Conferences related to Infant Mortality

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2015 IEEE International Reliability Physics Symposium (IRPS)

Sharing information related to cause, effects and solutions in the deign and manufacture of electronics and related components


2013 36th International Spring Seminar on Electronics Technology (ISSE)

This international conference focusses on exchange of information between senior and young scientists from academic communities and electronic industries. Since 1977 the conference has been hosted by different Eureopean universities.

  • 2012 35th International Spring Seminar on Electronics Technology (ISSE)

    The International Spring Seminar on Electronics Technology is the premier European forum for the exchange of information between senior and young scientists from academic communities and electronic industries from around the world on topics related to their experimental and theoretical work in the very widespread field of electronics and microelectronics technology and packaging.

  • 2011 34th International Spring Seminar on Electronics Technology (ISSE)

    The International Spring Seminar on Electronics Technology is the premier European forum for the exchange of information between senior and young scientists from academic communities and electronic industries from around the world on topics related to their experimental and theoretical work in the very widespread field of electronics and microelectronics technology and packaging.

  • 2010 33rd International Spring Seminar on Electronics Technology (ISSE)

    The International Spring Seminar on Electronics Technology is the premier European forum for the exchange of information between senior and young scientists from academic communities and electronic industries from around the world on topics related to their experimental and theoretical work in the very wide-spread field of electronics and microelectronics technology and packaging.

  • 2009 32nd International Spring Seminar on Electronics Technology (ISSE)

    The International Spring Seminar on Electronics Technology is the premier European forum for the exchange of information between senior and young scientists from academic communities and electronic industries from around the world on topics related to their experimental and theoretical work in the very wide -spread field of electronics and microelectronics technology and packaging. Based on a unique combination of oral and poster presentations as well as individual meetings, professors and students, senio


2013 7th Asia Modelling Symposium (AMS)

Analytical and mathematical modelling and simulation of a variety of application areas within computing science and technology and systems engineering emphasizing therole of intelligent system and hybrid intelligent systems and soft computing.

  • 2012 6th Asia Modelling Symposium (AMS 2012)

    Analytical and mathematical modelling and simulation of a variety of application areas within computing science and technology and systems engineering emphasising the role of intelligent system and hybrid intelligent systems and soft computing.

  • 2011 5th Asia Modelling Symposium (AMS 2011)

    Analytical and mathematical modelling and simulation of a variety of application areas within computing science and technology and systems engineering emphasizing the role of intelligent system and hybrid intelligent systems and soft computing.

  • 2010 4th Asia Modelling Symposium (AMS 2010)

    Analytical and mathematical modelling and simulation of a variety of application areas within computing science and technology and systems engineering emphasising the role of intelligent system and hybrid intelligent systems and soft computing.


2013 IEEE 19th International On-Line Testing Symposium (IOLTS)

Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wearout and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips.

  • 2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012)

    Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wearout and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips.

  • 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011)

    Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins.

  • 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010)

    On-Line Testing Techniques, Fault Tolerance.

  • 2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009)

    On-line testing, reliability, dependability, variability, diagnosis, maintenance, fault-tolerance.

  • 2008 14th IEEE International On-Line Testing Symposium (IOLTS 2008)

    Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques.

  • 2007 IEEE International On-Line Testing Symposium (IOLTS 2007)


2013 IEEE 21st International Symposium on Modelling, Analysis & Simulation of Computer and Telecommunication Systems (MASCOTS)

Research discussing methods for simulating and analyzing performance of both computer networks, computer architecture, and storage devices.


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Periodicals related to Infant Mortality

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Components and Packaging Technologies, IEEE Transactions on

Component parts, hybrid microelectronics, materials, packaging techniques, and manufacturing technology.


Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...


Reliability, IEEE Transactions on

Principles and practices of reliability, maintainability, and product liability pertaining to electrical and electronic equipment.


