Conferences related to Digital Circuits

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2016 IEEE International Solid- State Circuits Conference - (ISSCC)

foremost forum for presentation of advances in solid-state circuits and systems-on-a-chip. The Conference offers a unique opportunity for engineers working at the cutting edge of IC design and use to maintain technical currency, and to network with leading experts.


2016 IEEE Symposium on VLSI Circuits

circuit design to address challenges of deeply scaled technologies - e.g. dfm, variability, reliability - digital circuit techniques - analog and mixed signal circuits such as data converters and amp

  • 2020 IEEE Symposium on VLSI Circuits

    Circuit design to address challenges of deeply scaled technologies - e.g. DFM, variability, reliability - Digital circuit techniques - Analog and mixed signal circuits such as data converters and amplifiers to address performance, power, technology scaling, and variability - Complex SOC systems describing new architectures and implementations - Circuit approaches for clock generation and distribution - Advances in memory circuits; especially for embedded memories in scaled technologies - Adaptive pow

  • 2018 IEEE Symposium on VLSI Circuits

    Circuit design to address challenges of deeply scaled technologies - e.g. DFM, variability, reliability - Digital circuit techniques - Analog and mixed signal circuits such as data converters and amplifiers to address performance, power, technology scaling, and variability - Complex SOC systems describing new architectures and implementations - Circuit approaches for clock generation and distribution - Advances in memory circuits; especially for embedded memories in scaled technologies - Adaptive pow

  • 2014 IEEE Symposium on VLSI Circuits

    Circuit design to address challenges of deeply scaled technologies - e.g. DFM, variability, reliability - Digital circuit techniques - Analog and mixed signal circuits such as data converters and amplifiers to address performance, power, technology scaling, and variability - Complex SOC systems describing new architectures and implementations - Circuit approaches for clock generation and distribution - Advances in memory circuits; especially for embedded memories in scaled technologies - Adaptive pow

  • 2012 IEEE Symposium on VLSI Circuits

    Circuit design to address challenges of deeply scaled technologies - e.g. DFM, variability, reliability - Digital circuit techniques - Analog and mixed signal circuits such as data converters and amplifiers to address performance, power, technology scaling, and variability - Complex SOC systems describing new architectures and implementations - Circuit approaches for clock generation

  • 2011 Symposium on VLSI Circuits

    Circuit design to address challenges of deeply scaled technologies - e.g. DFM, variability, reliability - Digital circuit techniques - Analog and mixed signal circuits such as data converters and amplifiers to address performance, power, technology scaling, and variability - Complex SOC systems describing new architectures and implementations - Circuit approaches for clock generation and distribution - Advances in memory circuits; especially for embedded memories in scaled technologies - Adaptive pow

  • 2010 IEEE Symposium on VLSI Circuits

    Circuit design to address challenges of deeply scaled technologies - e.g. DFM, variability, reliability - Digital circuit techniques - Analog and mixed signal circuits such as data converters and amplifiers to address performance, power, technology scaling, and variability - Complex SOC systems describing new architectures and implementations - Circuit approaches for clock generation and distribution - Advances in memory circuits; especially for embedded memories in scaled technologies - Adaptive pow

  • 2009 Symposium on VLSI Circuits

    Circuit design to address challenges of deeply scaled technologies - e.g. DFM, variability, reliability - Digital circuit techniques - Analog and mixed signal circuits such as data converters and amplifiers to address performance, power, technology scaling, and variability - Complex SOC systems describing new architectures and implementations - Circuit approaches for clock generation and distribution - Advances in memory circuits; especially for embedded memories in scaled technologies

  • 2008 IEEE Symposium on VLSI Circuits

  • 2007 IEEE Symposium on VLSI Circuits


2016 IEEE Symposium on VLSI Technology

New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D - system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices.

  • 2020 IEEE Symposium on VLSI Technology

    New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D - system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices.

  • 2018 IEEE Symposium on VLSI Technology

    New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D - system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices.

