Conferences related to Degradation

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2019 IEEE International Electric Machines & Drives Conference (IEMDC)

The IEEE International Electric Machines and Drives Conference (IEMDC) has been established to be one of the major events in the field of electrical machines and drives. IEMDC is a refernce forum to disseminate and exchange state of art in the filed of the Electrical Machines and Drives. The 2018 edition started in 1997 and the 2019 edition will be 11th one.


2019 IEEE/CVF International Conference on Computer Vision (ICCV)

Early Vision and Sensors Color, Illumination and Texture Segmentation and Grouping Motion and TrackingStereo and Structure from Motion Image -Based Modeling Physics -Based Modeling Statistical Methods and Learning in VisionVideo Surveillance and Monitoring Object, Event and Scene Recognition Vision - Based Graphics Image and Video RetrievalPerformance Evaluation Applications


2018 13th European Microwave Integrated Circuits Conference (EuMIC)

The EuMIC conference is jointly organized by GAAS® Association and EuMA and is the premierEuropean technical conference for RF microelectronics. Aim of the conference is to promote thediscussion of recent developments and trends, and to encourage the exchange of scientific andtechnical information covering a broad range of high-frequency related topics, from materialsand technologies to integrated circuits and applications, that will be addressed in all of theiraspects: theory, simulation, design and measurement. If you are interested in anything aboutmicrowave and RF IC's, the EuMIC conference is an exceptional venue to learn about the latestadvances in the field and meet recognized experts from both Industry and Academia.

  • 2017 12th European Microwave Integrated Circuits Conference (EuMIC)

    The EuMIC conference is jointly organized by GAAS® Association and EuMA and is the premier European technical conference for RF microelectronics. Aim of the conference is to promote the discussion of recent developments and trends, and to encourage the exchange of scientific and technical information covering a broad range of high-frequency related topics, from materials and technologies to integrated circuits and applications, that will be addressed in all of theiraspects: theory, simulation, design and measurement. If you are interested in anything about microwave and RF IC's, the EuMIC conference is an exceptional venue to learn about the latest advances in the field and meet recognized experts from both Industry and Academia.

  • 2016 11th European Microwave Integrated Circuits Conference (EuMIC)

    The EuMIC conference is jointly organized by GAAS® Association and EuMA and is the premier European technical conference for RF microelectronics. Aim of the conference is to promote the discussion of recent developments and trends, and to encourage the exchange of scientific and technical information covering a broad range of high-frequency related topics, from materials and technologies to integrated circuits and applications, that will be addressed in all of their aspects: theory, simulation, design and measurement. If you are interested in anything about microwave and RF IC's, the EuMIC conference is an exceptional venue to learn about the latest advances in the field and meet recognized experts from both Industry and Academia.

  • 2015 10th European Microwave Integrated Circuits Conference (EuMIC)

    The EuMIC conference is jointly organized by GAAS® Association and EuMA and is the premier European technical conference for RF microelectronics. Aim of the conference is to promote the discussion of recent developments and trends, and to encourage the exchange of scientific and technical information covering a broad range of high-frequency related topics, from materials and technologies to integrated circuits and applications, that will be addressed in all of their aspects: theory, simulation, design and measurement. If you are interested in anything about microwave and RF IC’s, the EuMIC conference is an exceptional venue to learn about the latest advances in the field and meet recognized experts from both Industry and Academia.

  • 2014 9th European Microwave Integrated Circuits Conference (EuMIC)

    The EuMIC conference is jointly organized by GAAS

  • 2013 European Microwave Integrated Circuit Conference (EuMIC)

    RF and microwave devices for telecommunication and sensor systems including UMTS/LTE, LMDS and other systems working in the microwave and millimetre -wave range. Covering recent development and trends in physical fundamentals, physical and behavoural modeling, microwave and opto-electric devices and monolithic design in GaAs, InP, SiGe, GaN and SiC technologies.

  • 2012 European Microwave Integrated Circuit Conference (EuMIC)

    Microwave integrated circuits: modelling, simulation and characterisation of devices and circuits; technologies and devices; circuit design and applications.

  • 2011 European Microwave Integrated Circuit Conference (EuMIC)

    RF and microwave devices for telecommunication and sensor systems including UMTS/LTE, LMDS and other systems working in the microwave and millimetre-wave range. Covering recent development and trends in physical fundamentals, physical and behavoural modeling, microwave and opto-electric devices and monolithic design in GaAs, InP, SiGe, GaN and SiC technologies.

