Conferences related to Alpha Particle

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2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)

The NSS/MIC offers an outstanding opportunity for scientists and engineers interested in the fields of nuclear science, radiation detection, accelerators, high energy physics and astrophysics, and related software to present their latest developments and ideas. The scientific program provides a comprehensive review of the latest developments in technology and covers a wide range of applications from radiation and accelerator instrumentation, new detector materials, to complex detector systems for physical sciences, and advanced imaging systems for biological and medical research.

  • 2015 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

    The scope of the conference is to present advancements in the field of nuclear science (detectors, electronics and algorithms) as applied to high energy and nuclear physics, as well as various imaging techniques used in Medicine. The conference fosters interactions between instrumentation research and 'end user' application expertise, thus highlighting interdisciplinary aspects of nuclear science.

  • 2014 IEEE Nuclear Science Symposium and Medical Imaging Conference (2014 NSS/MIC)

    The conference emphasizes the latest developments in technology and instrumentation and their implementation in experiments for space, accelerators, other radiation environments, homeland security, and Medical Imaging Sciences

  • 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference (2013 NSS/MIC)

    Detectors, software, signal processing and systems for ionizing radiation. Medical imaging detector and system development for PET, SPECT and other imaging based on nuclear techniques.

  • 2012 IEEE Nuclear Science Symposium and Medical Imaging Conference (2012 NSS/MIC)

    Forum for exchange of scientist and engineers working Nuclear Physics and Medical Imaging in technology and instrumentation and their implementation in experiments for particle physics, space, accelerators and other applications of radiation detection such as the technological and mathematical aspects of radiotracer-based medical imaging and other areas of non-Nuclear Molecular Imaging technologies.

  • 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference (2011 NSS/MIC)

    Detectors, software, signal processing and systems for ionizing radiation. Medical imaging detector and system development for PET, SPECT and other imaging based on nuclear techniques.

  • 2010 IEEE Nuclear Science Symposium and Medical Imaging Conference (2010 NSS/MIC)

    Detectors, software, signal processing and systems for ionizing radiation. Medical imaging detector and system development for PET, SPECT and other imaging based on nuclear techniques.

  • 2009 IEEE Nuclear Science Symposium and Medical Imaging Conference (2009 NSS/MIC)

    Radiation Detectors and Instrumentation and their applications in Physics, Biology, Space,Material Science,Medical Physics, and Homeland Security

  • 2008 IEEE Nuclear Science Symposium and Medical Imaging Conference (2008 NSS/MIC)

    Detectors, software, signal processing and systems for ionizing radiation. Medical imaging detector and system development for PET, SPECT and other imaging based on nuclear techniques.

  • 2007 IEEE Nuclear Science Symposium and Medical Imaging Conference (2007 NSS/MIC)


2015 IEEE International Conference on Plasma Sciences (ICOPS)

Basic Processes in Fully and Partially Ionized Plasmas; Microwave Generation and Plasma Interactions; Charged Particle Beams and Sources; High Energy Density Plasmas and Applications; Industrial, Commercial, and Medical Plasma Applications; Plasma Diagnostics; Pulsed Power and other Plasma Applications.

  • 2012 IEEE 39th International Conference on Plasma Sciences (ICOPS)

    Fully and partially ionized plasmas, microwave-plasma interaction, charged particle beams and sources; high energy density plasmas and applications, industrial and medical applications of plasmas; plasma diagnostics; pulsed power and other plasma applictions

  • 2011 IEEE 38th International Conference on Plasma Sciences (ICOPS)

    The ICOPS is the state of the art plasma science conference that covers all aspects of the general plasma science and its applications in various research fields.

  • 2010 IEEE 37th International Conference on Plasma Sciences (ICOPS)

  • 2009 IEEE 36th International Conference on Plasma Sciences (ICOPS)

    The conference features an exciting technical program with reports from around the globe about new and innovative developments in the field of pulsed power, plasma science and engineering. Leading researchers gather to explore pulsed power plasmas, basic plasma physics, high-energy-density-plasmas, inertial confinement fusion, magnetic fusion, plasma diagnostics, microwave generation, lighting, micro and nano applications of plasmas, medical applications and plasma processing.

  • 2008 IEEE 35th International Conference on Plasma Sciences (ICOPS)

    The 35th IEEE International Conference on Plasma Science will feature an exciting technical program with reports from around the globe about new and innovative developments in the field of plasma science and engineering: 1. Basic processes in fully and partially ionized plasmas 2. Microwave generation and plasma interactions 3. Charged particle beams and sources 4. High energy density plasmas applications 5. Industrial, commercial and medical plasma applications 6. Plasma diagnostics 7. Pulsed power

  • 2007 IEEE 34th International Conference on Plasma Science (ICOPS)


2015 IEEE International Reliability Physics Symposium (IRPS)

Sharing information related to cause, effects and solutions in the deign and manufacture of electronics and related components



Periodicals related to Alpha Particle

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Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Nuclear Science, IEEE Transactions on

All aspects of the theory and applications of nuclear science and engineering, including instrumentation for the detection and measurement of ionizing radiation; particle accelerators and their controls; nuclear medicine and its application; effects of radiation on materials, components, and systems; reactor instrumentation and controls; and measurement of radiation in space.




Xplore Articles related to Alpha Particle

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An analytical approach for soft error rate estimation in digital circuits

G. Asadi; M. B. Tahoori 2005 IEEE International Symposium on Circuits and Systems, 2005

Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital systems, which increase exponentially with Moore's law. The first step in developing efficient soft error tolerant schemes is to analyze the effect of soft errors at the system level. In this work, we develop a systematic approach for soft error rate estimation. Experiments on benchmark circuits ...