Selected Areas in Communications, IEEE Journal on

All telecommunications, including telephone, telegraphy, facsimile, and point-to-point television, by electromagnetic propagation, including radio; wire; aerial, underground, coaxial, and submarine cables; waveguides, communication satellites, and lasers; in marine, aeronautical, space, and fixed station services; repeaters, radio relaying, signal storage, and regeneration; telecommunication error detection and correction; multiplexing and carrier techniques; communication switching systems; data communications; communication theory; and wireless communications.



Most published Xplore authors for Infant Mortality

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Xplore Articles related to Infant Mortality

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Wire-bonds failures induced by resonant vibrations in the CDF silicon detector

G. Bolla; M. Atac; V. Pavlicek; G. Cancelo; S. Nahn; R. Mumford; M. Garcia-Sciveres; T. Nguyen; S. Forrester; C. Hill; J. Olszewski; A. Rahaman; J. Goldstein; B. Ashmanskas; T. Maruyama; R. S. Lu; J. Spalding; Z. Tang; T. Zimmerman; S. Moccia; J. D. Lewis 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515), 2003

Unrecoverable internal failures of modules in the CDF Run2 silicon detector have been observed since its installation in early 2001. A fraction of these failures have been categorized as infant mortality because they were detected right after installation or in the first few months of data taking. Another fraction occurred during the second year of operation and they were strongly ...


Analyzing heart rate variability in infants using non-linear Poincaré techniques

RL Smith; ER Wathen; P Cetin Abaci; NH Von Bergen; IH Law; MD Dick; C. Connor; EL Dove 2009 36th Annual Computers in Cardiology Conference (CinC), 2009

Congenital heart defects, such as Hypoplastic Left Heart Syndrome, are the most prevalent type of birth defect. Palliative reconstructive procedures may interrupt autonomic cardiac function and increase infant mortality rate. Autonomic cardiac tone is classically assessed using linear, Fourier-based techniques. A non-linear Poincare¿ technique is proposed to more completely characterize heart rate variability in terms of short-term (SD1) and long-term ...


Reliability framework in a fabless-foundry environment

S. Y. Pai; J. K. Jerry Lee; Kenny Ng; Reality Hsiao; K. C. Su; E. N. Chou 2009 IEEE International Reliability Physics Symposium, 2009

A collaborative framework is presented to address the reliability challenges faced in a fabless-foundry environment. Examples are given to show the effectiveness of this framework for both infant mortality and long-term reliability risk. Through design-for-reliability, optimum process standardization and selective customization, defect density reduction and electrical screening, reliability of the highest level has been achieved in FPGA devices suitable for ...


Eliminating product infant mortality failures using prognostic analysis

Len Losik 2009 International Test Conference, 2009

Product factory test is inadequate to identify 100% of the products that will fail within one year of use before shipment. Product infant mortality failures that would occur after delivery are eliminated by using prognostic analysis for illustrating and identifying deterministic behavior (failure precursors) in all products that will fail in the near future.


Photovoltaic Module Qualification Plus Testing

John Wohlgemuth; Sarah Kurtz 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC), 2014

Reliability is a critical element in the continued growth of the photovoltaic (PV) industry. Design qualification tests such as IEC 61215 and IEC 61646 have been key to mitigating infant mortality, but do not address many of the module failures now observed in the field. Qualification Plus has been created to fill an immediate need by providing a well-defined set ...


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Educational Resources on Infant Mortality

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eLearning

Wire-bonds failures induced by resonant vibrations in the CDF silicon detector

G. Bolla; M. Atac; V. Pavlicek; G. Cancelo; S. Nahn; R. Mumford; M. Garcia-Sciveres; T. Nguyen; S. Forrester; C. Hill; J. Olszewski; A. Rahaman; J. Goldstein; B. Ashmanskas; T. Maruyama; R. S. Lu; J. Spalding; Z. Tang; T. Zimmerman; S. Moccia; J. D. Lewis 2003 IEEE Nuclear Science Symposium. Conference Record (IEEE Cat. No.03CH37515), 2003

Unrecoverable internal failures of modules in the CDF Run2 silicon detector have been observed since its installation in early 2001. A fraction of these failures have been categorized as infant mortality because they were detected right after installation or in the first few months of data taking. Another fraction occurred during the second year of operation and they were strongly ...


