Dielectric Breakdown

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Conferences related to Dielectric Breakdown

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2013 IEEE International Reliability Physics Symposium (IRPS)

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Reliability studies and applications related to physics in the areas of electronics and solar


2013 IEEE Pulsed Power and Plasma Science Conference (PPPS 2013)

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Combined conference of the IEEE International Conference on Plasma Science and the IEEE International Pulsed Power Conference

  • 2014 IEEE 41st International Conference on Plasma Sciences (ICOPS)

    The International Conference on Plasma Science (ICOPS) is an annual conference coordinated by the Plasma Science and Application Committee (PSAC) of the IEEE Nuclear & Plasma Sciences Society. The conference features a technical program with reports about new and innovative developments in the field of pulsed power, plasma science and engineering. Leading researchers gather to explore pulsed power plasmas, basic plasma physics, high-energy-density-plasmas, inertial confinement fusion, magnetic fusion, plasma diagnostics, microwave generation, lighting, micro and nano applications of plasmas, medical applications and plasma processing.

  • 2011 IEEE Pulsed Power Conference (PPC)

    The Pulsed Power Conference is held on a biannual basis and serves as the principal forum for the exchange of information on pulsed power technology and engineering.

  • 2009 IEEE Pulsed Power Conference (PPC)

    This biennial meeting is the principal medium for communicating advances in pulsed power science, technology and applications. Topics include high voltage components, dielectric breakdown, closing / opening switches, plasma processes and various applications. The Conference Proceedings constitute the most complete record of the accomplishments of the community.


2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials (ICPADM)

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The purpose of this conference is to provide a platform for researchers\, scientists and engineers from all over the world to exchange ideas and discuss recent progress in electrical insulation\, dielectric and practical applications. The focus of the conference is on dielectrics\, its phenomena and applications in developing technologies such as nanotechnology\, dielectric for superconductivity\, dielectric discharges and others.

  • 2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials (ICPADM)

    The IEEE International Conference on Properties and Applications of Dielectric Materials (ICPADM) is devoted to dielectrics and electrical insulation research. It attracts experts from around the world, and particularly from the fast growing economies of the Pacific Region.


2012 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2012)

The Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) is sponsored by the IEEE Dielectrics and Electrical Insulation Society to provide an international forum for the discussion of current research on electrical insulation\, dielectric phenomena and related topics. The conference provides an opportunity for specialists from around the world to meet and to discuss ongoing research. Topics of interest to the Conference include: aging\, biodielectrics\, charge storage and transport cryogenic di


Xplore Articles related to Dielectric Breakdown

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  • Impedance and nonlinear dielectric testing at high AC voltages using waveforms

    Obrzut, J.; Kano, K. Instrumentation and Measurement, IEEE Transactions on, 2005

    This paper presents the application of a waveform technique that can determine the complex impedance and nonlinear response of dielectric composite films at high ac voltages using a data acquisition (DAQ) card and virtual instrumentation. The voltage waveforms are Fourier transformed from the time domain to the frequency domain to obtain the fundamental and higher order harmonic responses as complex ...

  • Non-linear dielectric testing at high AC voltages using waveforms and harmonies

    Obrzut, J.; Kano, K. Electrical Insulation and Dielectric Phenomena, 2005. CEIDP '05. 2005 Annual Report Conference on, 2005

    Complex impedance and non-linear response were measured for high-dielectric composite films at AC voltages using a waveform technique. With decreasing dielectric thickness, these materials operate at higher electric fields, which cause non-linear dielectric effects and lead to a time dependent dielectric-breakdown. The waveforms were Fourier transformed from time domain to frequency domain and analyzed at fundamental and higher order harmonic ...

  • Investigation on Dielectric Window Treelike Breakdown and Suppression Under HPM in Vacuum

    Xi-Wei Hao; Guan-Jun Zhang; Shi Qiu; Wen-Hua Huang; Guo-zhi Liu Plasma Science, IEEE Transactions on, 2010

    Surface discharges of dielectric window seriously limit the generation and transmission of high-power microwaves (HPMs), which block the development of microwave technology. An S-band (2.856-GHz) HPM experimental system is established. Several kinds of dielectric window materials, i.e., polyethylene, polytetrafluoroethylene, and polymethyl methacrylate, are investigated under S-band HPMs in vacuum, and the characteristics of destroyed dielectric samples are analyzed with macroscopic ...

  • High dielectric constant composites for high power antennas

    O'Connor, K.A.; Curry, R.D. Pulsed Power Conference (PPC), 2011 IEEE, 2011

    The volume and weight of high power antennas can be a limiting factor for compact pulsed power transmitters. Options for antenna minimization are limited due to the relationship between an antenna's physical dimensions and the frequencies which can be transmitted. Thus, low frequency antennas often require dimensions on the order of meters. An effort undertaken at the University of Missouri ...

  • Gate dielectric breakdown: A focus on ESD protection

    Weir, Bonnie E.; Che-Choi Leung; Silverman, Paul J.; Alam, M.A. Reliability Physics Symposium Proceedings, 2004. 42nd Annual. 2004 IEEE International, 2004

    The challenge of electrostatic discharge (ESD) design is that as scaling continues and operating voltages are lowered, the interface to the outside world and therefore the ESD specifications remain the same. Moreover, as has been highlighted by Duvvury et al. (1996), the first breakdown voltage for snapback of a transistor and the median breakdown voltage of the gate dielectric are ...

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Periodicals related to Dielectric Breakdown

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  • Device and Materials Reliability, IEEE Transactions on

    Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...

  • Electron Devices, IEEE Transactions on

    Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.

  • Instrumentation and Measurement, IEEE Transactions on

    Measurements and instrumentation utilizing electrical and electronic techniques.

  • Plasma Science, IEEE Transactions on

    Plasma science and engineering, including: magnetofluid dynamics and thermionics; plasma dynamics; gaseous electronics and arc technology; controlled thermonuclear fusion; electron, ion, and plasma sources; space plasmas; high-current relativistic electron beams; laser-plasma interactions; diagnostics; plasma chemistry and colloidal and solid-state plasmas.