  • 2010 European Microwave Integrated Circuits Conference (EuMIC)

    EuMIC is the leading conference for MMICs/RFICs and their applications in Europe. The aim of the conference is to promote the discussion of recent developments and trends, and encourage the exchange of scientific and technical information on physical fundamentals, material technology, process development and technology, physics based and empirical behavioral modeling of microwave and optoelectronic active devices and design of monolithic ICs

  • 2009 European Microwave Integrated Circuits Conference (EuMIC)

    The 4th European Microwave Integrated Circut Conference, EuMIC, in Amsterdam, The Netherlands, is one of four conferences at the European Microwave Week 2008, the largest event in Europe dedicated to microwave electronics. EuMIC is the leading European conference for RFIC/MMIC technology and applications. The aim of the conference is to cover recent research and development on material technology, process development/technology.

  • 2008 European Microwave Integrated Circuits Conference (EuMIC)

    The third European Microwave Integrated Circut Conference, EuMIC, in Amsterdam, The Netherlands, is one of four conferences at the European Microwave Week 2008, the largest event in Europe dedicated to microwave electronics. EuMIC is the leading European conference for RFIC/MMIC technology and applications. The aim of the conference is to cover recent research and development on material technology, process development/technology.

  • 2007 European Microwave Integrated Circuits Conference (EuMIC)

    RF and microwave devices for telecommunication and sensor systems including UMTS, LMDS and other systems working in the microwave and millimetre-wave range. Covering recent development and trends in physical fundamentals, physicas and behavoural modeling, microwave and opto-electric devices and monolithic design in GaAs, InP, SiGe, GaN and SiC technologies.

  • 2006 European Microwave Integrated Circuits Conference (EuMIC) (Formerly GAAS)

  • GAAS 2005 - European Gallium Arsenide and Other Semiconductors Application Symposium


2018 14th IEEE International Conference on Signal Processing (ICSP)

ICSP2018 includes sessions on all aspects of theory, design and applications of signal processing. Prospective authors are invited to propose papers in any of the following areas, but not limited to: A. Digital Signal Processing (DSP)B. Spectrum Estimation & ModelingC. TF Spectrum Analysis & WaveletD. Higher Order Spectral AnalysisE. Adaptive Filtering &SPF. Array Signal ProcessingG. Hardware Implementation for Signal ProcessingH Speech and Audio CodingI. Speech Synthesis & RecognitionJ. Image Processing & UnderstandingK. PDE for Image ProcessingL.Video compression &StreamingM. Computer Vision & VRN. Multimedia & Human-computer InteractionO. Statistic Learning & Pattern RecognitionP. AI & Neural NetworksQ. Communication Signal processingR. SP for Internet and Wireless CommunicationsS. Biometrics & AuthentificationT. SP for Bio-medical & Cognitive ScienceU


2018 15th IEEE Annual Consumer Communications & Networking Conference (CCNC)

IEEE CCNC 2018 will present the latest developments and technical solutions in the areas of home networking, consumer networking, enabling technologies (such as middleware) and novel applications and services. The conference will include a peer-reviewed program of technical sessions, special sessions, business application sessions, tutorials, and demonstration sessions


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Periodicals related to Degradation

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Advanced Packaging, IEEE Transactions on

The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.


Aerospace and Electronic Systems Magazine, IEEE

The IEEE Aerospace and Electronic Systems Magazine publishes articles concerned with the various aspects of systems for space, air, ocean, or ground environments.


Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Audio, Speech, and Language Processing, IEEE Transactions on

Speech analysis, synthesis, coding speech recognition, speaker recognition, language modeling, speech production and perception, speech enhancement. In audio, transducers, room acoustics, active sound control, human audition, analysis/synthesis/coding of music, and consumer audio. (8) (IEEE Guide for Authors) The scope for the proposed transactions includes SPEECH PROCESSING - Transmission and storage of Speech signals; speech coding; speech enhancement and noise reduction; ...


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Most published Xplore authors for Degradation

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Xplore Articles related to Degradation

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Modeling of Read-Disturb-Induced SET-State Current Degradation in a Tungsten Oxide Resistive Switching Memory

[{u'author_order': 1, u'affiliation': u'Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan', u'full_name': u'Po-Cheng Su'}, {u'author_order': 2, u'affiliation': u'Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan', u'full_name': u'Cheng-Min Jiang'}, {u'author_order': 3, u'affiliation': u'Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan', u'full_name': u'Chih-Wei Wang'}, {u'author_order': 4, u'affiliation': u'Institute of Electronics, National Chiao Tung University, Hsinchu, Taiwan', u'full_name': u'Tahui Wang'}] IEEE Electron Device Letters, 2018

We characterize SET-state current degradation induced by read operations in a tungsten oxide resistive memory cell. The current degradation exhibits a two- stage evolution. In the second stage, the current decline follows inverse power-law dependence on cumulative read-disturb time. We present an analytical model to derive the inverse power law. Our model includes oxygen ion activation, mobile oxygen ion hopping, ...


