Conferences related to Infant Mortality

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2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

The Conference focuses on all aspects of instrumentation and measurement science andtechnology research development and applications. The list of program topics includes but isnot limited to: Measurement Science & Education, Measurement Systems, Measurement DataAcquisition, Measurements of Physical Quantities, and Measurement Applications.


2019 41st Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)

The conference program will consist of plenary lectures, symposia, workshops andinvitedsessions of the latest significant findings and developments in all the major fields ofbiomedical engineering.Submitted papers will be peer reviewed. Accepted high quality paperswill be presented in oral and postersessions, will appear in the Conference Proceedings and willbe indexed in PubMed/MEDLINE & IEEE Xplore


2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)

Photovoltaic materials, devices, systems and related science and technology


2019 IEEE Energy Conversion Congress and Exposition (ECCE)

IEEE-ECCE 2019 brings together practicing engineers, researchers, entrepreneurs and other professionals for interactive and multi-disciplinary discussions on the latest advances in energy conversion technologies. The Conference provides a unique platform for promoting your organization.

  • 2018 IEEE Energy Conversion Congress and Exposition (ECCE)

    The scope of ECCE 2018 includes all technical aspects of research, design, manufacture, application and marketing of devices, components, circuits and systems related to energyconversion, industrial power and power electronics.

  • 2017 IEEE Energy Conversion Congress and Exposition (ECCE)

    ECCE is the premier global conference covering topics in energy conversion from electric machines, power electronics, drives, devices and applications both existing and emergent

  • 2016 IEEE Energy Conversion Congress and Exposition (ECCE)

    The Energy Conversion Congress and Exposition (ECCE) is focused on research and industrial advancements related to our sustainable energy future. ECCE began as a collaborative effort between two societies within the IEEE: The Power Electronics Society (PELS) and the Industrial Power Conversion Systems Department (IPCSD) of the Industry Application Society (IAS) and has grown to the premier conference to discuss next generation technologies.

  • 2015 IEEE Energy Conversion Congress and Exposition

    The scope of ECCE 2015 includes all technical aspects of research, design, manufacture, application and marketing of devices, components, circuits and systems related to energy conversion, industrial power and power electronics.

  • 2014 IEEE Energy Conversion Congress and Exposition (ECCE)

    Those companies who have an interest in selling to: research engineers, application engineers, strategists, policy makers, and innovators, anyone with an interest in energy conversion systems and components.

  • 2013 IEEE Energy Conversion Congress and Exposition (ECCE)

    The scope of the congress interests include all technical aspects of the design, manufacture, application and marketing of devices, components, circuits and systems related to energy conversion, industrial power conversion and power electronics.

  • 2012 IEEE Energy Conversion Congress and Exposition (ECCE)

    The IEEE Energy Conversion Congress and Exposition (ECCE) will be held in Raleigh, the capital of North Carolina. This will provide a forum for the exchange of information among practicing professionals in the energy conversion business. This conference will bring together users and researchers and will provide technical insight as well.

  • 2011 IEEE Energy Conversion Congress and Exposition (ECCE)

    IEEE 3rd Energy Conversion Congress and Exposition follows the inagural event held in San Jose, CA in 2009 and 2nd meeting held in Atlanta, GA in 2010 as the premier conference dedicated to all aspects of energy processing in industrial, commercial, transportation and aerospace applications. ECCE2011 has a strong empahasis on renewable energy sources and power conditioning, grid interactions, power quality, storage and reliability.

  • 2010 IEEE Energy Conversion Congress and Exposition (ECCE)

    This conference covers all areas of electrical and electromechanical energy conversion. This includes power electrics, power semiconductors, electric machines and drives, components, subsystems, and applications of energy conversion systems.

  • 2009 IEEE Energy Conversion Congress and Exposition (ECCE)

    The scope of the conference include all technical aspects of the design, manufacture, application and marketing of devices, circuits, and systems related to electrical energy conversion technology


2019 IEEE International Reliability Physics Symposium (IRPS)

Meeting of academia and research professionals to discuss reliability challenges.


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Periodicals related to Infant Mortality

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Aerospace and Electronic Systems Magazine, IEEE

The IEEE Aerospace and Electronic Systems Magazine publishes articles concerned with the various aspects of systems for space, air, ocean, or ground environments.


Biomedical Engineering, IEEE Reviews in

The IEEE Reviews in Biomedical Engineering will review the state-of-the-art and trends in the emerging field of biomedical engineering. This includes scholarly works, ranging from historic and modern development in biomedical engineering to the life sciences and medicine enabled by technologies covered by the various IEEE societies.


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Components and Packaging Technologies, IEEE Transactions on

Component parts, hybrid microelectronics, materials, packaging techniques, and manufacturing technology.


Computers, IEEE Transactions on

Design and analysis of algorithms, computer systems, and digital networks; methods for specifying, measuring, and modeling the performance of computers and computer systems; design of computer components, such as arithmetic units, data storage devices, and interface devices; design of reliable and testable digital devices and systems; computer networks and distributed computer systems; new computer organizations and architectures; applications of VLSI ...


