203 resources related to Infant Mortality
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2015 IEEE International Reliability Physics Symposium (IRPS)
Sharing information related to cause, effects and solutions in the deign and manufacture of electronics and related components
2013 36th International Spring Seminar on Electronics Technology (ISSE)
This international conference focusses on exchange of information between senior and young scientists from academic communities and electronic industries. Since 1977 the conference has been hosted by different Eureopean universities.
2013 7th Asia Modelling Symposium (AMS)
Analytical and mathematical modelling and simulation of a variety of application areas within computing science and technology and systems engineering emphasizing therole of intelligent system and hybrid intelligent systems and soft computing.
2013 IEEE 19th International On-Line Testing Symposium (IOLTS)
Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wearout and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips.
2013 IEEE 21st International Symposium on Modelling, Analysis & Simulation of Computer and Telecommunication Systems (MASCOTS)
Research discussing methods for simulating and analyzing performance of both computer networks, computer architecture, and storage devices.
Component parts, hybrid microelectronics, materials, packaging techniques, and manufacturing technology.
Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...
Principles and practices of reliability, maintainability, and product liability pertaining to electrical and electronic equipment.
All telecommunications, including telephone, telegraphy, facsimile, and point-to-point television, by electromagnetic propagation, including radio; wire; aerial, underground, coaxial, and submarine cables; waveguides, communication satellites, and lasers; in marine, aeronautical, space, and fixed station services; repeaters, radio relaying, signal storage, and regeneration; telecommunication error detection and correction; multiplexing and carrier techniques; communication switching systems; data communications; communication theory; and wireless communications.
Soshnikov, S.; Lee, C.; Vladimirov, S. Computer and Information Science (ICIS), 2013 IEEE/ACIS 12th International Conference on, 2013
The infant mortality has been declining in the recent decades globally. However, it continues to be an international concern. The issues are not only on what types of diseases or incidents leading to the infant death for individual cases, but also on what factors; social, economic, environment, education and other; are associated with infant mortality in the society. In this ...
Mak, T.M. On-Line Testing Symposium, 2007. IOLTS 07. 13th IEEE International, 2007
Infant Mortality problems have been around for a long time (maybe that is why sometimes we have a shorter warranty period for many electronic products). Anyway, the explanation of infant mortality is that these are left over (or latent) defects. Defects that do not necessarily expose themselves and they can skip by all the manufacturing tests, including system test. However, ...
Alt, K.W.; Yeats, R.E.; Hutchinson, C.P.; Kuhn, D.K.; Low, T.S.; Iwamoto, M.; Adamski, M.E.; Shimon, R.L.; Shirley, T.E.; Bonse, M.; Kellert, F.G.; D'Avanzo, D.C. ROCS Workshop, 2006. [Reliability of Compound Semiconductors], 2006
A novel circuit for measuring the infant mortality rate in InGaP/GaAs HBT technology is presented. The circuit allows reliability stressing to be performed on as many as 100,000 transistors per wafer and is necessary in order to predict the infant circuit failure rate in circuits with >500 transistors. This new circuit allows for the identification of failed transistors and subsequent ...
Marsh, W. Components and Packaging Technologies, IEEE Transactions on, 2009
This paper presents the comments of the author on the work of Mr. Cooper (2008) by pointing out two concerns: First, the discussion of burn-in, and the tone of one of the major references (van der Pol et al. (1998)), would lead one to believe that burn-in is the only screen currently or commonly used to identify infant mortality or ...
Cooper, M. Components and Packaging Technologies, IEEE Transactions on, 2008
The following concepts are discussed: burn-in effectiveness, component failure distributions, early life distribution, early life failures, infant mortality.
Processes and methodologies for conducting reliability predictions for electronic systems and equipment.
A standardized medium for developing reliability predictions of electronic systems and equipment.