Metrology

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This article is about the science of measurement. (Wikipedia.org)






Conferences related to Metrology

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2019 20th International Conference on Solid-State Sensors, Actuators and Microsystems & Eurosensors XXXIII (TRANSDUCERS & EUROSENSORS XXXIII)

The world's premiere conference in MEMS sensors, actuators and integrated micro and nano systems welcomes you to attend this four-day event showcasing major technological, scientific and commercial breakthroughs in mechanical, optical, chemical and biological devices and systems using micro and nanotechnology.The major areas of activity in the development of Transducers solicited and expected at this conference include but are not limited to: Bio, Medical, Chemical, and Micro Total Analysis Systems Fabrication and Packaging Mechanical and Physical Sensors Materials and Characterization Design, Simulation and Theory Actuators Optical MEMS RF MEMS Nanotechnology Energy and Power


2018 11th Global Symposium on Millimeter Waves (GSMM)

The main theme of the GSMM2018 is Millimeter-wave Propagation: Hardware, Measurements and Systems. It covers millimeter-wave and THz devices, circuits, systems, and applications, with a special focus on mmWave propagation. The conference will include keynote talks, technical sessions, panels, and exhibitions on the listed topics.

  • 2017 10th Global Symposium on Millimeter-Waves (GSMM)

    The main theme of the symposium is Millimeter-Wave and Terahertz Sensing and Communications. It covers millimeter- wave and THz antennas, circuits, devices, systems and applications.

  • 2016 Global Symposium on Millimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications

    The main theme of the conference is millimeter-wave and terahertz sensing and communications and the conference covers different topics related to millimeter-wave and terahertz technologies, such as: antennas and propagation, passive and active devices, radio astronomy, earth observation and remote sensing, communications, wireless power transfer, integration and packaging, photonic systems, and emerging technologies.

  • 2015 Global Symposium On Millimeter Waves (GSMM)

    The main theme of the GSMM 2015 is “Future Millimeter-wave and Terahertz Wireless and Wireline”. It will cover all emerging and future millimeter wave and terahertz software and hardware aspects ranging from communicating devices, circuits, systems and applications to passive and active sensing and imaging technologies and applications. The GSMM 2015 will feature world-class keynote speeches, technical sessions, panel discussions and industrial exhibitions in the following (but not limited to) topics listed below.In addition to the regular program, the GSMM 2015 will organize a unique industrial forum for presenting and discussing future wireless technologies and trends including 5G and Terahertz Wireless Systems.

  • 2012 5th Global Symposium on Millimeter Waves (GSMM 2012)

    The aim of the conferences is to bring together people involved in research and development of millimeter-wave components, equipment and systems, and to explore common areas.

  • 2009 Global Symposium On Millimeter Waves (GSMM 2009)

    The GSMM2009 will be held in Sendai, Japan from April 20 to April 22, 2009. The GSMM2009 is the second international conference in its name after the three conferences of TSMMW, MINT-MIS, and MilliLab Workshop on Millimeter-wave Technology and Applications were integrated into GSMM (Global Symposium on Millimeter Waves) in 2007. The main theme of the GSMM2009 is "Millimeter Wave Communications at Hand" and it will focus on millimeter wave devices and systems to realize Giga-bit wireless applications. The

  • 2008 Global Symposium On Millimeter Waves (GSMM 2008)

    Frequency Management and Utilization, Millimeter-Wave Communication Systems, Devices and Circuit Technologies, Wireless Access Systems, Mobile Access Systems, Satellite Communications, LANs and PANs, Home Link Systems, Photonics, Antennas and Propagation, Phased Array Antennas, Signal Processing, Wearable Devices and Systems, Automotive Radars and Remote Sensing, Supporting and Related Technologies


2018 48th European Microwave Conference (EuMC)

The Premier European event for the disemination of knowledge about Microwave Technology.The event caters for the seasoned industrial engineer as well as the graduate student. Sessionsand workshops are held on the full range of microwave technology from field theory, throughcomponents and subsystems to systems.

  • 2017 47th European Microwave Conference (EuMC)

    The Premier European event for the disemination of knowledge about Microwave Technology.The event caters for the seasoned industrial engineer as well as the graduate student. Sessions and workshops are held on the full range of microwave technology from field theory, through components and subsystems to systems.