  • 2014 IEEE Symposium on VLSI Technology

    New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D - system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices.

  • 2012 IEEE Symposium on VLSI Technology

    New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D - system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices -

  • 2011 Symposium on VLSI Technology

    New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D - system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices -

  • 2010 IEEE Symposium on VLSI Technology

    New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D - system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices -

  • 2009 IEEE Symposium on VLSI Technology

    - New concepts and breakthroughs in VLSI processes and devices including Memory, Logic, I/O, and I/F (RF/Analog/MS, Imager, MEMS, etc.) - Advanced gate stack and interconnect in VLSI processes and devices - Advanced lithography and fine patternig technologies for high density VLSI - New functional devices beyond CMOS with a path for VLSI implantation - Packing of VLSI devices including 3D-system integration - Processes and devices modeling of VLSI devices - Reliability related to the above devices

  • 2008 IEEE Symposium on VLSI Technology

  • 2007 IEEE Symposium on VLSI Technology

  • 2006 IEEE Symposium on VLSI Technology


2014 IEEE Custom Integrated Circuits Conference - CICC 2014

The IEEE Custom Integrated Circuits Conference (CICC) is the premier conference devoted to IC development. CICC showcases original, first-published innovative analog and digital circuit techniques covering a broad spectrum of technical topics. It is a forum for circuit, IC and SoC designers, CAD developers, manufacturers and ASIC users. CICC is the conference to find out how to solve design problems and improve circuit design and chip design techniques.


2014 IEEE International Symposium on Circuits and Systems (ISCAS)

The IEEE International Symposium on Circuits and Systems (ISCAS) is the flagship conference of the IEEE Circuits and Systems Society and the world’s premier networking forum in the highly active fields of theory, design and implementation of circuits and systems.ISCAS 2014 will have a special focus on nano/bio circuits and systems applied to enhancing living and lifestyles, and seeks to address multidisciplinary challenges in healthcare and well-being, the environment and climate change.

  • 2013 IEEE International Symposium on Circuits and Systems (ISCAS)

    The Symposium will focus on circuits and systems employing nanodevices (both extremely scaled CMOS and non-CMOS devices) and circuit fabrics (mixture of standard CMOS and evolving nano-structure elements) and their implementation cost, switching speed, energy efficiency, and reliability. The ISCAS 2010 will include oral and poster sessions; tutorials given by experts in state-of-the-art topics; and special sessions, with the aim of complementing the regular program with topics of particular interest to the community that cut across and beyond disciplines traditionally represented at ISCAS.

  • 2012 IEEE International Symposium on Circuits and Systems - ISCAS 2012

    2012 International Symposium on Circuits and Systems (ISCAS 2012) aims at providing the world's premier forum of leading researchers in circuits and systems areas from academia and industries, especially focusing on Convergence of BINET (BioInfoNanoEnviro Tech.) which represents IT, NT and ET and leading Human Life Revolutions. Prospective authors are invited to submit papers of their original works emphasizing contributions beyond the present state of the art. We also welcome proposals on special tuto

  • 2011 IEEE International Symposium on Circuits and Systems (ISCAS)

    The IEEE International Symposium on Circuits and Systems (ISCAS) is the world's premier networking forum of leading researchers in the highly active fields of theory, design and implementation of circuits and systems.

  • 2010 IEEE International Symposium on Circuits and Systems - ISCAS 2010

    ISCAS is a unique conference dealing with circuits and systems. It's the yearly "rendez-vous" of leading researchers, coming both from academia and industry, in the highly active fields of theory, design and implementation of circuits and systems. The Symposium will focus on circuits and systems for high quality life and consumer technologies, including mobile communications, advanced multimedia systems, sensor networks and Nano-Bio Circuit Fabrics and Systems.

