Conferences related to Digital Circuits

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2016 IEEE International Solid- State Circuits Conference - (ISSCC)

foremost forum for presentation of advances in solid-state circuits and systems-on-a-chip. The Conference offers a unique opportunity for engineers working at the cutting edge of IC design and use to maintain technical currency, and to network with leading experts.


2016 IEEE Symposium on VLSI Circuits

circuit design to address challenges of deeply scaled technologies - e.g. dfm, variability, reliability - digital circuit techniques - analog and mixed signal circuits such as data converters and amp

  • 2020 IEEE Symposium on VLSI Circuits

    Circuit design to address challenges of deeply scaled technologies - e.g. DFM, variability, reliability - Digital circuit techniques - Analog and mixed signal circuits such as data converters and amplifiers to address performance, power, technology scaling, and variability - Complex SOC systems describing new architectures and implementations - Circuit approaches for clock generation and distribution - Advances in memory circuits; especially for embedded memories in scaled technologies - Adaptive pow

  • 2018 IEEE Symposium on VLSI Circuits

    Circuit design to address challenges of deeply scaled technologies - e.g. DFM, variability, reliability - Digital circuit techniques - Analog and mixed signal circuits such as data converters and amplifiers to address performance, power, technology scaling, and variability - Complex SOC systems describing new architectures and implementations - Circuit approaches for clock generation and distribution - Advances in memory circuits; especially for embedded memories in scaled technologies - Adaptive pow

  • 2014 IEEE Symposium on VLSI Circuits

    Circuit design to address challenges of deeply scaled technologies - e.g. DFM, variability, reliability - Digital circuit techniques - Analog and mixed signal circuits such as data converters and amplifiers to address performance, power, technology scaling, and variability - Complex SOC systems describing new architectures and implementations - Circuit approaches for clock generation and distribution - Advances in memory circuits; especially for embedded memories in scaled technologies - Adaptive pow

  • 2012 IEEE Symposium on VLSI Circuits

    Circuit design to address challenges of deeply scaled technologies - e.g. DFM, variability, reliability - Digital circuit techniques - Analog and mixed signal circuits such as data converters and amplifiers to address performance, power, technology scaling, and variability - Complex SOC systems describing new architectures and implementations - Circuit approaches for clock generation

  • 2011 Symposium on VLSI Circuits

    Circuit design to address challenges of deeply scaled technologies - e.g. DFM, variability, reliability - Digital circuit techniques - Analog and mixed signal circuits such as data converters and amplifiers to address performance, power, technology scaling, and variability - Complex SOC systems describing new architectures and implementations - Circuit approaches for clock generation and distribution - Advances in memory circuits; especially for embedded memories in scaled technologies - Adaptive pow

  • 2010 IEEE Symposium on VLSI Circuits

    Circuit design to address challenges of deeply scaled technologies - e.g. DFM, variability, reliability - Digital circuit techniques - Analog and mixed signal circuits such as data converters and amplifiers to address performance, power, technology scaling, and variability - Complex SOC systems describing new architectures and implementations - Circuit approaches for clock generation and distribution - Advances in memory circuits; especially for embedded memories in scaled technologies - Adaptive pow

  • 2009 Symposium on VLSI Circuits

    Circuit design to address challenges of deeply scaled technologies - e.g. DFM, variability, reliability - Digital circuit techniques - Analog and mixed signal circuits such as data converters and amplifiers to address performance, power, technology scaling, and variability - Complex SOC systems describing new architectures and implementations - Circuit approaches for clock generation and distribution - Advances in memory circuits; especially for embedded memories in scaled technologies

  • 2008 IEEE Symposium on VLSI Circuits

  • 2007 IEEE Symposium on VLSI Circuits


2016 IEEE Symposium on VLSI Technology

New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D - system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices.

  • 2020 IEEE Symposium on VLSI Technology

    New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D - system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices.

  • 2018 IEEE Symposium on VLSI Technology

    New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D - system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices.

  • 2014 IEEE Symposium on VLSI Technology

    New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D - system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices.

  • 2012 IEEE Symposium on VLSI Technology

    New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D - system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices -

  • 2011 Symposium on VLSI Technology

    New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D - system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices -

  • 2010 IEEE Symposium on VLSI Technology

    New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D - system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices -

  • 2009 IEEE Symposium on VLSI Technology

    - New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D-system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices

  • 2008 IEEE Symposium on VLSI Technology

  • 2007 IEEE Symposium on VLSI Technology

  • 2006 IEEE Symposium on VLSI Technology


2014 IEEE Custom Integrated Circuits Conference - CICC 2014

The IEEE Custom Integrated Circuits Conference (CICC) is the premier conference devoted to IC development. CICC showcases original, first-published innovative analog and digital circuit techniques covering a broad spectrum of technical topics. It is a forum for circuit, IC and SoC designers, CAD developers, manufacturers and ASIC users. CICC is the conference to find out how to solve design problems and improve circuit design and chip design techniques.


