Metrology

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This article is about the science of measurement. (Wikipedia.org)






Conferences related to Metrology

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2019 20th International Conference on Solid-State Sensors, Actuators and Microsystems & Eurosensors XXXIII (TRANSDUCERS & EUROSENSORS XXXIII)

The world's premiere conference in MEMS sensors, actuators and integrated micro and nano systems welcomes you to attend this four-day event showcasing major technological, scientific and commercial breakthroughs in mechanical, optical, chemical and biological devices and systems using micro and nanotechnology.The major areas of activity in the development of Transducers solicited and expected at this conference include but are not limited to: Bio, Medical, Chemical, and Micro Total Analysis Systems Fabrication and Packaging Mechanical and Physical Sensors Materials and Characterization Design, Simulation and Theory Actuators Optical MEMS RF MEMS Nanotechnology Energy and Power


2018 11th Global Symposium on Millimeter Waves (GSMM)

The main theme of the GSMM2018 is Millimeter-wave Propagation: Hardware, Measurements and Systems. It covers millimeter-wave and THz devices, circuits, systems, and applications, with a special focus on mmWave propagation. The conference will include keynote talks, technical sessions, panels, and exhibitions on the listed topics.

  • 2017 10th Global Symposium on Millimeter-Waves (GSMM)

    The main theme of the symposium is Millimeter-Wave and Terahertz Sensing and Communications. It covers millimeter- wave and THz antennas, circuits, devices, systems and applications.

  • 2016 Global Symposium on Millimeter Waves (GSMM) & ESA Workshop on Millimetre-Wave Technology and Applications

    The main theme of the conference is millimeter-wave and terahertz sensing and communications and the conference covers different topics related to millimeter-wave and terahertz technologies, such as: antennas and propagation, passive and active devices, radio astronomy, earth observation and remote sensing, communications, wireless power transfer, integration and packaging, photonic systems, and emerging technologies.

  • 2015 Global Symposium On Millimeter Waves (GSMM)

    The main theme of the GSMM 2015 is “Future Millimeter-wave and Terahertz Wireless and Wireline”. It will cover all emerging and future millimeter wave and terahertz software and hardware aspects ranging from communicating devices, circuits, systems and applications to passive and active sensing and imaging technologies and applications. The GSMM 2015 will feature world-class keynote speeches, technical sessions, panel discussions and industrial exhibitions in the following (but not limited to) topics listed below.In addition to the regular program, the GSMM 2015 will organize a unique industrial forum for presenting and discussing future wireless technologies and trends including 5G and Terahertz Wireless Systems.

  • 2012 5th Global Symposium on Millimeter Waves (GSMM 2012)

    The aim of the conferences is to bring together people involved in research and development of millimeter-wave components, equipment and systems, and to explore common areas.

  • 2009 Global Symposium On Millimeter Waves (GSMM 2009)

    The GSMM2009 will be held in Sendai, Japan from April 20 to April 22, 2009. The GSMM2009 is the second international conference in its name after the three conferences of TSMMW, MINT-MIS, and MilliLab Workshop on Millimeter-wave Technology and Applications were integrated into GSMM (Global Symposium on Millimeter Waves) in 2007. The main theme of the GSMM2009 is "Millimeter Wave Communications at Hand" and it will focus on millimeter wave devices and systems to realize Giga-bit wireless applications. The

  • 2008 Global Symposium On Millimeter Waves (GSMM 2008)

    Frequency Management and Utilization, Millimeter-Wave Communication Systems, Devices and Circuit Technologies, Wireless Access Systems, Mobile Access Systems, Satellite Communications, LANs and PANs, Home Link Systems, Photonics, Antennas and Propagation, Phased Array Antennas, Signal Processing, Wearable Devices and Systems, Automotive Radars and Remote Sensing, Supporting and Related Technologies


2018 48th European Microwave Conference (EuMC)

The Premier European event for the disemination of knowledge about Microwave Technology.The event caters for the seasoned industrial engineer as well as the graduate student. Sessionsand workshops are held on the full range of microwave technology from field theory, throughcomponents and subsystems to systems.

  • 2017 47th European Microwave Conference (EuMC)

    The Premier European event for the disemination of knowledge about Microwave Technology.The event caters for the seasoned industrial engineer as well as the graduate student. Sessions and workshops are held on the full range of microwave technology from field theory, through components and subsystems to systems.

  • 2016 46th European Microwave Conference (EuMC)

    The Premier European event for the disemination of knowledge about Microwave Technology. The event caters for the seasoned industrial engineer as well as the graduate student. Sessions and workshops are held on the full range of microwave technology from field theory, through components and subsystems to systems.