  • 2016 46th European Microwave Conference (EuMC)

    The Premier European event for the disemination of knowledge about Microwave Technology. The event caters for the seasoned industrial engineer as well as the graduate student. Sessions and workshops are held on the full range of microwave technology from field theory, through components and subsystems to systems.

  • 2015 European Microwave Conference (EuMC 2015)

    The 45th European Microwave Conference (EuMC) represents the main event in the European Microwave Week 2015, the largest event in Europe dedicated to microwave components, systems and technology. It is the premier event to present the current status and future trends in the field of microwave, millimeter-wave and terahertz systems and technologies. A broad range of high frequency related topics, from materials and technologies to integrated circuits, systems and applications will be addressed in all their aspects: theory, simulation, design and measurement.The European Microwave Conference provides many opportunities of networking and interaction with international experts in a wide variety of specialties, attracting delegates with academic as well as industrial backgrounds. In addition to scientific papers, contributions on industrial applications are also encouraged, covering the fields of instrumentation, medical, telecommunication, radar, space, automotive and defense systems.

  • 2014 44th European Microwave Conference (EuMC)

    EuMC is the premier European conference in the microwave field, which represent the ideal venue for prospective authors to present the status and trends in microwave and millimetre-wave systems and frequency related topics, from materials and technologies to integrated circuits, systems their aspects: theory, simulation, design and measurement including passive components, design of high frequency and high data rate photonics, highly stable and noiseless microwave wave sources, new linearisation techniques and the impact of new packaging technologies.

  • 2013 European Microwave Conference (EuMC)

    Status and trends in microwave and millimetre -wave systems and technologies. High-frequency related topics, from materials and technologies to integrated circuits, systems and applications in alltheir aspects: theory, simulation, design and measurement including passive components, modelling and design of high frequency and high data rate photonics, highly stable and noiseless microwave and millimetre-wave sources, new linearisation techniques and the impact of new packaging technologies on development

  • 2012 European Microwave Conference (EuMC)

    Microwave and millimeter wave: active/passive devices, antennas, electromagnetics, bio-interaction, circuits, manufacturing and measurement, MEMS, meta-materials, sensor networks, cognitive radio, 4G communications, space technology and applications.

  • 2011 European Microwave Conference (EuMC)

    Status and trends in microwave and millimetre-wave systems and technologies. High-frequency related topics, from materials and technologies to integrated circuits, systems and applications in all their aspects: theory, simulation, design and measurement including passive components, modelling and design of high frequency and high data rate photonics, highly stable and noiseless microwave and millimetre-wave sources, new linearisation techniques and the impact of new packaging technologies on development app

  • 2010 European Microwave Conference (EuMC)

    The European Microwave Conference is the premier forum for presentation of the present status and future trends in the field of microwave, millimetre- and submillimetre-wave systems and technologies.

  • 2009 European Microwave Conference (EuMC)

    The 39th European Microwave Conference (EuMC), is the core of the European Microwave Week 2009, the largest event in Europe dedicated to microwave electronics. It is the premier forum to present the actual status and future trends in the field of materials and technologies to integrated circuits, systems and applications will be addressed in all their aspects: theory, simulation, design and measurement.

  • 2008 European Microwave Conference (EuMC)

    The 38th European Microwave Conference (EuMC) in Amsterdam, The Netherlands, from 27 to 31 October, is the core of the European Microwave Week 2008, the largest event in Europe dedicated to microwave electronics. It is the premier forum to present the actual status and future trends in the field of materials and technologies to integrated circuits, systems and applications will be addressed in all their aspects: theory, simulation, design and measurement.

  • 2007 European Microwave Conference (EuMC)

    Status and trends in microwave and millimetre-wave systems and technologies. High-frequency related topics, from materials and technologies to integrated circuits, systems and applications in all their aspects: theory, simulation, design and measurement including passive components, modelling and design of high frequency and high data rate photonics, highly stable and noiseless microwave and millimetre-wave sources, new linearisation techniques and the impact of new packaging.

