850 resources related to Burn In
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2015 IEEE International Reliability Physics Symposium (IRPS)
Sharing information related to cause, effects and solutions in the deign and manufacture of electronics and related components
2013 IEEE International Integrated Reliability Workshop (IIRW)
We invite you to submit a presentation proposal that addresses any semiconductor related reliability issue, including the following topics: resistive memories, high-k and nitrided SiO2 gate dielectrics, reliability assessment of novel devices, III-V, SOI, emerging memory technologies, transistor reliability including hot carriers and NBTI/PBTI, root cause defects (physical mechanisms and simulations), Cu interconnects and low-k dielectrics, impact of transistor degradation on circuit reliability, designing-in reliability (products, circuits,systems, processes), customer product reliability requirements / manufacturer reliability tasks, waferlevel reliability tests (test approaches and reliability test structures), reliability modeling and simulation,optoelectronics, and single event upsets.
2013 IEEE/CPMT 29th Semiconductor Thermal Measurement & Management Symposium (SemiTherm)
This international symposium continues to focus on recent developments and future directions in quality and reliability management of materials, devices and circuits for micro, nano, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.
Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...
Design for manufacturability, cost and process modeling, process control and automation, factory analysis and improvement, information systems, statistical methods, environmentally-friendly processing, and computer-integrated manufacturing for the production of electronic assemblies, products, and systems.
The most highly-cited general interest journal in electrical engineering and computer science, the Proceedings is the best way to stay informed on an exemplary range of topics. This journal also holds the distinction of having the longest useful archival life of any EE or computer related journal in the world! Since 1913, the Proceedings of the IEEE has been the ...
Principles and practices of reliability, maintainability, and product liability pertaining to electrical and electronic equipment.
Addresses innovations of interest to the integrated circuit manufacturing researcher and professional. Includes advanced process control, equipment modeling and control, yield analysis and optimization, defect control, and manufacturability improvement. It also addresses factory modelling and simulation, production planning and scheduling, as well as environmental issues in semiconductor manufacturing.
Sumikawa, N.; Wang, L.-C.; Abadir, M.S. Test Conference (ITC), 2012 IEEE International, 2012
Burn-in is a common test approach to screen out unreliable parts. The cost of burn-in can be significant due to long burn-in periods and expensive equipment. This work studies the potential of using parametric test data to reduce the time of burn-in. The experiment focuses on developing parametric test models based on test data collected after 10 hours of burn-in ...
Conti, D.R.; Van Horn, J. Electronic Components & Technology Conference, 2000. 2000 Proceedings. 50th, 2000
Is it the industry's intent to apply wafer-level burn-in (WLBI) to MPUs and ASICs? Package-level burn-in (PLBI) today is facing escalating burn-in power dissipation for these MPU and ASIC devices. The burn-in board (BIB) density (devices/BIB) varies inversely with device power dissipation. However, wafer- level burn-in would indicate the opposite-more devices in a 200 mm diameter. Is it the industry's ...
Bing Bai; Shaobo Chen; Weiming Wang; Hongwei Hao; Luming Li Reliability, Maintainability and Safety (ICRMS), 2011 9th International Conference on, 2011
Burn-in screening test technology has been an important method to ensure integrated circuits (IC) quality and reliability. But there are many problems remains to be solved during burn-in and accurate junction temperature of IC during burn-in is one of these problems. Leakage currents are rapidly increasing with CMOS IC technology scaling, and this will lead to high junction temperature of ...
Qingfeng Li; Shaobo Chen; Weiming Wang; Luming Li Reliability, Maintainability and Safety (ICRMS), 2011 9th International Conference on, 2011
Burn-in is used to force the failure of marginal devices before using into products. Usually devices are placed in a burn-in oven. The burn-in time mainly depends on the device junction temperature, so the junction temperature control is very important during burn-in test. Usually the oven ambient temperature is closed-loop controlled during burn-in, but the device junction temperature is open-loop, ...
Taeho Kim; Way Kuo; Chien, W.-T.K. Electronics Packaging Manufacturing, IEEE Transactions on, 2000
By removing infant mortalities, burn-in of semiconductor devices improves reliability. However, burn-in may affect the yield of semiconductor devices since defects grow during burn-in and some of them end up with yield loss. The amount of yield loss depends upon burn-in environments. Another burn-in effect is the yield gain. Since yield is a function of defect density, if some defects ...
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