  • 2015 European Microwave Conference (EuMC 2015)

    The 45th European Microwave Conference (EuMC) represents the main event in the European Microwave Week 2015, the largest event in Europe dedicated to microwave components, systems and technology. It is the premier event to present the current status and future trends in the field of microwave, millimeter-wave and terahertz systems and technologies. A broad range of high frequency related topics, from materials and technologies to integrated circuits, systems and applications will be addressed in all their aspects: theory, simulation, design and measurement.The European Microwave Conference provides many opportunities of networking and interaction with international experts in a wide variety of specialties, attracting delegates with academic as well as industrial backgrounds. In addition to scientific papers, contributions on industrial applications are also encouraged, covering the fields of instrumentation, medical, telecommunication, radar, space, automotive and defense systems.

  • 2014 44th European Microwave Conference (EuMC)

    EuMC is the premier European conference in the microwave field, which represent the ideal venue for prospective authors to present the status and trends in microwave and millimetre-wave systems and frequency related topics, from materials and technologies to integrated circuits, systems their aspects: theory, simulation, design and measurement including passive components, design of high frequency and high data rate photonics, highly stable and noiseless microwave wave sources, new linearisation techniques and the impact of new packaging technologies.

  • 2013 European Microwave Conference (EuMC)

    Status and trends in microwave and millimetre -wave systems and technologies. High-frequency related topics, from materials and technologies to integrated circuits, systems and applications in alltheir aspects: theory, simulation, design and measurement including passive components, modelling and design of high frequency and high data rate photonics, highly stable and noiseless microwave and millimetre-wave sources, new linearisation techniques and the impact of new packaging technologies on development

  • 2012 European Microwave Conference (EuMC)

    Microwave and millimeter wave: active/passive devices, antennas, electromagnetics, bio-interaction, circuits, manufacturing and measurement, MEMS, meta-materials, sensor networks, cognitive radio, 4G communications, space technology and applications.

  • 2011 European Microwave Conference (EuMC)

    Status and trends in microwave and millimetre-wave systems and technologies. High-frequency related topics, from materials and technologies to integrated circuits, systems and applications in all their aspects: theory, simulation, design and measurement including passive components, modelling and design of high frequency and high data rate photonics, highly stable and noiseless microwave and millimetre-wave sources, new linearisation techniques and the impact of new packaging technologies on development app

  • 2010 European Microwave Conference (EuMC)

    The European Microwave Conference is the premier forum for presentation of the present status and future trends in the field of microwave, millimetre- and submillimetre-wave systems and technologies.

  • 2009 European Microwave Conference (EuMC)

    The 39th European Microwave Conference (EuMC), is the core of the European Microwave Week 2009, the largest event in Europe dedicated to microwave electronics. It is the premier forum to present the actual status and future trends in the field of materials and technologies to integrated circuits, systems and applications will be addressed in all their aspects: theory, simulation, design and measurement.

  • 2008 European Microwave Conference (EuMC)

    The 38th European Microwave Conference (EuMC) in Amsterdam, The Netherlands, from 27 to 31 October, is the core of the European Microwave Week 2008, the largest event in Europe dedicated to microwave electronics. It is the premier forum to present the actual status and future trends in the field of materials and technologies to integrated circuits, systems and applications will be addressed in all their aspects: theory, simulation, design and measurement.

  • 2007 European Microwave Conference (EuMC)

    Status and trends in microwave and millimetre-wave systems and technologies. High-frequency related topics, from materials and technologies to integrated circuits, systems and applications in all their aspects: theory, simulation, design and measurement including passive components, modelling and design of high frequency and high data rate photonics, highly stable and noiseless microwave and millimetre-wave sources, new linearisation techniques and the impact of new packaging.

  • 2006 European Microwave Conference (EuMC)

  • 2005 European Microwave Conference (EuMC)

  • 2004 European Microwave Conference (EuMC)

  • 2003 European Microwave Conference (EuMC)

  • 1998 28th European Microwave Conference (EuMC)

  • 1997 27th European Microwave Conference (EuMC)


2018 Conference on Precision Electromagnetic Measurements (CPEM 2018)

CPEM is the most important scientific and technological conference in the domain of electromagnetic measurements at the highest accuracy levels. This conference covers the frequency range from DC to the optical region.2018 is expected to be a watershed year in the history of the international system of units (SI), with the adoption of the new definitions for the kilogram, the ampere, the kelvin and the mole. All the SI units will then be based on a set of seven defining constants. CPEM 2018 will provide a privileged opportunity to mark this milestone of the SI through a natural focus on quantum devices that relate electrical measurement standards to fundamental constants of physics. CPEM 2018 will also be the place to share knowledge on research in electromagnetic metrology focused on present and future challenges regarding industry and society in sectors such as Energy, ICT, quantum engineering, Industry 4.0, etc.


