Topics related to Infant Mortality

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IEEE Organizations related to Infant Mortality

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Conferences related to Infant Mortality

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2015 IEEE International Reliability Physics Symposium (IRPS)

Sharing information related to cause, effects and solutions in the deign and manufacture of electronics and related components

2013 36th International Spring Seminar on Electronics Technology (ISSE)

This international conference focusses on exchange of information between senior and young scientists from academic communities and electronic industries. Since 1977 the conference has been hosted by different Eureopean universities.

2013 7th Asia Modelling Symposium (AMS)

Analytical and mathematical modelling and simulation of a variety of application areas within computing science and technology and systems engineering emphasizing therole of intelligent system and hybrid intelligent systems and soft computing.

2013 IEEE 19th International On-Line Testing Symposium (IOLTS)

Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wearout and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips.

2013 IEEE 21st International Symposium on Modelling, Analysis & Simulation of Computer and Telecommunication Systems (MASCOTS)

Research discussing methods for simulating and analyzing performance of both computer networks, computer architecture, and storage devices.

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Periodicals related to Infant Mortality

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Components and Packaging Technologies, IEEE Transactions on

Component parts, hybrid microelectronics, materials, packaging techniques, and manufacturing technology.

Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...

Reliability, IEEE Transactions on

Principles and practices of reliability, maintainability, and product liability pertaining to electrical and electronic equipment.

Selected Areas in Communications, IEEE Journal on

All telecommunications, including telephone, telegraphy, facsimile, and point-to-point television, by electromagnetic propagation, including radio; wire; aerial, underground, coaxial, and submarine cables; waveguides, communication satellites, and lasers; in marine, aeronautical, space, and fixed station services; repeaters, radio relaying, signal storage, and regeneration; telecommunication error detection and correction; multiplexing and carrier techniques; communication switching systems; data communications; communication theory; and wireless communications.

Most published Xplore authors for Infant Mortality

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Xplore Articles related to Infant Mortality

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Infant Mortality--The Lesser Known Reliability Issue

Mak, T.M. On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International, 2007

Infant Mortality problems have been around for a long time (maybe that is why sometimes we have a shorter warranty period for many electronic products). Anyway, the explanation of infant mortality is that these are left over (or latent) defects. Defects that do not necessarily expose themselves and they can skip by all the manufacturing tests, including system test. However, ...

A modeling approach to identify factors associated with infant mortality in Russia

Soshnikov, S.; Lee, C.; Vladimirov, S. Computer and Information Science (ICIS), 2013 IEEE/ACIS 12th International Conference on, 2013

The infant mortality has been declining in the recent decades globally. However, it continues to be an international concern. The issues are not only on what types of diseases or incidents leading to the infant death for individual cases, but also on what factors; social, economic, environment, education and other; are associated with infant mortality in the society. In this ...

An approach to developing an infant mortality requirement for fiber optic transport systems

Hamilton, C.M.; Lewin, B.R. Selected Areas in Communications, IEEE Journal on, 1988

The approach used in developing an infant mortality requirement for fiber optic transport systems used in Bellcore client networks is described. Two generic parameters are considered: failure rate ratio, which is the ratio of the instantaneous failure rate to the steady-state failure rate, and infant mortality factor, which is the ratio of the expected number of failures in the first ...

Infant mortality failures of lead — free solder joints

Szwech, M.; Niedzwiedz, W.; Drozd, Z. Electronics Technology, 2009. ISSE 2009. 32nd International Spring Seminar on, 2009

Two goals of the work - verification of suitability of mechanical tests of solder joints reliability and infant mortality (early failures) of lead-free joints are selected. The results of reliability tests of lead - free solder joints of SMT resistors showed a tendency to increase of infant mortality failure rate comparing to SnPb eutectic joints. These new results are presented. ...

IDVP (Intra-Die Variation Probe) for System-On-Chip (SoC) Infant Mortality screen

Latif, M.A.A.; Ali, N.B.Z.; Hussin, F.A. Circuits and Systems (ISCAS), 2011 IEEE International Symposium on, 2011

Abstract-Used materials, oxides thicknesses, and ultra-small channel lengths are contributors to the impact of well known reliability issue such as NBTI (Negative Bias Temperature Instability). This paper describes a case study using an Intra-Die Variation Probe (IDVP) test to screen out Infant Mortality (IM) failures. The approach is pursued by applying the learning of yield and reliability on 45 nm ...

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Educational Resources on Infant Mortality

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Standards related to Infant Mortality

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IEEE Guide for Selecting and Using Reliability Predictions Based on IEEE 1413

Processes and methodologies for conducting reliability predictions for electronic systems and equipment.

IEEE Standard Methodology for Reliability Predictions and Assessment for Electronic Systems Equipment

A standardized medium for developing reliability predictions of electronic systems and equipment.

Jobs related to Infant Mortality

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