Conferences related to Testing

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2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe)

Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for smarter grid, energy efficiency,technologies for sustainable energy systems, converters and power supplies


2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC)

ASP-DAC 2018 is the 23rd annual international conference on VLSI design automation in Asia and South Pacific regions, one of the most active regions of design and fabrication of silicon chips in the world. The conference aims at providing the Asian and South Pacific CAD/DA and Design community with opportunities of presenting recent advances and with forums for future directions in technologies related to Electronic Design Automation (EDA). The format of the meeting intends to cultivate and promote an instructive and productive interchange of ideas among EDA researchers/developers and system/circuit/device designers. All scientists, engineers, and students who are interested in theoretical and practical aspects of VLSI design and design automation are welcomed to ASP-DAC.


2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)

The DATE conference addresses all aspects of research into technologies for electronic and embedded system engineering. It covers the design process, test, and automation tools for electronics ranging from integrated circuits to distributed embedded systems. This includes both hardware and embedded software design issues. The conference scope also includes the elaboration of design requirements and new architectures for challenging application fields such as telecoms, wireless communications, multimedia, healthcare, smart energy and automotive systems. Companies also present innovative industrial designs to foster the feedback fromrealworld design to research. DATE also hosts a number of special sessions, events within the main technical programme such as panels, hot-topic sessions, tutorials and workshops technical programme such as panels, hot-topic sessions, tutorials and workshops.

  • 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE)

    The DATE conference addresses all aspects of research into technologies for electronic and embedded system engineering. It covers the design process, test, and automation tools for electronics ranging from integrated circuits to distributed embedded systems. This includes both hardware and embedded software design issues. The conference scope also includes the elaboration of design requirements and new architectures for challenging application fields such as telecoms, wireless communications, multimedia, healthcare, smart energy and automotive systems. Companies also present innovative industrial designs to foster the feedback fromrealworld design to research. DATE also hosts a number of special sessions, events within the main technical programme such as panels, hot-topic sessions, tutorials and workshops technical programme such as panels, hot-topic sessions, tutorials and workshops.

  • 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)

    The DATE conference addresses all aspects of research into technologies for electronic andembedded system engineering. It covers the design process, test, and automation tools forelectronics ranging from integrated circuits to distributed embedded systems. This includes bothhardware and embedded software design issues. The conference scope also includes theelaboration of design requirements and new architectures for challenging application fields suchas telecoms, wireless communications, multimedia, healthcare, smart energy and automotivesystems. Companies also present innovative industrial designs to foster the feedback from realworlddesign to research. DATE also hosts a number of special sessions, events within the maintechnical programme such as panels, hot-topic sessions, tutorials and workshops technical programme such as panels, hot-topic sessions, tutorials and workshops

  • 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE)

    The DATE conference addresses all aspects of research into technologies for electronic and embedded system engineering. It covers the design process, test, and automation tools for electronics ranging from integrated circuits to distributed embedded systems. This includes both hardware and embedded software design issues. The conference scope also includes the elaboration of design requirements and new architectures for challenging application fields such as telecoms, wireless communications, multimedia, healthcare, smart energy and automotive systems. Companies also present innovative industrial designs to foster the feedback from realworld design to research. DATE also hosts a number of special sessions, events within the main technical programme such as panels, hot-topic sessions, tutorials and workshops.

  • 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)

    The DATE conference addresses all aspects of research into technologies for electronic and embedded system engineering. It covers the design process, test, and automation tools for electronics ranging from integrated circuits to distributed embedded systems. This includes both hardware and embedded software design issues. The conference scope also includes the elaboration of design requirements and new architectures for challenging application fields such as telecoms, wireless communications, multimedia, healthcare, smart energy and automotive systems. Companies also present innovative industrial designs to foster the feedback from real-world design to research. DATE also hosts a number of special sessions, events within the main technical programme such as panels, hot-topic sessions, tutorials and workshops

  • 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE 2013)

    DATE is the complete event for the European electronic and test community. A leading world conference and exhibition, DATE unites 2,000 professionals with approximately 60 exhibiting companies, cutting edge R&D, industrial designers and technical managers from around the world.