Analyzing heart rate variability in infants using non-linear Poincaré techniques

RL Smith; ER Wathen; P Cetin Abaci; NH Von Bergen; IH Law; MD Dick; C. Connor; EL Dove 2009 36th Annual Computers in Cardiology Conference (CinC), 2009

Congenital heart defects, such as Hypoplastic Left Heart Syndrome, are the most prevalent type of birth defect. Palliative reconstructive procedures may interrupt autonomic cardiac function and increase infant mortality rate. Autonomic cardiac tone is classically assessed using linear, Fourier-based techniques. A non-linear Poincare¿ technique is proposed to more completely characterize heart rate variability in terms of short-term (SD1) and long-term ...


Reliability framework in a fabless-foundry environment

S. Y. Pai; J. K. Jerry Lee; Kenny Ng; Reality Hsiao; K. C. Su; E. N. Chou 2009 IEEE International Reliability Physics Symposium, 2009

A collaborative framework is presented to address the reliability challenges faced in a fabless-foundry environment. Examples are given to show the effectiveness of this framework for both infant mortality and long-term reliability risk. Through design-for-reliability, optimum process standardization and selective customization, defect density reduction and electrical screening, reliability of the highest level has been achieved in FPGA devices suitable for ...


Eliminating product infant mortality failures using prognostic analysis

Len Losik 2009 International Test Conference, 2009

Product factory test is inadequate to identify 100% of the products that will fail within one year of use before shipment. Product infant mortality failures that would occur after delivery are eliminated by using prognostic analysis for illustrating and identifying deterministic behavior (failure precursors) in all products that will fail in the near future.


Photovoltaic Module Qualification Plus Testing

John Wohlgemuth; Sarah Kurtz 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC), 2014

Reliability is a critical element in the continued growth of the photovoltaic (PV) industry. Design qualification tests such as IEC 61215 and IEC 61646 have been key to mitigating infant mortality, but do not address many of the module failures now observed in the field. Qualification Plus has been created to fill an immediate need by providing a well-defined set ...


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IEEE-USA E-Books

  • Production AST with Computers Using the Taguchi Method - Reprinted from Environmental Stress Testing Experiment Using the Taguchi Method, IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part A, Vol. 18, No.1, pp. 39, with permission from the author and the IEEE, 1995.

    Manufacturing process improvements which increase productivity, decrease test process time, and improve customer satisfaction are highly desirable in today's marketplace. The application of environmental stress screening (ESS), i.e, Production AST, is a method of achieving these improvements. ESS is the application of stresses applied beyond product specification limits in order to find latent product defects. Utilizing ESS achieves increased robustness and lowers infant mortality. An experiment was performed to identify the significance or relevancy of the selected stresses for application in the printed wiring assembly (PWA) production process by using a statistically significant controlled method. The design of experiments statistical approach (analysis of variance) is applied, combined with the Taguchi two-level, seven- factor design method. This experiment concentrated on three stresses?-?temperature cycling, random vibration, and power cyling?-?and two diagnostic levels?-?a prom-based (programmable memory chip), power-on self test (POST), and a functional diagnostic test suite, contained on disk storage. This was not an optimization experiment. Once the significance to the production process is identified, future optimizing of temperature cycling, power cycling, and vibration screens will be conducted. Also, voltage margining was not included to reduce the complexity of the experiment- treatment factors and interactions. Experimental results and conclusions on the effectiveness of different stress regimens are presented in this chapter. Introduction Objectives Stress Overview Stress Screen Designs Experiment Overview The Taguchi Method Response Variable Results and Conclusions of the Taguchi Experiment Intra-Experiment Summary Taguchi Method Conclusion Terms Acknowledgments References



Standards related to Infant Mortality

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IEEE Guide for Selecting and Using Reliability Predictions Based on IEEE 1413

Processes and methodologies for conducting reliability predictions for electronic systems and equipment.


IEEE Standard Methodology for Reliability Predictions and Assessment for Electronic Systems Equipment

A standardized medium for developing reliability predictions of electronic systems and equipment.



Jobs related to Infant Mortality

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