CMOSFET logic devices
58 resources related to CMOSFET logic devices
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2016 IEEE Symposium on VLSI Technology
New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D - system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices.
2014 IEEE International Symposium on Circuits and Systems (ISCAS)
The IEEE International Symposium on Circuits and Systems (ISCAS) is the flagship conference of the IEEE Circuits and Systems Society and the world’s premier networking forum in the highly active fields of theory, design and implementation of circuits and systems.ISCAS 2014 will have a special focus on nano/bio circuits and systems applied to enhancing living and lifestyles, and seeks to address multidisciplinary challenges in healthcare and well-being, the environment and climate change.
Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...
Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.
Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.
Kechichian, K.; Al-Khalili, A.J.; Al-Khalili, D. Electrical and Computer Engineering, 1994. Conference Proceedings. 1994 Canadian Conference on, 1994
In VLSI CMOS circuit design chip area, signal propagation delay and power dissipation are conflicting criteria that need to be optimized in order to improve performance. Full circuit simulation and manual optimization can be costly and time consuming. We present here a method of obtaining different circuit configurations from a given multiple-output Boolean expression. An optimum circuit is selected from ...
Chan, V.; Rengarajan, R.; Rovedo, N.; Wei Jin; Hook, T.; Nguyen, P.; Jia Chen; Nowak, E.; Xiang-Dong Chen; Lea, D.; Chakravarti, A.; Ku, V.; Yang, S.; Steegen, A.; Baiocco, C.; Shafer, P.; Hung Ng; Shih-Fen Huang; Wann, C. Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International, 2003
A leading edge 90 nm logic bulk foundry technology with 45 nm gate length devices, incorporating strain engineering, is described in this paper. Gate length and dielectric scaling, along with optimized strain engineering, enable high performance devices, which are amongst the best reported to date. Short channel effect control down to 35 nm is demonstrated. Both NMOS and PMOS performance ...
Portmann, C.L.; Meng, T.H.Y. VLSI Circuits, 1993. Digest of Technical Papers. 1993 Symposium on, 1993
We have discussed the behavior of buffered and unbuffered latches versus loading from a metastable performance viewpoint. A formula to determine T/sub 0/ for a buffered latch from an unbuffered one has been described. Measured results were presented for buffered and unbuffered latches. The results shown here are relevant to standard cell or gate array ASIC designers who generally use ...
Han, L.K.; Crowder, S.; Hargrove, M.; Wu, E.; Lo, S.H.; Guarin, F.; Crabbe, E.; Su, L. Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International, 1997
We present a detailed study of electrical characteristics of sub-3 nm gate oxides grown on nitrogen implanted Si substrates (N/sub 2/ I/I oxides). The new results that advance the understanding of N/sub 2/ I/I oxides are the following: lower tunneling current, higher TDDB lifetime and reduced defect density are reported in N/sub 2/ I/I oxides for the first time. In ...
Manabe, K.; Masuzaki, K.; Ogura, T.; Nakagawa, Takashi; Saitoh, M.; Sunamura, H.; Tatsumi, T.; Watanabe, H. VLSI Technology, 2008 Symposium on, 2008
We demonstrate midgap and band-edge effective workfunctions (EWFs) control with simple metal gate process scheme (_single_ _metal_ _gate/single_ _gate_ _dielectric_), using impurity-segregated NiSi2/SiON structure for embedded memory application. The application of midgap and band-edge EWF enables us to lower power consumption in SRAM and logic devices by 30% and 15% compared to poly-Si devices, respectively, due to reduced channel impurity ...
Prototyping MIMO Systems with the AD9361: MicroApps 2015 - Analog Devices
Analog Devices SP4T RF MEMS Switch with Integrated Driver Circuitry for RF Instrumentation: MicroApps 2015 - Analog Devices
Provably-Correct Robot Control with LTLMoP, OMPL and ROS
IEEE Life Sciences: Wearable Medical Devices Advancing bioengineering
The Long Term Reliability of Gallium Nitride
2013 IEEE Robert N. Noyce Medal
Radiated Performance Assessment of Wireless Communications Devices - An Operator's Perspective
Bridging the gap for wearable electronics
Smart Textile Computational Systems
IMS 2015 Keynote: Soft Assemblies of Radios, Sensors and Circuits for the Skin
APEC 2015: KeyTalks - How to Optimize Performance and Reliability of GaN Power Devices
Superconductive Energy-Efficient Computing - ASC-2014 Plenary-series - 6 of 13 - Wednesday 2014/8/13
ASC-2014 SQUIDs 50th Anniversary: 1 of 6 Arnold Silver
ASC-2014 SQUIDs 50th Anniversary: 3 of 6 - Bob Fagaly
CES 2015 DAY 1: TAN LE AND MIND-CONTROL TECHNOLOGY
Open Sesame: Design Guidelines for Invisible Passwords
Transphorm: GaN Champions
Evaluating Over-The-Air Performance of MIMO Wireless Devices
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