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2013 Annual Reliability and Maintainability Symposium - Product Quality & Integrity (RAMS)
2013 IEEE International Reliability Physics Symposium (IRPS)Visit website
Reliability studies and applications related to physics in the areas of electronics and solar
2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012)Visit website
Devoted to fundamental understanding of the physical mechanisms of semiconductor device failures and issues related to semiconductor device reliability and yield\, especially those related to advanced process technologies.
2012 6th International Conference on Software Security and Reliability (SERE)Visit website
Focuses on software security\, safety\, reliability\, and quality assurance for researchers and practitioners to exchange ideas and best-of-breed practices for developing trustworthy software in a more effective and efficient way.
2012 IEEE International Integrated Reliability Workshop (IIRW)Visit website
The IRW focuses on ensuring electronic device reliability through fabrication\, design\, testing\, characterization\, and simulation\, as well as identification of the defects and physical mechanisms responsible for reliability problems.
Erqiang Feng; Chang Liu; Jun Zheng Reliability, Maintainability and Safety (ICRMS), 2011 9th International Conference on, 2011
For increasing the effectiveness and efficiency of the software reliability testing, a two-stage combined software reliability accelerated testing is proposed. The combined testing method combines representative testing and directed testing, and it is able to test some operations or program modules with low operation frequency to satisfy the coverage criteria if the number of the test cases is the same ...
Tebbi, O.; Guerin, F.; Dumon, B. Reliability and Maintainability Symposium, 2003. Annual, 2003
Accelerated testing of mechanical products offers great potential for development in reliability life testing. Unfortunately, difficulties met in accelerated life testing have limited its applications and acceptance. This paper presents a discussion of the different approaches to accelerate life of mechanical materials. The importance of failure mechanism models and the separate treatment of failure mechanisms during accelerated life tests are ...
Yumei Wu; Yongqi Zhang; Minyan Lu Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual, 2010
This study is conducted by solving these four key questions: the key points of the whole testing process; the data and information to be collected during the testing process; the model to estimate the software reliability; the verification of the testing method and the estimation model. Software reliability accelerated testing (SRAT) based on mixed testing is proposed. SRAT increases the ...
Zhengfang Qian; Sheng Liu Adhesive Joining and Coating Technology in Electronics Manufacturing, 1998. Proceedings of 3rd international Conference on, 1998
Summary form only given. A critical review of the life prediction and accelerated testing of solder joints, including the role of constitutive modeling and the factors of accelerated testing, is presented in this paper. As a perfect example, a Ford solder joint specimen was used to investigate accelerated testing factors under various accelerated testing conditions in terms of thermal fatigue ...
Klein, B.; Kirschmann, D.; Haas, W.; Bertsche, B. Reliability and Maintainability Symposium (RAMS), 2010 Proceedings - Annual, 2010
Radial Shaft Seals (RSS) are widely used in all fields of mechanical engineering for sealing of rotating elements. Up to now there has been no possibility to include Radial Shaft Seals adequately into the lifetime calculation of mechanical systems. In this paper the difficulties in accelerated life testing of RSS are presented and discussed. First of all, this involves the ...
Software Test Manager (Seattle, WA) Qualcomm, Inc.
Software Test Engineer - Sensors Qualcomm, Inc.
Quality Assurance & Testing Engineer -- Consumer Electronics (consumer product testing and eval) Company Confidential
Electrical Engineer - Cable Assemblies - Automated Production Testing Molex
Staff Engineer/Manager - Validation of WLAN Products (Wi-Fi testing) Qualcomm, Inc.
Server Software Test Engineer - Austin, TX Qualcomm, Inc.
Software Test Engineer Positions @ Qualcomm : Experienced SW Test & Integration Eng - Apply Here Qualcomm, Inc.
Software Test - Microprocessor Characterization and Test Engineer - Raleigh, NC (RTP) Qualcomm, Inc.
Software Test Engineer Positions @ Qualcomm : New Grad SW Test & Integration Eng - Apply Here Qualcomm, Inc.
Electrical Engineer I (Contract) Textron
Electrical Engineer, Staff Roche
Electrical Engineer, Staff Ventana
Electrical Engineer Roche
Electrical Engineer Ventana
Verification CAD Engineer Qualcomm, Inc.
Software Engineer/Software Developer ODVA, Inc.
Staff display test engineer Qualcomm, Inc.
Reliability Device Physics Lead Qualcomm, Inc.
Hyderabad Careers for Senior Engineering Professionals - Sr. Staff / Principal / Director Qualcomm, Inc.
Security Architect / Design Engineer (Raleigh, NC) Qualcomm, Inc.
Security Architect / Design Engineer (Austin, TX) Qualcomm, Inc.
Multimedia Display SW Engineer Qualcomm, Inc.
Engineering Manager-Industrial Network Technology ODVA, Inc.
Project Analyst Qualcomm, Inc.
Bezdek, James C. Fuzzy Cluster Analysis in Very Large Data Sets, 2009
This last module in the series discusses just one approach to the interesting and important problem of clustering in very large (VL) data. The target audience is graduate students majoring in engineering and science, and practicing engineers and scientists interested in either research about or applications of clustering applied to very large real world problems that occur in data mining, ...
This guide provides information on the equipment, cable specimens, test conditions, and measurements to perform accelerated aging tests on medium-voltage cables using water-filled tanks, whether the test be a time-to-failure test or a test in which samples are aged for fixed times followed by a diagnostic test such as a step ACBD test. The guide identifies the critical test parameters ...
Processes and methodologies for conducting reliability predictions for electronic systems and equipment.
This document presents a standard that defines the reliability capability of organizations and identifies the criteria for assessing the reliability capability of an organization. This standard is intended to be usable by all organizations that design, manufacture or procure electrical/electronics components or products. Although the concepts described in this standard could be applied to both hardware and software products, the ...
A standardized medium for developing reliability predictions of electronic systems and equipment.
This project will develop for electronic products and systems a standard set of reliability-program objectives which can be used to express reliability requirements when a customer is contracting with a producer for electronic products.
Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.
Principles and practices of reliability, maintainability, and product liability pertaining to electrical and electronic equipment.