom having been the difficulties in the field of environmental engineering. Various measures have been taken to control the occurrence of algal blooms and slow down the outbreak of the frequency, such as source control (non-point source pollution control and abatement nutrient loading, sediment dredging, etc.), inhibition algaecide measures (artificial salvage or kill algae, etc.) ...


Statistical and Domain Analytics Applied to PV Module Lifetime and Degradation Science

Bruckman, L.S.; Wheeler, N.R.; Ma, J.; Wang, E.; Wang, C.K.; Chou, I.; Jiayang Sun; French, R.H. Access, IEEE, 2013

A better understanding of the degradation modes and rates for photovoltaic (PV) modules is necessary to optimize and extend the lifetime of these modules. Lifetime and degradation science (L&DS) is used to understand degradation modes, mechanisms and rates of materials, components and systems to predict lifetime of PV modules. A PV module lifetime and degradation science (PVM L&DS) model is ...


Notice of Retraction<BR>Outlier test and analysis method of degradation data based on linear regression

Hui-Rui Zhang; Yun-Xia Chen; Rui Kang; Feng-Chun Lin Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on, 2013

Notice of Retraction After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE's Publication Principles. We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper. The presenting author of this paper ...


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Jobs related to Degradation

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Educational Resources on Degradation

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eLearning

Fighting Against Counterfeit Drugs with Sproxil

Mitra, Meliza Fighting Against Counterfeit Drugs with Sproxil, 2011

This webinar explains the issue of counterfeit drugs in emerging markets and about how Sproxil empowers consumers in the fight against fake drugs. Sproxil provides software and systems that capture market intelligence in emerging markets using cell phones. Our service provides automatic protection against counterfeiters. Brand and product pirates in emerging markets pose a significant risk to legitimate manufacturers, leading ...


Maximum Power Point Tracking (MPPT): Algorithms and Applications

Petrone, Giovanni; Spagnuolo, Giovanni Maximum Power Point Tracking (MPPT): Algorithms and Applications, 2012

This webinar explains the issue of counterfeit drugs in emerging markets and about how Sproxil empowers consumers in the fight against fake drugs. Sproxil provides software and systems that capture market intelligence in emerging markets using cell phones. Our service provides automatic protection against counterfeiters. Brand and product pirates in emerging markets pose a significant risk to legitimate manufacturers, leading ...


Introduction to Optical Fiber Communication Systems

Willner, Alan Introduction to Optical Fiber Communication Systems, 2007

As point-to-point links become more sophisticated, single-channel and WDM systems must dynamically adapt to changing environmental and traffic conditions in order to avoid SNR degradation. This scenario erupts into a much greater challenge when channels originate at different locations, as is the case with add/drop multiplexers, reconfigurable cross-connects, circuit- switched networking, and, eventually, optical packet switching. This course is intended ...


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Standards related to Degradation

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IEEE Guide for Assessing, Monitoring, and Mitigating Aging Effects on Class 1E Equipment Used in Nuclear Power Generating Stations

This document provides the guidelines for assessing, monitoring, and mitigating aging degradation effects on class 1E equipment used in nuclear power generating stations.



Periodicals related to Degradation

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Automation Science and Engineering, IEEE Transactions on

The IEEE Transactions on Automation Sciences and Engineering (T-ASE) publishes fundamental papers on Automation, emphasizing scientific results that advance efficiency, quality, productivity, and reliability. T-ASE encourages interdisciplinary approaches from computer science, control systems, electrical engineering, mathematics, mechanical engineering, operations research, and other fields. We welcome results relevant to industries such as agriculture, biotechnology, healthcare, home automation, maintenance, manufacturing, pharmaceuticals, retail, ...


Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...


Electron Device Letters, IEEE

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Electron Devices, IEEE Transactions on

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Reliability, IEEE Transactions on

Principles and practices of reliability, maintainability, and product liability pertaining to electrical and electronic equipment.


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