  • 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012)

    DATE is the complete event for the European electronic system and test community. A leading world conference and exhibition, DATE unites 2,000 professionals with some 60 exhibiting companies, cutting edge R&D, industrial designers and technical managers from around the world.

  • 2011 Design, Automation & Test in Europe Conference & Exhibition (DATE 2011)

    DATE is the complete event for the European electronic system and test community. A world leading conference and exhibition, DATE unites 2,000 professionals with some 60 exhibiting companies, cutting edge R&D, industrial designers and technical managers from around the world.

  • 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)

    All aspects of research into technologies for electronic and (embedded) systems engineering. It covers the design process, test, and tools for design automation of electronic products ranging from integrated circuits to distributed large-scale systems.

  • 2009 Design, Automation & Test in Europe Conference & Exhibition (DATE 2009)

    The Design, Automation, and Test in Europe (DATE) conference is the world's premier conference dedicated to electronics system design & test. The technical programme features: Four distinctive and integrated themes, covering all aspects of systems design and engineering. Two special days are focusing on SoC Development Strategies and Multicore Applications.

  • 2008 Design, Automation & Test in Europe Conference & Exhibition (DATE 2008)

    The 11th DATE conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems. It puts strong emphasis on ICs/SoCs, reconfigurable hardware and embedded systems, including embedded software. The five-day event consists of a conference with plenary invited papers, regular papers, panels, hot-topic sessions, tutorials.

  • 2007 Design, Automation & Test in Europe Conference & Exhibition (DATE 2007)

    DATE is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems. It puts strong emphasis on both ICs/SoCs, reconfigurable hardware and embedded systems, including embedded software.

  • 2006 Design, Automation & Test in Europe Conference & Exhibition (DATE 2006)

  • 2005 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  • 2004 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  • 2003 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  • 2002 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  • 2001 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  • 2000 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  • 1999 Design, Automation & Test in Europe Conference & Exhibition (DATE)


2018 European Conference on Antennas and Propagation (EuCAP)

Antennas & related topics e.g. theoretical methods, systems, wideband, multiband, UWBPropagation & related topics e.g. modelling/simulation, HF, body-area, urbanAntenna & RCS measurement techniques


2018 IEEE 18th International Power Electronics and Motion Control Conference (PEMC)

Promote and co-ordinate the exchange and the publication of technical, scientific and economic information in the field of Power Electronics and Motion Control with special focus on countries less involved in IEEE related activities. The main taget is to create a forum for industrial and academic community.

  • 2016 IEEE International Power Electronics and Motion Control Conference (PEMC)

    The IEEE Power Electronics and Motion Control (IEEE-PEMC) conference continues to be the oldest in Europe and is a direct continuation of the conferences held since 1970. Its main goal is to promote and co-ordinate the exchange and publication of technical, scientific and economic information on Power Electronics and Motion Control. One of its main objectives is the cooperation and integration between the long-time divided Western and Eastern Europe, this goal expressed in the conference logo, as well. The conference attracts now a large number (roughly 500+) of participants from the world. An exhibition is organised in parallel with every PEMC Conference, offering space for the industry to present their latest products for Power Electronics and Motion Control. In addition to the regular oral sessions, key notes, round tables, tutorials, workshops, seminars, exhibitions, the dialogue sessions (enlarged “poster” presentations) present to the speakers a better cooperation opportunity.

  • 2014 16th International Power Electronics and Motion Control Conference (PEMC)

    The purpose of the 16th International Power Electronics and Motion Control Conference and Exposition (PEMC) is to bring together researchers, engineers and practitioners from all over the world, interested in the advances of power systems, power electronics, energy, electrical drives and education. The PEMC seeks to promote and disseminate knowledge of the various topics and technologies of power engineering, energy and electrical drives. The PEMC aims to present the important results to the international community of power engineering, energy, electrical drives fields and education in the form of research, development, applications, design and technology. It is therefore aimed at assisting researchers, scientists, manufacturers, companies, communities, agencies, associations and societies to keep abreast of new developments in their specialist fields and to unite in finding power engineering issues.