  • 2006 European Microwave Conference (EuMC)

  • 2005 European Microwave Conference (EuMC)

  • 2004 European Microwave Conference (EuMC)

  • 2003 European Microwave Conference (EuMC)

  • 1998 28th European Microwave Conference (EuMC)

  • 1997 27th European Microwave Conference (EuMC)


2018 Conference on Precision Electromagnetic Measurements (CPEM 2018)

CPEM is the most important scientific and technological conference in the domain of electromagnetic measurements at the highest accuracy levels. This conference covers the frequency range from DC to the optical region.2018 is expected to be a watershed year in the history of the international system of units (SI), with the adoption of the new definitions for the kilogram, the ampere, the kelvin and the mole. All the SI units will then be based on a set of seven defining constants. CPEM 2018 will provide a privileged opportunity to mark this milestone of the SI through a natural focus on quantum devices that relate electrical measurement standards to fundamental constants of physics. CPEM 2018 will also be the place to share knowledge on research in electromagnetic metrology focused on present and future challenges regarding industry and society in sectors such as Energy, ICT, quantum engineering, Industry 4.0, etc.


2018 European Conference on Antennas and Propagation (EuCAP)

Antennas & related topics e.g. theoretical methods, systems, wideband, multiband, UWBPropagation & related topics e.g. modelling/simulation, HF, body-area, urbanAntenna & RCS measurement techniques


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Periodicals related to Metrology

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Advanced Packaging, IEEE Transactions on

The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.


Aerospace and Electronic Systems Magazine, IEEE

The IEEE Aerospace and Electronic Systems Magazine publishes articles concerned with the various aspects of systems for space, air, ocean, or ground environments.


Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Antennas and Wireless Propagation Letters, IEEE

IEEE Antennas and Wireless Propagation Letters (AWP Letters) will be devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


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Xplore Articles related to Metrology

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Development of the Virtual Metrology for the Nitride Thickness in Multi-Layer Plasma-Enhanced Chemical Vapor Deposition Using Plasma-Information Variables

[{u'author_order': 1, u'affiliation': u'Department of Energy Systems Engineering, Seoul National University, Seoul, 08826, Republic of Korea.', u'full_name': u'Hyun-Joon Roh'}, {u'author_order': 2, u'affiliation': u'Department of Energy Systems Engineering, Seoul National University, Seoul, 08826, Republic of Korea.', u'full_name': u'Sangwon Ryu'}, {u'author_order': 3, u'affiliation': u'Department of Energy Systems Engineering, Seoul National University, Seoul, 08826, Republic of Korea.', u'full_name': u'Yunchang Jang'}, {u'author_order': 4, u'affiliation': u'Department of Energy Systems Engineering, Seoul National University, Seoul, 08826, Republic of Korea.', u'full_name': u'Nam-Kyun Kim'}, {u'author_order': 5, u'affiliation': u'Department of Energy Systems Engineering, Seoul National University, Seoul, 08826, Republic of Korea.', u'full_name': u'Younggil Jin'}, {u'author_order': 6, u'affiliation': u'Samsung Display Co., Ltd, Asan, 31454, Republic of Korea.', u'full_name': u'Seolhye Park'}, {u'author_order': 7, u'affiliation': u'Department of Energy Systems Engineering, Seoul National University, Seoul, 08826, Republic of Korea.', u'full_name': u'Gon-Ho Kim'}] IEEE Transactions on Semiconductor Manufacturing, None

A phenomenological-based virtual metrology (VM) technique is developed for predicting the silicon nitride film thickness in multi-layer plasma-enhanced chemical vapor deposition (PECVD). Particularly, the analysis of optical emission spectroscopy (OES) based on the excitation kinetics of nitrogen plasma is used to develop novel variables, named plasma-information (PI) variables. One variable, PIWall, is determined by analyzing the light transmittances of the ...


Timing jitter of the dual-comb mode-locked laser: a quantum origin and the ultimate effect on high speed time/frequency domain metrology

[{u'author_order': 1, u'affiliation': u'Tianjin University, Tianjin China (e-mail: shihaosen@tju.edu.cn)', u'full_name': u'Haosen Shi'}, {u'author_order': 2, u'affiliation': u'Instruments and Optoelectronics Engineering, Ulltrafast laser lab, College of Precision, Tianjin, Tianjin China (e-mail: yjsong@tju.edu.cn)', u'full_name': u'Youjian Song'}, {u'author_order': 3, u'affiliation': u'School of Electronic and Information Engineering, Beihang University, Beijing China (e-mail: litingshd@163.com)', u'full_name': u'Ting Li'}, {u'author_order': 4, u'affiliation': u'School of Precision Instruments & Optoelectronics Engineering, Tianjin University, Tianjin, Tianjin China (e-mail: chywang@tju.edu.cn)', u'full_name': u'Chingyue Wang'}, {u'author_order': 5, u'affiliation': u'Beihang University, China (e-mail: zhaoxin127@163.com)', u'full_name': u'Xin Zhao'}, {u'author_order': 6, u'affiliation': u'School of Electronic and Information Engineering, Beihang University, Beijing, Beijing China 100083 (e-mail: zhengzheng@buaa.edu.cn)', u'full_name': u'Zheng Zheng'}, {u'author_order': 7, u'affiliation': u'College of Precision Instrument and Optoelectronics Engineering, Ultrafast Laser Lab, Tianjin, Tianjin China 300072 (e-mail: huminglie@tju.edu.cn)', u'full_name': u'Minglie Hu'}] IEEE Journal of Selected Topics in Quantum Electronics, None