Using System Profiling for Effective Degradation Detection

[{u'author_order': 1, u'full_name': u'Ian Riley'}, {u'author_order': 2, u'full_name': u'Rose Gamble'}] 2018 IEEE International Conference on Autonomic Computing (ICAC), None

Many computing systems suffer from degradation that becomes present over time and affects the value of the system. For an autonomic computing (AC) system to self-optimize and self-heal, rapid detection of degradation and identifying its source must be performed during execution, even when the degradation appears slowly over time. A common technique is to employ a MAPE-K (monitor- analyze-plan-execute plus ...


Improved Battery Storage Valuation Through Degradation Reduction

[{u'author_order': 1, u'affiliation': u'University of California, Riverside, CA, USA', u'full_name': u'Brandon Foggo'}, {u'author_order': 2, u'affiliation': u'University of California, Riverside, CA, USA', u'full_name': u'Nanpeng Yu'}] IEEE Transactions on Smart Grid, 2018

The widespread adoption of battery energy storage systems (BESSs) has been hindered by the uncertainty of their financial value. In past research, this value has been estimated by optimizing the system's actions over the course of the battery's lifetime. However, these estimates did not consider the fact that battery actions decrease the lifetime itself. This paper uses realistic battery cycle ...


Hot-Carrier Degradation in Power LDMOS: Drain Bias Dependence and Lifetime Evaluation

[{u'author_order': 1, u'affiliation': u'Department of Electrical, Electronic, and Information Engineering, Advanced Research Center on Electronic System, University of Bologna, Cesena, Italy', u'full_name': u'Andrea Natale Tallarico'}, {u'author_order': 2, u'affiliation': u'Department of Electrical, Electronic, and Information Engineering, Advanced Research Center on Electronic System, University of Bologna, Cesena, Italy', u'full_name': u'Susanna Reggiani'}, {u'author_order': 3, u'affiliation': u'Technology Research and Development, STMicroelectronics, Agrate Brianza, Italy', u'full_name': u'Riccardo Depetro'}, {u'author_order': 4, u'affiliation': u'Technology Research and Development, STMicroelectronics, Agrate Brianza, Italy', u'full_name': u'Stefano Manzini'}, {u'author_order': 5, u'affiliation': u'Technology Research and Development, STMicroelectronics, Agrate Brianza, Italy', u'full_name': u'Andrea Mario Torti'}, {u'author_order': 6, u'affiliation': u'Technology Research and Development, STMicroelectronics, Agrate Brianza, Italy', u'full_name': u'Giuseppe Croce'}, {u'author_order': 7, u'affiliation': u'Department of Electrical, Electronic, and Information Engineering, Advanced Research Center on Electronic System, University of Bologna, Cesena, Italy', u'full_name': u'Enrico Sangiorgi'}, {u'author_order': 8, u'affiliation': u'Department of Electrical, Electronic, and Information Engineering, Advanced Research Center on Electronic System, University of Bologna, Cesena, Italy', u'full_name': u'Claudio Fiegna'}] IEEE Transactions on Electron Devices, 2018

In this brief, we present an analysis of the degradation induced by hot- carrier stress in new generation power lateral double-diffused MOSFET (LDMOS) transistors. When a relatively high drain voltage is applied during the ON- state regime, high energetic and/or multiple cold electrons are recognized as the main source of degradation affecting the LDMOS lifetime: the latter is usually extrapolated ...


Efficiency Degradation Model of Lithium-ion Batteries for Electric Vehicles

[{u'author_order': 1, u'affiliation': u'LTE, IFSTTAR Departement Amenagement Mobilites et Environnement, 419056 BRON France 69500 (e-mail: eduardo.redondo@ifsttar.fr)', u'full_name': u'Eduardo Redondo-Iglesias'}, {u'author_order': 2, u'affiliation': u'AMPERE Laboratory, Lyon 1 University, Lyon, Villeurbanne cedex France 69622', u'full_name': u'Pascal Venet'}, {u'author_order': 3, u'affiliation': u'LTE, IFSTTAR Departement Amenagement Mobilites et Environnement, 419056 BRON France', u'full_name': u'Serge Pelissier'}] IEEE Transactions on Industry Applications, None

The purpose of this paper is to analyse efficiency degradation of lithium-ion batteries. Two lithiumion cell technologies are considered under calendar ageing. It is well known that ageing mechanisms have an impact in cells' performances. Most of studies focus on capacity fade and impedance rise but efficiency is less frequently studied. However, from the application point of view, battery efficiency ...


