Cathode ray tubes
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MIKON is an international conference organized since 1969 which turned into an important biannual international microwave event in 1989. MIKON covers the scientific microwave areas like: modeling and measurements of antennas, sensors, detectors and circuits, ultrawideband technology, electromagnetic compatibility and the like.
This publication covers the theory, design, fabrication, manufacturing and application of information displays and aspects of display technology that emphasize the progress in device engineering, device design, materials, electronics, physics and reliabilityaspects of displays and the application of displays.
Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.
Science and technology related to the basic physics and engineering of magnetism, magnetic materials, applied magnetics, magnetic devices, and magnetic data storage. The Transactions publishes scholarly articles of archival value as well as tutorial expositions and critical reviews of classical subjects and topics of current interest.
Matraszek, S.T. Power Industry Computer Applications Conference, 1979. PICA-79. IEEE Conference Proceedings, 1979
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Boucher, J.N. Power Industry Computer Applications Conference, 1979. PICA-79. IEEE Conference Proceedings, 1979
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Bastien, P.L.; Dunn, L.A. Computers, IEEE Transactions on, 1971
In this paper we present some new ideas on pattern recognition of bubble chamber photographs. We have found global transformations that reduce circular tracks to a point in a two-dimensional angle-curvature space. The performance of this tracking method on a sample of bubble chamber events is presented and planned improvements are discussed.
Marchut, L.; Antonell, M.; Fresina, M.; Novak, C.; Meeder, M.; Darche, T.; Chamberlain, S.; Antonell, J. Reliability of Compound Semiconductors Digest (ROCS), 2009, 2009
Electro-static discharge (ESD) is a common failure mode during field service and customer assembly. To develop and verify capacitor designs that are rugged during customer assembly and field service, sufficient quantities of devices need to be tested to determine larger failure voltage distributions than the minimal three required for product qualification. Using ESD voltage breakdown testing can more precisely simulate ...
Proceedings of the IEEE, 1966
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