2018 European Conference on Antennas and Propagation (EuCAP)

Antennas & related topics e.g. theoretical methods, systems, wideband, multiband, UWBPropagation & related topics e.g. modelling/simulation, HF, body-area, urbanAntenna & RCS measurement techniques


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Periodicals related to Metrology

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Advanced Packaging, IEEE Transactions on

The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.


Aerospace and Electronic Systems Magazine, IEEE

The IEEE Aerospace and Electronic Systems Magazine publishes articles concerned with the various aspects of systems for space, air, ocean, or ground environments.


Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Antennas and Wireless Propagation Letters, IEEE

IEEE Antennas and Wireless Propagation Letters (AWP Letters) will be devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


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Most published Xplore authors for Metrology

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Xplore Articles related to Metrology

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Known void size micro-bump, a novel standard of 3D X-ray computed tomography in-line metrology for accuracy assessment and monitoring

[{u'author_order': 1, u'affiliation': u'Data Center Group, Intel Corporation, Chandler, AZ, USA', u'full_name': u'Lay Wai Kong'}, {u'author_order': 2, u'affiliation': u'Tecnology Manufacturing Group, Intel Corporation, Chandler, AZ, USA', u'full_name': u'Osborne A. Martin'}] 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), None

Three dimensional (3D) X-ray Computed Tomography (XCT) is used as an in-line metrology for silicon die and substrate packages to detect and quantify voids in micro bumps. Long term health monitoring of the 3D-XCT is important to ensure tool performance. The best means for evaluating tool performance is having a standard unit with a known void size embedded in micro ...


Secure cloud computing: Continuous anomaly detection approach in legal metrology

[{u'author_order': 1, u'affiliation': u'Department 8.5 Metrological IT, Physikalisch-Technische Bundesanstalt (PTB), Berlin, Germany', u'full_name': u'Alexander Oppermann'}, {u'author_order': 2, u'affiliation': u'Department 8.5 Metrological IT, Physikalisch-Technische Bundesanstalt (PTB), Berlin, Germany', u'full_name': u'Federico Grasso Toro'}, {u'author_order': 3, u'affiliation': u'Department 8.5 Metrological IT, Physikalisch-Technische Bundesanstalt (PTB), Berlin, Germany', u'full_name': u'Florian Thiel'}, {u'author_order': 4, u'affiliation': u'Security in Telecommunications, Technische Universitat Berlin, Berlin, Germany', u'full_name': u'Jean-Pierre Seifert'}] 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), None

In the field of Legal Metrology, it shall be assured that all measurements are carried out by a trusted computer system. Securing Computer Systems, especially in a distributed environment can be a challenging task to comply, since, in such an environment, a measurement instrument cannot be simply disconnected to guarantee its security. Following the approach of continuous monitoring to derive ...


Blockchain applications for legal metrology

[{u'author_order': 1, u'affiliation': u'Physikalisch-Technische Bundesanstalt, Germany', u'full_name': u'Daniel Peters'}, {u'author_order': 2, u'affiliation': u'Physikalisch-Technische Bundesanstalt, Germany', u'full_name': u'Jan Wetzlich'}, {u'author_order': 3, u'affiliation': u'Physikalisch-Technische Bundesanstalt, Germany', u'full_name': u'Florian Thiel'}, {u'author_order': 4, u'affiliation': u'Security in Telecommunications, Technische Universität Berlin, Germany', u'full_name': u'Jean-Pierre Seifert'}] 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), None

Blockchain technology has become a promising approach in many domains. It first came up with the cryptocurrency Bitcoin, where it is used to maintain a distributed ledger, a public list of all transactions. It is assumed that the use of a blockchain as a cryptocurrency, or in general for financial services, was just the first stage, called Phase 1.0. The ...


A spatial moments sub-pixel edge detector with edge blur compensation for imaging metrology

[{u'author_order': 1, u'affiliation': u'Institute of Parallel and Distributed Systems / Graduate School of Excellence advanced Manufacturing Engineering, Nobelstr. 12, D-70569 Stuttgart, Germany', u'full_name': u'D. Gester'}, {u'author_order': 2, u'affiliation': u'Institute of Parallel and Distributed Systems, University of Stuttgart, Universitätsstr. 38, D-70569 Stuttgart, Germany', u'full_name': u'S. Simon'}] 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), None

In contactless metrology sub-pixel edge detectors allow for high precision dimensional measurements of lengths and positions of objects. Several classes of detectors exist with various assumptions about the edge model and different requirements on computational resources. Moment-based detectors are fast to compute and offer potential for parallelisation. However, being based on a step-edge model, moment based detectors often introduce systematic ...