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Educational Resources on Degradation

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eLearning

No eLearning Articles are currently tagged "Degradation"

IEEE-USA E-Books

  • MetalGaAs Interaction and Contact Degradation in Microwave MESFETs

    This work reports and critically reviews failure mechanisms induced by metal- GaAs interaction and contact degradation in low and medium power GaAs MESFETs in the framework of a comprehensive reliability evaluation test plan, performed mainly on commercially purchased devices manufactured by different technologies. The results show that, at least as regards contact degradation phenomena, these technologies have reached sufficient maturity, and significant reliability levels have been achieved even for the most severe applications and environments. Devices coming from some suppliers still suffer from reliability problems, such as ?>sinking?> of Au-based gate metallization into the active channel, Al electromigration, Al/GaAs interdiffusion enhanced by high contact current density, source and drain ohmic contact resistance increase, ohmic contacts electromigration, surface metal migration and short circuiting of closely spaced electrodes on GaAs with a non-suitable surface preparation and/or passivation. All these failure mechanisms have been identified by means of suitable microanalytical techniques, correlated with device electrical degradation and thoroughly discussed in this paper by comparison with results previously reported in the technical literature.

  • Thermal Degradation and Termination Behavior of Thick Film Resistors

    Thermal stability was measured for Du Pont 1420 (102 ohims/square), Du Pont 1440 (104 ohms/square), Cermalloy 540 (104 ohms/square), and Cermalloy 550 (105 ohms/square) thick film resistor materials. Samples were aged at 200, 300 and 400¿¿c. In addition, effects of resistor-conductor termination area, laser trimming, and applied bias voltage on thermal stability were evaluated. For 200 and 300¿¿C exposure, the sheet resistivity increased for all materials. Maximum increase after 5000 hours exposure as +8%. For 400¿¿C exposure, sheet resistivity decreased for all materials. Maximum decrease was -20% for 5000 hours exposure. The termination region had no significant effect on either asfired resistance or thermal degradation behavior. Laser trimming tended to stabilize resistors slightly and applied bias voltage had no significant effect.

  • PHM of Light‐Emitting Diodes

    This chapter provides an overview of the prognostics and health management (PHM) methods applied to light‐emitting diodes (LEDs). These methods include optimizing LED design with simulations, shortening qualification test times, enabling condition‐based maintenance (CBM) for LED systems, and providing information for return on investment (ROI) analysis. The simulation has unique characteristics for LED lighting systems, such as parameter selections and assumptions. The chapter describes the latest information regarding the prognostics of high‐power white LEDs and physical modeling and failure analysis for LEDs. It also provides an overview of the available prognostic methods and models that have been applied to both LED devices and LED systems. These methods include statistical regression, static Bayesian network (BN), Kalman filtering (KF), particle filtering (PF), artificial neural network (ANN), and physics‐based methods. Degradation processes vary one‐directionally and are monotonic, for example, light output degradation processes of LEDs.

  • Health and Remaining Useful Life Estimation of Electronic Circuits

    This chapter develops a kernel‐based learning technique to estimate the health degradation of an electronic circuit due to parametric deviation in the circuit components. A model‐based filtering method is developed for predicting the remaining useful life (RUL) of electronic circuit‐comprising components exhibiting parametric faults. The existing approaches for predicting failures resulting from electronic component parametric faults emphasize identifying monotonically deviating parameters and modeling their progression over time. The existing literature is classified and reviewed based on the approach employed for health estimation and failure prediction ‐ either the component‐centric approach or the circuit‐centric approach. The chapter presents the developed first‐principles‐based model to capture the degradation in circuit performance. It discusses the stochastic algorithm used for joint state‐parameter estimation and RUL prediction. The chapter describes the validation results using data obtained from simulation‐based experiments on the critical circuits of a direct‐current (DC)‐DC converter system.

