Metrology

View this topic in
This article is about the science of measurement. (Wikipedia.org)






Conferences related to Metrology

Back to Top

2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

The Conference focuses on all aspects of instrumentation and measurement science and technology research, development and applications. The list of program topics includes but is not limited to: Measurement Science & Education, Measurement Systems, Measurement Data Acquisition, Measurements of Physical Quantities, and Measurement Applications.

  • 2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

    The Conference focuses on all aspects of instrumentation and measurement science and technology research, development and applications. The list of program topics includes but is not limited to MEASUREMENT SCIENCE & EDUCATION, MEASUREMENT SYSTEMS, MEASUREMENT -DATA ACQUISITION, MEASUREMENTS OF PHYSICAL QUANTITIES, and MEASUREMENT APPLICATIONS.

  • 2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

    The conference focuses on research, development and applications in the field of instrumentation and measurement science and technology. The list of program topics includes but is not limited to Fundamentals, Sensors & Transducers, Measurements of Physical Qualities, Measurement Systems, Measurement Applications, Signal & Image Processing, and Industrial Applications.

  • 2011 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

    The Conference focuses on all aspects of instrumentation and measurement science and technology research, development and applications. The list of program topics includes but is not limited to MEASUREMENT SCIENCE & EDUCATION, MEASUREMENT SYSTEMS, MEASUREMENT -DATA ACQUISITION, MEASUREMENTS OF PHYSICAL QUANTITIES, and MEASUREMENT APPLICATIONS.

  • 2010 IEEE Instrumentation & Measurement Technology Conference - I2MTC 2010

    The Conference focuses on all aspects of instrumentation and measurement science and technology research, development and applications. The list of program topics includes but is not limited to MEASUREMENT SCIENCE & EDUCATION, MEASUREMENT SYSTEMS, MEASUREMENT -DATA ACQUISITION, MEASUREMENTS OF PHYSICAL QUANTITIES, and MEASUREMENT APPLICATIONS.

  • 2009 IEEE Instrumentation & Measurement Technology Conference - I2MTC 2009

    The Conference focuses on all aspects of instrumentation and measurement science and technology research, development and applications. The list of program topics includes but is not limited to MEASUREMENT SCIENCE & EDUCATION, MEASUREMENT SYSTEMS, MEASUREMENT-DATA ACQUISITION, MEASUREMENTS OF PHYSICAL QUANTITIES, and MEASUREMENT APPLICATIONS.


2014 IEEE Semiconductor Wafer Test Workshop (SWTW 2014)

The IEEE SW Test Workshop is the only workshop specializing in semiconductor wafer level testing. It has a comprehensive technical program that is comnplemented by social activities which promote networking and sharing among the attendees. Booth displays at SWTW provide attendees with a one -stop opportunity to meet in person with all the key suppiers and learn about their new products and services.

  • 2013 IEEE Semiconductor Wafer Test Workshop (SWTW 2013)

    The IEEE SW Test Workshop is the only workshop specializing in semiconductor wafer level testing. It has a comprehensive technical program that is complemented by social activities which promote networking and sharing among the attendees. Booth displays at SWTW provide attendees with a on-stop opportunity to meet firsthand with all the key suppliers and learn about their new products and services.

  • 2012 IEEE Semiconductor Wafer Test Workshop (SWTW 2012)

    The IEEE SW Test Workshop is the only workshop specializing in semiconductor wafer level testing. It has a comprehensive technical program that is complemented by social activities which promote networking and sharing among the attendees. Booth displays at SWTW provide attendees with a on-stop opportunity to meet firsthand with all the key suppliers and learn about their new products and services.

  • 2011 IEEE Semiconductor Wafer Test Workshop (SWTW 2011)

    The IEEE SW Test Workshop is the only workshop specializing in semiconductor wafer level testing. It has a comprehensive technical program that is complemented by social activities which promote networking and sharing amoung attendees. Exhibit booth displays at SWTW provide attendees with a one-stop opportunity to meet firsthand with all key suppliers and learn about their new products and services.

  • 2010 IEEE Semiconductor Wafer Test Workshop (SWTW 2010)

    The IEEE SW Test Workshop is the only workshop specializing in semiconductor wafer level testing. It has a comprehensive technical program that is complemented by social activities which promote networking and sharing among the attendees. Booth displays at SWTW provide attendees with a one-stop opportunity to meet firsthand with all the key suppliers and learn about their new products and services.