  • 2012 EPE-ECCE Europe Congress

    Power Electronics and Motion Control.

  • 2010 14th International Power Electronics and Motion Control Conference (EPE/PEMC 2010)

    Semiconductor Devices and Packaging, Power Converters, Electrical Machines, Actuators, Motion Control, Robotics, Adjustable Speed Drives, Application and Design of Power Electronics circuits, Measurements, Sensors, Observing Techniques, Electromagnetic Compatibility, Power Electronics in Transportation, Mechatronics, Power Electronics in Electrical Energy Generation, Transmission and Distribution, Renewable Energy Sources, Active Filtering, Power Factor Correction

  • 2008 13th International Power Electronics and Motion Control Conference (EPE/PEMC 2008)

  • 2006 12th International Power Electronics and Motion Control Conference (EPE/PEMC 2006)


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Periodicals related to Testing

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Advanced Packaging, IEEE Transactions on

The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.


Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Antennas and Wireless Propagation Letters, IEEE

IEEE Antennas and Wireless Propagation Letters (AWP Letters) will be devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


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Most published Xplore authors for Testing

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Xplore Articles related to Testing

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IEE Colloquium on 'Techniques for Testing and Measuring Digital Systems' (Digest No.105)

[] IEE Colloquium on Techniques for Testing and Measuring Digital Systems, 1988

None


Delayed Failures in Software Using High Volume Automated Testing

[{u'author_order': 1, u'affiliation': u'Cranfield University', u'full_name': u'J. Gardiner'}] Testing: Academic & Industrial Conference - Practice And Research Techniques (TAIC PART'06), 2006

The research described studies delayed failures in software using high volume automated testing (HVAT) and investigates the effectiveness of different HVAT techniques; such techniques include genetic algorithms, model-based testing, penetration testing, robustness testing, and random (stochastic) testing. A delayed failure is a failure that occurs some time after the conditions that lead to the failure are applied. There appear to ...


IEE Colloquium on 'Testing-the Gordian Knot of VLSI Design' (Digest No.1993/131)

[] IEE Colloquium on Testing-the Gordian Knot of VLSI Design, 1993

None


IEEE Standard for High-Voltage Testing Techniques - Redline

[] IEEE Std 4-2013 (Revision of IEEE Std 4-1995) - Redline, 2013

Standard methods and basic techniques for high-voltage testing applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established in this standard. Sections that deal with alternating voltage, direct voltage, and impulse testing are combined in this revision to organize the technical content for ease of use. In addition, ...


Search-Based Testing and System Testing: A Marriage in Heaven

[{u'author_order': 1, u'full_name': u'Andreas Zeller'}] 2017 IEEE/ACM 10th International Workshop on Search-Based Software Testing (SBST), 2017

Software test generation can take place at the function level or the system level, and be driven by random, constraint-based, and/or search-based techniques. In this paper, we argue that the best way to generate tests is at the system level, as it avoids false failures due to implicit preconditions, and that for testing at the system level, search-based techniques are ...


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Educational Resources on Testing

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eLearning

No eLearning Articles are currently tagged "Testing"

IEEE-USA E-Books

  • Hard Problems in Software Testing: Solutions Using Testing as a Service (TaaS)

    This book summarizes the current hard problems in software testing as voiced by leading practitioners in the field. The problems were identified through a series of workshops, interviews, and surveys. Some of the problems are timeless, such as education and training, while others such as system security have recently emerged as increasingly important. The book also provides an overview of the current state of Testing as a Service (TaaS) based on an exploration of existing commercial offerings and a survey of academic research. TaaS is a relatively new development that offers software testers the elastic computing capabilities and generous storage capacity of the cloud on an as-needed basis. Some of the potential benefits of TaaS include automated provisioning of test execution environments and support for rapid feedback in agile development via continuous regression testing. The book includes a case study of a representative web application and three commercial TaaS tools to determine which hard problems in software testing are amenable to a TaaS solution. The findings suggest there remains a significant gap that must be addressed before TaaS can be fully embraced by the industry, particularly in the areas of tester education and training and a need for tools supporting more types of testing. The book includes a roadmap for enhancing TaaS to help bridge the gap between potential benefits and actual results. Table of Contents: Introduction / Hard Problems in Software Testing / Testing as a Service (TaaS) / Case Study and Gap Analysis / Summary / Appendix A: Hard Problems in Software Testing Survey / Appendix B: Google App Engine Code Examples / Appendix C: Sauce Labs Code Examples / References / Author Biographies