  • Introduction to PHM

    Prognostics and systems health management (PHM) is a multifaceted discipline for the assessment of product degradation and reliability. This chapter provides a basic understanding of prognostics and health monitoring of products and the techniques being developed to enable prognostics for electronic products. PHM consists of sensing, anomaly detection, diagnostics, prognostics, and decision support. To enable PHM, the physics‐of‐failure (PoF)‐, canary‐, data‐driven‐, and fusion‐based approaches have been studied. The chapter explains each of these approaches. It then presents various applications using these approaches and discusses how to implement PHM in a system of systems. The chapter further introduces the opportunities of Internet of Things (IoT)‐based PHM for industrial applications. The key conclusion is that IoT‐based PHM is expected to have considerable influence on the implementation of reliability assessment, prediction and risk mitigation, and create new business opportunities.

  • Analysis of PHM Patents for Electronics

    This chapter provides a comprehensive overview of prognostics and health management (PHM) patents from three aspects: PHM for electrical systems, PHM for mechanical systems, and general PHM methodologies. It deals with the PHM implementation methods, algorithms, and apparatus for specific electrical systems, electronic devices, or pieces of equipment. PHM patents for semiconductor components, computers, and their accessories, such as hard disk drives, memories, and mainboards, account for more than 60% of all PHM patents for electrical systems. Additionally, PHM patents for batteries represent less than a 10% share of patents for electrical systems up to 2015. Nearly all PHM patents for electric motors are based on the measurement of current, since it is closely related to the operating condition of electric motors. PHM patents for electrical devices in automobiles and aircraft are constantly being proposed. Although PHM technologies have matured, PHM patents for networks and communications facilities are currently insufficient.

  • Self‐Healing

    This chapter contains sections titled: Introduction Cell Degradation Detection Cell Degradation Diagnosis and Prediction Cell Outage Compensation References

  • Transceiver Budgets

    This chapter illustrates how to carry out the system design of a transceiver in order to fulfill a given set of requirements while taking into consideration the limitations in its physical implementation. Two approaches can be followed. We can decide a priori on an architecture that is theoretically able to fulfill the different requirements we have for a transceiver. We can then carry out the budget of the line‐up to refine the balance of the constraints between the different blocks of the line‐up, and then check that we can achieve the desired performance. In practice, these two approaches can be seen as the two sequences of an iterative process that leads to the optimization of the final implementation of a transceiver. Finally the chapter illustrates how to budget a transceiver for a selected architecture, and reviews the functions embedded in the direct conversion receiver.

  • Inter‐layer Mobility Optimization

    This chapter summarizes some potentially useful concepts and information for handling mobility in multi‐layer long‐term evolution (LTE) networks. The mobility design problem can be split into two regimes: coverage and capacity‐limited cases. The chapter focuses on inter‐layer mobility of a classical cellular network without small cells. It elaborates the idle mode cell selection/reselection and measurement process in LTE. The chapter details the user equipment (UE) measurement process, with some examples of how commercial LTE UEs implement the sometimes mystifying third generation partnership project (3GPP) idle mode measurement requirements. It summarizes inter‐layer measurements in connected mode. The UE needs measurement gaps to perform inter‐frequency or inter‐radio access technologies (RATs) measurements. A UE supporting carrier aggregation may be able to do inter‐frequency measurements without gaps. To alleviate long‐term intra‐ and cross‐layer congestion, network capacity needs to be increased by physical optimization and addition of new cells.

  • Security and Dependability in Train Control Systems

    During the last 15 years, the interest in vehicular communication has grown, especially in the automotive industry. Due to the envisioned mass market, projects focusing on Car-to-X communication experience high public visibility. This book presents vehicular communication in a broader perspective that includes more than just its application to the automotive industry. It provides, researchers, engineers, decision makers and graduate students in wireless communications with an introduction to vehicular communication focussing on car-to-x and train-based systems. **Key Features:**  * Emphasises important perspectives of vehicular communication including market area, application areas, and standardisation issues as well as selected topics featuring aspects of developing, prototyping, and testing vehicular communication systems. * Supports the reader in understanding common characteristics and differences between the various application areas of vehicular com unication. * Offers both an overview of the application area and an in-depth discussion of key technologies in these areas. * Written by a wide range of experts in the field.



Standards related to Degradation

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IEEE Guide for Assessing, Monitoring, and Mitigating Aging Effects on Class 1E Equipment Used in Nuclear Power Generating Stations

This document provides the guidelines for assessing, monitoring, and mitigating aging degradation effects on class 1E equipment used in nuclear power generating stations.



Jobs related to Degradation

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