We study on the timing jitter characteristics of a passively mode-locked dual- wavelength dual-comb Er-fiber laser that generates two femtosecond optical frequency combs with an offset repetition rate in a shared cavity. The relative timing jitter is characterized directly in time domain with tens of attoseconds precision by utilizing the intrinsic asynchronous optical sampling process between the two laser beams. ...


Design of metrology equipment running management system based on the internet of things technology

[{u'author_order': 1, u'affiliation': u'Unit 92493 of PLA, Huludao 125000, China', u'full_name': u'Bai Xu'}] 2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI), None

With the development of measuring technology to high, precise and pointed, the measurement standard and measuring equipment used for the technical performance of calibration/calibration equipment are also increasing day by day. The price of instruments is also getting higher and higher, and traditional metrological standard equipment management methods and management methods cannot meet the actual demand of metering management. Therefore, ...


A practical yield prediction approach using inline defect metrology data for system-on-chip integrated circuits

[{u'author_order': 1, u'affiliation': u'College of Control Science and Engineering, Zhejiang University', u'full_name': u'Yuting Kong'}, {u'author_order': 2, u'affiliation': u'College of Control Science and Engineering, Zhejiang University', u'full_name': u'Dong Ni'}] 2017 13th IEEE Conference on Automation Science and Engineering (CASE), None

Integrated circuit (IC) yield prediction which focuses on modelling the IC yield characteristics using manufacturing data is an extremely critical task to pursue, this is because it directly impacts the decision making process to improve manufacturing quality, reliability and reduce cost. In this work, we propose a practical yield prediction approach for system-on-chip (SoC) ICs. To achieve finer granularity in ...


Automatic Virtual Metrology and Deformation Fusion Scheme for Engine-Case Manufacturing

[{u'author_order': 1, u'affiliation': u'Institute of Manufacturing Information and Systems, National Cheng Kung University, Tainan, Taiwan', u'full_name': u'Hao Tieng'}, {u'author_order': 2, u'affiliation': u'Institute of Manufacturing Information and Systems, National Cheng Kung University, Tainan, Taiwan', u'full_name': u'Tsung-Han Tsai'}, {u'author_order': 3, u'affiliation': u'Institute of Manufacturing Information and Systems, National Cheng Kung University, Tainan, Taiwan', u'full_name': u'Chun-Fang Chen'}, {u'author_order': 4, u'affiliation': u'Institute of Electrical Engineering, National Kaohsiung First University of Science and Technology, Kaohsiung, Taiwan', u'full_name': u'Haw-Ching Yang'}, {u'author_order': 5, u'affiliation': u'Institute of Manufacturing Information and Systems, National Cheng Kung University, Tainan, Taiwan', u'full_name': u'Jhih-Wei Huang'}, {u'author_order': 6, u'affiliation': u'Institute of Manufacturing Information and Systems, National Cheng Kung University, Tainan, Taiwan', u'full_name': u'Fan-Tien Cheng'}] IEEE Robotics and Automation Letters, 2018

Industry 4.0 paves the way to smart factory through integrating Internet of Things, cyber-physical systems, cloud manufacturing, and big data analytics for various industrial fields. Especially, the machinery industry significantly benefits from these automation techniques in machine-tool quality inspection, cutting-tool remaining-useful-life, surface roughness prediction, etc. However, these innovation technologies are still not executable in the aerospace-component production due to their ...


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Standards related to Metrology

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IEEE Guide for Measurement of Environmental Sensitivities of Standard Frequency Generators

This project is a revision of the existing guide for measurements of environmental sensitivities of standard frequency generators. It includes effects and metrology of acceleration; temperature, humidity, and pressure; electrical and magnetic fields; ionizing and particle radiation; and aging, warm-up time and retrace.


IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities



Jobs related to Metrology

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