  • 2009 IEEE Semiconductor Wafer Test Workshop (SWTW 2009)

    The IEEE SW Test Workshop is the only workshop specializing in semiconductor wafer level testing. It has a comprehensive technical program that is complemented by social activities which promote networking and sharing among the attendees. Booth displays at SWTW provide attendees with a one-stop opportunity to meet fi rsthand with all the key suppliers and learn about their new products and services.

  • 2008 IEEE Semiconductor Wafer Test Workshop (SWTW 2008)

    The SW Test Workshop is the only IEEE sponsored conference dealing with all aspects of semiconductor wafer and die level probe testing.


2013 81st ARFTG Microwave Measurement Conference (ARFTG)

RF and Microwave Measurement Techniques


2013 Conference on Lasers and Electro-Optics (CLEO)

CLEO serves as the premier international forum for scientific and technical optics, uniting the fields of lasers and opto-electronics by bringing together all aspects of laser technology, from basic research to industry applications.

  • 2012 Conference on Lasers and Electro-Optics (CLEO)

    CLEO 2012 features a complete and up-to-date technical program under three core conferences; CLEO: QELS- Fundamental Science, CLEO: Science & Innovations, and CLEO: Applications & Technology. CLEO: Expo and Market Focus bring CLEO 2012 full circle by highlighting the latest innovations and products as well as providing a forum to discuss marketplace trends and challenges.

  • 2011 Conference on Lasers and Electro-Optics (CLEO)

    CLEO, the Conference on Lasers and Electro-Optics, formerly known as CLEO/QELS, serves as the premier international forum for scientific and technical optics. The CLEO: 2011 Conference unites the fields of lasers and opto-electronics by bringing together all aspects of laser technology, from basic research to industry applications.

  • 2010 Conference on Lasers and Electro-Optics (CLEO)

    CLEO is held in conjunction with the Quantum Electronics and Laser Science Conference. CLEO/QELS attracts leaders in the fields of lasers, optical devices, optical fibers, photonics and innovative approaches in such fields as: laser spectroscopy, ultrafast optics, nonlinear optics, optical detectors, optical modulators, optical pulses, and quantum mechanics.

  • 2009 Conference on Lasers and Electro-Optics (CLEO)

    CLEO has evolved into a dynamic six-day event that has successfully bridged the science and applications sides of the optics and photonics industry. CLEO offers high-quality programming; the latest in the lasers, electro-optics and photonics industry; the CLEO Exhibit, which has over 350 participating companies; and a new location in Baltimore, Maryland. CLEO and PhAST 2008 is the must attend event of the year.

  • 2008 Conference on Lasers and Electro-Optics (CLEO)

    CLEO/QELS and PhAST has evolved into a dynamic six-day event that has successfully bridged the science and applications sides of the optics and photonics industry. CLEO/QELS offers high-quality programming; the latest in the lasers, electro-optics and photonics industry; the CLEO Exhibit, which has over 350 participating companies; and a new location in San Jose, California. CLEO/QELS and PhAST 2008 is the must attend event of the year.

  • 2007 Conference on Lasers & Electro-Optics/Quantum Electronics and Laser Science Conference (CLEO/QELS 2007)

  • 2006 Conference on Lasers & Electro-Optics/Quantum Electronics and Laser Science Conference (CLEO/QELS 2006)


2013 IEEE 11th International Conference on Electronic Measurement & Instruments (ICEMI)

ICEMI is invited authors to submit original papers in any but not limited as following areas: Science Foundation of Instrument and Measurement Innovative Designing of Instrument and Test System Applications on Instrument and Testing Signal & Image Processing Sensor and Non-electric Measurement Communication and Network Test Systems Control Theory and Application Condition Monitoring, Fault Diagnosis and Prediction Other Relevant Theories and Technologies

  • 2011 IEEE 10th International Conference on Electronic Measurement & Instruments (ICEMI)

    ICEMI is the world s premier conference dedicated to the electronic test of devices, boards and systems covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement, and is convened every two years. The purpose of the ICEMI is to provide excellent opportunities for scientists, engineers, and participants throughout the world to present the latest research results and to exchange their views or experience.

