Conferences related to Stress Test

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2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe)

Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for smarter grid, energy efficiency,technologies for sustainable energy systems, converters and power supplies


2019 IEEE 69th Electronic Components and Technology Conference (ECTC)

premier components, packaging and technology conference


2019 IEEE International Conference on Systems, Man and Cybernetics (SMC)

2019 IEEE International Conference on Systems, Man, and Cybernetics (SMC2019) will be held in the south of Europe in Bari, one of the most beautiful and historical cities in Italy. The Bari region’s nickname is “Little California” for its nice weather and Bari's cuisine is one of Italian most traditional , based of local seafood and olive oil. SMC2019 is the flagship conference of the IEEE Systems, Man, and Cybernetics Society. It provides an international forum for researchers and practitioners to report up-to-the-minute innovations and developments, summarize state­of-the-art, and exchange ideas and advances in all aspects of systems science and engineering, human machine systems and cybernetics. Advances have importance in the creation of intelligent environments involving technologies interacting with humans to provide an enriching experience, and thereby improve quality of life.


2019 IEEE International Electron Devices Meeting (IEDM)

the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart -power technologies, etc.


2019 IEEE International Reliability Physics Symposium (IRPS)

Meeting of academia and research professionals to discuss reliability challenges.


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Periodicals related to Stress Test

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Advanced Packaging, IEEE Transactions on

The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Components and Packaging Technologies, IEEE Transactions on

Component parts, hybrid microelectronics, materials, packaging techniques, and manufacturing technology.


Computer Graphics and Applications, IEEE

IEEE Computer Graphics and Applications (CG&A) bridges the theory and practice of computer graphics. From specific algorithms to full system implementations, CG&A offers a strong combination of peer-reviewed feature articles and refereed departments, including news and product announcements. Special Applications sidebars relate research stories to commercial development. Cover stories focus on creative applications of the technology by an artist or ...


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Most published Xplore authors for Stress Test

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Xplore Articles related to Stress Test

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Evaluation of T-wave alternans in comparison with ECG stress test and scintigraphic examination in patients with coronary artery disease

[{u'author_order': 1, u'affiliation': u'Nalecz Institute of Biocybernetics and Biomedical Engineering, Warsaw, Poland', u'full_name': u'D. Janusek'}, {u'author_order': 2, u'affiliation': u'Nalecz Institute of Biocybernetics and Biomedical Engineering, Warsaw, Poland', u'full_name': u'M. Kania'}, {u'author_order': 3, u'affiliation': u'Nalecz Institute of Biocybernetics and Biomedical Engineering, Warsaw, Poland', u'full_name': u'H. Zavala-Fernandez'}, {u'author_order': 4, u'affiliation': u'Nalecz Institute of Biocybernetics and Biomedical Engineering, Warsaw, Poland', u'full_name': u'R. Maniewski'}, {u'author_order': 5, u'affiliation': u'Medical University of Warsaw, Warsaw, Poland', u'full_name': u'R. Zaczek'}, {u'author_order': 6, u'affiliation': u'Medical University of Warsaw, Warsaw, Poland', u'full_name': u'M. Kobylecka'}, {u'author_order': 7, u'affiliation': u'Medical University of Warsaw, Warsaw, Poland', u'full_name': u'G. Opolski'}, {u'author_order': 8, u'affiliation': u'Medical University of Warsaw, Warsaw, Poland', u'full_name': u'L. Krolicki'}] 2012 IEEE 12th International Conference on Bioinformatics & Bioengineering (BIBE), 2012

The results of study on T-wave alternans in the group of patients with ischemic heart disease are shown. The body surface potential maps were recorded with use of 67 channel high-resolution ECG system. Electrocardiographic stress test was performed during the patient examinations. The T-wave alternans ratio was calculated and results were compared with data obtained by single-photon emission computed tomography ...


Research and application of network load stress test for smart substation

[{u'author_order': 1, u'affiliation': u'State Grid Jiangxi Electric Power Company, Maintenance Branch, Nanchang, Jiangxi, China', u'authorUrl': u'https://ieeexplore.ieee.org/author/37085817127', u'full_name': u'Ming Cai', u'id': 37085817127}, {u'author_order': 2, u'affiliation': u'State Grid Jiangxi Electric Power Company, Maintenance Branch, Nanchang, Jiangxi, China', u'full_name': u'Qi Xiao'}, {u'author_order': 3, u'affiliation': u'State Grid Jiangxi Electric Power Company, Maintenance Branch, Nanchang, Jiangxi, China', u'authorUrl': u'https://ieeexplore.ieee.org/author/37085811435', u'full_name': u'Yuyun Chen', u'id': 37085811435}, {u'author_order': 4, u'affiliation': u'State Grid Jiangxi Electric Power Company, Maintenance Branch, Nanchang, Jiangxi, China', u'authorUrl': u'https://ieeexplore.ieee.org/author/37085812768', u'full_name': u'Wenxing Cheng', u'id': 37085812768}, {u'author_order': 5, u'affiliation': u'State Grid Jiangxi Electric Power Company, Maintenance Branch, Nanchang, Jiangxi, China', u'authorUrl': u'https://ieeexplore.ieee.org/author/37085811281', u'full_name': u'Xiaobing Zhou', u'id': 37085811281}, {u'author_order': 6, u'affiliation': u'Wuhan Kemov Electric Company Ltd, Wuhan, Hubei, China', u'authorUrl': u'https://ieeexplore.ieee.org/author/37085814224', u'full_name': u'Zhihua Wang', u'id': 37085814224}] 2015 5th International Conference on Electric Utility Deregulation and Restructuring and Power Technologies (DRPT), 2015

Load stress test of secondary equipment network is important for the large- scale construction of smart substations. In this article, several secondary equipment network schemes and their influence on relays related IEDs are discussed, and then stress test objects, principles for smart substation are proposed. Based on embedded CPU and large-scale FPGA, load stress testing device for secondary equipment network ...