Charge collection in <e1>HI</e1><sup>2</sup><e1>L</e1> bipolar transistors

P. J. McNulty; M. H. Taktieen; J. E. Lynch; W. M. Weber; H. T. Yuan; J. F. Salzman IEEE Transactions on Nuclear Science, 1988

Charge-collection measurements were carried out on HI2L transistors in GaAs in order to determine the thickness of the equivalent sensitive volume to be used in calculating single-event-upset (SEU) rates for this technology and to set a lower limit to the critical charge. The measurements were in the form of pulse-height spectra measured between the base-emitter and collector-emitter contacts upon exposure ...


Low power logic circuit and SRAM cell applications with silicon on depletion layer CMOS (SODEL CMOS) technology

S. Inaba; H. Nagano; K. Miyano; I. Mizushima; Y. Okayama; T. Nakauchi; K. Ishimaru; H. Ishiuchi Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571), 2004

In this paper, the AC performance of SODEL CMOS is discussed, aiming for low power CMOS applications. Propagation delay time (τpd) in SODEL CMOS has been improved by up to 25 % in five stacked nFET inverters, and about 30% better power-delay product has been observed at same τpd, compared to conventional (conv.) bulk CMOS. In SRAM cell applications of ...


Single-event-upset and alpha-particle emission rate measurement techniques

M. S. Gordon; K. P. Rodbell; D. F. Heidel; C. Cabral; E. H. Cannon; D. D. Reinhardt IBM Journal of Research and Development, 2008

The susceptibility of modern integrated-circuit devices to single-event upsets (SEUs) depends on both the alpha-particle emission rate and the energy of the alpha-particles emitted. In addition, the terrestrial neutron energy and flux, which produce secondary charged fragments in the device and circuit at the location of operation, contribute to the SEU rate. In this paper, we discuss methods that are ...


Vulnerability-based Interleaving for Multi-Bit Upset (MBU) protection in modern microprocessors

Michail Maniatakos; Maria K. Michael; Yiorgos Makris 2012 IEEE International Test Conference, 2012

We present a novel methodology for protecting incore microprocessor memory arrays from Multiple Bit Upsets (MBUs). Recent radiation studies in modern SRAMs demonstrate that up to 55% of Single Event Upsets (SEUs) due to alpha particle or neutron strikes result in MBUs. Towards suppressing these MBUs, methods such as physical interleaving or periodic scrubbing have been successfully applied to caches. ...


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Educational Resources on Alpha Particle

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eLearning

An analytical approach for soft error rate estimation in digital circuits

G. Asadi; M. B. Tahoori 2005 IEEE International Symposium on Circuits and Systems, 2005

Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital systems, which increase exponentially with Moore's law. The first step in developing efficient soft error tolerant schemes is to analyze the effect of soft errors at the system level. In this work, we develop a systematic approach for soft error rate estimation. Experiments on benchmark circuits ...


Charge collection in <e1>HI</e1><sup>2</sup><e1>L</e1> bipolar transistors

P. J. McNulty; M. H. Taktieen; J. E. Lynch; W. M. Weber; H. T. Yuan; J. F. Salzman IEEE Transactions on Nuclear Science, 1988

Charge-collection measurements were carried out on HI2L transistors in GaAs in order to determine the thickness of the equivalent sensitive volume to be used in calculating single-event-upset (SEU) rates for this technology and to set a lower limit to the critical charge. The measurements were in the form of pulse-height spectra measured between the base-emitter and collector-emitter contacts upon exposure ...


Low power logic circuit and SRAM cell applications with silicon on depletion layer CMOS (SODEL CMOS) technology

S. Inaba; H. Nagano; K. Miyano; I. Mizushima; Y. Okayama; T. Nakauchi; K. Ishimaru; H. Ishiuchi Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571), 2004

In this paper, the AC performance of SODEL CMOS is discussed, aiming for low power CMOS applications. Propagation delay time (τpd) in SODEL CMOS has been improved by up to 25 % in five stacked nFET inverters, and about 30% better power-delay product has been observed at same τpd, compared to conventional (conv.) bulk CMOS. In SRAM cell applications of ...


Single-event-upset and alpha-particle emission rate measurement techniques

M. S. Gordon; K. P. Rodbell; D. F. Heidel; C. Cabral; E. H. Cannon; D. D. Reinhardt IBM Journal of Research and Development, 2008

The susceptibility of modern integrated-circuit devices to single-event upsets (SEUs) depends on both the alpha-particle emission rate and the energy of the alpha-particles emitted. In addition, the terrestrial neutron energy and flux, which produce secondary charged fragments in the device and circuit at the location of operation, contribute to the SEU rate. In this paper, we discuss methods that are ...


Vulnerability-based Interleaving for Multi-Bit Upset (MBU) protection in modern microprocessors

Michail Maniatakos; Maria K. Michael; Yiorgos Makris 2012 IEEE International Test Conference, 2012

We present a novel methodology for protecting incore microprocessor memory arrays from Multiple Bit Upsets (MBUs). Recent radiation studies in modern SRAMs demonstrate that up to 55% of Single Event Upsets (SEUs) due to alpha particle or neutron strikes result in MBUs. Towards suppressing these MBUs, methods such as physical interleaving or periodic scrubbing have been successfully applied to caches. ...


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