  • 2009 9th International Conference on Electronic Measurement & Instruments (ICEMI 2009)

    Science Foundation of Instrument and Measurement Instrument, Measurement and Test Technology: Sensing Technology and Transducer Designing of Instrument and Test System Applications on Instrument and Testing: Communication and Network Test Systems Control Theory and Application

  • 2007 8th International Conference on Electronic Measurement & Instruments (ICEMI 2007)


More Conferences

Periodicals related to Metrology

Back to Top

Advanced Packaging, IEEE Transactions on

The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.


Components and Packaging Technologies, IEEE Transactions on

Component parts, hybrid microelectronics, materials, packaging techniques, and manufacturing technology.


Electronics Packaging Manufacturing, IEEE Transactions on

Design for manufacturability, cost and process modeling, process control and automation, factory analysis and improvement, information systems, statistical methods, environmentally-friendly processing, and computer-integrated manufacturing for the production of electronic assemblies, products, and systems.


Semiconductor Manufacturing, IEEE Transactions on

Addresses innovations of interest to the integrated circuit manufacturing researcher and professional. Includes advanced process control, equipment modeling and control, yield analysis and optimization, defect control, and manufacturability improvement. It also addresses factory modelling and simulation, production planning and scheduling, as well as environmental issues in semiconductor manufacturing.




Xplore Articles related to Metrology

Back to Top

A flat spectral photon flux source for single photon detector quantum efficiency calibration

Haiyong Gan; Ruoduan Sun; Nan Xu; Jianwei Li; Yanfei Wang; Guojin Feng; Chundi Zheng; Chong Ma; Yandong Lin 2015 11th Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2015

A flat spectral photon flux source is proposed to facilitate the single photon detector quantum efficiency calibration in an extended wavelength range (400-800nm). The absolute quantum efficiency at certain wavelengths (e.g. 633nm and 807nm) of the photon counter under test can be measured via correlated photons method and used to evaluate the photon statistics of the flat spectral photon flux ...


Lessons learned from designing and manufacturing of the coil support structure of W7-X

Didier Chauvin; Torsten Koppe; Antonio Cardella; Bernd Missal; Dirk Pilopp; Giovanni Di Bartolo; Rocio Camín; Ivan Gonzales; Luca Giordano; Stefano Langone 2011 IEEE/NPSS 24th Symposium on Fusion Engineering, 2011

Wendelstein 7-X (W7-X) is a fully optimised low-shear stellarator and shall demonstrate the reactor potential of this fusion plant. It is presently under construction at the Greifswald branch institute of IPP. The W7-X coil system consists of 20 planar and 50 non planar coils. They are supported by a pentagonal 10 m diameter, 2.5 m high called coil support structure ...


The optimized probe light frequency detuning for Faraday-rotation cesium atomic magnetometer

Wenhao Li; Pingwei Lin; Xiang Peng; Hong Guo 2014 Conference on Lasers and Electro-Optics (CLEO) - Laser Science to Photonic Applications, 2014

We experimentally demonstrate that the sensitivity of all-optical Faraday- rotation magnetometer can be improved by tuning probe light frequency to the edge of wings of Doppler profile with cesium atoms, which coincides with the theoretical analysis.


Table of contents

2013 IEEE Antennas and Propagation Society International Symposium (APSURSI), 2013

The following topics are dealt with: UWB antennas; wireless sensor networks; healthcare; time-domain techniques; guided wave antennas; slotted wave antennas; well-conditioned integral equation formulations; EBG theory; phased array antennas; nanoantennas; planar antennas; printed antennas; MIMO antennas; mobile devices; pattern reconfigurable antennas; propagation channel modeling; antenna impedance matching; metasurfaces; inverse scattering and imaging; MIMO communications; frequency reconfigurable antennas; RCS; electromagnetic wave ...


Chip Package Interaction: An Experiment Study on White Bump Mitigation Using Flat Laminates

Yi Pan; Jeffrey A. Zitz; David L. Questad; Kamal K. Sikka 2014 IEEE 64th Electronic Components and Technology Conference (ECTC), 2014

Chip-Package Interaction (CPI) related failure risk has increased in organic laminate-based electronic packages fueled in part by certain industry- segments' requirements for larger silicon die size and signal performance. CPI-related stresses increase directly with radial distance from the center of the die, known as distance from the neutral-point (DNP). The resulting risk of local delamination (White Bumps, WBs) in the ...


