Conferences related to Cathode ray tubes

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2012 19th International Conference on Microwaves, Radar & Wireless Communications (MIKON 2012)

MIKON is an international conference organized since 1969 which turned into an important biannual international microwave event in 1989. MIKON covers the scientific microwave areas like: modeling and measurements of antennas, sensors, detectors and circuits, ultrawideband technology, electromagnetic compatibility and the like.

  • 2010 18th International Conference on Microwaves, Radar & Wireless Communications (MIKON 2010)

    Main Topics: Antenna Design, Modeling and Measurements Active Devices and Components Microwave and Optical Integrated Circuits Millimeter and Sub-millimeter Technology Photonic, Microwave-Light Wave Interaction RF, VHF and UHF Technologies Magnetic and Acoustic Wave Devices Cad Techniques, Modeling and Simulations Microwave Measurements Industrial, Environmental, Medical App. Microwave and Optical Communication Systems Wireless and Personal Communication Radar Technol

  • 2008 17th International Conference on Microwaves, Radar & Wireless Communications (MIKON 2008)

    antenna design, modeling and measurements, active and passive devices and components microwave and optical integrated circuits millimeter and sub-millimeter technology, CAD techniques, microwave measurements, microwave & optical communication systems, wireless & personal communications, radar technology, radar polarimetry & signatures sensors, detectors and vehicular radars

  • 2006 International Conference on Microwaves, Radar & Wireless Communications (MIKON 2006)



Periodicals related to Cathode ray tubes

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Display Technology, Journal of

This publication covers the theory, design, fabrication, manufacturing and application of information displays and aspects of display technology that emphasize the progress in device engineering, device design, materials, electronics, physics and reliabilityaspects of displays and the application of displays.


Electron Devices, IEEE Transactions on

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Magnetics, IEEE Transactions on

Science and technology related to the basic physics and engineering of magnetism, magnetic materials, applied magnetics, magnetic devices, and magnetic data storage. The Transactions publishes scholarly articles of archival value as well as tutorial expositions and critical reviews of classical subjects and topics of current interest.




Xplore Articles related to Cathode ray tubes

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Interactive Load Flow Utilizing Tabular Display Format

Matraszek, S.T. Power Industry Computer Applications Conference, 1979. PICA-79. IEEE Conference Proceedings, 1979

First Page of the Article ![](/xploreAssets/images/absImages/00720052.png)


Real-time Energy Control

Boucher, J.N. Power Industry Computer Applications Conference, 1979. PICA-79. IEEE Conference Proceedings, 1979

First Page of the Article ![](/xploreAssets/images/absImages/00720063.png)


Global Transformations in Pattern Recognition of Bubble Chamber Photographs

Bastien, P.L.; Dunn, L.A. Computers, IEEE Transactions on, 1971

In this paper we present some new ideas on pattern recognition of bubble chamber photographs. We have found global transformations that reduce circular tracks to a point in a two-dimensional angle-curvature space. The performance of this tracking method on a sample of bubble chamber events is presented and planned improvements are discussed.


Machine model ESD tester for enhanced capacitor reliability

Marchut, L.; Antonell, M.; Fresina, M.; Novak, C.; Meeder, M.; Darche, T.; Chamberlain, S.; Antonell, J. Reliability of Compound Semiconductors Digest (ROCS), 2009, 2009

Electro-static discharge (ESD) is a common failure mode during field service and customer assembly. To develop and verify capacitor designs that are rugged during customer assembly and field service, sufficient quantities of devices need to be tested to determine larger failure voltage distributions than the minimal three required for product qualification. Using ESD voltage breakdown testing can more precisely simulate ...


On phosphor-photocathode conversion efficiency

Proceedings of the IEEE, 1966

First Page of the Article ![](/xploreAssets/images/absImages/01446661.png)


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