2014 IEEE International Symposium on Circuits and Systems (ISCAS)

The IEEE International Symposium on Circuits and Systems (ISCAS) is the flagship conference of the IEEE Circuits and Systems Society and the world’s premier networking forum in the highly active fields of theory, design and implementation of circuits and systems.ISCAS 2014 will have a special focus on nano/bio circuits and systems applied to enhancing living and lifestyles, and seeks to address multidisciplinary challenges in healthcare and well-being, the environment and climate change.

  • 2013 IEEE International Symposium on Circuits and Systems (ISCAS)

    The Symposium will focus on circuits and systems employing nanodevices (both extremely scaled CMOS and non-CMOS devices) and circuit fabrics (mixture of standard CMOS and evolving nano-structure elements) and their implementation cost, switching speed, energy efficiency, and reliability. The ISCAS 2010 will include oral and poster sessions; tutorials given by experts in state-of-the-art topics; and special sessions, with the aim of complementing the regular program with topics of particular interest to the community that cut across and beyond disciplines traditionally represented at ISCAS.

  • 2012 IEEE International Symposium on Circuits and Systems - ISCAS 2012

    2012 International Symposium on Circuits and Systems (ISCAS 2012) aims at providing the world's premier forum of leading researchers in circuits and systems areas from academia and industries, especially focusing on Convergence of BINET (BioInfoNanoEnviro Tech.) which represents IT, NT and ET and leading Human Life Revolutions. Prospective authors are invited to submit papers of their original works emphasizing contributions beyond the present state of the art. We also welcome proposals on special tuto

  • 2011 IEEE International Symposium on Circuits and Systems (ISCAS)

    The IEEE International Symposium on Circuits and Systems (ISCAS) is the world's premier networking forum of leading researchers in the highly active fields of theory, design and implementation of circuits and systems.

  • 2010 IEEE International Symposium on Circuits and Systems - ISCAS 2010

    ISCAS is a unique conference dealing with circuits and systems. It's the yearly "rendez-vous" of leading researchers, coming both from academia and industry, in the highly active fields of theory, design and implementation of circuits and systems. The Symposium will focus on circuits and systems for high quality life and consumer technologies, including mobile communications, advanced multimedia systems, sensor networks and Nano-Bio Circuit Fabrics and Systems.

  • 2009 IEEE International Symposium on Circuits and Systems - ISCAS 2009

    Analog Signal Processing, Biomedical Circuits and Systems, Blind Signal Processing, Cellular Neural Networks and Array Computing, Circuits and Systems for Communications, Computer-Aided Network Design, Digital Signal Processing, Life-Science Systems and Applications, Multimedia Systems and Applications, Nanoelectronics and Gigascale Systems, Neural Systems and Applications, Nonlinear Circuits and Applications, Power Systems and Power Electronic Circuits, Sensory Systems, Visual Signal Processing and Communi

  • 2008 IEEE International Symposium on Circuits and Systems - ISCAS 2008

  • 2007 IEEE International Symposium on Circuits and Systems - ISCAS 2007

  • 2006 IEEE International Symposium on Circuits and Systems - ISCAS 2006

  • 2005 IEEE International Symposium on Circuits and Systems - ISCAS 2005


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Periodicals related to Digital Circuits

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Circuits and Systems for Video Technology, IEEE Transactions on

Video A/D and D/A, display technology, image analysis and processing, video signal characterization and representation, video compression techniques and signal processing, multidimensional filters and transforms, analog video signal processing, neural networks for video applications, nonlinear video signal processing, video storage and retrieval, computer vision, packet video, high-speed real-time circuits, VLSI architecture and implementation for video technology, multiprocessor systems--hardware and software-- ...


Circuits and Systems I: Regular Papers, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Circuits and Systems II: Express Briefs, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Circuits and Systems Magazine, IEEE


Computers, IEEE Transactions on

Design and analysis of algorithms, computer systems, and digital networks; methods for specifying, measuring, and modeling the performance of computers and computer systems; design of computer components, such as arithmetic units, data storage devices, and interface devices; design of reliable and testable digital devices and systems; computer networks and distributed computer systems; new computer organizations and architectures; applications of VLSI ...


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Most published Xplore authors for Digital Circuits

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Xplore Articles related to Digital Circuits

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Reliable design methodology: The combined effect of radiation, variability and temperature

Fernando García-Redondo; Marisa López-Vallejo; Hernan Aparicio; Pablo Ituero 2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2016

The effects caused by variability, temperature, radiation or aging may compromise the reliability of electronic circuits. Circuits designers must consider their combined effects early during the design cycle, even though it is a time and effort demanding task. In this work we present a methodology and simulation framework for the reliable design of circuits working under realistic conditions such as ...


