Conferences related to Testing

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2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe)

Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for smarter grid, energy efficiency,technologies for sustainable energy systems, converters and power supplies


2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)

The conference will provide a forum for discussions and presentations of advancements inknowledge, new methods and technologies relevant to industrial electronics, along with their applications and future developments.


2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)

Photovoltaic materials, devices, systems and related science and technology


2019 IEEE 69th Electronic Components and Technology Conference (ECTC)

premier components, packaging and technology conference


2019 IEEE Applied Power Electronics Conference and Exposition (APEC)

APEC focuses on the practical and applied aspects of the power electronics business. The conference addresses issues of immediate and long term importance to practicing power electronics engineer.


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Periodicals related to Testing

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Advanced Packaging, IEEE Transactions on

The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.


Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Antennas and Wireless Propagation Letters, IEEE

IEEE Antennas and Wireless Propagation Letters (AWP Letters) will be devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


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Most published Xplore authors for Testing

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Xplore Articles related to Testing

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IEE Colloquium on 'Techniques for Testing and Measuring Digital Systems' (Digest No.105)

[] IEE Colloquium on Techniques for Testing and Measuring Digital Systems, 1988

None


Delayed Failures in Software Using High Volume Automated Testing

[{u'author_order': 1, u'affiliation': u'Cranfield University', u'authorUrl': u'https://ieeexplore.ieee.org/author/38032705300', u'full_name': u'J. Gardiner', u'id': 38032705300}] Testing: Academic & Industrial Conference - Practice And Research Techniques (TAIC PART'06), 2006

The research described studies delayed failures in software using high volume automated testing (HVAT) and investigates the effectiveness of different HVAT techniques; such techniques include genetic algorithms, model-based testing, penetration testing, robustness testing, and random (stochastic) testing. A delayed failure is a failure that occurs some time after the conditions that lead to the failure are applied. There appear to ...


IEE Colloquium on 'Testing-the Gordian Knot of VLSI Design' (Digest No.1993/131)

[] IEE Colloquium on Testing-the Gordian Knot of VLSI Design, 1993

None


IEEE Standard for High-Voltage Testing Techniques - Redline

[] IEEE Std 4-2013 (Revision of IEEE Std 4-1995) - Redline, 2013

Standard methods and basic techniques for high-voltage testing applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established in this standard. Sections that deal with alternating voltage, direct voltage, and impulse testing are combined in this revision to organize the technical content for ease of use. In addition, ...


Search-Based Testing and System Testing: A Marriage in Heaven

[{u'author_order': 1, u'authorUrl': u'https://ieeexplore.ieee.org/author/37270132000', u'full_name': u'Andreas Zeller', u'id': 37270132000}] 2017 IEEE/ACM 10th International Workshop on Search-Based Software Testing (SBST), 2017

Software test generation can take place at the function level or the system level, and be driven by random, constraint-based, and/or search-based techniques. In this paper, we argue that the best way to generate tests is at the system level, as it avoids false failures due to implicit preconditions, and that for testing at the system level, search-based techniques are ...


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Educational Resources on Testing

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eLearning

No eLearning Articles are currently tagged "Testing"

IEEE-USA E-Books

  • Hard Problems in Software Testing: Solutions Using Testing as a Service (TaaS)

    This book summarizes the current hard problems in software testing as voiced by leading practitioners in the field. The problems were identified through a series of workshops, interviews, and surveys. Some of the problems are timeless, such as education and training, while others such as system security have recently emerged as increasingly important. The book also provides an overview of the current state of Testing as a Service (TaaS) based on an exploration of existing commercial offerings and a survey of academic research. TaaS is a relatively new development that offers software testers the elastic computing capabilities and generous storage capacity of the cloud on an as-needed basis. Some of the potential benefits of TaaS include automated provisioning of test execution environments and support for rapid feedback in agile development via continuous regression testing. The book includes a case study of a representative web application and three commercial TaaS tools to determine which hard problems in software testing are amenable to a TaaS solution. The findings suggest there remains a significant gap that must be addressed before TaaS can be fully embraced by the industry, particularly in the areas of tester education and training and a need for tools supporting more types of testing. The book includes a roadmap for enhancing TaaS to help bridge the gap between potential benefits and actual results. Table of Contents: Introduction / Hard Problems in Software Testing / Testing as a Service (TaaS) / Case Study and Gap Analysis / Summary / Appendix A: Hard Problems in Software Testing Survey / Appendix B: Google App Engine Code Examples / Appendix C: Sauce Labs Code Examples / References / Author Biographies

  • An Introduction to Logic Circuit Testing

    An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self- test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

  • Testing iOS Apps with HadoopUnit: Rapid Distributed GUI Testing

    Smartphone users have come to expect high-quality apps. This has increased the importance of software testing in mobile software development. Unfortunately, testing apps—particularly the GUI—can be very time-consuming. Exercising every user interface element and verifying transitions between different views of the app under test quickly becomes problematic. For example, execution of iOS GUI test suites using Apple’s UI Automation framework can take an hour or more if the app’s interface is complicated. The longer it takes to run a test, the less frequently the test can be run, which in turn reduces software quality. This book describes how to accelerate the testing process for iOS apps using HadoopUnit, a distributed test execution environment that leverages the parallelism inherent in the Hadoop platform. HadoopUnit was previously used to run unit and system tests in the cloud. It has been modified to perform GUI testing of iOS apps on a small-scale cluster—a modest computing infrastructure available to almost every developer. Experimental results have shown that distributed test execution with HadoopUnit can significantly outperform the test execution on a single machine, even if the size of the cluster used for the execution is as small as two nodes. This means that the approach described in this book could be adopted without a huge investment in IT resources. HadoopUnit is a cost-effective solution for reducing lengthy test execution times of system-level GUI testing of iOS apps.

  • Part 2: Automotive Lubricant Testing, Lubricant Performance, and Current Lubricant Specifications

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  • Chapter 11—Gear Oil Screen Testing with FZG Back-to-Back Rig

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  • Automotive Lubricants and Testing

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  • Chapter 24—Filters and Filtration Testing of Automotive Fuels and Lubricants

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  • Part 3: Specialized Automotive Lubricant Testing and Future Automotive Applications

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  • Logic Testing

    None

  • Reliability Criteria in Information Theory and in Statistical Hypothesis Testing

    Reliability Criteria in Information Theory and Statistical Hypothesis Testing is devoted to one of the central problems of Information Theory; the problem of determination of interdependence of coding rate and of error probability exponent for different information transmission systems. The overview deals with memoryless systems of finite alphabet setting. Reliability Criteria in Information Theory and Statistical Hypothesis Testing briefly formulates fundamental notions and results of Shannon theory on reliable transmission via coding and gives a survey of results obtained in last two-three decades by the authors, their colleagues and other researchers. The book is written with the goal to make accessible to a broader circle of readers the concept of rate- reliability. This concept is useful to solve these problems as well as elaborating the idea of reliability-reliability dependence related to statistical hypothesis testing and identification. Reliability Criteria in Information Theory and Statistical Hypothesis Testing is for students, researchers and professionals working in Information Theory.