  • 2009 IEEE International Symposium on Circuits and Systems - ISCAS 2009

    Analog Signal Processing, Biomedical Circuits and Systems, Blind Signal Processing, Cellular Neural Networks and Array Computing, Circuits and Systems for Communications, Computer-Aided Network Design, Digital Signal Processing, Life-Science Systems and Applications, Multimedia Systems and Applications, Nanoelectronics and Gigascale Systems, Neural Systems and Applications, Nonlinear Circuits and Applications, Power Systems and Power Electronic Circuits, Sensory Systems, Visual Signal Processing and Communi

  • 2008 IEEE International Symposium on Circuits and Systems - ISCAS 2008

  • 2007 IEEE International Symposium on Circuits and Systems - ISCAS 2007

  • 2006 IEEE International Symposium on Circuits and Systems - ISCAS 2006

  • 2005 IEEE International Symposium on Circuits and Systems - ISCAS 2005


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Periodicals related to Digital Circuits

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Circuits and Systems for Video Technology, IEEE Transactions on

Video A/D and D/A, display technology, image analysis and processing, video signal characterization and representation, video compression techniques and signal processing, multidimensional filters and transforms, analog video signal processing, neural networks for video applications, nonlinear video signal processing, video storage and retrieval, computer vision, packet video, high-speed real-time circuits, VLSI architecture and implementation for video technology, multiprocessor systems--hardware and software-- ...


Circuits and Systems I: Regular Papers, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Circuits and Systems II: Express Briefs, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Circuits and Systems Magazine, IEEE


Computers, IEEE Transactions on

Design and analysis of algorithms, computer systems, and digital networks; methods for specifying, measuring, and modeling the performance of computers and computer systems; design of computer components, such as arithmetic units, data storage devices, and interface devices; design of reliable and testable digital devices and systems; computer networks and distributed computer systems; new computer organizations and architectures; applications of VLSI ...


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Most published Xplore authors for Digital Circuits

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Xplore Articles related to Digital Circuits

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Adaptive digital predistortion technique for microwave power amplifiers

E. G. Jeckeln; P. M. Ghannouchi; M. Sawan Electrical and Computer Engineering, 1995. Canadian Conference on, 1995

The proposed technique is based on the use of algorithms executed by a digital signal processing circuit. A third-order spline function is deduced for application as a signal generator which can provide a predistorted equivalent output for any value or input signal. Samples of the baseband complex equivalent of the signal at the input and output of the amplifier are ...


Quantifying the effects on EMI and SI of source imbalances in differential signaling

Chen Wang; J. L. Drewniak Electromagnetic Compatibility, 2003 IEEE International Symposium on, 2003

Imbalances in differential signaling can introduce common-mode components, resulting in signal integrity (SI) problems as well as EMI problems. Three- port mixed-mode S-parameters are employed to quantify the impacts on EMI. The EMI problems caused by delay skew and slew rate skew are investigated.


Calculating the effects of linear dependencies in <e1>m</e1>-sequences used as test stimuli

P. H. Bardell Test Conference, 1989. Proceedings. Meeting the Tests of Time., International, 1989

When pseudorandom patterns generated by a linear feedback shift register (LFSR) are used as test stimuli, there is always a concern about the linear dependencies within the sequence of patterns. It is possible for these linear dependencies to prevent a specific test pattern from being present in the sequence of applied patterns. These dependencies and ways to calculate their effects ...


Threshold voltage-minimum gate length trade-off in buried channel PMOS devices for scaled supply voltage CMOS technologies

I. C. Kizilyalli; M. M. Rambaud; A. Duncan; S. A. Lytle; M. J. Thoma IEEE Electron Device Letters, 1995

The trade-off between threshold voltage (VTh) and the minimum gate length (L/sub m/in) is discussed for optimizing the performance of buried channel PMOS transistors for low voltage/low power high-speed digital CMOS circuits. In a low supply voltage CMOS technology it is desirable to scale VTh and L/sub m/in for improved circuit performance. However, these two parameters cannot be scaled independently ...


