Conferences related to Infant Mortality

Back to Top

2014 IEEE International Reliability Physics Symposium (IRPS)


2013 36th International Spring Seminar on Electronics Technology (ISSE)

This international conference focusses on exchange of information between senior and young scientists from academic communities and electronic industries. Since 1977 the conference has been hosted by different Eureopean universities.

  • 2012 35th International Spring Seminar on Electronics Technology (ISSE)

    The International Spring Seminar on Electronics Technology is the premier European forum for the exchange of information between senior and young scientists from academic communities and electronic industries from around the world on topics related to their experimental and theoretical work in the very widespread field of electronics and microelectronics technology and packaging.

  • 2011 34th International Spring Seminar on Electronics Technology (ISSE)

    The International Spring Seminar on Electronics Technology is the premier European forum for the exchange of information between senior and young scientists from academic communities and electronic industries from around the world on topics related to their experimental and theoretical work in the very widespread field of electronics and microelectronics technology and packaging.

  • 2010 33rd International Spring Seminar on Electronics Technology (ISSE)

    The International Spring Seminar on Electronics Technology is the premier European forum for the exchange of information between senior and young scientists from academic communities and electronic industries from around the world on topics related to their experimental and theoretical work in the very wide-spread field of electronics and microelectronics technology and packaging.

  • 2009 32nd International Spring Seminar on Electronics Technology (ISSE)

    The International Spring Seminar on Electronics Technology is the premier European forum for the exchange of information between senior and young scientists from academic communities and electronic industries from around the world on topics related to their experimental and theoretical work in the very wide -spread field of electronics and microelectronics technology and packaging. Based on a unique combination of oral and poster presentations as well as individual meetings, professors and students, senio


2013 7th Asia Modelling Symposium (AMS)

Analytical and mathematical modelling and simulation of a variety of application areas within computing science and technology and systems engineering emphasizing the role of intelligent system and hybrid intelligent systems and soft computing.

  • 2012 6th Asia Modelling Symposium (AMS 2012)

    Analytical and mathematical modelling and simulation of a variety of application areas within computing science and technology and systems engineering emphasising the role of intelligent system and hybrid intelligent systems and soft computing.

  • 2011 5th Asia Modelling Symposium (AMS 2011)

    Analytical and mathematical modelling and simulation of a variety of application areas within computing science and technology and systems engineering emphasizing the role of intelligent system and hybrid intelligent systems and soft computing.

  • 2010 4th Asia Modelling Symposium (AMS 2010)

    Analytical and mathematical modelling and simulation of a variety of application areas within computing science and technology and systems engineering emphasising the role of intelligent system and hybrid intelligent systems and soft computing.


2013 IEEE 19th International On-Line Testing Symposium (IOLTS)

Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, vo

  • 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012)

    Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, vo

  • 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011)

    Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins.

  • 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010)

    On-Line Testing Techniques, Fault Tolerance.

  • 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009)

    On-line testing, reliability, dependability, variability, diagnosis, maintenance, fault-tolerance.

  • 2008 14th IEEE International On-Line Testing Symposium (IOLTS 2008)

    Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques.

  • 2007 IEEE International On-Line Testing Symposium (IOLTS 2007)


2013 IEEE 21st International Symposium on Modelling, Analysis & Simulation of Computer and Telecommunication Systems (MASCOTS)

Research discussing methods for simulating and analyzing performance of both computer networks, computer architecture, and storage devices.


More Conferences

Xplore Articles related to Infant Mortality

Back to Top

Infant Mortality--The Lesser Known Reliability Issue

Mak, T.M. On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International, 2007

Infant Mortality problems have been around for a long time (maybe that is why sometimes we have a shorter warranty period for many electronic products). Anyway, the explanation of infant mortality is that these are left over (or latent) defects. Defects that do not necessarily expose themselves and they can skip by all the manufacturing tests, including system test. However, ...