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Most published Xplore authors for Infant Mortality

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Xplore Articles related to Infant Mortality

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A Comparison of ARIMA, Neural Network and Linear Regression Models for the Prediction of Infant Mortality Rate

[{u'author_order': 1, u'authorUrl': u'https://ieeexplore.ieee.org/author/37847541000', u'full_name': u'Dr. Purwanto', u'id': 37847541000}, {u'author_order': 2, u'authorUrl': u'https://ieeexplore.ieee.org/author/37274590000', u'full_name': u'Chikkannan Eswaran', u'id': 37274590000}, {u'author_order': 3, u'authorUrl': u'https://ieeexplore.ieee.org/author/37267548100', u'full_name': u'Rajasvaran Logeswaran', u'id': 37267548100}] 2010 Fourth Asia International Conference on Mathematical/Analytical Modelling and Computer Simulation, 2010

The aim of this paper is to compare the performances of ARIMA, Neural Network and Linear Regression models for the prediction of Infant Mortality Rate. The performance comparison is based on the Infant Mortality Rate data collected in Indonesia during the years 1995 - 2008. We compare the models using performance measures such as Mean Absolute Error (MAE), Mean Absolute ...


Observations on Component Infant Mortality and Burn-In Effectiveness

[{u'author_order': 1, u'authorUrl': u'https://ieeexplore.ieee.org/author/37849137000', u'full_name': u'Mark Cooper', u'id': 37849137000}] IEEE Transactions on Components and Packaging Technologies, 2008

The following concepts are discussed: burn-in effectiveness, component failure distributions, early life distribution, early life failures, infant mortality.


Predicting the Effect of Parental Education and Income on Infant Mortality Through Statistical Learning

[{u'author_order': 1, u'authorUrl': u'https://ieeexplore.ieee.org/author/37086388376', u'full_name': u'George Toscano', u'id': 37086388376}, {u'author_order': 2, u'authorUrl': u'https://ieeexplore.ieee.org/author/37298790200', u'full_name': u'Gahangir Hossain', u'id': 37298790200}] 2018 1st International Conference on Data Intelligence and Security (ICDIS), 2018

Parental education, income per capita and health service indicators are the three most important determinants of child mortality. In this paper, we explored the influence of parental education and per capita income on infant mortality rate (IMR) using higher degree polynomial ridge regression. The polynomial regression analysis draws valid inferences about IMR based on an analysis of a representative sample ...


Infant Mortality--The Lesser Known Reliability Issue

[{u'author_order': 1, u'affiliation': u'Intel', u'authorUrl': u'https://ieeexplore.ieee.org/author/37935494200', u'full_name': u'T.M. Mak', u'id': 37935494200}] 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

Infant Mortality problems have been around for a long time (maybe that is why sometimes we have a shorter warranty period for many electronic products). Anyway, the explanation of infant mortality is that these are left over (or latent) defects. Defects that do not necessarily expose themselves and they can skip by all the manufacturing tests, including system test. However, ...


IDVP (Intra-Die Variation Probe) for System-On-Chip (SoC) Infant Mortality screen

[{u'author_order': 1, u'affiliation': u'SoC Quality and Reliability, Intel Corporation, 11900 Penang, Malaysia', u'authorUrl': u'https://ieeexplore.ieee.org/author/38232127300', u'full_name': u'Mohd Azman Abdul Latif', u'id': 38232127300}, {u'author_order': 2, u'affiliation': u'Electrical and Electronic Eng, Universiti Teknologi Petronas, 31750 Tronoh, Malaysia', u'authorUrl': u'https://ieeexplore.ieee.org/author/38197382600', u'full_name': u'Noohul Basheer Zain Ali', u'id': 38197382600}, {u'author_order': 3, u'affiliation': u'Electrical and Electronic Eng, Universiti Teknologi Petronas, 31750 Tronoh, Malaysia', u'authorUrl': u'https://ieeexplore.ieee.org/author/37293874900', u'full_name': u'Fawnizu Azmadi Hussin', u'id': 37293874900}] 2011 IEEE International Symposium of Circuits and Systems (ISCAS), 2011

Abstract-Used materials, oxides thicknesses, and ultra-small channel lengths are contributors to the impact of well known reliability issue such as NBTI (Negative Bias Temperature Instability). This paper describes a case study using an Intra-Die Variation Probe (IDVP) test to screen out Infant Mortality (IM) failures. The approach is pursued by applying the learning of yield and reliability on 45 nm ...


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Educational Resources on Infant Mortality

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eLearning

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IEEE-USA E-Books

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Standards related to Infant Mortality

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IEEE Guide for Selecting and Using Reliability Predictions Based on IEEE 1413

Processes and methodologies for conducting reliability predictions for electronic systems and equipment.


IEEE Standard Methodology for Reliability Predictions and Assessment for Electronic Systems Equipment

A standardized medium for developing reliability predictions of electronic systems and equipment.



Jobs related to Infant Mortality

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