Comparing the dynamic behavior between LFSRs and counting techniques

R. Seireg; A. Vacroux Radio Science Conference, 1996. NRSC '96., Thirteenth National, 1996

Transition counting is one of the schemes which is used for testing digital circuits. A relation for the aliasing error probability has been deduced which depends on the length of the input pattern. Previously, we have proved that the final value for aliasing error probability for both linear and counting techniques are similar. However, the practical results indicate that the ...


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Educational Resources on Digital Circuits

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eLearning

Adaptive digital predistortion technique for microwave power amplifiers

E. G. Jeckeln; P. M. Ghannouchi; M. Sawan Electrical and Computer Engineering, 1995. Canadian Conference on, 1995

The proposed technique is based on the use of algorithms executed by a digital signal processing circuit. A third-order spline function is deduced for application as a signal generator which can provide a predistorted equivalent output for any value or input signal. Samples of the baseband complex equivalent of the signal at the input and output of the amplifier are ...


Quantifying the effects on EMI and SI of source imbalances in differential signaling

Chen Wang; J. L. Drewniak Electromagnetic Compatibility, 2003 IEEE International Symposium on, 2003

Imbalances in differential signaling can introduce common-mode components, resulting in signal integrity (SI) problems as well as EMI problems. Three- port mixed-mode S-parameters are employed to quantify the impacts on EMI. The EMI problems caused by delay skew and slew rate skew are investigated.


Calculating the effects of linear dependencies in <e1>m</e1>-sequences used as test stimuli

P. H. Bardell Test Conference, 1989. Proceedings. Meeting the Tests of Time., International, 1989

When pseudorandom patterns generated by a linear feedback shift register (LFSR) are used as test stimuli, there is always a concern about the linear dependencies within the sequence of patterns. It is possible for these linear dependencies to prevent a specific test pattern from being present in the sequence of applied patterns. These dependencies and ways to calculate their effects ...


Threshold voltage-minimum gate length trade-off in buried channel PMOS devices for scaled supply voltage CMOS technologies

I. C. Kizilyalli; M. M. Rambaud; A. Duncan; S. A. Lytle; M. J. Thoma IEEE Electron Device Letters, 1995

The trade-off between threshold voltage (VTh) and the minimum gate length (L/sub m/in) is discussed for optimizing the performance of buried channel PMOS transistors for low voltage/low power high-speed digital CMOS circuits. In a low supply voltage CMOS technology it is desirable to scale VTh and L/sub m/in for improved circuit performance. However, these two parameters cannot be scaled independently ...


Comparing the dynamic behavior between LFSRs and counting techniques

R. Seireg; A. Vacroux Radio Science Conference, 1996. NRSC '96., Thirteenth National, 1996

Transition counting is one of the schemes which is used for testing digital circuits. A relation for the aliasing error probability has been deduced which depends on the length of the input pattern. Previously, we have proved that the final value for aliasing error probability for both linear and counting techniques are similar. However, the practical results indicate that the ...


More eLearning Resources

IEEE-USA E-Books

  • Combinational Circuits

    This chapter contains sections titled: Introduction to Digital Circuits Binary Numbers: a Quick Introduction Boolean Algebra Minterms: Standard or Canonical Sum of Products (SOP) Form Maxterms: Standard or Canonical Product of Sums (POS) Form Karnaugh Maps and Design Examples Product of Sums Simplifications Don't Care Conditions Logic Gates: Electrical and Timing Characteristics Summary Further Reading Problems

  • Index

    Modern, complex digital systems invariably include hardware-implemented finite state machines. The correct design of such parts is crucial for attaining proper system performance. This book offers detailed, comprehensive coverage of the theory and design for any category of hardware-implemented finite state machines. It describes crucial design problems that lead to incorrect or far from optimal implementation and provides examples of finite state machines developed in both VHDL and SystemVerilog (the successor of Verilog) hardware description languages.Important features include: extensive review of design practices for sequential digital circuits; a new division of all state machines into three hardware-based categories, encompassing all possible situations, with numerous practical examples provided in all three categories; the presentation of complete designs, with detailed VHDL and SystemVerilog codes, comments, and simulation results, all tested in FPGA devices; and exercise examples, all of which can be synthesized, simulated, and physically implemented in FPGA boards. Additional material is available on the book's Website. Designing a state machine in hardware is more complex than designing it in software. Although interest in hardware for finite state machines has grown dramatically in recent years, there is no comprehensive treatment of the subject. This book offers the most detailed coverage of finite state machines available. It will be essential for industrial designers of digital systems and for students of electrical engineering and computer science.

