Acceptance Testing

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Conferences related to Acceptance Testing

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2012 13th International Symposium on Quality Electronic Design (ISQED)

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The International Symposium on Quality Electronic Design (ISQED) the premier Electronic Design conference bridges the gap between Electronic/Semiconductor ecosystem members providing electronic design tools\, integrated circuit technologies\, semiconductor technology\,packaging\, assembly & test to achieve design quality.

  • 2011 International Symposium on Quality Electronic Design (ISQED)

    ISQED is a premier Design & Design Automation conference bridges the gap between electronic design tools and processes\, integrated circuit technologies\, processes & manufacturing\, to achieve design quality. ISQED is the leading conference for design for manufacturability (DFM) and quality (DFQ) issues. It provides a forum to exchange ideas and promote research\, development\, and application of design techniques & methods\, design processes\, and EDA design methodologies and tools that address issues which impa

  • 2010 11th International Symposium on Quality of Electronic Design (ISQED)

    ISQED is the pioneer and leading conference dealing with design for manufacturability and quality issues, front to back.

  • 2009 10th International Symposium on Quality of Electronic Design (ISQED)

    The International Symposium on Quality Electronic Design (ISQED), is a premier Design & Design Automation conference, aimed at bridging the gap between and integration of, electronic design tools and processes, integrated circuit technologies, processes & manufacturing, to achieve design quality. ISQED is the pioneer and leading conference dealing with design for manufacturability and quality issues, front to back. The conference provides a forum to present and exchange ideas and to promote the research, de

  • 2008 9th International Symposium on Quality of Electronic Design (ISQED)

    The International Symposium on Quality Electronic Design (ISQED), is a premier Design & Design Automation conference, aimed at bridging the gap between and integration of, electronic design tools and processes, integrated circuit technologies, processes & manufacturing, to achieve design quality. ISQED is the pioneer and leading conference dealing with design for manufacturability and quality issues, front to back. The conference provides a forum to present and exchange ideas and to promote the research.


2012 6th International Conference on Software Security and Reliability (SERE)

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Focuses on software security\, safety\, reliability\, and quality assurance for researchers and practitioners to exchange ideas and best-of-breed practices for developing trustworthy software in a more effective and efficient way.


2012 IEEE 16th International Symposium on Consumer Electronics - (ISCE 2012)

ISCE hence provides a grand opportunity for the presentation and discussion of the very latest research and technology innovations related to the fast evolving consumer electronics technology.


2012 IEEE International Integrated Reliability Workshop (IIRW)

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The IRW focuses on ensuring electronic device reliability through fabrication\, design\, testing\, characterization\, and simulation\, as well as identification of the defects and physical mechanisms responsible for reliability problems.

  • 2011 IEEE International Integrated Reliability Workshop (IIRW)

    The IRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems through tutorials, paper presentations, discussion groups and special interest groups.

  • 2010 IEEE International Integrated Reliability Workshop (IIRW)

    The Integrated Reliability Workshop focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding, developing, and sharing reliability technology and test methodology for present and f

  • 2009 IEEE International Integrated Reliability Workshop (IRW)

    Semiconductor Reliability in general; and Wafer Level Reliability in specific. Covering areas like (but not limited to): Design-in Reliability, reliability characterization, deep sub-micron transistor and circuit reliability, customer reliability requirements, wafer level reliability tests, and reliability root cause analysis, etc.

  • 2008 IEEE International Integrated Reliability Workshop (IRW)

    The workshop focuses on ensuring device reliability through fabrication, design, testing, characterization and simulation as well as identification of the defects and mechanisms responsible for reliability problems. It provides a unique environment for understanding, developing and sharing reliability technology and test methodology.

  • 2007 IEEE International Integrated Reliability Workshop (IRW)

    The Workshop focuses on ensuring semiconductor reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliabilty problems. Through tutorials, discussion groups, special interest groups, and the informal format of the technical program, a unique environment is provided for understanding and developing reliability technology and test methodology.


2012 IEEE International Symposium on Electrical Insulation (ISEI)

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This conference is directed towards those who develop\, test or use electrical insulation in electrical equipment.