A review of the six-port technique for metrology applications

[{u'author_order': 1, u'affiliation': u'SEGULA Engineering France, Valenciennes, France', u'full_name': u'Simon Lallemand'}, {u'author_order': 2, u'affiliation': u'Univ. Lille CNRS UMR 8520 - IEMN Lille France', u'full_name': u'Kamel Haddadi'}, {u'author_order': 3, u'affiliation': u'Univ. Lille CNRS UMR 8520 - IEMN Lille France', u'full_name': u'Christophe Loyez'}] 2018 22nd International Microwave and Radar Conference (MIKON), None

The six-port measurement technique has played a major role in microwave metrology, particularly within the community of national standards laboratories. The six-port reflectometer provides a simple method of implementing one-port and dual-six-port vector network analyzer. This paper reviews the development of six-port technology for metrology applications.


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Educational Resources on Metrology

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eLearning

No eLearning Articles are currently tagged "Metrology"

IEEE-USA E-Books

  • Metrology and Quality Criteria in Software Measurement

    This chapter contains sections titled: * Introduction to Metrology * A Model for Measuring Devices * Quality Criteria for the Design of a Measurement Method * Quality Criteria for the Application of a Measurement Method * Quality Criteria for Measurement Results * Summary * Advanced Readings: Measuring Chain and Measuring System

  • EM Metrology Issues in Wireless Communications

    This chapter contains sections titled: * Introduction * RF Dosimetry * Extremely Low Frequency (ELF) Magnetic Field Metrology * Conclusions * References

  • Section 14: Metrology

    This chapter contains sections titled: * Can We Design Microbotic Devices Without Knowing the Mechanical Properties of Materials? * The Use of Micromachined Structures for the Measurement of Mechanical Properties and Adhesion of Thin Films * Mechanical Property Measurements of Thin Films Using Load-Deflection of Composite Rectangular Membrane * Fracture Toughness Characterization of Brittle Thin Films * Spiral Microstructures for the Measurement of Average Strain Gradients in Thin Films * Polysilicon Microstructures to Characterize Static Friction * Study on the Dynamic Force/Acceleration Measurements * Anomalous Emissivity from Periodic Micromachined Silicon Surfaces

  • Commission A: Electromagnetic Metrology

  • Quantification and Measurement Are Not the Same!

    This chapter contains sections titled: * Introduction: Numbers are Not All Created Equals * ISO 15939 Measurement Information Model * Scope of the ISO 15939 Measurement Information Model * The Metrology Perspective in the ISO 15939 Measurement Information Model * The Quantification of Relationships in ISO 15939 * A Productivity Model: An ISO 15939 Measurement Information Model * Examples: A Metrology Design and a Quantification Model of Relationships * Summary

  • ISO 9126: Analysis of Quality Models and Measures

    This chapter contains sections titled: * Introduction to ISO 9126 * Analysis Models of ISO 9126: The (Quantitative) Models * The Metrology-Related Part of ISO 9126: Base and Derived Measures * Analysis of Derived Measures * The Missing Links: From Metrology to Quantitative Analysis * Outstanding Measurement Design Issues: Improvement Strategy * Advanced Readings 1: Analysis of the Design of the Productivity Measure in ISO 9126 * Advanced Readings 2: Attributes and Related Base Measures within ISO 9126

  • The Design of Software Measurement Methods

    This chapter contains sections titled: * Introduction * Linking Software Measurement and Metrology * Defining the Measurement Principle * Determining the Measurement Method * Products of the Measurement Design Phase * Post Design Activity: Determining a Measurement Procedure * Summary * Advanced Readings 1: Verification Criteria for Software Measurement Methods * Advanced Readings 2: Relational Structures in Assigning a Numerical Value

  • Introduction

    This chapter contains sections titled: * Introduction * Software Measurement: Is it Mature or Not? * Software Measurement as a New Technology * The Designs of Software Measures must be Verified * Advanced Readings: How much Measurement Support is Recognized within the Software Engineering Body of Knowledge (Swebok)?

  • COSMIC: Scaling up and Industrialization

    This chapter contains sections titled: * Introduction * Overview of Previous Convertibility Studies * A Convertibility Study of an Industry Dataset * FP to Cosmic Convertibility: Issues and Discussion

  • Halstead's Metrics: Analysis of Their Designs

    This chapter contains sections titled: * Introduction * Halstead's Metrics: Definitions * Analysis of the Design of Halstead's Metrics * Discussion on the Findings * Advanced Readings: Other Halstead's Metrics



Standards related to Metrology

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IEEE Guide for Measurement of Environmental Sensitivities of Standard Frequency Generators

This project is a revision of the existing guide for measurements of environmental sensitivities of standard frequency generators. It includes effects and metrology of acceleration; temperature, humidity, and pressure; electrical and magnetic fields; ionizing and particle radiation; and aging, warm-up time and retrace.


IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities



Jobs related to Metrology

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