Basic qualitative properties of Petri nets with multi-guarded transitions

Jorge Julvez 2009 American Control Conference, 2009

In many discrete event dynamic systems, there exist tasks that can start performing before every input data is available. A common device exhibiting such a feature is the multiplexer: its output can be produced as soon as data is available in the selected channel without waiting for data in the other channels. The Petri net formalism can be easily extended ...


Fast Vth instability in HfO2 gate dielectric MOSFETs and Its impact on digital circuits

C. Shen; T. Yang; M. -f. Li; G. Samudra; Y. -c. Yeo; C. X. Zhu; S. C. Rustagi; M. B. Yu; D. -l. Kwong 2006 IEEE International Reliability Physics Symposium Proceedings, 2006

Fast component of Vth instability in MOSFET with HfO 2 gate dielectric is systematically measured and characterized. A charge trapping/de-trapping model is used to simulate the Vth instability with overall agreement with the experiments. Experimental and modeling data provide and predict the fast Vth shift under both static and dynamic stress conditions. These data are incorporated into HSpice circuit simulation ...


Effect of aliasing on spurs and PM noise in frequency dividers

A. SenGupta; F. L. Walls Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052), 2000

We show that the noise and spurious signals over the entire input frequency response of a binary digital divider contribute with equal weight to the output signal. Similar results are also obtained using non-binary digital dividers. We present a simple model that allows one to understand the mechanisms that produce these aliasing effects. Only filters at the input or intermediate ...


A new method in DFD design

Ling Xiang; Jiang Yonghua; Zhai Longjun; Tang Zhikai; Gao Weiliang 2005 Asia-Pacific Microwave Conference Proceedings, 2005

This paper provides a new technology of digital frequency discriminator (DFD) design. After a brief introduction on the definition and some historical remarks, the paper concentrates on the two different design in DFD. The method based on correlator arrays is analysed which is widely applied in IFM systems. The paper presents a new digital countering technology to realize a DFD ...


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Educational Resources on Digital Circuits

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eLearning

Reliable design methodology: The combined effect of radiation, variability and temperature

Fernando García-Redondo; Marisa López-Vallejo; Hernan Aparicio; Pablo Ituero 2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2016

The effects caused by variability, temperature, radiation or aging may compromise the reliability of electronic circuits. Circuits designers must consider their combined effects early during the design cycle, even though it is a time and effort demanding task. In this work we present a methodology and simulation framework for the reliable design of circuits working under realistic conditions such as ...


Basic qualitative properties of Petri nets with multi-guarded transitions

Jorge Julvez 2009 American Control Conference, 2009

In many discrete event dynamic systems, there exist tasks that can start performing before every input data is available. A common device exhibiting such a feature is the multiplexer: its output can be produced as soon as data is available in the selected channel without waiting for data in the other channels. The Petri net formalism can be easily extended ...


Fast Vth instability in HfO2 gate dielectric MOSFETs and Its impact on digital circuits

C. Shen; T. Yang; M. -f. Li; G. Samudra; Y. -c. Yeo; C. X. Zhu; S. C. Rustagi; M. B. Yu; D. -l. Kwong 2006 IEEE International Reliability Physics Symposium Proceedings, 2006

Fast component of Vth instability in MOSFET with HfO 2 gate dielectric is systematically measured and characterized. A charge trapping/de-trapping model is used to simulate the Vth instability with overall agreement with the experiments. Experimental and modeling data provide and predict the fast Vth shift under both static and dynamic stress conditions. These data are incorporated into HSpice circuit simulation ...


Effect of aliasing on spurs and PM noise in frequency dividers

A. SenGupta; F. L. Walls Proceedings of the 2000 IEEE/EIA International Frequency Control Symposium and Exhibition (Cat. No.00CH37052), 2000

We show that the noise and spurious signals over the entire input frequency response of a binary digital divider contribute with equal weight to the output signal. Similar results are also obtained using non-binary digital dividers. We present a simple model that allows one to understand the mechanisms that produce these aliasing effects. Only filters at the input or intermediate ...


A new method in DFD design

Ling Xiang; Jiang Yonghua; Zhai Longjun; Tang Zhikai; Gao Weiliang 2005 Asia-Pacific Microwave Conference Proceedings, 2005

This paper provides a new technology of digital frequency discriminator (DFD) design. After a brief introduction on the definition and some historical remarks, the paper concentrates on the two different design in DFD. The method based on correlator arrays is analysed which is widely applied in IFM systems. The paper presents a new digital countering technology to realize a DFD ...