A modeling approach to identify factors associated with infant mortality in Russia

Soshnikov, S.; Lee, C.; Vladimirov, S. Computer and Information Science (ICIS), 2013 IEEE/ACIS 12th International Conference on, 2013

The infant mortality has been declining in the recent decades globally. However, it continues to be an international concern. The issues are not only on what types of diseases or incidents leading to the infant death for individual cases, but also on what factors; social, economic, environment, education and other; are associated with infant mortality in the society. In this ...


Facial feature extraction on pre and post-operative infant with NFCS and nCRF

Kirana, M.C.; Purnama, I.K.E.; Suprapto, Y.K.; Hariadi, M.; Purnomo, M.H. Instrumentation, Communications, Information Technology, and Biomedical Engineering (ICICI-BME), 2013 3rd International Conference on, 2013

Infant Mortality Rate (IMR) is the predominant problem in medical, especially in developing countries like Indonesia. One cause of IMR increasing is diagnosis mistake of infant pain. Baby's communication have not perfect, it is leading to high risk of diagnosis mistake when the baby feels pain, such as post-surgery conditions. This problem encourages research on the pain identification of infant ...


An approach to developing an infant mortality requirement for fiber optic transport systems

Hamilton, C.M.; Lewin, B.R. Selected Areas in Communications, IEEE Journal on, 1988

The approach used in developing an infant mortality requirement for fiber optic transport systems used in Bellcore client networks is described. Two generic parameters are considered: failure rate ratio, which is the ratio of the instantaneous failure rate to the steady-state failure rate, and infant mortality factor, which is the ratio of the expected number of failures in the first ...


IDVP (Intra-Die Variation Probe) for System-On-Chip (SoC) Infant Mortality screen

Latif, M.A.A.; Ali, N.B.Z.; Hussin, F.A. Circuits and Systems (ISCAS), 2011 IEEE International Symposium on, 2011

Abstract-Used materials, oxides thicknesses, and ultra-small channel lengths are contributors to the impact of well known reliability issue such as NBTI (Negative Bias Temperature Instability). This paper describes a case study using an Intra-Die Variation Probe (IDVP) test to screen out Infant Mortality (IM) failures. The approach is pursued by applying the learning of yield and reliability on 45 nm ...


More Xplore Articles

Jobs related to Infant Mortality

Back to Top

No jobs are currently tagged "Infant Mortality"

Educational Resources on Infant Mortality

Back to Top

eLearning

No eLearning Articles are currently tagged "Infant Mortality"

IEEE.tv Videos

No IEEE.tv Videos are currently tagged "Infant Mortality"

IEEE-USA E-Books

No IEEE-USA E-Books are currently tagged "Infant Mortality"


Standards related to Infant Mortality

Back to Top

IEEE Guide for Selecting and Using Reliability Predictions Based on IEEE 1413

Processes and methodologies for conducting reliability predictions for electronic systems and equipment.


IEEE Standard Methodology for Reliability Predictions and Assessment for Electronic Systems Equipment

A standardized medium for developing reliability predictions of electronic systems and equipment.


Periodicals related to Infant Mortality

Back to Top

Components and Packaging Technologies, IEEE Transactions on

Component parts, hybrid microelectronics, materials, packaging techniques, and manufacturing technology.


Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...


Reliability, IEEE Transactions on

Principles and practices of reliability, maintainability, and product liability pertaining to electrical and electronic equipment.


Selected Areas in Communications, IEEE Journal on

All telecommunications, including telephone, telegraphy, facsimile, and point-to-point television, by electromagnetic propagation, including radio; wire; aerial, underground, coaxial, and submarine cables; waveguides, communication satellites, and lasers; in marine, aeronautical, space, and fixed station services; repeaters, radio relaying, signal storage, and regeneration; telecommunication error detection and correction; multiplexing and carrier techniques; communication switching systems; data communications; communication theory; and wireless communications.