2010 IEEE 34th Annual Computer Software and Applications Conference - COMPSAC 2010

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COMPSAC is a major international forum for researchers, practitioners, managers, and policy makers interested in computer software and applications. It was first held in Chicago in 1977, and since then it has been one of the major forums for academia, industry, and government to discuss the state of the art, new advances, and future trends in software technologies and practices. The technical program includes keynote addresses, research papers, industrial case studies, panel discussions and fast abstracts.

  • 2009 IEEE 33rd International Computer Software and Applications Conference - COMPSAC 2009

    COMPSAC is a major international forum for researchers, practitioners, managers, and policy makers interested in computer software and applications. It was first held in Chicago in 1977, and since then it has been one of the major forums for academia, industry, and government to discuss the state of art, new advances, and future trends in software technologies and practices. The technical program includes keynote addresses, research papers, industrial case studies, panel discussions and fast abstracts. It


2008 7th International Conference on Composition-Based Software Systems (ICCBSS)

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ICCBSS 08 focuses on Composition-Based Software Systems (CBSS) development paradigm that weaves existing or custom-developed systems, COTS-software components, leased or rented applications and service oriented systems into composite system-of-systems.



Standards related to Acceptance Testing

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Patents related to Acceptance Testing

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Periodical articles related to Acceptance Testing

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No periodicals are currently tagged "Acceptance Testing"


Xplore Articles related to Acceptance Testing

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  • Towards Call for Testing: An Application to User Acceptance Testing of Web Applications

    Lian Yu; Wei Zhao; Xiaofeng Di; Changzhu Kong; Wenbo Zhao; Qianxiang Wang; Jun Zhu Computer Software and Applications Conference, 2009. COMPSAC '09. 33rd Annual IEEE International, 2009

    The paper proposes a new test model, Call-For-Testing (CFT), and applies it to User Acceptance Testing (UAT) of Web Applications. Different from traditional approaches, UAT in the context of CFT only means beta-testing on the site or field, i.e., by customers or end-users, and does not include alpha-testing which is supervised or performed by the system provider. CFT model leverages ...

  • Behavior-based acceptance testing of software systems: a formal scenario approach

    Hsia, P.; Gao, J.; Samuel, J.; Kung, D.; Toyoshima, Y.; Chen, C. Computer Software and Applications Conference, 1994. COMPSAC 94. Proceedings., Eighteenth Annual International, 1994

    Acceptance testing is the determining factor in the satisfaction of the contract between the software vendor and the customer. In today's industry practice, there is a lack of a systematic method to help testers (or customers) construct, formalize, and verify acceptance testing models, and use them for automatic test case generation. This paper proposes a systematic approach to form the ...

  • Reworking non-applicable tests in a customer's test suite

    Epifanov, N.A.; Avdeychuk, A.V. Consumer Electronics, 2006. ISCE '06. 2006 IEEE Tenth International Symposium on, 2006

    Acceptance testing is a crucial stage of software development process. Results of acceptance testing define customer's perception of the software product and, as such, overall success of the project. Due to importance of acceptance testing, some projects even use acceptance test suites for their internal system testing. Customers often share a common acceptance test suite between several similar projects. Each ...

  • Test procedure and acceptance criteria for PD commissioning testing of transmission class cables

    Fenger, M. Electrical Insulation (ISEI), Conference Record of the 2010 IEEE International Symposium on, 2010

    Over the last decade, partial discharge testing has gained acceptance as a valid diagnostic tool for condition assessment of cable insulation. It is well known and understood that the results obtained from a partial discharge test depend not only on the conditions under which the test was performed but also on the test equipment itself including the type of sensor ...

  • Cost impact of automated acceptance testing of Electrical Ground Support Equipment for spacecraft testing

    Nguyen, H.D.; Miller, I.A. AUTOTESTCON, 2011 IEEE, 2011

    In today's environment, building a reliable and cost-effective spacecraft is perhaps emphasized more than ever before. Sponsors are looking for the same high-quality products but at lower costs and with shorter schedules. Whether it is a spacecraft for the Department of Defense (DoD), a research observatory for the National Aeronautics and Space Administration (NASA), or a commercial communications satellite, total ...