  • An Introduction to Logic Circuit Testing

    An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self- test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References

  • Testing iOS Apps with HadoopUnit: Rapid Distributed GUI Testing

    Smartphone users have come to expect high-quality apps. This has increased the importance of software testing in mobile software development. Unfortunately, testing apps—particularly the GUI—can be very time-consuming. Exercising every user interface element and verifying transitions between different views of the app under test quickly becomes problematic. For example, execution of iOS GUI test suites using Apple’s UI Automation framework can take an hour or more if the app’s interface is complicated. The longer it takes to run a test, the less frequently the test can be run, which in turn reduces software quality. This book describes how to accelerate the testing process for iOS apps using HadoopUnit, a distributed test execution environment that leverages the parallelism inherent in the Hadoop platform. HadoopUnit was previously used to run unit and system tests in the cloud. It has been modified to perform GUI testing of iOS apps on a small-scale cluster—a modest computing infrastructure available to almost every developer. Experimental results have shown that distributed test execution with HadoopUnit can significantly outperform the test execution on a single machine, even if the size of the cluster used for the execution is as small as two nodes. This means that the approach described in this book could be adopted without a huge investment in IT resources. HadoopUnit is a cost-effective solution for reducing lengthy test execution times of system-level GUI testing of iOS apps.

  • Reliability Criteria in Information Theory and in Statistical Hypothesis Testing

    Reliability Criteria in Information Theory and Statistical Hypothesis Testing is devoted to one of the central problems of Information Theory; the problem of determination of interdependence of coding rate and of error probability exponent for different information transmission systems. The overview deals with memoryless systems of finite alphabet setting. Reliability Criteria in Information Theory and Statistical Hypothesis Testing briefly formulates fundamental notions and results of Shannon theory on reliable transmission via coding and gives a survey of results obtained in last two-three decades by the authors, their colleagues and other researchers. The book is written with the goal to make accessible to a broader circle of readers the concept of rate- reliability. This concept is useful to solve these problems as well as elaborating the idea of reliability-reliability dependence related to statistical hypothesis testing and identification. Reliability Criteria in Information Theory and Statistical Hypothesis Testing is for students, researchers and professionals working in Information Theory.

  • Logic Testing

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  • Software Testing

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  • Quality Assurance Beyond Testing

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  • Mechanical Testing for the Biomechanics Engineer: A Practical Guide

    Mechanical testing is a useful tool in the field of biomechanics. Classic biomechanics employs mechanical testing for a variety of purposes. For instance, testing may be used to determine the mechanical properties of bone under a variety of loading modes and various conditions including age and disease state. In addition, testing may be used to assess fracture fixation procedures to justify clinical approaches. Mechanical testing may also be used to test implants and biomaterials to determine mechanical strength and appropriateness for clinical purposes. While the information from a mechanical test will vary, there are basics that need to be understood to properly conduct mechanical testing. This book will attempt to provide the reader not only with the basic theory of conducting mechanical testing, but will also focus on providing practical insights and examples. Table of Contents: Preface / Fundamentals / Accuracy and Measurement Tools / Design / Testing Machine Design and Fabrication / Fixture Design and Applications / Additional Considerations in a Biomechanics Test / Laboratory Examples and Additional Equations / Appendices: Practical Orthopedic Biomechanics Problems / Bibliography / Author Biography

  • Future Trends in Testing

    This chapter contains sections titled:Testing Earlier in the Development CycleIMS and Technology ConvergenceEvolving Testing TechnologiesFuture Cellular Network Technologies

  • Integration Testing

    This chapter contains sections titled:DefinitionGetting Things WorkingKeeping Things Working




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