Cycle stress test equipment for automated short circuit testing of smart power switches according to the AEC Q100-012 standard

[{u'author_order': 1, u'affiliation': u'KAI-Kompetenzzentrum Automobil- und Industrieelektronik GmbH Europastrasse 8, 9500 Villach, Austria', u'authorUrl': u'https://ieeexplore.ieee.org/author/37268796400', u'full_name': u'Michael Glavanovics', u'id': 37268796400}, {u'author_order': 2, u'affiliation': u'KAI-Kompetenzzentrum Automobil- und Industrieelektronik GmbH Europastrasse 8, 9500 Villach, Austria', u'authorUrl': u'https://ieeexplore.ieee.org/author/37681252700', u'full_name': u'Hans-Peter Kreuter', u'id': 37681252700}, {u'author_order': 3, u'affiliation': u'KAI-Kompetenzzentrum Automobil- und Industrieelektronik GmbH Europastrasse 8, 9500 Villach, Austria', u'authorUrl': u'https://ieeexplore.ieee.org/author/38096589400', u'full_name': u'Roland Sleik', u'id': 38096589400}, {u'author_order': 4, u'affiliation': u'Infineon Technologies Austria AG, Villach, Austria', u'authorUrl': u'https://ieeexplore.ieee.org/author/38092686000', u'full_name': u'Christoph Schreiber', u'id': 38092686000}] 2009 13th European Conference on Power Electronics and Applications, 2009

We present the design of a cycle test system for automated stress testing of smart power switches under automotive load short circuit conditions up to 250A / 50V. A fast overcurrent detection and shutdown strategy protects the test equipment from damage. Device degradation and failure data are recorded individually for statistical analysis of time-to-failure distributions. Representative measurements show that our ...


Stress test and finite element analysis of a 10×10<sup>4</sup>m<sup>3</sup>crude oil tank

[{u'author_order': 1, u'affiliation': u'College of Architecture and Environment, Sichuan University, Chengdu, China', u'full_name': u'Xiaoyang Peng'}, {u'author_order': 2, u'affiliation': u'College of Architecture and Environment, Sichuan University, Chengdu, China', u'full_name': u'Qi Ge'}, {u'author_order': 3, u'affiliation': u'College of Architecture and Environment, Sichuan University, Chengdu, China', u'full_name': u'Feng Xiong'}] 2011 International Conference on Multimedia Technology, 2011

The large crude oil storage tank with a capacity of 10×104m3has been widely used in China currently. In order to obtain the stress distribution in the wall board, bottom board, big fillet weld and manhole, and to verify the rationality of tank design, a stress test which combining the method of static resistance strain test (SRST) and optical fiber strain ...


Voltage Ramp Stress Test to determine TDDB performance in SRAM vehicle

[{u'author_order': 1, u'affiliation': u'Si Technology Group, Programmable Platforms Development, Xilinx, Inc. 2100 Logic Drive San Jose, CA 95124, USA', u'full_name': u'Jae-Gyung Ahn'}, {u'author_order': 2, u'affiliation': u'Si Technology Group, Programmable Platforms Development, Xilinx, Inc. 2100 Logic Drive San Jose, CA 95124, USA', u'full_name': u'Suresh Parameswaran'}, {u'author_order': 3, u'affiliation': u'Reliability Engineering Group, Quality and New Product, Xilinx, Inc. 2100 Logic Drive San Jose, CA 95124, USA', u'full_name': u'Dean Tsaggaris'}, {u'author_order': 4, u'affiliation': u'NPI Product Engineering Group, Quality and New Product, Xilinx, Inc. 2100 Logic Drive San Jose, CA 95124, USA', u'full_name': u'Chien-Wei Ku'}, {u'author_order': 5, u'affiliation': u'Si Technology Group, Programmable Platforms Development, Xilinx, Inc. 2100 Logic Drive San Jose, CA 95124, USA', u'full_name': u'Ping-Chin Yeh'}, {u'author_order': 6, u'affiliation': u'Si Technology Group, Programmable Platforms Development, Xilinx, Inc. 2100 Logic Drive San Jose, CA 95124, USA', u'full_name': u'Jonathan Chang'}] 2014 IEEE International Reliability Physics Symposium, 2014

We applied Voltage Ramp Stress Test (VRST) to an SRAM test vehicle and compared the obtained Vfail distribution with theoretical predictions from various TDDB failure criteria. Measured Vfail results are matched with the prediction from TDDB failure criterion of Ig/Ig0=1000 or more. We developed a numerical method to predict effective Igate with TDDB stress. It was applied to VRST condition ...


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Standards related to Stress Test

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Guide for the statistical analysis of electrical insulation breakdown data


IEEE Guide for Gas-Insulated Substations

This guide provides information of special relevance to the planning, design, testing, installation, operation and maintenance of gas-insulated substations(GIS) and equipment. This guide is intended to supplement IEEE Std C37-122- 1993(R2002). In general, this guide is applicable to all GIS above 52 kV. However the importance of the topics covered varies with application category. For example, issues related to advanced ...


IEEE Guide for Making Corona (Partial Discharge) Measurements on Electronics Transformers

This guide covers the detection of corona (partial discharge) and the measurement of its magnitude in electronics transformers. Test conditions, test apparatus, and test requirements are included.