  • A Generic Gateway for Testing Heterogeneous Components in Acceptance Testing Tools

    Diaz, J.; Yague, A.; Alarcon, P.P.; Garbajosa, J. Composition-Based Software Systems, 2008. ICCBSS 2008. Seventh International Conference on, 2008

    Acceptance testing tools and Systems Under Test (SUT) require a gateway that will set up the communication link between them. Nevertheless, SUTs are often large systems composed of heterogeneous components that are executed in heterogeneous networks and platforms. Therefore, a non trivial communication problem between testing tools and these SUT heterogeneous components arises. A significant effort is invested in designing ...

  • Air Force nickel-hydrogen testing at NAVSURFWARCENDIV Crane

    Moore, B.A.; Brown, H.M.; Hill, C.A. Energy Conversion Engineering Conference, 1997. IECEC-97., Proceedings of the 32nd Intersociety, 1997

    Testing for the Air Force Nickel-Hydrogen Cell Test Program began in 1986 at Crane Division, Naval Surface Warfare Center (NAVSURFWARCENDIV Crane). The purpose of the test was to demonstrate the performance of Ni-H<sub>2</sub> secondary cells in low Earth orbit conditions and develop a statistically significant database on Ni-H<sub>2</sub> batteries. The program has included random vibration, acceptance, characterization and life cycle ...

  • IEEE Standard for Software and System Test Documentation - Redline

    None IEEE Std 829-2008 (Revision of IEEE Std 829-1998) - Redline, 2008

    Test processes determine whether the development products of a given activity conform to the requirements of that activity and whether the system and/or software satisfies its intended use and user needs. Testing process tasks are specified for different integrity levels. These process tasks determine the appropriate breadth and depth of test documentation. The documentation elements for each type of test ...

  • Automated Acceptance Testing: A Literature Review and an Industrial Case Study

    Haugset, B.; Hanssen, G.K. Agile, 2008. AGILE '08. Conference, 2008

    Automated acceptance testing is a quite recent addition to testing in agile software development holding great promise of improving communication and collaboration. This paper summarizes existing literature and also presents a case study from industry on the use of automated acceptance testing. The aim of this paper is to establish an up to date overview of existing knowledge to benefit ...

  • International Space Station nickel-hydrogen battery cell testing at NAVSURFWARCENDIV Crane

    Moore, B.A.; Brown, H.M.; Miller, T.B. Energy Conversion Engineering Conference, 1997. IECEC-97., Proceedings of the 32nd Intersociety, 1997

    Testing for the International Space Station nickel-hydrogen battery cell test program began in 1990 at Crane Division, Naval Surface Warfare Center (NAVSURFWARCENDIV Crane). The purpose of the testing is to develop a statistically significant nickel-hydrogen database. The program has included acceptance testing, characterization testing, random vibration, life cycle testing and failure analysis of nickel-hydrogen battery cells. The program is directed ...




Educational Resources on Acceptance Testing

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  • OTDR Theory and Operation - Operating the OTDR

    Johnson, Larry OTDR Theory and Operation - Operating the OTDR, 2009

    In this tutorial, we examine the OTDR's key role which is the acceptance testing of optical fibers and cables. This is followed by a review of the key task for users--identifying and measuring splices in the optical cable span. Next we examine reflectance, which is recognized today as a limitation of high-performance systems. This is followed by a review of ...

  • Fiber Optic Splicing - Fiber Preparation and Multimode Splicing

    Johnson, Larry Fiber Optic Splicing - Fiber Preparation and Multimode Splicing, 2009

    In this tutorial we will begin with an introduction to the correct methods of preparing, cleaving, splicing and protecting optical fibers using a cross-section of splicing equipment and techniques. Fiber optic splicing is performed in the field, the factory and in the laboratory. We will discuss the various applications in addition to premises and acceptance testing. Next, fiber preparation and ...

  • Fiber Optic Cable - Fiber Optic Cables, Applications, and Manufacturing

    Johnson, Larry Fiber Optic Cable - Fiber Optic Cables, Applications, and Manufacturing, 2009

    In this tutorial we will begin with an introduction to the cabling process and the variations in cable structures that have been developed for the physical protection of the internal fiber structures. You will learn about cable structures for aerial, ducted, buried, underground premise and industrial environments. Next, loose buffered cables and tight buffered cables will be reviewed. Finally, the ...