  • No title

    The Boolean Differential Calculus (BDC) is a very powerful theory that extends the structure of a Boolean Algebra significantly. Based on a small number of definitions, many theorems have been proven. The available operations have been efficiently implemented in several software packages. There is a very wide field of applications. While a Boolean Algebra is focused on values of logic functions, the BDC allows the evaluation of changes of function values. Such changes can be explored for pairs of function values as well as for whole subspaces. Due to the same basic data structures, the BDC can be applied to any task described by logic functions and equations together with the Boolean Algebra. The BDC can be widely used for the analysis, synthesis, and testing of digital circuits. Generally speaking, a Boolean differential equation (BDE) is an equation in which elements of the BDC appear. It includes variables, functions, and derivative operations of these functions. The solution of su h a BDE is a set of Boolean functions. This is a significant extension of Boolean equations, which have sets of Boolean vectors as solutions. In the simplest BDE a derivative operation of the BDC on the left-hand side is equal to a logic function on the right-hand side. The solution of such a simple BDE means to execute an operation which is inverse to the given derivative. BDEs can be applied in the same fields as the BDC, however, their possibility to express sets of Boolean functions extends the application field significantly.

  • Power Dissipation Analysis and Optimization of Deep Submicron CMOS Digital Circuits

    This paper introduces a simple analytical model for estimating standby and switching power dissipation in deep submicron CMOS digital circuits. The model is based on Berkeley Short-Channel IGFET model and fits HSPICE simulation results well. Static and dynamic power analysis for various threshold voltages is addressed. A design methodology to minimize the power-delay product by selecting the lower and upper bounds of the supply and threshold voltages is presented. The effects of the supply voltage, the threshold voltage, and _ ?> _, which reflects the drain induced barrier lowing, are also addressed.

  • Low Power Digital Design

    This part contains sections titled: Introduction Sources of power dissipation in digital circuits Low power CMOS design A case study Summary This part contains sections titled: References

  • Appendix A: Counting in Base 2

    This book explains, in lay terms, the surprisingly simple system of mathematical logic used in digital computer circuitry. Anecdotal in its style and often funny, it follows the development of this logic system from its origins in Victorian England to its rediscovery in this century as the foundation of all modern computing machinery. ONES AND ZEROS will be enjoyed by anyone who has a general interest in science and technology.

  • Adaptive Power Supply Systems

    This chapter contains sections titled: A Voltage Reduction Technique for Battery Operated Systems Automatic Adjustment of Threshold and Supply Voltage for Minimum Power Consumption in CMOS Digital Circuits Low-Power Operation Using Self-Timed Circuits and Adaptive Scaling of the Supply Voltage A Low-Power Switching Power Supply for Self-Clocked Systems Variable-Voltage Digital-Signal Processing Scheduling for Reduced CPU Energy

  • Frontmatter

    The prelims comprise: Half Title Book Series Title IEEE Press Board Page Dedication Copyright Contents Before We Begin

  • Index

    This book explains, in lay terms, the surprisingly simple system of mathematical logic used in digital computer circuitry. Anecdotal in its style and often funny, it follows the development of this logic system from its origins in Victorian England to its rediscovery in this century as the foundation of all modern computing machinery. ONES AND ZEROS will be enjoyed by anyone who has a general interest in science and technology.

  • Laws of Boolean Algebra

    This chapter contains sections titled: Sets of Axioms Perfect Induction Deduction Allowed Manipulations of Boolean Equations Principle of Duality



Standards related to Digital Circuits

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No standards are currently tagged "Digital Circuits"