Conferences related to Semiconductor

Xplore Articles related to Semiconductor

• IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

  ANSI/IEEE Std 759-1984, 1984

  Administratively Withdrawn January 2007. Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and computers are not covered.

• 2003 International Symposium on Compound Semiconductors: Post-Conference Proceedings (IEEE Cat. No.03TH8767)

  Compound Semiconductors: Post-Conference Proceedings, 2003 International Symposium on, 2003

  The following topics were dealt with: wide-bandgap semiconductors; laser materials processing; semiconductor doping; semiconductor growth; photoluminescence measurements; Hall effect; optoelectronics applications; semiconductor defects; semiconductor quantum dots; thermal annealing; semiconductor heterojunctions; III-V semiconductors; II-VI semiconductors; semiconductor quantum wells; Raman scattering study; electron effective mass; spin-orbit splitting; magnetic anisotropy; metallic thin films; magnetic thin films; spin devices; spintronics; resonant tunneling devices; quantum ...

• Electron-hole plasmas in semiconductors

  Zutavern, F.J.; Baca, A.G.; Chow, W.W.; Hafich, M.J.; Hjalmarson, H.P.; Loubriel, G.M.; Mar, A.; O'Malley, M.W.; Vawter, A.G.A. Pulsed Power Plasma Science, 2001. IEEE Conference Record - Abstracts, 2001

  Summary form only given, as follows. Electron hole plasmas are found in high speed, high power semiconductor switches and oscillators. Their properties are used to describe the operation of high-gain photoconductive semiconductor switches (PCSS), resonant tunneling diodes, Read diodes, impact ionization avalanche transit time (IMPATT) devices, and Gunn oscillators. Models for electronic polarizability, plasma resonances, transit time effects, and plasma ...

• Innovations in undergraduate engineering education through NSF ILI and NASA JOVE program-sponsored development of a laboratory course sequence in semiconductor materials

  Engelken, R.D. Education, IEEE Transactions on, 1997

  This paper describes development of two undergraduate laboratory courses in semiconductor materials and devices. The project was supported through a National Science Foundation (NSF) Instrumentation and Laboratory Improvement (ILI) Grant with supplementary support from the NASA JOVE Program, Arkansas State University, and equipment vendors. The courses complement lecture courses, cover semiconductor growth, characterization, processing, and simple devices, and enhance intuition ...

• The new dope on semiconductor doping

  Paulson, L.D. Computer, 2004

  A University of California, Berkeley, researcher has developed a way to apply semiconductor dopants at the atomic level. Controlling the amount of dopant applied is increasingly important as the size of wires, diodes, transistors, switches, and other semiconductor elements approaches molecular scale. During semiconductor fabrication, manufacturers typically add dopants to semiconductor materials, such as silicon, to change their performance by ...

Jobs related to Semiconductor

Educational Resources on Semiconductor

• Tunable Semiconductor Lasers

  Buus, Jens Tunable Semiconductor Lasers, 2006

  This course describes the state-of-the-art of tunable lasers, tunable laser technologies and control of tunable lasers. It also includes a brief introduction to the basics of semiconductor lasers, as well as background on DFB lasers, in particular how a grating works as a wavelength selective element in DFB and DBR lasers. Tuning mechanisms and tuning properties will be described, and ...

• High power variable speed drives: Performance issues, application guide, and network studies Part 2

  Badrzadeh, Babak High power variable speed drives: Performance issues, application guide, and network studies Part 2, 2010

  The principles of operation, performance issues, application guide, market status and power system studies required for high power variable speed drive systems is presented in this tutorial. The focus of the tutorial is on the Line Commutated Inverter (LCI) and Voltage Source Inverter (VSI) drives. The tutorial spans from entry level topics such as a survey of high power, power ...

• High power variable speed drives: Performance issues, application guide, and network studies Part 1

  Smith, Kenneth; Badrzadeh, Babak High power variable speed drives: Performance issues, application guide, and network studies Part 1, 2010

  The principles of operation, performance issues, application guide, market status and power system studies required for high power variable speed drive systems is presented in this tutorial. The focus of the tutorial is on the Line Commutated Inverter (LCI) and Voltage Source Inverter (VSI) drives. The tutorial spans from entry level topics such as a survey of high power, power ...

• Understanding On-Chip Transmission Lines - Part 1

  Deutsch, Alina Understanding On-Chip Transmission Lines - Part 1, 2006

  This course reviews the present-day on-chip wiring design practices and the special characteristics of on-chip lossy transmission lines. The deficiencies of present-day RC-circuit-representation-based designs and tools are highlighted through relevant examples. Guidelines are given for how to use controlled transmission line structures and design practices are discussed for best optimizing the wiring structure and design methodologies to circumvent the negative ...

• Organic Field Effect Transistors

  Kymissis, Ioannis Organic Field Effect Transistors, 2006

  The course will explain the theory underlying OFET operation, discuss practical fabrication strategies in use and underdevelopment, and discuss characterization and simulation of these devices, as well as some simple circuit implications considering their performance strengths and limitations.

Standards related to Semiconductor

• IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Semiconductor Design Environments

  Define structures in STIL to support usage as semiconductor simulation stimulus; including: 1) mapping signal names to equivalent design references, 2) interface between Scan and BIST, and the logic simulation, 3) data types to represent unresolved states in a pattern, 4) parallel or asynchronous pattern execution on different design blocks, and 5) expression-based conditional execution of pattern constructs. Define structures ...

• IEEE Standard for Practices and Requirements for Semiconductor Power Rectifier Transformers Amendment 1: Added Technical and Editorial Corrections

• IEEE Standard Practices and Requirements for Semiconductor Power Rectifier Transformers

  To develop a standard for transformers serving semiconductor power rectifiers employing monochrystalline semiconductor diodes or thyristors. Excepted applications are welding equipment, static precipitators, HVDC converters, and low power applications; such as radio receivers and other non-linear loads. The standard includes loads rated: single phase 300 KW and above and three phase 500 KW and above.

• IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

• Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

  Structures are defined in STIL to support usage as semiconductor simulation stimulus, including (1) mapping signal names to equivalent design references, (2) interface between scan and built-in self test (BIST) and the logic simulation, (3) data types to represent unresolved states in a pattern, (4) parallel or asynchronous pattern execution on different design blocks, and (5) expression-based conditional execution of ...

Periodicals related to Semiconductor

• Advanced Packaging, IEEE Transactions on

  The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.

• Components and Packaging Technologies, IEEE Transactions on

  Component parts, hybrid microelectronics, materials, packaging techniques, and manufacturing technology.

• Computer

  Computer, the flagship publication of the IEEE Computer Society, publishes peer-reviewed technical content that covers all aspects of computer science, computer engineering, technology, and applications. Computer is a resource that practitioners, researchers, and managers can rely on to provide timely information about current research developments, trends, best practices, and changes in the profession.

• Education, IEEE Transactions on

  Educational methods, technology, and programs; history of technology; impact of evolving research on education.

• Electronics Packaging Manufacturing, IEEE Transactions on

  Design for manufacturability, cost and process modeling, process control and automation, factory analysis and improvement, information systems, statistical methods, environmentally-friendly processing, and computer-integrated manufacturing for the production of electronic assemblies, products, and systems.

IEEE Organizations related to Semiconductor

• Aerospace & Electronics Systems
• Cloud Computing
• Communications
• Components, Packaging & Manufacturing Tech
• Computer

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