More Xplore Articles

Educational Resources on Metrology

Back to Top

eLearning

A flat spectral photon flux source for single photon detector quantum efficiency calibration

Haiyong Gan; Ruoduan Sun; Nan Xu; Jianwei Li; Yanfei Wang; Guojin Feng; Chundi Zheng; Chong Ma; Yandong Lin 2015 11th Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2015

A flat spectral photon flux source is proposed to facilitate the single photon detector quantum efficiency calibration in an extended wavelength range (400-800nm). The absolute quantum efficiency at certain wavelengths (e.g. 633nm and 807nm) of the photon counter under test can be measured via correlated photons method and used to evaluate the photon statistics of the flat spectral photon flux ...


Lessons learned from designing and manufacturing of the coil support structure of W7-X

Didier Chauvin; Torsten Koppe; Antonio Cardella; Bernd Missal; Dirk Pilopp; Giovanni Di Bartolo; Rocio Camín; Ivan Gonzales; Luca Giordano; Stefano Langone 2011 IEEE/NPSS 24th Symposium on Fusion Engineering, 2011

Wendelstein 7-X (W7-X) is a fully optimised low-shear stellarator and shall demonstrate the reactor potential of this fusion plant. It is presently under construction at the Greifswald branch institute of IPP. The W7-X coil system consists of 20 planar and 50 non planar coils. They are supported by a pentagonal 10 m diameter, 2.5 m high called coil support structure ...


The optimized probe light frequency detuning for Faraday-rotation cesium atomic magnetometer

Wenhao Li; Pingwei Lin; Xiang Peng; Hong Guo 2014 Conference on Lasers and Electro-Optics (CLEO) - Laser Science to Photonic Applications, 2014

We experimentally demonstrate that the sensitivity of all-optical Faraday- rotation magnetometer can be improved by tuning probe light frequency to the edge of wings of Doppler profile with cesium atoms, which coincides with the theoretical analysis.


Table of contents

2013 IEEE Antennas and Propagation Society International Symposium (APSURSI), 2013

The following topics are dealt with: UWB antennas; wireless sensor networks; healthcare; time-domain techniques; guided wave antennas; slotted wave antennas; well-conditioned integral equation formulations; EBG theory; phased array antennas; nanoantennas; planar antennas; printed antennas; MIMO antennas; mobile devices; pattern reconfigurable antennas; propagation channel modeling; antenna impedance matching; metasurfaces; inverse scattering and imaging; MIMO communications; frequency reconfigurable antennas; RCS; electromagnetic wave ...


Chip Package Interaction: An Experiment Study on White Bump Mitigation Using Flat Laminates

Yi Pan; Jeffrey A. Zitz; David L. Questad; Kamal K. Sikka 2014 IEEE 64th Electronic Components and Technology Conference (ECTC), 2014

Chip-Package Interaction (CPI) related failure risk has increased in organic laminate-based electronic packages fueled in part by certain industry- segments' requirements for larger silicon die size and signal performance. CPI-related stresses increase directly with radial distance from the center of the die, known as distance from the neutral-point (DNP). The resulting risk of local delamination (White Bumps, WBs) in the ...


More eLearning Resources

IEEE-USA E-Books

  • About the Author

    "Joseph F. Keithley, a modern pioneer of instrumentation, brings you a fascinating history of electrical measurement from the ancient Greeks to the inventors of the early twentieth century. Written in a direct and fluent style, the book illuminates the lives of the most significant inventors in the field, including George Simon Ohm, Andre Marie Ampere, and Jean Baptiste Fourier. Chapter by chapter, meet the inventors in their youth and discover the origins of their lifelong pursuits of electrical measurement. Not only will you find highlights of important technological contributions, you will also learn about the tribulations and excitement that accompany the discoveries of these early masters. Included are nearly 100 rare photographs from museums around the world. THE STORY OF ELECTRICAL AND MAGNETIC MEASUREMENTS is a ""must read"" for students and practitioners of physics, electrical engineering, and instrumentation and metrology who want to understand the history behind modern day instruments." Sponsored by: IEEE Instrumentation and Measurement Society

  • Convertibility across Measurement Methods

    This chapter contains sections titled: Introduction Overview of Previous Convertibility Studies A Convertibility Study of an Industry Dataset FP to Cosmic Convertibility: Issues and Discussion

  • Part Introduction

    No abstract.