More eLearning Resources

IEEE-USA E-Books

  • Wavelets in Packaging, Interconnects, and EMC

    In this chapter we study multiconductor, multilayered transmission lines (MMTL) employing quasi-static, quasi-dynamic, and full-wave analyses. We begin with the quasi-static formulation (QSF), which provides the parasitic capacitance, inductance, resistance, and conductance. We introduce an intermediate formulation between that of the quasi-static and full-wave, referred to as the quasi-dynamic formulation (QDF). Next, we present the full- wave analysis, from which we extract the scattering parameters. The emphasis of this chapter is given to packaging and interconnects of high-speed digital circuits and systems and the implementation of numerical algorithms using wavelets.

  • More Digital Circuits

    This chapter contains sections titled: The Multiplexer: Data Versus Control Vectors and Parallel Operations The Adder The Comparator The ALU

  • Low Power Digital Design

    This part contains sections titled: Introduction Sources of power dissipation in digital circuits Low power CMOS design A case study Summary This part contains sections titled: References

  • No title

    An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluat on techniques used in BIST (built-in self- test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

  • Laws of Boolean Algebra

    This chapter contains sections titled: Sets of Axioms Perfect Induction Deduction Allowed Manipulations of Boolean Equations Principle of Duality

  • No title

    This book is concerned with circuit simulation using National Instruments Multisim. It focuses on the use and comprehension of the working techniques for electrical and electronic circuit simulation. The first chapters are devoted to basic circuit analysis. It starts by describing in detail how to perform a DC analysis using only resistors and independent and controlled sources. Then, it introduces capacitors and inductors to make a transient analysis. In the case of transient analysis, it is possible to have an initial condition either in the capacitor voltage or in the inductor current, or both. Fourier analysis is discussed in the context of transient analysis. Next, we make a treatment of AC analysis to simulate the frequency response of a circuit. Then, we introduce diodes, transistors, and circuits composed by them and perform DC, transient, and AC analyses. The book ends with simulation of digital circuits. A practical approach is followed through the chapters, using step-by-st p examples to introduce new Multisim circuit elements, tools, analyses, and virtual instruments for measurement. The examples are clearly commented and illustrated. The different tools available on Multisim are used when appropriate so readers learn which analyses are available to them. This is part of the learning outcomes that should result after each set of end-of- chapter exercises is worked out. Table of Contents: Introduction to Circuit Simulation / Resistive Circuits / Time Domain Analysis -- Transient Analysis / Frequency Domain Analysis -- AC Analysis / Semiconductor Devices / Digital Circuits

  • SubstrateAware MixedSignal Macrocell Placement in WRIGHT

    We describe a set of placement algorithms for handling substrate-coupled switching noise. A typical mixed-signal IC has both sensitive analog and noisy digital circuits, and the common substrate parasitically couples digital switching transients into the sensitive analog regions of the chip. To preserve the integrity of sensitive analog signals, it is thus necessary to electrically isolate the analog and digital. We argue that optimal area utilization requires such isolation be designed into the system during first- cut chip-level placement. We present algorithms that incorporate commonly used isolation techniques within an automatic placement framework. Our substrate- noise evaluation mechanism uses a simplified substrate model and simple electrical representations for the noisy digital macrocells. The digital/analog interactions determined through these models are incorporated into a simulated annealing macrocell placement framework. Automatic placement results indicate these substrateaware algorithms allow efficient mixed-signal placement optimization.

  • Digital Electronics

    This chapter contains sections titled: Introduction Circuit Board Material The Two-Sided Circuit Board Multilayer Circuit Boards Ground Planes and Digital Circuit Boards Clocked Logic The Transmission of a Single Logic Signal Decoupling Capacitors The Power Plane The Ground and Power Plane Capacitance Using Vias Decoupling Capacitors as Transmission Lines Characteristic Impedance Control Radiation from Digital Boards Measurement Problems - Ground Bounce High Clock Rates Balanced Transmission Ribbon Cable and Connectors Daughter Boards Mixing Analog and Digital Circuits Optical Isolation Gold Plating GHz Notes

  • LowPower CMOS Digital Circuits

    This chapter contains sections titled: Introduction Power and Energy Definitions Power and Energy Consumption in Digital Circuits Switching Activity in CMOS Digital Systems Reduction of Energy in CMOS Digital Circuits Adiabatic Computing This chapter contains sections titled: Appendix A Appendix B References

  • Boolean Logic

    This chapter contains sections titled: Opposition Consensus Canonical Form Blake Canonical Form Prime Implicants A New Realization of the Implication Function Syllogistic Reasoning Premises that are Not Implications Clausal Form Video Game Example Equivalent Formulations of Results Specific Results Derived from General Results Karnaugh Maps



Standards related to Digital Circuits

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No standards are currently tagged "Digital Circuits"