Conferences related to Dielectric Breakdown

Back to Top

2015 IEEE International Reliability Physics Symposium (IRPS)

Sharing information related to cause, effects and solutions in the deign and manufacture of electronics and related components


2014 IEEE 41st International Conference on Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS)

The International Conference on Plasma Science (ICOPS) is an annual conference coordinated by the Plasma Science and Application Committee (PSAC) of the IEEE Nuclear & Plasma Sciences Society. Promote physical understanding of neutral and non-neutral plasma physics, leading towards energy sources and applications.


2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2014)

Topics of interest to the Conference include: Aging, Bio-dielectrics, Charge storage and transport, Electro-hydrodynamics, Flow electrification, High-field effects, High frequency dielectric phenomena, Measurement techniques, Nano-dielectrics, Outdoor insulation, Partial discharge measurements, Polarization phenomena, Pre-breakdown and breakdown in solids, liquids, gases, and vacuum, Surface flashover, Treeing, and Cryogenic dielectrics

  • 2012 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2012)

    The Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) is sponsored by the IEEE Dielectrics and Electrical Insulation Society to provide an international forum for the discussion of current research on electrical insulation, dielectric phenomena and related topics. The conference provides an opportunity for specialists from around the world to meet and to discuss ongoing research. Topics of interest to the Conference include: aging, biodielectrics, charge storage and transport cryogenic dielectrics, etc... prebreakdown and breakdown in solids, liquids, gases, and vacuum surface flashover, and treeing.

  • 2011 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2011)

    CEIDP provides an international forum for the discussion and presentations of current research on electrical insulation, dielectric phenomena, and related topics. The Conference provides a great opportunity for researchers and scientists from all over the world to meet and discuss ongoing research. Topics of interest to the Conference include: aging, biodielectrics, outdoor insulation, nanodilectrics, partial discharges, surface flashover, high field effects, polarization phenomena.

  • 2010 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2010)

    CEIDP provides an international forum for teh discussion and presentation of current research on electrical insulation, dielectric phenomena and realted topics. The ocnference provides a great opportunity for researchers and scientists from around teh world to meet and discuss onglong research. Topics of interest to the Conference include:aging, biodielectrics, outdoor insulation, surface flashover, partial discharge measurements, polarization phenomena, measurement techniques, flow electrification, schrag

  • 2009 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2009)

    CEIDP provides an international forum for the discussion of current research on electrical insulation, dielectric phenomena and related topics. The conference provides an opportunity for specialists from around the world to meet and to discuss ongoing research. Topics of interest to the Conference include: aging; biodielectrics; outdoor insulation; surface flashover; polarization phenomena; measurement techniques; partial discharge measurements; flow electrification; charge storage and transport; electrohy

  • 2008 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2008)

    To provide an international forum for the discussion of current research on electrical insulation, dielectric phenomena and related topics.

  • 2007 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2007)

    The Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) is sponsored by the IEEE Dielectrics and Electrical Insulation Society to provide an international forum for the discussion of current research on electrical insulation, dielectric phenomena and related topics.

  • 2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2006)

  • 2005 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2005)


2013 IEEE Pulsed Power and Plasma Science Conference (PPPS 2013)

Combined conference of the IEEE International Conference on Plasma Science and the IEEE International Pulsed Power Conference

  • 2011 IEEE Pulsed Power Conference (PPC)

    The Pulsed Power Conference is held on a biannual basis and serves as the principal forum for the exchange of information on pulsed power technology and engineering.

  • 2009 IEEE Pulsed Power Conference (PPC)

    This biennial meeting is the principal medium for communicating advances in pulsed power science, technology and applications. Topics include high voltage components, dielectric breakdown, closing / opening switches, plasma processes and various applications. The Conference Proceedings constitute the most complete record of the accomplishments of the community.


2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials (ICPADM)

The purpose of this conference is to provide a platform for researchers, scientists and engineers from all over the world to exchange ideas and discuss recent progress in electrical insulation, dielectric and practical applications. The focus of the conference is on dielectrics, its phenomena and applications in developing technologies such as nanotechnology, dielectric for superconductivity, dielectric discharges and others.

  • 2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials (ICPADM)

    The IEEE International Conference on Properties and Applications of Dielectric Materials (ICPADM) is devoted to dielectrics and electrical insulation research. It attracts experts from around the world, and particularly from the fast growing economies of the Pacific Region.



Periodicals related to Dielectric Breakdown

Back to Top

Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...


Electron Devices, IEEE Transactions on

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Instrumentation and Measurement, IEEE Transactions on

Measurements and instrumentation utilizing electrical and electronic techniques.


Plasma Science, IEEE Transactions on

Plasma science and engineering, including: magnetofluid dynamics and thermionics; plasma dynamics; gaseous electronics and arc technology; controlled thermonuclear fusion; electron, ion, and plasma sources; space plasmas; high-current relativistic electron beams; laser-plasma interactions; diagnostics; plasma chemistry and colloidal and solid-state plasmas.




Xplore Articles related to Dielectric Breakdown

Back to Top

Weibull statistics in short-term dielectric breakdown of thin polyethylene films [comment and reply]

Donazzi, F.; Luoni, G.; Laurent, C. Dielectrics and Electrical Insulation, IEEE Transactions on, 1994

For original paper see ibid., vol.28, p18-29 (1993).The comments make it clear and underline that a parameter obtained from ramped voltages bears no relationship whatsoever with the life threshold parameter that would be derived from constant stress experiments. A reply is given


Effects of Gamma-ray Irradiation on Dielectric Breakdown of Polybutylene Naphthalate and Polybutylene Terephthalate under Magnetic Field

Du, B.X.; Liu, H.J.; Fu Shen Solid Dielectrics, 2007. ICSD '07. IEEE International Conference on, 2007

This paper describes the effects of magnetic field on dielectric breakdown of gamma-ray irradiated polybutylene naphthalate (PBN) and polybutylene terephthalate (PBT). The experiment was carried out by applying a dc pulse voltage under magnetic field. The magnetic flux density (MFD) of the magnetic filed was 495 mT. Both PBN and PBT were irradiated in air up to 100 kGy and ...


Hot-hole-induced dielectric breakdown in LDMOS transistors

Labate, L.; Manzini, S.; Roggero, R. Electron Devices, IEEE Transactions on, 2003

A novel failure mechanism in an n-channel lateral double-diffused metal-oxide- semiconductor (LDMOS) transistor biased in the saturation mode is investigated. A correlation between time-to-breakdown and hot hole gate current is established and the static safe operating area (SOA), limited by hot-hole-induced dielectric breakdown, is defined. A method based on the evaluation of the time integral of an "effective" hot-hole gate ...


Dielectric-breakdown-induced epitaxy: a universal breakdown defect in ultrathin gate dielectrics

Selvarajoo, T.A.L.; Ranjan, Rakesh; Pey, K.-L.; Lei-Jun Tang; Chih Hang Tung; Wenhe Lin Device and Materials Reliability, IEEE Transactions on, 2005

The breakdown phenomena in SiOxNy (EOT=20 Å) gate dielectric under a two- stage constant voltage stress in inversion mode are physically analyzed with the aid of transmission electron microscopy. The results show that dielectric- breakdown-induced epitaxy (DBIE) remains as one of the major failure defects responsible for gate dielectric breakdown evolution even for a stress voltage as low as 2.5 ...


Effects of interfacial phenomena on dielectric breakdown of filled epoxy resin

Ezoe, M.; Nakanishi, M.; Masayuki, N.; Jia ShouGuo High Voltage Engineering, 1999. Eleventh International Symposium on (Conf. Publ. No. 467), 1999

Dielectric properties, the frequency characteristics, space charge distribution and dielectric breakdown strength of filled epoxy resins were measured after water attack at 50°C. The loss tangent tan δ of these composites showed a tendency to increase rapidly, but roundish filled resin did not show the phenomena to increase rapidly, and this tan δ increased only a little. The same was ...


More Xplore Articles

Educational Resources on Dielectric Breakdown

Back to Top

eLearning

No eLearning Articles are currently tagged "Dielectric Breakdown"

IEEE-USA E-Books

No IEEE-USA E-Books are currently tagged "Dielectric Breakdown"



Standards related to Dielectric Breakdown

Back to Top

No standards are currently tagged "Dielectric Breakdown"


Jobs related to Dielectric Breakdown

Back to Top