  • Use Case Points: Analysis of Their Design

    This chapter contains sections titled: Introduction Use Case Points Description Analysis of the UCP Design The Modeling of Relationships of UCP with Project Effort Summary

  • Introduction

    This chapter contains sections titled: Introduction Software Measurement: Is it Mature or Not? Software Measurement as a New Technology The Designs of Software Measures must be Verified Advanced Readings: How much Measurement Support is Recognized within the Software Engineering Body of Knowledge (Swebok)?

  • Design of Standard Etalons: The next Frontier in Software Measurement

    This chapter contains sections titled: Introduction - Measurement Standard Etalon Calibration and Testing: Reference Material and Uncertainty Related Work in Software Measurement A (Draft) Methodology to Design an FSM Standard Etalon Discussion Advanced Readings: The Development of an (Initial) Draft of a Measurement Standard Etalon for Cosmic

  • Commission E: Electromagnetic Noise and Interference

    "The purpose of this book is to further communication and understanding of the status and future of radio science, both for those working in the field, and for those who want to know what is of current importance in this area. The International Union of Radio Science, URSI (Union Radio-Scientifique Internationale), has divided the subject of ""Radio Science"" according to the ten topics of the Commissions that make up URSI: * Electromagnetic metrology * Fields and waves * Signals and systems * Electronics and photonics * Radio astronomy * Electromagnetic noise and interference * Wave propagation and remote sensing * Ionospheric radio and propagation * Waves in plasmas * Electromagnetics in biology and medicine This book consists of 37 original, peer-reviewed papers. The topics, authors, and reviewers were selected by the URSI Commissions. Each paper provides a critical, in-depth review of and, in many cases, tutorial on advances and research that have been of significant importance within the area of interest of the Commissions during the past three to four years. Among the 37 topics covered are the following: * Two-way satellite time and frequency transfer * Handset antennas for mobile communications * Wireless ATM networks * Ultra-high-bit-rate optical communication systems * Modeling techniques for EMC analysis * Mobile, terrestrial, and satellite propagation modeling * GPS and the ionosphere * Radio-frequency sounders in space * The early radio universe * Exposure assessment for handheld mobile communications devices A ""Collected References"" CD-ROM is an integral part of this book, intended to permit a reader to install the bibliographic database on a personal computer or workstation, so that it can be searched as needed. Independently of the papers in the boo k, the CD-ROM contains key references on the topics each Commission has deemed to be most significant during the triennium. The full titles are included in the references, and they are augmented by keywords including the country of origin for the work, to facilitate searching for the most important references on a particular topic."

  • Cyclomatic Complexity Number: Analysis of Its Design

    This chapter contains sections titled: Introduction The Cyclomatic Number in Graph Theory The Cyclomatic Number for Software Other Design Issues: The Entity and Attritube Measured Advanced Readings: Lack of Consensus on Complexity in Software

  • ISO 9126: Analysis of Quality Models and Measures

    This chapter contains sections titled: Introduction to ISO 9126 Analysis Models of ISO 9126: The (Quantitative) Models The Metrology-Related Part of ISO 9126: Base and Derived Measures Analysis of Derived Measures The Missing Links: From Metrology to Quantitative Analysis Outstanding Measurement Design Issues: Improvement Strategy Advanced Readings 1: Analysis of the Design of the Productivity Measure in ISO 9126 Advanced Readings 2: Attributes and Related Base Measures within ISO 9126

  • From Measurement Methods to Quantitative Models: A Measurement Context Model

    This chapter contains sections titled: Introduction: Numbers, Measures, and Quantitative Models Measurement Context Model How to Design a Measurement Method Application of a Measurement Method Exploitation of Measurement Results in Quantitative Models Validation or Verification? Advanced Readings : Analysis of the ISO Requirements for the Designs of Functional Size Measurement Methods



Standards related to Metrology

Back to Top

IEEE Guide for Measurement of Environmental Sensitivities of Standard Frequency Generators

This project is a revision of the existing guide for measurements of environmental sensitivities of standard frequency generators. It includes effects and metrology of acceleration; temperature, humidity, and pressure; electrical and magnetic fields; ionizing and particle radiation; and aging, warm-up time and retrace.


IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities