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2015 IEEE International Reliability Physics Symposium (IRPS)
Sharing information related to cause, effects and solutions in the deign and manufacture of electronics and related components
The International Conference on Plasma Science (ICOPS) is an annual conference coordinated by the Plasma Science and Application Committee (PSAC) of the IEEE Nuclear & Plasma Sciences Society. Promote physical understanding of neutral and non-neutral plasma physics, leading towards energy sources and applications.
2014 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2014)
Topics of interest to the Conference include: Aging, Bio-dielectrics, Charge storage and transport, Electro-hydrodynamics, Flow electrification, High-field effects, High frequency dielectric phenomena, Measurement techniques, Nano-dielectrics, Outdoor insulation, Partial discharge measurements, Polarization phenomena, Pre-breakdown and breakdown in solids, liquids, gases, and vacuum, Surface flashover, Treeing, and Cryogenic dielectrics
Combined conference of the IEEE International Conference on Plasma Science and the IEEE International Pulsed Power Conference
The purpose of this conference is to provide a platform for researchers, scientists and engineers from all over the world to exchange ideas and discuss recent progress in electrical insulation, dielectric and practical applications. The focus of the conference is on dielectrics, its phenomena and applications in developing technologies such as nanotechnology, dielectric for superconductivity, dielectric discharges and others.
Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission
Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...
Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.
Measurements and instrumentation utilizing electrical and electronic techniques.
Plasma science and engineering, including: magnetofluid dynamics and thermionics; plasma dynamics; gaseous electronics and arc technology; controlled thermonuclear fusion; electron, ion, and plasma sources; space plasmas; high-current relativistic electron beams; laser-plasma interactions; diagnostics; plasma chemistry and colloidal and solid-state plasmas.
Aerospace, IEEE Transactions on, 1965
Experimental measurements of electrical discharges caused by corona, glow discharges, and voltage breakdown were made under conditions encountered in aerospace vehicles operating within the 70,000 to 250,000 foot altitude range. All measurements were made in gases commonly used to pressurize spacecraft electrical and electronic compartments: nitrogen, nitrogenoxygen mixtures, and normal atmosphere at sea-level pressure. Test results show that: (1) the ...
Electrical Insulation, IEEE Transactions on, 1987
Insulating papers and pressboards must have high dielectric strength and high tensile strength. However, these materials are gradually degraded due to thermal stress, oxygen, and moisture. Because the tensile strength decreases owing to degradation, the degradation of insulating material may affect the life of transformers. In our laboratory, through accelerated tests using models of oil-impregnated insulating systems, changes in characteristics ...
Reliability Physics Symposium (IRPS), 2013 IEEE International, 2013
The dielectric breakdown field (EBD) and the time-dependent-dielectric- breakdown (TDDB) of eight different low-K films with porosities between 3% (K=3.2) and 50% (K=1.8) and thicknesses between 15 and 60 nm were investigated using imec's planar capacitors (p-cap) test vehicle. EBD values decrease linearly with porosity to reach 6MV/cm at 50% porosity. The analogous Organo- Silicate Glass (OSG) films show a ...
Solid State Device Research Conference, 1993. ESSDERC '93. 23rd European, 1993
Low power is a desirable system property. It is not achieved by only a simple reduction in power supply voltage of the system. It includes IC's specifically designed for low power operation, and a semiconductor technology allowing these chips to function with adequate speed at that lower power supply voltage. Standardisation is a key factor in achieving the goal of ...
Pulsed Power Conference, 2009. PPC '09. IEEE, 2009
Several advanced oils have been identified by the Air Force Research Laboratory, Materials and Manufacturing Directorate, for characterization by MU as pressurized dielectric switching media. The oils tested were Diala AX transformer oil, a hydrogenated 1-decene polyalphaolefin, two hydrogenated 1-decene/1-dodecene polyalphaolefin mixtures, a silahydrocarbon, an ester, an alkylbenzene, and a silicone oil. Experiments on the pulsed voltage breakdown were performed ...
G. C. Montanari; F. Ciani; L. Testa; F. Guastavino; G. Coletti; R. Mulhaupt Proceedings of 2005 International Symposium on Electrical Insulating Materials, 2005. (ISEIM 2005)., 2005
A set of surface discharge ageing procedures, space charge observations and dielectric strength measurements has been implemented on a type of insulating nanofilled epoxy-resin (nanostructured by compatibilised synthetic layered silicates) and on its non-filled base resin. Promising improvements in the electrical behaviour of the nanofilled epoxy, particularly as concerns surface discharge endurance, were detected. Regarding space charge, it was found ...
A. Al-Arainy; Nazar H. Malik; Mohammed Iqbal Qureshi; Mohammed Nabih Al-Saati IEEE Transactions on Power Delivery, 2007
XLPE high-voltage underground cables are being extensively used in Arabian Gulf countries. Most of these cables are being manufactured locally. Although XLPE has excellent dielectric characteristics, extensive premature failures have been reported by the local power utilities. The main causes of such premature failures are related to manufacturing defects and insulation degradation mainly caused by water treeing phenomena. In this ...
Kikuo Yamabe; Kenji Taniguchi; Yoshiaki Matsushita Reliability Physics Symposium, 1983. 21st Annual, 1983
Thickness dependence of total dielectric breakdown failure fraction of thermal SiO2 films has a minimum value at around l10A and a maximum value at around 400A. It is concluded that two main origins of dielectric breakdown failures of thin SiO2 film are surface contamination prior to gate oxidation and microdefects in Si substrates.
R. V. A. van Loon; K. R. Catchpole; A. Polman 2008 5th IEEE International Conference on Group IV Photonics, 2008
Si/SiOx heterostructures show a photovoltaic effect when the samples are annealed to form Si quantum dots. Subsequently applying dielectric breakdown increases the short-circuit current by up to an order of magnitude.
M. S. Madhukar; Bradley Morgan; J. K. Walsh; M. W. Hooker 2009 23rd IEEE/NPSS Symposium on Fusion Engineering, 2009
The cyanate ester polymer, CTD 403, is being considered for use as an insulation material in future fusion devices. In this study, the moisture resistance of neat polymer, glass fiber/CTD 403 and copper foil/CTD 403 was studied. The results show that while prolonged exposure to moisture cause property degradation, however, most of the property loss is recovered after drying the ...
This chapter contains sections titled: Introduction Physics of Degradation and Breakdown Physical Models for Oxide Degradation and Breakdown Experimental Results of Oxide Breakdown Post-Breakdown Phenomena References
This chapter contains sections titled: Introduction Fundamentals of Insulator Physics and Characterization Measurement of Dielectric Reliability Fundamentals of Dielectric Breakdown Statistics Summary and Future Trends References
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